Acoustic-optical metrology system and method for characterizing a sample and non-transitory computer readable medium

TW202640122APending Publication Date: 2026-10-01NOVALTD
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Patent Information

Application Number
TW114148740
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-11
Filing Date
2025-12-11
Publication Date
2026-10-01

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Abstract

Systems and methods of optical metrology and inspection are provided, including shaping a pump pulse to have a concave wavefront that generates, in a sample, an acoustic wave that converges at a focal location. When a subsurface feature is at the focal location, a reflected acoustic wave is generated, with a convex acoustic wavefront. A probe assembly is configured to shape a probe pulse to have a spherical wavefront and to impinge on the surface simultaneously with the return to the surface of a reflected acoustic wave. A detection assembly is configured to receive a reflected probe pulse, reflected from the surface, and, responsively, to determine whether the reflected probe pulse is indicative of surface changes induced by a reflected acoustic wave from a subsurface feature at the focal location.
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