Semiconductor testing equipment and inspection system

Abstract

The present invention provides a semiconductor testing apparatus comprising: a body frame; a plurality of substrate units inserted into the interior of the body frame; and an incorrect insertion prevention mechanism formed in a shape corresponding to the type of substrate unit to limit the incorrect insertion of the substrate unit into the interior of the body frame; the incorrect insertion prevention mechanism comprising: a pin unit having a pin disposed at a position corresponding to the type of substrate unit; and a pin insertion plate having a pin insertion hole for inserting the pin of the pin unit; the pin unit is disposed on one side of the body frame and the substrate unit, and the pin insertion plate is disposed on the other side of the body frame and the substrate unit. none

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