Manufacturing method of semiconductor device, temporary bonding of semiconductor device, and composition of temporary bonding agent.
TW202641928APending Publication Date: 2026-10-16SHIN ETSU CHEMICAL CO LTD
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Patent Information
- Application Number
- TW115106775
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-11-07
- Filing Date
- 2026-02-25
- Publication Date
- 2026-10-16
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Figure TWG2TA001081136_001 
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Abstract
A method for manufacturing a semiconductor device is provided, comprising a temporary adhesive layer forming stage in which a temporary adhesive layer of a temporary adhesive composition is formed on one side of a support; a viscosity increasing stage in which the viscosity of the temporary adhesive layer is increased; a configuration stage in which a plurality of pre-processing devices, serving as semiconductor devices before processing, are configured on the temporary adhesive layer with increased viscosity; a processing stage in which the pre-processing devices are processed to obtain a semiconductor device; and a peeling stage in which the semiconductor device is peeled off from the support. A temporary adhesive semiconductor device is provided, comprising a support, a temporary adhesive layer formed on one side of the support, and a pre-processing device, serving as a semiconductor device before processing, configured on the temporary adhesive layer, wherein the density of bubbles with a maximum diameter of 10 μm or more in the cross-section of the temporary adhesive layer perpendicular to the support is 3 bubbles / mm² or less.
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