Substrate

The use of glass or ceramic substrates with insulating elements in through-holes addresses leakage risks in TSVs, improving reliability and reducing costs by enabling independent traces and reducing via manufacturing risks.

TWI934521BActive Publication Date: 2026-08-01VESTA MICROSYSTEM CO LTD
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Patent Information

Application Number
TW114110895
Authority / Receiving Office
TW · TW
Patent Type
Patents
Current Assignee / Owner
Filing Date
2025-03-24
Publication Date
2026-08-01
Estimated Expiration
2045-03-23

AI Technical Summary

Technical Problem

Current through-silicon vias (TSVs) in silicon substrates pose leakage risks, reducing product reliability and increasing manufacturing costs due to the need for insulation treatments.

Method used

A substrate using glass or ceramic materials with insulating elements to separate conductive elements within through-holes, allowing for independent traces and reducing the number of vias, thereby improving reliability and reducing costs.

Benefits of technology

The substrate achieves improved product reliability and reduced manufacturing costs by using insulating materials and designing independent traces within vias, enhancing wiring density and structural strength.

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Abstract

A substrate includes a base layer and through-holes. The base layer is made of glass or ceramic. Each through-hole includes a first conductive element, a second conductive element, and an insulating element. The insulating element spaces the first conductive element and the second conductive element apart, such that the first conductive element and the second conductive element are electrically independent of each other within the through-hole.
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