Radiosensitive linear components, patterning methods and compounds

TW202639487APending Publication Date: 2026-10-01JSR CORPORATION
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Patent Information

Application Number
TW115109584
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-17
Filing Date
2026-03-16
Publication Date
2026-10-01
Patent Text Reader

Abstract

The object of the present invention is to provide a radiosensitive linear composition, a patterning method and a compound that can fully exert sensitivity, LWR and development defect suppression during patterning. A radiosensitive linear composition comprises a polymer (A) containing a structural unit (I) having an acid-dissociable group, a compound (B) represented by the following formula (1) and a solvent (S).
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