Power supply circuit, test system, method for electrical testing, and electronic device under test

Abstract

A power supply circuit, a test system, a method for electrical testing, and an electronic device under test are provided. The power supply circuit includes a power supply circuit, a gain circuit, and a voltage adjustment circuit. The power supply circuit provides a test power supply. The gain circuit has a first-stage amplification / buffer circuit and a second-stage amplification / buffer circuit. The first-stage amplification / buffer circuit receives the test power supply and generates a first output power supply. The second-stage amplification / buffer circuit receives the first output power supply and generates a second output power supply. The voltage adjustment circuit is electrically connected to the first-stage amplification / buffer circuit and the second-stage amplification / buffer circuit. The voltage adjustment circuit dynamically generates a power supply voltage relative to the change of a reference voltage of the first output power supply to the second-stage amplification / buffer circuit. The power supply voltage is adjusted by the voltage adjustment circuit to follow the reference voltage, and the voltage difference between the power supply voltage and the reference voltage is determined by the voltage adjustment circuit.

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