Method for detecting abnormalities based on machine vision, apparatus, electronic device and storage media

Abstract

The present application provides a method for detecting abnormalities based on machine vision, an apparatus, an electronic device, and a storage media. The method includes acquiring an image captured by a camera device; preprocessing the image and obtaining a sample image; determining sampling areas in the sample image according to preset sampling parameters; determining sample features corresponding to the sampling areas according to image information of the sampling areas, the sample feature indicating brightness information in the sample image; determining abnormality information based on the machine vision according to the sample features. The present application can increase efficiency of equipment maintenance.

Images