Charged particle wire device

TW202640690APending Publication Date: 2026-10-01HITACHI HIGH TECH CORP
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW115110458
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-21
Filing Date
2026-03-19
Publication Date
2026-10-01

Smart Images

  • Figure TWG2TA001079614_001
    Figure TWG2TA001079614_001
  • Figure TWG2TA001079614_002
    Figure TWG2TA001079614_002
  • Figure TWG2TA001079614_003
    Figure TWG2TA001079614_003
Patent Text Reader

Abstract

[Problem to be solved] To correct the distortion caused by the influence of charged particles, thereby improving the length measurement accuracy. [Solution] The imaging unit (101) scans the sample multiple times under specified optical conditions to obtain a scan image. The computer (100) accumulates and corrects the frame image to obtain the scan image. The corrected frame image is obtained by correcting the frame image generated by the imaging unit for the i-th scan to obtain the scan image using a pre-calculated transformation matrix (i is an integer of 2 or more). The i-th transformation matrix is ​​calculated as a matrix that transforms the first coordinate group in the reference image containing the pattern into the second coordinate group corresponding to the first coordinate group in the frame image generated by the i-th scan to calculate the transformation matrix.
Need to check novelty before this filing date? Find Prior Art