Semiconductor testing equipment, signal transmission unit loading and unloading system, and signal transmission unit loading and unloading method

TW202642168APending Publication Date: 2026-10-16NIHON MICRONICS KK
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Patent Information

Application Number
TW114147386
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-26
Filing Date
2025-12-04
Publication Date
2026-10-16

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Abstract

The tester includes: a test carrier unit on which probe cards for testing semiconductor circuits are mounted; and a body unit on which the test carrier unit is detachably mounted; the test carrier unit has casters on the side of the body unit; the body unit includes: a caster rail for supporting the casters; and a lifting unit for lifting the caster rail in the loading / unloading direction of the test carrier unit. none
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