Test probe for a finger tester for testing printed circuit boards, finger tester for testing printed circuit boards, and method for testing printed circuit boards

Abstract

The invention relates to a test probe for a test finger for testing printed circuit boards. The test probe has a contact sleeve and a test needle, which has a contact tip at one end. In addition, the test probe comprises at least one sleeve spring arm, which is embodied with one end on a base of the test probe and with the other end on the contact sleeve for elastically holding and electrically connecting the contact sleeve. The test needle in the contact sleeve can be moved in the axial direction so that the contact sleeve can be brought into contact with a printed circuit board test point of the printed circuit board to be tested. The test probe has a needle spring arm which is electrically and mechanically attached to a connection end of the test needle that protrudes from the contact sleeve at the end that is remote from the contact tip so that the needle spring arm counteracts a movement of the test needle in which its connection end moves out from the contact sleeve. As a result, the test needle forms an internal sensor and the contact sleeve forms an external sensor for scanning a printed circuit board test point.

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