Semiconductor structure and method of forming the same
TW202638990APending Publication Date: 2026-09-16TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information
- Application Number
- TW114135974
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-07-24
- Filing Date
- 2025-09-18
- Publication Date
- 2026-09-16
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Abstract
A method includes: forming a first device region including a first semiconductor substrate; forming a first interconnect structure over a first front side of the first semiconductor substrate, wherein the first device region and the first interconnect structure form a first semiconductor die; forming a second device region including a second semiconductor substrate; forming a second interconnect structure over a second front side of the second semiconductor substrate, wherein the second device region and the second interconnect structure form a second semiconductor die; flipping the second semiconductor die and bonding the first semiconductor die with the second semiconductor die at a bonding region between the first interconnect structure and the second interconnect structure; and forming a third interconnect structure on a backside of the first semiconductor substrate, wherein the of the third interconnect structure includes a capacitor between two adjacent metallization layers of the third interconnect structure.
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