Method for acquiring focal length values, device for acquiring focal length values and detection equipment capable of calculating focal length of slide

TW202640247APending Publication Date: 2026-10-01INVECTEC APPLIANCES CORPORATION
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Patent Information

Application Number
TW114115827
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-26
Filing Date
2025-04-25
Publication Date
2026-10-01

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Abstract

A method for acquiring focal length values, a device for acquiring focal length values, and a detection equipment capable of calculating the focal length of a slide are described. The method includes the following steps: acquiring a calibration slope value and a calibration intercept value of a detection equipment including a microscope; acquiring a height value of a slide by identifying a scale when a probe touches a carrier and the scale when the probe touches the slide, based on an image of the carrier; and calculating a calculation focal length value of the slide based on the calibration slope value, the calibration intercept value, and the height value.
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