Image data generation method, abnormality detection method, electronic device and storage medium

TW202640526APending Publication Date: 2026-10-01HON HAI PRECISION INDUSTRY CO LTD
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Patent Information

Application Number
TW114113158
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-28
Filing Date
2025-04-08
Publication Date
2026-10-01

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Abstract

This application provides an image data generation method, an abnormality detection method, an electronic device and a storage medium. The image data generation method includes: obtaining a three-dimensional model of a target object, a reality defect image, and a normal image; generating a synthetic defect image and annotation information of the synthetic defect image based on the three-dimensional model and the reality defect image, the annotation information of the synthetic defect image including distribution information of a defect of the three-dimensional model in the synthetic defect image; simulating and processing the normal image of a target object based on a preset adversarial generative network model, and generating a plurality of simulated defect images; constructing an image fusion dataset based on a plurality of reality defect images, a plurality of synthetic defect images, a plurality of simulated defect images, and the annotation information of each synthetic defect image in the plurality of synthetic defect images.
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