Test table and handler for testing electronic components
TW202642167APending Publication Date: 2026-10-16TECHWING CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- TW114151165
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-02-07
- Filing Date
- 2025-12-24
- Publication Date
- 2026-10-16
Smart Images
Figure 00000000_0000_ABST
Abstract
This invention relates to a test bench for testing electronic components. The test bench of this invention has a plurality of vacuum flow paths and a plurality of cooling flow paths formed on a bench body supporting a plurality of electronic components mounted on its upper surface. The vacuum flow paths have pressure vessels with enlarged inner diameters. According to this invention, processing capacity is increased and testing reliability is improved because the temperature of the electronic components can be rapidly adjusted.
Need to check novelty before this filing date? Find Prior Art