Information processing systems, information processing methods, and information processing programs

Abstract

An information processing system, information processing method, and information processing program are provided to more easily analyze defects existing in a laminate containing opaque rolls of material. The information processing system includes: an acquisition unit (511) for acquiring first feature point information about feature points existing in a first roll of material and second feature point information about feature points existing in a laminate formed by laminating an opaque second roll of material onto the first roll of material; a comparison unit (513) for comparing the acquired first feature point information with the acquired second feature point information; and an output unit (514) for outputting comparison information of the comparison result between the first feature point information and the second feature point information.

Description

[Technical Field]

[0001] This invention relates to an information processing system, an information processing method, and an information processing program. [Previous Technology]

[0002] Optical thin films are used in displays such as liquid crystal display devices. The rolls of optical thin films are composed of laminates of multiple rolls. In the manufacturing process of such optical thin films, strict management is required regarding defects occurring in the rolls. For example, Patent Document 1 describes a technique for controlling defects occurring in rolls. [Prior Art Documents] [Patent Documents]

[0003] [Patent Document 1] Japanese Patent Application Publication No. 2022-107419 [Summary of the Invention]

[0004] [Problem to be Solved by the Invention] A laminate system of multiple rolls of material may contain opaque rolls of material, such as protective films, release films, or anti-glare films. In laminates containing opaque rolls of material, the detection of defects can become difficult. Therefore, there is a need for a method to more easily analyze defects present in laminates containing opaque rolls of material.

[0005] This invention was developed in view of the above-mentioned matters, and its purpose is to provide an information processing system, information processing method, and information processing program that can more easily analyze defects existing in laminates containing opaque rolls of material. [Means for solving the problem]

[0006] The above-described objective of the present invention is achieved by the means described below.

[0007] (1) An information processing system comprising: an acquisition unit for acquiring first feature point information about feature points present in a first roll of material and second feature point information about feature points present in a laminate formed by laminating an opaque second roll of material onto the first roll of material; a comparison unit for comparing the acquired first feature point information with the acquired second feature point information; and an output unit for outputting comparison information about the comparison result of the first feature point information and the second feature point information.

[0008] (2) The information processing system described in (1) above, wherein the prior comparison unit classifies the feature points existing in the first volume of the prior record and the feature points existing in the prior laminate into: a first type of feature point that exists in the first volume of the prior record but disappears in the prior laminate; a second type of feature point that does not exist in the first volume of the prior record but appears in the prior laminate; and a third type of feature point that exists in the first volume of the prior record and remains in the prior laminate; the prior comparison information contains: information about at least one of the first type of feature point, the second type of feature point and the third type of feature point.

[0009] (3) The information processing system described in (1) above, wherein the former acquisition unit also acquires information about the third feature point present in the second volume of the former; the former comparison unit compares the acquired first feature point information and third feature point information of the former with the second feature point information of the former.

[0010] (4) The information processing system described in (1) above further includes: a position matching unit, which correlates the feature points present in the first volume of the preceding material with the feature points present in the preceding laminate based on their respective positions; and a preceding comparison unit, which compares the information of the first feature point of the preceding material with the information of the second feature point of the preceding material using the result of the preceding correlation.

[0011] (5) The information processing system described in (1) above, wherein the previous output unit outputs the previous comparison information by displaying the previous comparison information on the display unit.

[0012] (6) The information processing system described in (1) above, wherein the first volume of the above-mentioned material has a multi-volume stacked structure.

[0013] (7) The information processing system described in (1) above, wherein the material in Volume 2 of the foregoing contains at least one of a protective film, a separation film or an anti-glare film.

[0014] (8) The information processing system described in (1) above, wherein the material in Volume 2 of the above description has a haze of 5% or more.

[0015] (9) An information processing method comprising: a step of acquiring first feature point information about feature points present in a first roll of material and second feature point information about feature points present in a laminate formed by laminating an opaque second roll of material onto the first roll of material; a step of comparing the acquired first feature point information with the acquired second feature point information; and a step of outputting comparison information about the comparison result of the first feature point information and the second feature point information.

[0016] (10) An information processing program that causes a computer to execute the information processing method described in (9) above. [Effects of the Invention]

[0017] In the information processing system, information processing method, and information processing program involved in this invention, the first feature point information and the second feature point information are compared, and comparison information regarding the comparison result is output. Therefore, for example, manufacturing managers can easily identify the feature points remaining from the state of the first roll among the feature points present in a laminate containing an opaque second roll, and can more easily analyze the defects present in the laminate containing the opaque roll.

Implementation Method

[0019] Hereinafter, embodiments of the present invention will be described with reference to the attached drawings. However, the scope of the present invention is not limited to the disclosed embodiments. Furthermore, in the description of the drawings, the same elements are indicated by the same symbols, and repeated descriptions are omitted. Also, the dimensions in the drawings are exaggerated for ease of explanation and may differ from the actual dimensions.

[0020] <First Embodiment> Figure 1 is a schematic diagram of an applicable example of the information processing system 50 described in the first embodiment. The information processing system 50 is configured using, for example, a server. The information processing system 50 is interconnected with the terminal device 70 of the factory 100 via a network. The network is a communication line such as a data communication network. In some parts of the network, wired LAN, wireless LAN, etc., may also be used. The wireless LAN is a LAN that conforms to, for example, the IEEE 802.11 standard. The information processing system 50 can also be connected to other factories via the network. In the factory 100, the second layer 80B is manufactured from the first layer 80A by the manufacturing apparatus 2000. The second layer 80B is wound into, for example, a roller shape. Here, the first layer 80A is a specific example of the first roll of material corresponding to the invention of this case, and the second layer 80B is a specific example of the laminate corresponding to the invention of this case.

[0021] Figure 2 shows an example of the cross-sectional structure of the first laminate 80A and the second laminate 80B. The first laminate 80A contains a first roll 81, a second roll 82, and a third roll 83. In the first laminate 80A, the first roll 81, the second roll 82, and the third roll 83 are laminated in this order. An adhesive layer 801 is provided between the first roll 81 and the second roll 82. An adhesive layer 802 is provided between the second roll 82 and the third roll 83. The first roll 81 and the third roll 83 are, for example, TAC films. TAC is an abbreviation for triacetin cellulose. The second roll 82 is, for example, an optical functional film such as a polarizer. The adhesive layer 801 bonds the first roll 81 and the second roll 82 together. Next, layer 802 is used to bond the second roll 82 and the third roll 83. The first layer 80A is an opaque roll, for example, with a haze of 5% or more. This haze refers to the total haze.

[0022] The second layer 80B comprises the first layer 80A and the fourth roll 84. The fourth roll 84 is, for example, bonded to the third roll 83 through an adhesive layer 803. The fourth roll 84 is an opaque roll, for example, having a haze of 5% or more. In this fourth roll 84, for example, irregular light reflection and scattering occur on its surface. Here, the fourth roll 84 is a specific example corresponding to the second roll of the present invention. The fourth roll 84 is, for example, a protective film. After the fourth roll 84 is bonded to the first layer 80A, for example, a slit treatment is applied to the second layer 80B. At this time, the surface of the first layer 80A is protected by the fourth roll 84, preventing scratches or the like from occurring on the surface of the first layer 80A. The fourth roll 84 may also be a release film or the like. In the second layer 80B, the adhesive layers 801, 802, and 803 can also be replaced by an adhesive layer.

[0023] [Factory 100] In factory 100, for example, a second layer 80B is manufactured by bonding a fourth roll of material 84 to a first layer 80A through an adhesive layer 803. The first layer 80A can also be manufactured in factory 100 or in other factories. The width of the second layer 80B is, for example, in the range of 1000mm to 5000mm. The thickness of each of the first roll of material 81, the second roll of material 82, the third roll of material 83, and the fourth roll of material 84 is set in the range of, for example, 15μm to 500μm, taking into account quality and operation. When the first roll of material 81, the second roll of material 82, the third roll of material 83, or the fourth roll of material 84 contains a metal such as steel, the thickness of the first roll of material 81, the second roll of material 82, the third roll of material 83, or the fourth roll of material 84 can also be 1mm or more. The length of the second layer 80B, which is in the shape of a roller, is, for example, in the range of 2000m to 10000m.

[0024] In factory 100, the second layer 80B is inspected. For example, the surface of the second layer 80B is inspected by inspection device 90. Inspection device 90 includes, for example, a camera. By performing optical inspection by inspection device 90, inspection data of the second layer 80B is generated. This inspection data contains second feature point information regarding feature points present in the second layer 80B.

[0025] Here, the so-called feature points existing in the second layer 80B refer to optical feature points existing in the roll material, specifically, spots that have optical differences from the surrounding area. Furthermore, when determining the optical differences from the surrounding area, a predetermined threshold can be set, and those exceeding this threshold are considered feature points. Feature points existing in the roll material are sometimes also referred to as defects, flaws, and faults of the roll material. Feature points include, for example, defects caused by poor bonding when joining multiple roll materials and defects caused by axial unevenness. Joining multiple roll materials may be done using, for example, ultrasonic welding. For example, tens to tens of thousands of feature points can be detected from image data taken from one second layer 80B. The total length of the second layer 80B is, for example, several hundred meters to several kilometers. Furthermore, multiple defects, flaws, and faults located within a defined area (e.g., 10 mm square) can also be considered as a single feature point.

[0026] The second feature point information regarding the feature points present in the second layer integral 80B includes, for example, information about the position and size of each of the plurality of feature points present in the second layer integral 80B. The position of the feature points can be represented using, for example, XY coordinates. In the second feature point information, a plurality of feature points that are close together can also be clustered.

[0027] The inspection device 90 for detecting feature points present in the second-layer module 80B is a transmission-type or reflection-type inspection device. The transmission-type inspection device 90 illuminates the second-layer module 80B with light and receives the light that passes through the second-layer module 80B. The reflection-type inspection device 90 illuminates the second-layer module 80B with light and receives the light reflected by the second-layer module 80B. The transmission-type and reflection-type inspection devices respectively include bright-field inspection devices and dark-field inspection devices. A plurality of inspection devices 90 may be configured in the factory 100.

[0028] Figures 3A and 3B show an example of the configuration of the reflective inspection device 90. Figure 3A shows the configuration in which the inspection device 90 is viewed from the width direction of the second layer 80B. Figure 3B shows the configuration in which the inspection device 90 is viewed from the transport direction of the second layer 80B. The inspection device 90 includes, for example, a light source 91, a camera 92, a resolution unit 93, and a memory unit 94.

[0029] In the inspection apparatus 90, the camera 92 captures images of the surface of the second layer 80B, generating image data. The number of cameras 92, their viewing angle, and their distance from the surface of the second layer 80B are appropriately set to capture the entire width of the second layer 80B. Figure 3B shows an inspection apparatus 90 with two cameras 92 in the width direction.

[0030] Light source 91 illuminates the inspection area of ​​the second layer 80B. Light source 91 illuminates the second layer 80B uniformly in the width direction of the cylindrical second layer 80B. Here, "uniformly illuminated" means that the illuminance of the illuminated light is approximately the same.

[0031] Camera 92 is an optical sensor that optically reads the inspection area of ​​the second-layer integrated circuit 80B. Camera 92 includes imaging elements such as CCD and CMOS, and a lens. CCD is an abbreviation for Charge Coupled Device. CMOS is an abbreviation for Complementary Metal Oxide Semiconductor. Camera 92 generates 2D image data from the output signals of each imaging element. Camera 92 detects diffused light reflected from the surface of the second-layer integrated circuit 80B by light irradiated by light source 91. Camera 92 can be a color camera or a monochrome camera. Camera 92 can also detect light in the visible light field and light in the infrared field.

[0032] For example, the camera 92 can read the entire width range of the second layer 80B at once. The contrast of the image data captured by the camera 92 is preferably above a predetermined value. In other words, within the second layer 80B, the illuminated area and the unilluminated area from the light source 91 preferably have a predetermined contrast ratio. To generate image data with a contrast ratio above the predetermined value, it is preferable to use a powerful and highly directional light source 91.

[0033] Here, "powerful" means, for example, that when the illuminance at a distance of 50mm is E50, the illuminance E50 is 50,000 lx or more. Also, "high directivity" means, for example, that when the illuminance at a distance of 50mm is E50 and the illuminance at a distance of 100mm is E100, (E50-E100) / E50 < 0.5.

[0034] The camera 92 is configured, for example, to receive the direct reflection of light from the light source 91. The camera 92 may also be configured to avoid the direct reflection of light from the light source 91, that is, to receive the diffused light from the second layer 80B.

[0035] The analysis unit 93 is composed of a CPU and RAM, etc. The analysis unit 93 reads out various processing programs stored in the memory unit 94 and expands them into RAM, performing various processing tasks in conjunction with these programs. The analysis unit 93 processes the image data captured by the camera 92 and detects feature points present in the second layer of the integrated circuit 80B. For example, after performing predetermined image processing on the image data, the analysis unit 93 detects feature points and quantitatively evaluates each detected feature point. Image analysis can use, for example, known techniques. Specifically, pixels whose pixel values ​​deviate from the average value of their surrounding pixels by a predetermined amount are extracted as feature points. The analysis unit 93 can also detect feature points using the following methods.

[0036] The analysis unit 93 divides the image data captured by the camera 92 into a plurality of regions. For example, the analysis unit 93 divides the image data into n regions in the width direction. n regions can be, for example, several to dozens. Hereinafter, the n regions will be referred to as region a1 to region an.

[0037] Next, the analysis unit 93 acquires image data of a region a1 and performs mathematical processing on the image data of region a1. The mathematical processing includes, for example, preprocessing, emphasis processing, signal processing, and image feature extraction.

[0038] Preprocessing includes, for example, image cropping, low-pass filtering, high-pass filtering, Gaussian filtering, median filtering, bilateral filtering, shape conversion, color conversion, contrast adjustment, noise removal, restoration of out-of-focus / shaky images, masking, Hough conversion, and projection conversion. Color conversion systems include, for example, L*a*b*, sRGB, HSV, and HSL.

[0039] It is emphasized that the processing system includes, for example: Sobel filtering, Scharr filtering, Laplacian filtering, Gabor filtering and Canny method, etc.

[0040] Signal processing includes, for example, the calculation of basic statistics, squares and square roots, differences, sums, products, ratios, distance matrices, differentiation and integration, thresholding, Fourier transform, wavelet transform, and peak detection. Basic statistics include, for example, maximum, minimum, mean, median, standard deviation, dispersion, and quartiles. Thresholding includes, for example, binarization and adaptive binarization. Peak detection includes, for example, the detection of peak value, peak count, or half-width.

[0041] The image feature extraction process includes template matching and SIFT features, etc.

[0042] The analysis unit 93 performs thresholding on the value obtained from the mathematical processing of the image data in the region a1. The thresholding process is a process that determines whether a point is a feature point and determines the size of the feature point based on a predetermined threshold.

[0043] The analysis unit 93 processes fields other than field a1 in the same way.

[0044] After processing each field a1 to an, the analysis unit 93 integrates the results for each field a1 to an. In this way, the feature points present in each field of the second-layer integral 80B are detected in relation to their position and size. Subsequently, the analysis unit 93 stores the detection results of the feature points of the second-layer integral 80B in the memory unit 94.

[0045] The analysis unit 93 may, for example, combine multiple images obtained by continuous photography from one camera 92. The analysis unit 93 may, for example, generate and store an image of the entire surface of the second layer 80B in the memory unit 94. Alternatively, the analysis unit 93 may generate multiple image data in relation to the photography time and store them in the memory unit 94. The analysis unit 93 may also combine multiple image data obtained by multiple cameras 92 arranged in the width direction. The analysis unit 93 may, for example, determine the position of the second layer 80B along its long side by referring to the stored transport speed and based on the photography time.

[0046] The memory unit 94 is composed of HDD and SSD, etc. SSD is an abbreviation for Solid State Drive. The memory unit 94 stores various processing programs and the data necessary for the execution of those programs. For example, the memory unit 94 stores image data captured by the camera 92 along with the time of capture. The memory unit 94 stores manufacturing conditions such as the winding speed of the manufacturing device 2000. The manufacturing conditions of the second layer 80B can also be included in the process list for checking the DB described later.

[0047] Figure 3C shows an example of a penetrating inspection device 90. In this inspection device 90, the light source 91 is positioned facing the camera 92 through a second layer of material 80B.

[0048] The inspection device 90 may also have a plurality of inspection units. For example, the camera 92 may include: a camera for detecting scratches on the surface of the second layer 80B, and a camera for detecting foreign objects inside the second layer 80B. The inspection data may be data from a portion of the plurality of inspection units, or a combination of the results from the plurality of inspection units.

[0049] [Composition of Terminal Device 70] Terminal device 70 is a computer such as a PC, smartphone, or tablet. PC is an abbreviation for Personal Computer. Terminal device 70 is configured to connect to information processing system 50. Terminal device 70 receives and sends various types of information with information processing system 50. For example, terminal device 70 is a PC used by employees of a manufacturing company operating factory 100.

[0050] Figure 4 is a block diagram showing the schematic structure of the terminal device 70. The terminal device 70 includes: a CPU 71, a ROM 72, a RAM 73, a storage unit 74, a communication interface 75, a display unit 76, and an operation receiving unit 77. CPU is an abbreviation for Central Processing Unit. ROM is an abbreviation for Read Only Memory. RAM is an abbreviation for Random Access Memory. The components are interconnected communicatively via bus 78.

[0051] CPU71 performs control or various calculations of the above components according to the program recorded in ROM72 or storage 74.

[0052] ROM72 is used to store various programs or data.

[0053] RAM73 is used as a temporary memory for programs or data in the operating field.

[0054] Storage 74 stores various programs or data containing the operating system. For example, storage 74 contains an application program used to display various information sent from the information processing system 50.

[0055] Communication interface 75 is an interface required for communication with other devices. As communication interface 75, it can be a communication interface of various specifications, including wired or wireless. Communication interface 75 is used, for example, when sending inspection data from inspection device 90 to information processing system 50, and when receiving comparison information described later from information processing system 50.

[0056] The display unit 76 includes, for example, a liquid crystal display or an organic EL display. The display unit 76 displays various information. The display unit 76 may also be configured using viewer software or a printer.

[0057] The operation receiving unit 77 includes, for example, a touch sensor, a mouse or other pointing device, or a keyboard. The operation receiving unit 77 receives various operations from the user. In addition, the display unit 160 and the operation receiving unit 77 can also form a touch panel by overlapping the touch sensor, which is the operation receiving unit 77, on the display surface, which is the display unit 76.

[0058] Alternatively, the terminal device 70 can perform image analysis on the image data of the second layer 80B captured by the inspection device 90 to generate second feature point information. For example, the terminal device 70 sends the inspection data containing the second feature point information to the information processing system 50.

[0059] For example, the terminal device 70 also sends the inspection data of the first layer assembly 80A to the information processing system 50. The inspection data contains first feature point information about the feature points present in the first layer assembly 80A. The feature points present in the first layer assembly 80A are optically detected, for example, by using the same inspection device as the aforementioned inspection device 90.

[0060] Inspection data of the first layer 80A can also be sent to the information processing system 50 from other terminal devices. Other terminal devices are, for example, terminal devices of the factory that manufactures the first layer 80A.

[0061] For example, the information processing system 50 compares the first feature point information and the second feature point information received from the terminal device 70, and classifies each feature point into three types: the first type of feature point, the second type of feature point, and the third type of feature point.

[0062] Figure 5 is a table illustrating the first type of feature point, the second type of feature point, and the third type of feature point. The plurality of feature points present in the first layer 80A can be classified, for example, into the first type of feature point and the third type of feature point. The feature points present in the second layer 80B can be classified, for example, into the second type of feature point and the third type of feature point.

[0063] The first type of feature point is a feature point that exists only in the first laminate 80A and not in the second laminate 80B. That is, the first type of feature point is a feature point that disappears during the lamination process of the fourth roll 84. This first type of feature point is a feature point that, even if it exists in the first laminate 80A, has a relatively low probability of affecting subsequent processes in the lamination process of the fourth roll 84. Furthermore, in this specification, the term "feature point that does not exist in the roll or disappears" does not necessarily mean that it has completely disappeared; it also includes the concept of feature points that, although they exist as feature points, have a low probability of becoming defects and causing problems.

[0064] The second type of feature point is a feature point that does not exist in the first layer 80A but exists in the second layer 80B. That is, the second type of feature point is a newly generated feature point in the lamination process of the fourth roll 84. This second type of feature point is a feature point that originates from the lamination process of the fourth roll 84.

[0065] The third type of feature point is a feature point existing in both the first laminate 80A and the second laminate 80B. That is, the third type of feature point is a feature point generated in the process prior to the manufacturing process of the first laminate 80A and remaining in the second laminate 80B. This third type of feature point is a feature point that is more likely to affect the process after the lamination process of the fourth roll 84. In addition, the shape or size of the third type of feature point may sometimes change due to the lamination process of the fourth roll 84 compared to when it existed in the first laminate 80A. Other faults may also occur as a result of the lamination process.

[0066] The information processing system 50, for example, classifies the feature points existing in the first layer of the integrated matrix 80A and the feature points existing in the second layer of the integrated matrix 80B into three types of feature points and memorizes them. By memorizing them as the first type of feature points and the third type of feature points, it can be determined whether the feature points of the first layer of the integrated matrix 80A continue to remain or disappear in the second layer of the integrated matrix 80B.

[0067] [Structure of Information Processing System 50] Figure 6 is a block diagram showing the general structure of the information processing system 50. The information processing system 50 includes, for example, a control unit 51, a memory unit 52, and a communication unit 53.

[0068] The control unit 51 includes, for example, a CPU, RAM, and ROM. The CPU is a multi-core processor that executes the control or various calculations of the aforementioned units according to a program. The functions of the information processing system 50 are realized by the CPU executing the corresponding programs. The specific functions of the control unit 51 will be described later.

[0069] The memory unit 52 is a large-capacity auxiliary memory device for storing various programs and data of the operating system. The storage system may be, for example, a hard drive, a solid-state drive, flash memory, or ROM. The memory unit 52 stores, for example, user lists, batch lists, and inspection data databases. For example, the user lists and batch lists are managed by the manager of factory 100. The manager of factory 100 is, for example, an employee of the company operating factory 100.

[0070] Figure 7A shows an example of a user list. The user list contains information such as each user's user ID, username, and contact information. Access rights to the database can also be set for each user; for example, each user can access various information about a specified volume.

[0071] Figure 7B shows an example of a batch list. The batch list contains information such as the batch ID, product name, target user ID, manufacturing conditions, dimensions, and manufacturing date for each batch.

[0072] Figures 8A to 8C respectively show examples of inspection data DB. Inspection data DB includes, for example, the process list of each manufacturing process of the first layer assembly 80A and the second layer assembly 80B, and the inspection data of each inspection performed in each manufacturing process.

[0073] Figure 8A shows an example of a work list. The work list contains information such as: batch ID, width and length of the roll material in each work, work name, elongation of the roll material, number of layers in the roll material, width direction, and long side direction. The work list also contains, for example, information about the inspections performed in each manufacturing process. Information about each inspection includes, for example, the inspection ID of each inspection, the inspection device ID of the inspection device used in each inspection, inspection data, and inspection date and time. Information about the width direction and long side direction of the roll material is indicated by, for example, whether it is the same as or reversed from the width direction and long side direction of the roll material in the previous work.

[0074] Figures 8B and 8C respectively illustrate examples of inspection data for each inspection included in the bill of quantities. Figure 8B illustrates an example of inspection data for inspection ID i0101. This inspection data is, for example, the inspection data for the first layer of the integrated structure 80A. This inspection data contains, for example, information regarding the feature point ID, position, area, length, width, maximum brightness, minimum brightness, differentiation, and presence or absence of concentrated markings of feature points present in the first layer of the integrated structure 80A. That is, this inspection data contains information regarding the first feature point of the feature points present in the first layer of the integrated structure 80A.

[0075] Figure 8C shows an example of inspection data with inspection ID i0102. This inspection data is, for example, the inspection data of the second layer integral 80B. This inspection data contains, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, differentiation, and presence or absence of concentrated dots of the feature points present in the second layer integral 80B. That is, this inspection data contains second feature point information about the feature points present in the second layer integral 80B.

[0076] The position of the feature point is represented, for example, by the XY coordinates based on the predetermined position of each roll. The X coordinate is, for example, the coordinate of the width direction of each roll, and may be in the range of 0 to 3000 mm. The Y coordinate is, for example, the coordinate of the long side direction of each roll, and may be in the range of 0 to 10000 mm.

[0077] The distinction of feature points is represented, for example, by the shape and brightness distribution of each feature point. Each feature point is classified into approximately 5 to 20 distinctions based on its shape and brightness distribution. The presence or absence of clustered points is represented, for example, by whether there are multiple feature points around the feature point.

[0078] The inspection data may also include inspection data of Volume 4, Material 84. This inspection data contains, for example, information regarding the feature point ID, position, area, length, width, maximum brightness, minimum brightness, differentiation, and presence or absence of clustered dots of the feature points present in Volume 4, Material 84.

[0079] The communication unit 53 is an interface for network connection with external devices such as the terminal device 70.

[0080] [Functions of Information Processing System 50] As shown in FIG6, the information processing system 50 reads and executes the program stored in the memory unit 52 through the control unit 51, so as to function as the acquisition unit 511, the position matching unit 512, the comparison unit 513 and the output unit 514.

[0081] The acquisition unit 511 acquires first feature point information and second feature point information. The first feature point information is information about the feature points present in the first layer 80A. The first feature point information includes, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, differentiation, and presence or absence of clustered points for each of the plurality of feature points present in the first layer 80A.

[0082] The second feature point information is information about the feature points present in the second layer of the integral 80B. The second feature point information includes, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, differentiation, and presence or absence of clustered points for each of the plurality of feature points present in the second layer of the integral 80B.

[0083] The first feature point information and the second feature point information preferably contain at least information about the position of each feature point. The position of the feature point is represented, for example, by XY coordinates based on the predetermined position of each roll of material. The acquisition unit 511 acquires the first feature point information and the second feature point information, for example, from the terminal device 70. The acquisition unit 511 may also acquire the first feature point information and the second feature point information from the memory unit 52.

[0084] The acquisition unit 511 may also acquire the third feature point information. The third feature point information is information about the feature points present in the fourth roll 84. The third feature point information includes, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, differentiation, and presence or absence of clustered dots for each of the plurality of feature points present in the fourth roll 84.

[0085] The position alignment part 512 matches the XY coordinates of the first layer 80A with the XY coordinates of the second layer 80B. For example, the position alignment part 512 correlates predetermined feature points in the first layer 80A and predetermined feature points in the second layer 80B based on their respective positions. This correlation is based on the first feature point information and the second feature point information acquired by the acquisition part 511. Through this correlation of feature points, the XY coordinates are matched between the first layer 80A and the second layer 80B. The position alignment part 512 can also match the XY coordinates of the first layer 80A, the XY coordinates of the second layer 80B, and the XY coordinates of the fourth roll 84.

[0086] The comparison unit 513 compares the first feature point information and the second feature point information acquired by the acquisition unit 511. The comparison unit 513 compares the first feature point information and the second feature point information using the correspondence result caused by the position matching unit 512. Specifically, the comparison unit 513 classifies the feature points present in the first layer 80A and the feature points present in the second layer 80B into a first type of feature point, a second type of feature point, and a third type of feature point through this comparison. The comparison unit 513 classifies the feature points of the first layer 80A and the second layer 80B, which have been matched with XY coordinates by the position matching unit 512.

[0087] Figure 9 shows an example of the comparison result between the first feature point information and the second feature point information. The comparison unit 513, for example, integrates and compares the feature points present in the first layer 80A and the feature points present in the second layer 80B. The comparison unit 513, for example, assigns a new feature point ID to all the integrated feature points. The comparison unit 513, for example, classifies the feature points into a first type of feature point, a second type of feature point, or a third type of feature point according to each feature point ID. The comparison result may also include information regarding the accuracy of the classification of the first type of feature point, the second type of feature point, and the third type of feature point.

[0088] The comparison unit 513 can also compare the first feature point information and the third feature point information obtained by the acquisition unit 511 with the second feature point information.

[0089] The output unit 514 outputs comparison information regarding the comparison result of the first feature point information and the second feature point information obtained by the comparison unit 513. For example, the output unit 514 outputs the comparison information by displaying the comparison information on the display unit 76 of the terminal device 70.

[0090] The output unit 514, for example, displays on a screen of the display unit 76 the feature points present in the first layer 80A and the feature points present in the second layer 80B. The screen displays the first layer 80A and the second layer 80B, whose XY coordinates have been matched by the positioning alignment unit 512. The output unit 514, for example, displays a defined area of ​​the second layer 80B and the corresponding area of ​​the first layer 80A. The output unit 514, for example, displays the feature points present in the second layer 80B and the feature points present in the first layer 80A using different colors on the display unit 76. The output unit 514 can also display on the display unit 76 the feature points present in each roll of material contained in the first layer 80A.

[0091] For example, in one screen, the defined area of ​​the second layer 80B and the area of ​​the first layer 80A corresponding to the defined area will be displayed overlapping. In one screen, the defined area of ​​the second layer 80B and the area of ​​the first layer 80A corresponding to the defined area can also be displayed side by side.

[0092] The comparison information includes, for example, information about at least one of the first type of feature point, the second type of feature point, and the third type of feature point. The output unit 514 preferably outputs the comparison information in a manner that distinguishes between the first type of feature point, the second type of feature point, and the third type of feature point. For example, the output unit 514 may display the first type of feature point, the second type of feature point, and the third type of feature point on the display unit 76 using mutually different colors. Alternatively, the output unit 514 may display the first type of feature point, the second type of feature point, and the third type of feature point on the display unit 76 using mutually different colors.

[0093] The output unit 514 can also output comparison information regarding the comparison results of the first feature point information and the third feature point information with the second feature point information caused by the comparison unit 513.

[0094] Figure 10 is a flowchart of an example of the output processing procedure for comparison information executed in the information processing system 50. The processing of the information processing system 50 shown in the flowchart of Figure 10 is stored as a program in the memory unit 52 of the information processing system 50 and executed by the CPU controlling each part.

[0095] (Step S31) The information processing system 50, for example, in response to an instruction from the user via the terminal device 70, acquires inspection data of the first layer 80A and inspection data of the second layer 80B. Thereby, the information processing system 50 can acquire first feature point information regarding feature points present in the first layer 80A and second feature point information regarding feature points present in the second layer 80B. The information processing system 50 can also acquire the inspection data of the first layer 80A and the inspection data of the second layer 80B at predetermined time points.

[0096] (Step S32) The information processing system 50 performs preprocessing on each piece of inspection data in order to align the coordinate systems of the first-layer unit 80A and the second-layer unit 80B. For example, the information processing system 50 matches the XY coordinate system of the first-layer unit 80A with the XY coordinate system of the second-layer unit 80B.

[0097] For example, the information processing system 50 inverts the Y coordinate of the first-layer module 80A as a preprocessing step for each inspection data. The information processing system 50 can also invert the X coordinate of the first-layer module 80A. The information processing system 50 can also transform the XY coordinates of the first-layer module 80A according to the elongation of the first-layer module 80A and the second-layer module 80B, etc.

[0098] The information processing system 50 further performs noise removal processing as preprocessing for each piece of inspection data. The noise removal processing includes, for example, at least one of the following: removal of low-intensity feature points, removal of extremely small feature points, and removal of continuous dots. The noise removal processing may also include the removal of concentrated dots in the width direction. Concentrated dots in the width direction may, for example, occur at the beginning or end of the first layer integral 80A and the second layer integral 80B.

[0099] (Step S33) The information processing system 50 performs position alignment processing of the coordinate system of the first layer 80A and the coordinate system of the second layer 80B after preprocessing the inspection data.

[0100] Figure 11 is a routine flowchart of the position matching process in step S33.

[0101] (Steps S401-S403) The information processing system 50 first performs a coarse adjustment on the XY coordinates of the feature points of the first layer integral 80A and the second layer integral 80B as follows. For example, the information processing system 50 first shifts the coordinate position of a defined feature point of the first layer integral 80A by a certain amount. Next, the information processing system 50 calculates the distances L1 to Lm between the defined feature point of the first layer integral 80A and the feature point of the corresponding feature point of the second layer integral 80B, and selects the minimum shift amount (x1, y1) by summing them. Alternatively, the information processing system 50 may use an average value instead of a sum. For example, the information processing system 50 determines the feature point of the second layer 80B that has the closest coordinate position to the defined feature point of the first layer 80A as the feature point of the second layer 80B corresponding to the defined feature point of the first layer 80A. Alternatively, the information processing system 50 may exclude a feature point if it is impossible to determine the feature point of the second layer 80B corresponding to the defined feature point of the first layer 80A, i.e., if the defined feature point is a type 1 feature point, and then calculate the sum of distances L1 to Lm.

[0102] For example, the information processing system 50 uses a fixed coarse adjustment scale width of translation amount a, and with the center translation amount (0,0) as the center, it sequentially translates the coordinate positions of the defined feature points of the first layer integral 80A to (-shift_x, -shift_y) to (+shift_x, +shift_y). The distances L1 to Lm from the coordinate positions of the defined feature points of the first layer integral 80A to the feature points 1 to m of the second layer integral 80B are calculated. Then, the translation amount (x1, y1) with the minimum sum of distances L1 to Lm is selected from (-shift_x, -shift_y) to (+shift_x, +shift_y).

[0103] For example, if the coarse adjustment translation amount a = 1.0 mm, then (-shift_x, -shift_y) = (-10 mm, -10 mm) and (-shift_x, +shift_y) = (+10 mm, +10 mm). The information processing system 50 can also make the units in the X and Y directions different for the coarse adjustment translation amount a. For example, assuming the X direction is in millimeters and the Y direction is in meters, then (-shift_x, -shift_y) = (-10 mm, -10 m) and (-shift_x, +shift_y) = (+10 mm, +10 m).

[0104] (Steps S404-S406) Next, the information processing system 50 performs fine adjustments to the XY coordinates of the feature points of each of the first layer integral 80A and the second layer integral 80B, and selects a translation amount (x2, y2). The information processing system 50 selects the translation amount (x2, y2) in almost the same way as steps S401-S403 above. Steps S404-S406 differ from steps S401-S403, for example, in the following aspects: The fine adjustment translation amount b in step S404 is smaller than the coarse adjustment translation amount a. Also, the center translation amount in step S405 uses the translation amount (x1, y1) selected in step S403. For example, the fine adjustment translation amount b is much smaller than the coarse adjustment translation amount a, and is, for example, 0.1 mm with one less digit.

[0105] (Step S407) The information processing system 50 uses the translation amount (x2, y2) selected in step S406 to perform coordinate transformation processing on all feature points of the first layer solid 80A.

[0106] (Step S408) The information processing system 50 calculates the distances L1 to Lm after coordinate transformation in step S407 and confirms whether the sum of distances L1 to Lm is less than the predetermined threshold. If it is above the predetermined threshold, the information processing system 50 can also determine that the coordinate transformation process in step S407 is inappropriate.

[0107] (Step S409) If the position matching is inappropriate, i.e., YES, the information processing system 50 terminates the processing. If inappropriate, the information processing system 50 may also display an error message on the display unit 76 or record the inability to calculate in the check data DB. On the other hand, if the position matching is appropriate, i.e., NO, the information processing system 50 terminates the processing in Figure 11, returns to the processing in Figure 10, and executes the processing from step S34 onwards.

[0108] (Step S34) The information processing system 50 compares the first feature point information with the second feature point information. Specifically, the information processing system 50 compares the feature points present in the first layer 80A and the feature points present in the second layer 80B. For example, the coordinates of the feature points present in the first layer 80A have been transformed by the processing in step S33. The information processing system 50, for example, classifies the feature points present in the first layer 80A and the feature points present in the second layer 80B into any one of the first type of feature point, the second type of feature point, and the third type of feature point through this comparison.

[0109] (Step S35) The information processing system 50 ends the processing by outputting the comparison result of step S34.

[0110] [Effect of action of information processing system 50] In the information processing system 50 involved in the present invention, the first feature point information and the second feature point information are aligned and the alignment information about the result of the comparison is output. Thereby, for example, the manufacturing manager and the like are able to easily grasp the feature points that remain from the inspection of the first layer 80A among the feature points present in the second layer of the volume 80B containing the opaque fourth volume of material 84 . Therefore, the defects present in the second layer volume 80B containing the opaque volume 4 material 84 can be analyzed more simply. Below, the effect of the action is explained.

[0111] In roll materials such as optical films, strict quality management is required. For example, the occurrence of defects in the roll material is strictly managed. Defects, are for, for example, foreign bodies, scratches and dents. Such rolls are manufactured through multiple projects, in which quality checks are carried out.

[0112] In laminates containing coils of opaque coils, the detection of defects is often more difficult compared to laminates made of only transparent coils. Opaque coils are, for example, have tiny bumps on their surface or contain light-scattering substances. Therefore, irregular scattering and reflection of light occur in opaque coils. Therefore, if an optical method is used to examine the laminates containing opaque coils, noise is prone to occur, which may lead to reduced sensitivity and precision of the inspection.

[0113] To this end, in the information processing system 50 , the feature points present in the second-layer product 80B will be aligned with those present in the first-layer product 80A . Thus, even if the inspection data of layer 2 product 80B contains noise, for example, it is still easy to grasp the feature points present in both parties of layer 1 product 80A and layer 2 product 80B , i.e., the third type of feature points that remain from layer 1 product 80A to layer 2 product 80B . Therefore, even if the inspection data of the second layer product 80B is containing noise, the defects present in the second layer product 80B can be analyzed more simply.

[0114] In particular, the information processing system 50, after matching the coordinate system of the first layer 80A with the coordinate system of the second layer 80B, compares the feature points existing in the first layer 80A with the feature points existing in the second layer 80B. Therefore, the feature points existing in the first layer 80A and the feature points existing in the second layer 80B can be classified into type 1 feature points, type 2 feature points, and type 3 feature points with high precision.

[0115] Furthermore, even if both the first layer 80A and the second layer 80B are opaque, the probability of noise overlap between the inspection data of the first layer 80A and the second layer 80B is still low. In other words, the probability that the feature points with overlapping coordinates between the inspection data of the first layer 80A and the second layer 80B are third-type feature points is very high.

[0116] Furthermore, even if the optical film containing the polarizing element or the like in the first layer 80A is opaque, regular light transmission, reflection, and scattering will still occur. Therefore, the first layer 80A is different from the protective film or separation film constituting the fourth roll 84, and can be inspected with high sensitivity and accuracy using optical methods.

[0117] Furthermore, the information processing system 50 preferably uses third feature point information about the feature points present in the fourth roll 84. In this way, the feature points present in the first layer 80A and the feature points present in the second layer 80B can be classified into first type feature points, second type feature points and third type feature points with higher precision.

[0118] The following describes other embodiments of the information processing system 50 described in the first embodiment above. In addition, to avoid repetition, detailed descriptions of components that are identical to those of the information processing system 50 described in the first embodiment above are omitted below.

[0119] <Second Embodiment> Figure 12 is a sub-normal flowchart of the position alignment process of the information processing system 50 described in the second embodiment. Figure 12 corresponds to Figure 11 described in the first embodiment above. This information processing system 50 uses kernel density estimation when the XY coordinates of the first layer 80A and the XY coordinates of the second layer 80B are aligned. In this respect, the information processing system 50 described in the second embodiment differs from the information processing system 50 described in the first embodiment above. Except for this point, the information processing system 50 described in the second embodiment has the same structure as the information processing system 50 described in the first embodiment above, achieving the same functional effect.

[0120] (Step S451) The information processing system 50 obtains a probability density function for the feature points of the first layer integral 80A by performing kernel density estimation. The kernel density estimation is performed in two dimensions, and a Gaussian kernel is used as the kernel function. The bandwidth is, for example, a predetermined value. For example, a table that establishes a correspondence between the product name of the roll and the bandwidth is stored in the memory unit 52. The information processing system 50 may also use the bandwidth value corresponding to the product name of the roll, or it may use a bandwidth value that varies depending on the number of feature points present in the first layer integral 80A. When estimating the kernel density of the predetermined feature point, the information processing system 50 also considers the surrounding data of the feature point. Then, the information processing system 50 calculates the density of each feature point to obtain the probability density function.

[0121] Figure 13 shows an example of a probability density function calculated by estimating the kernel density. The horizontal and vertical axes of Figure 13 represent the XY coordinates, and the shades of color represent the density levels.

[0122] (Step S452) The information processing system 50, in the same manner as in step S451, obtains the probability density function of each feature point of the second layer integral 80B.

[0123] (Steps S453-S455) The information processing system 50 compares the two obtained probability density functions and establishes corresponding relationships based on the density distribution. Then, the information processing system 50 calculates a transformation matrix based on the corresponding relationship results and performs XY coordinate transformation on the feature points of the first layer integral 80A.

[0124] (Steps S456 to S457) The information processing system 50 performs the processing of S456 to S457 in the same way as steps S406 to S407 in Figure 11.

[0125] The information processing system 50 can also use kernel density estimation in all positions of the XY coordinates of the first layer 80A and the XY coordinates of the second layer 80B, or it can use kernel density estimation in a part of them.

[0126] The information processing system 50 described in this second embodiment is similar to that described in the first embodiment above. The first feature point information and the second feature point information are compared, and comparison information about the comparison result is output. Therefore, it is easier to analyze the defects existing in the second layer 80B.

[0127] Furthermore, in kernel density estimation, the feature points of the first layer 80A and the feature points of the second layer 80B are not determined in a one-to-one manner, but rather the existence probability of the feature points using a probability density function is adopted. Therefore, even if the fourth volume 84 is opaque and the second feature point information contains a large amount of noise, the accuracy of feature point extraction and classification can still be guaranteed. Therefore, kernel density estimation can be appropriately used in the information processing system 50.

[0128] The information processing system 50 may also use other methods to align the XY coordinates of the first layer 80A and the second layer 80B before layering. For example, the information processing system 50 may perform kernel density estimation of the feature points of one of the first layer 80A and the second layer 80B. At this time, the information processing system 50 compares the obtained probability density function with the feature points of the other layer. In this way, the information processing system 50 can align the XY coordinates of the first layer 80A and the second layer 80B.

[0129] <Third Embodiment> FIG14 shows an example of the cross-sectional configuration of the laminate 80C to which the information processing system 50 described in the third embodiment is applied. FIG14 corresponds to FIG2 described in the first embodiment. The laminate 80C includes: a fifth roll 85 and a sixth roll 86 on the fifth roll 85. The sixth roll 86 is formed by coating the fifth roll 85. In this respect, the information processing system 50 described in the third embodiment differs from the information processing system 50 described in the first embodiment. Except for this point, the information processing system 50 described in the third embodiment has the same configuration as the information processing system 50 described in the first embodiment, and achieves the same functional effect. Here, the fifth roll 85 corresponds to a specific example of the first roll of the present invention, and the sixth roll 86 corresponds to a specific example of the second roll of the present invention.

[0130] Roll 5, material 85, is, for example, a substrate film. Roll 5, material 85, is, for example, transparent and has a haze of 2% or less. Roll 6, material 86, is opaque and has a haze of 5% or more. Roll 6, material 86, is, for example, an anti-glare layer.

[0131] Figure 15 illustrates an example of the manufacturing process of the laminate 80C. For example, a fifth roll of material 85 is manufactured in factory 100A. In factory 100A, the feature points present in the fifth roll of material 85 are inspected by inspection device 90A. The fifth roll of material 85 is then transported to factory 100B. The fifth roll of material 85 may also be transported to other factories. In factory 100B, a sixth roll of material 86 is coated on the fifth roll of material 85 to manufacture the laminate 80C. In factory 100B, the feature points present in the laminate 80C are inspected by inspection device 90B. For example, a manufacturing apparatus 2000A is provided in factory 100A, and for example, a manufacturing apparatus 2000B is provided in factory 100B.

[0132] The information processing system 50 compares the first feature point information of the feature points existing in the fifth roll 85 with the second feature point information of the feature points existing in the laminate 80C, and outputs the comparison information.

[0133] The information processing system 50 described in this third embodiment is similar to that described in the first embodiment above, in that the first feature point information and the second feature point information are compared, and comparison information regarding the comparison result is output. Therefore, it is easier to analyze the defects existing in the laminate 80C.

[0134] The above description of the configuration of the information processing system 50 is intended to illustrate the features of the aforementioned embodiment, but it is not limited to the configuration described above. Various modifications can be made within the scope of the patent application. Furthermore, the configuration found in general information processing devices or information processing systems is not excluded. For example, the information processing system 50 may also include an inspection device 90. Additionally, the feature point generation function of the analysis unit 93 of the inspection device 90 may be handled by the control unit 51 of the information processing system 50.

[0135] For example, in the above embodiment, although the example of the first roll of material of this invention being an opaque optical film having a polarizing element was described, the first roll of material may also contain other opaque rolls. The first roll of material may also contain, for example, steel plates or anti-glare films. The first roll of material may also be transparent. A transparent first roll of material has, for example, a haze of 2% or less. A transparent first roll of material may be, for example, a transparent optical film, a hard coating, an anti-reflective layer, or a liquid crystal layer. The second roll of material of this invention may also contain opaque optical films such as polarizing elements, plastic films, steel plates, and paper.

[0136] Furthermore, the means and methods for performing various processes in the information processing system 50 described in the above embodiment can be implemented using either dedicated hardware circuitry or a pre-programmed computer. The aforementioned program can be provided, for example, via a computer-readable recording medium such as a USB memory or DVD-ROM, or online via a network such as the Internet. In this case, the program recorded on the computer-readable recording medium is usually transferred to a memory unit such as a hard drive and stored thereon. Furthermore, the aforementioned program can also be provided as a standalone application software, or it can be embedded as a function of the device into the device's software. DVD is an abbreviation for Digital Versatile Disc.

[0137] Although embodiments of the present invention have been described and illustrated in detail, the disclosed embodiments are made for illustrative and exemplary purposes only and are not intended to be limiting. The scope of the present invention must be interpreted in accordance with the wording of the appended claims.

[0138] This application is based on Japanese Patent Application No. 2024-59896 filed on April 3, 2024, the disclosure of which is referenced and incorporated in its entirety. [Simplified Explanation of the Diagram]

[0018] The advantages and features provided by one or more embodiments of the present invention can be fully understood from the following detailed description and the accompanying drawings, but these are for illustrative purposes only and are not intended to define the limitations of the present invention. [Fig. 1] A schematic diagram of an applicable example of the information processing system described in the first embodiment. [Fig. 2] A cross-sectional view of an example of the configuration of the first and second layers shown in Fig. 1. [Fig. 3A] A schematic diagram of an example of the configuration of the inspection device shown in Fig. 1. [Fig. 3B] Another schematic diagram of the configuration of the inspection device shown in Fig. 3A. [Fig. 3C] A schematic diagram of another configuration of the inspection device shown in Fig. 3A. [Fig. 4] A block diagram of the schematic configuration of the terminal device shown in Fig. 1. [Fig. 5] A table explaining the classification of feature points present in each of the first and second layers shown in Fig. 2. [Fig. 6] A block diagram of the schematic configuration of the information processing system shown in Fig. 1. [Fig. 7A] An example of a user list stored in the memory unit shown in Fig. 6. [Fig. 7B] An example of the batch list stored in the memory unit shown in Fig. 6. [Fig. 8A] An example of the check data DB stored in the memory unit shown in Fig. 6. [Fig. 8B] Other examples of the check data DB stored in the memory unit shown in Fig. 6. [Fig. 8C] Other examples of the check data DB stored in the memory unit shown in Fig. 6. [Fig. 9] An explanatory diagram of the comparison results of the first feature point information and the second feature point information caused by the control unit shown in Fig. 6. [Fig. 10] A flowchart of an example of the processing performed by the information processing system shown in Fig. 1. [Fig. 11] A sub-normal flowchart of the processing of step S33 shown in Fig. 10. [Fig. 12] A sub-normal flowchart of the information processing system described in the second embodiment. [Fig. 13] A representation of an example of the probability density function calculated by kernel density estimation shown in Fig. 12. [Fig. 14] A cross-sectional view of an example of the structure of the laminate to which the information processing system described in the third embodiment is applied. [Figure 15] A schematic diagram of one example of the manufacturing process of the laminate shown in Figure 14.

Claims

1. An information processing system comprising: an acquisition unit for acquiring first feature point information about feature points present in a first roll of material, and second feature point information about feature points present in a laminate formed by laminating an opaque second roll of material onto the first roll of material; a comparison unit for comparing the acquired first feature point information with the acquired second feature point information; and an output unit for outputting comparison information about the comparison result of the first feature point information and the second feature point information. The prior comparison unit classifies feature points present in the first volume of the prior record and feature points present in the prior laminate into three categories: a first type of feature point that exists in the first volume of the prior record but disappears in the prior laminate; a second type of feature point that does not exist in the first volume of the prior record but appears in the prior laminate; and a third type of feature point that exists in the first volume of the prior record and remains in the prior laminate. The prior comparison information contains at least information about the first and third type of feature points. The prior output unit outputs the prior comparison information in a manner that allows the first and third type of feature points to be distinguished.

2. The information processing system as described in claim 1, wherein, The comparison information mentioned above contains information about at least one of the first type of feature point, the second type of feature point, and the third type of feature point mentioned above.

3. The information processing system as described in claim 1, wherein, The Foreword Acquisition Unit also acquires information about the third feature point present in Volume 2 of the Foreword; The Foreword Comparison Unit compares the acquired Foreword First Feature Point Information and Foreword Third Feature Point Information with the Foreword Second Feature Point Information.

4. The information processing system as described in Request 1, wherein, It also has: a position matching section, which correlates the feature points present in the first volume of the preceding material with the feature points present in the preceding laminate based on their respective positions; and a preceding comparison section, which compares the information of the first feature point of the preceding material with the information of the second feature point of the preceding material using the result of the preceding correlation.

5. The information processing system as described in claim 1, wherein, The pre-record output unit outputs the pre-record comparison information by displaying the pre-record comparison information on the display unit.

6. The information processing system as described in claim 1, wherein, The first volume of the preface has a multi-volume laminated structure.

7. The information processing system as described in claim 1, wherein, The material in Volume 2 of the Foreword contains at least one of a protective film, a separation film, or an anti-glare film.

8. The information processing system as described in claim 1, wherein, The material in Volume 2 of the foreword has a haze of over 5%.

9. An information processing method comprising: a step of acquiring first feature point information about feature points present in a first roll of material and second feature point information about feature points present in a laminate formed by depositing an opaque second roll of material on the first roll of material; a step of comparing the acquired first feature point information with the acquired second feature point information; a step of outputting comparison information about the comparison result of the first feature point information and the second feature point information; and a step of classifying, by means of the preceding comparison, the feature points present in the first roll of material and the feature points present in the preceding laminate into: a first type of feature point that exists in the first roll of material but disappears in the preceding laminate, a second type of feature point that does not exist in the first roll of material but appears in the preceding laminate, and a third type of feature point that exists in the first roll of material and remains in the preceding laminate; The prior comparison information includes: information about at least the first and third feature points of the prior; and also includes: a step of outputting the prior comparison information in a manner that makes the first and third feature points of the prior distinguishable.

10. An information processing program that causes a computer to execute the information processing method as described in claim 9.

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