Temperature test apparatus

TW202640164APending Publication Date: 2026-10-01TAKAMISAWA CYBERNETICS CO LTD +1
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW114131698
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-03
Filing Date
2025-08-20
Publication Date
2026-10-01

Smart Images

  • Figure TWG2TA001078272_001
    Figure TWG2TA001078272_001
  • Figure TWG2TA001078272_002
    Figure TWG2TA001078272_002
  • Figure TWG2TA001078272_003
    Figure TWG2TA001078272_003
Patent Text Reader

Abstract

This invention provides a temperature testing apparatus capable of shortening the time required for the temperature in a test chamber to stabilize at a set temperature. The temperature testing apparatus (1A) includes an opening (3a), an air supply mechanism, a mounting surface (4g), and an air flow path. The opening (3a) is provided in part of a partition wall separating the inside and outside of the test chamber (3) and is used for moving the test object into and out of the test chamber (3). The air supply mechanism includes an air outlet (10a) located at the upper part of the opening (3a), an air inlet (10b) located at the lower part of the opening (3a), and a blower (6) for supplying air from the inlet (10b) to the outlet (10a), forming an air curtain (A1) along the opening (3a). The mounting surface (4g) is provided inside the test chamber (3) and holds the test object. The airflow path in the test chamber (3) is from the area located on the side opposite to the opening (3a) relative to the mounting surface (4g) through the underside of the mounting surface (4g) to the inlet (10b).
Need to check novelty before this filing date? Find Prior Art