Inspection system and program

TW202638369APending Publication Date: 2026-09-16OMRON CORP
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Patent Information

Application Number
TW115106488
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-06
Filing Date
2026-02-24
Publication Date
2026-09-16

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Abstract

The objective of this invention is to provide a technique that allows operators in an inspection system to more easily confirm whether the results of inspection image processing based on an AI model are good or bad. An inspection system (1) performs inspection based on image data obtained from photographing a product. The inspection system (1) includes: a processing unit (20c) that performs inspection image processing for the inspection using an AI model on the image data of the product; a calculation unit (20d) that calculates a predetermined feature quantity of the processed image data used for evaluating the inspection image processing, created accompanying the execution of the inspection image processing; and a determination unit (20d) that determines whether the results of the inspection image processing are good or bad by comparing the feature quantity with a predetermined threshold value.
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