Defect Image Generation System and Defect Image Generation Method

Abstract

A defect image generation system and method are disclosed. The defect image generation system includes a reference database, a defect database, and a processing device. The processing device runs a diffusion model and an application. The application combines a potential high-dimensional vector, a reference potential high-dimensional vector, and a defect potential high-dimensional vector to generate a synthetic high-dimensional vector. The diffusion model generates additional prediction noise based on the defect potential high-dimensional vector and a cue word high-dimensional vector, and generates main prediction noise based on a noisy synthetic high-dimensional vector generated by the application along different time steps. The noisy synthetic high-dimensional vector is then progressively denoised using the main prediction noise and the additional prediction noise to generate a generative defect image.

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