Probe card and its manufacturing method
TW202642173APending Publication Date: 2026-10-16NIHON MICRONICS KK
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Patent Information
- Application Number
- TW115108007
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-04-02
- Filing Date
- 2026-03-05
- Publication Date
- 2026-10-16
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Abstract
The probe card of the present invention comprises: a probe having a front end that contacts a wafer; a guide member having a guide hole for the probe to pass through; and a wiring board having a terminal portion that engages with the base end of the probe; the wiring board comprises: a main surface having the terminal portion; and a pedestal portion having a main surface that protrudes more than the terminal portion and forming a space between the main surface and the guide member. none
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