Etching composition, etching method, and method for manufacturing semiconductor substrate
TW202639810APending Publication Date: 2026-10-01TOKYO OHKA KOGYO CO LTD
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Patent Information
- Application Number
- TW114150504
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-23
- Filing Date
- 2025-12-22
- Publication Date
- 2026-10-01
Abstract
The present invention provides an etching composition, an etching method, and a method for manufacturing a semiconductor substrate. The etching composition contains (A) an oxidant, (B) a compound or salt thereof capable of releasing fluoride ions, (C) at least one amine compound selected from the group consisting of amine compounds (c1), (c2), (c3), piperazine, 1,5,9-triazacyclododecane, 1,4,7-triazacyclononane, tetraazacyclododecane, tetraazacyclotetradecane, tetraethylpentamine, and polyethylimide and their derivatives, and (D) an etching inhibitor.
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