Contact-type temperature control testing device, method of controlling temperature, and temperature controlling system
TW202640160APending Publication Date: 2026-10-01MPI CORP
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- TW115107730
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-03-05
- Filing Date
- 2026-03-04
- Publication Date
- 2026-10-01
Smart Images

Figure TWG2TA001079441_001 
Figure TWG2TA001079441_002 
Figure TWG2TA001079441_003
Abstract
A contact-type temperature control testing device, which directly contacts a test object and controls its temperature, includes a low-temperature module, a high-temperature module, and a spacing adjustment member. The low-temperature module provides a preset low temperature. The high-temperature module is located adjacent to the low-temperature module and includes a high-temperature source and a base. The high-temperature source is disposed on the base and provides a preset high temperature. A surface of the base directly contacts the test object, and a preset temperature is conducted to the test object by the low-temperature module and / or the high-temperature source. The spacing adjustment member has one end, which is connected to the low-temperature module, and the other end, which is disposed on the high-temperature module. The spacing adjustment member is configured to adjust a mechanical coupling condition between the low-temperature module and the high-temperature module in response to a temperature change of the high-temperature source.
Need to check novelty before this filing date? Find Prior Art
