Method and system for generating test questions

TW202640516APending Publication Date: 2026-10-01WISTRON CORP
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Patent Information

Application Number
TW114111510
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-03-26
Publication Date
2026-10-01

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Abstract

The disclosure provides a method and a system for generating test questions. The method includes the following steps. At least one reference text and an examination syllabus are obtained. Based on the examination syllabus, a plurality of first relevant text segments are extracted from at least one reference text by using a term frequency analysis method. Based on the examination syllabus, a plurality of second relevant text segments are extracted from at least one reference text by using a natural language understanding model. A first target text segment and a second target text segment are respectively select from the plurality of first relevant text segments and the plurality of second relevant text segments. A test question is generated by inputting the first target text segment and the second target text segment into a first large language model.
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