Inspection system and program
TW202638369APending Publication Date: 2026-09-16OMRON CORP
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Patent Information
- Application Number
- TW115106488
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-03-06
- Filing Date
- 2026-02-24
- Publication Date
- 2026-09-16
Smart Images

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Abstract
The objective of this invention is to provide a technique that allows operators in an inspection system to more easily confirm whether the results of inspection image processing based on an AI model are good or bad. An inspection system (1) performs inspection based on image data obtained from photographing a product. The inspection system (1) includes: a processing unit (20c) that performs inspection image processing for the inspection using an AI model on the image data of the product; a calculation unit (20d) that calculates a predetermined feature quantity of the processed image data used for evaluating the inspection image processing, created accompanying the execution of the inspection image processing; and a determination unit (20d) that determines whether the results of the inspection image processing are good or bad by comparing the feature quantity with a predetermined threshold value.
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