Detection circuit and detection method
Patent Information
- Authority / Receiving Office
- TW · TW
- Patent Type
- Patents
- Current Assignee / Owner
- NOVATEK MICROELECTRONICS CORP
- Filing Date
- 2025-03-18
- Publication Date
- 2026-08-01
Smart Images

Figure TWG2TB001903862_001 
Figure TWG2TB001903862_002 
Figure TWG2TB001903862_003
Abstract
Claims
1. A detection circuit, comprising: An input circuit includes a first input node and a second input node, wherein the first input node is coupled to a first detection node and the second input node is coupled to a second detection node; and a sensing circuit includes a current source providing a predetermined current, wherein the current source is coupled to the first input node, the sensing circuit generates an induced voltage at an output node in response to the predetermined current, wherein the first detection node is directly in contact with or electrically connected to the second detection node through a trace, and an impedance value between the first detection node and the second detection node is related to the induced voltage; wherein the input circuit further includes: a first transistor, wherein a source of the first transistor is coupled to the first input node; and a second transistor, wherein a source of the second transistor is coupled to the second input node.
2. The detection circuit as described in claim 1 further includes: A processing circuit is coupled to the sensing circuit and detects the impedance value based on the induced voltage. The processing circuit controls a current quantity of the predetermined current to switch from a first current quantity to a second current quantity. In response to the first current quantity, the processing circuit receives a first induced voltage from the output node. In response to the second current quantity, the processing circuit receives a second induced voltage from the output node. The processing circuit further determines the impedance value based on a difference between the second induced voltage and the first induced voltage.
3. The detection circuit as described in claim 1, wherein the first detection node and the second detection node are each coupled to a system voltage of a display system.
4. The detection circuit as described in claim 3, wherein the system voltage is a power supply voltage or a ground voltage.
5. The detection circuit as claimed in claim 1, wherein the first detection node is contained in a first device, the second detection node is contained in a second device, and the first detection node and the second detection node are electrically connected via a bonding wire.
6. The detection circuit as claimed in claim 1, wherein the first detection node is contained on a first metal surface of a first device, the second detection node is contained on a second metal surface of a second device, and the first metal surface is in direct contact with the second metal surface.
7. The detection circuit as described in claim 2, wherein the processing circuit further determines whether the impedance value is abnormal based on a threshold value, and in response to a determination that the impedance value is abnormal, the processing circuit generates an error code or a warning message.
8. A detection method, comprising detecting an impedance value between two nodes using a detection circuit, comprising: A first detection node is coupled to a first input node of the detection circuit, and a second detection node is coupled to a second input node of the detection circuit, wherein the first detection node is directly in contact with or electrically connected to the second detection node through a trace; a current source of the detection circuit is controlled to provide a first current; a first induced voltage is received from an output node of the detection circuit in response to the first current; a second current is controlled to provide a second current; a second induced voltage is received from the output node in response to the second current; and the impedance value between the first detection node and the second detection node is determined based on a difference between the second induced voltage and the first induced voltage; wherein the first detection node is coupled to a source of a first transistor of the detection circuit through the first input node, and the second detection node is coupled to a source of a second transistor of the detection circuit through the second input node.
9. The detection method as described in claim 8, wherein the first detection node and the second detection node are each coupled to a system voltage of a display system.
10. The detection method as described in claim 9, wherein the system voltage is a power supply voltage or a ground voltage.
11. The detection method as claimed in claim 8, wherein the first detection node is contained in a first device, the second detection node is contained in a second device, and the first detection node and the second detection node are electrically connected via a bonding wire.
12. The detection method as claimed in claim 8, wherein the first detection node is contained on a first metal surface of a first device, the second detection node is contained on a second metal surface of a second device, and the first metal surface is in direct contact with the second metal surface.
13. The detection method as described in claim 8 further includes: Determine whether the impedance value is abnormal based on a critical value; In response to a judgment result indicating an abnormal impedance value, an error code or a warning message is generated and displayed on a display panel.