Method of matching multiple chips for forming a system-on-integrated-chips

Abstract

The present disclosure provides a method of matching multiple chips for forming a System-on-Integrated-Chips (SOIC). The method comprising: obtaining a first individual transistor parameter of a first die and a second individual transistor parameter of a second die; wherein both the first individual transistor parameter and the second individual transistor parameter are a first type of transistor parameter, and wherein the first die is associated with a first chip, and the second die is associated with a second chip; matching the first chip and the second chip successfully when the first individual transistor parameter of the first die and the second transistor parameter of the second die satisfy a first predetermined condition.

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