Assay system calibration systems and methods

TW202640414APending Publication Date: 2026-10-01MESO SCALE TECH LLC
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Patent Information

Application Number
TW115121385
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2021-01-11
Filing Date
2022-01-11
Publication Date
2026-10-01

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Abstract

Systems and methods for calibrating sample assays are provided. Systems may include assay devices and components for carrying out calibration and sample assays. Systems may further include processing components and storage units configured for receiving calibration information, determining calibration models and parameters, and applying calibration parameters to sample data. Systems may further include components for operating in a networked environment. Methods may include techniques and processes for carrying out calibration and sample assays, determining calibration models and parameters, and applying calibration parameters to sample data.
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