Transparent surface dirt / defect detection device and method

TW202640128AInactive Publication Date: 2026-10-01SHYAWEI OPTRONICS CORP CO LTD +1
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Patent Information

Application Number
TW114109904
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-03-17
Publication Date
2026-10-01
Estimated Expiration
Not applicable · inactive patent

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Abstract

A transparent surface dirt / defect detection device is disclosed. The transparent surface dirt / defect detection device orthogonally shoots a transparent surface layer of a multi-layer structure object under test obtain a first image, and emits sensing light to obliquely illuminate an upper surface of the transparent surface layer. An angle between a propagating direction of the sensing light and the upper surface of the transparent surface layer is the Brewster angle between the transparent surface layer and air, and the sensing light is non-polarized light. After the sensing light obliquely irradiates the upper surface of the transparent surface layer, reflected light and refracted light are formed. The transparent surface dirt / defect detection device filters out the reflected light and receives the refracted light to obtain a second image. Then, the transparent surface dirt / defect detection device identifies and locates an upper surface dirt / defect and a lower surface dirt / defect of the transparent surface layer according to the first image and the second image.
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