Lens testing device
Patent Information
- Authority / Receiving Office
- TW · TW
- Patent Type
- Patents
- Current Assignee / Owner
- ALPHA NETWORKS INC
- Filing Date
- 2025-06-18
- Publication Date
- 2026-08-01
Smart Images

Figure TWG2TB001904010_001 
Figure TWG2TB001904010_002 
Figure TWG2TB001904010_003
Abstract
Claims
1. A lens testing apparatus for capturing an image of a lens under test and comprising: a beam-splitting unit; a plurality of first light-emitting units, the beam-splitting unit being disposed between one of the first light-emitting units and the lens under test, wherein each first light-emitting unit incident a first light beam toward the beam-splitting unit to correspondingly form a first split beam, the first split beam being incident perpendicularly toward the lens under test, the first light-emitting unit being located at a position of 0x image height of the lens under test, and the remaining first light-emitting units emitting the first light beam toward the lens under test, wherein every two of the remaining first light-emitting units are symmetrically arranged relative to the lens under test; a plurality of second light-emitting units, wherein one of the second light-emitting units incident a second light beam toward the beam-splitting unit to correspondingly form a second split beam, the second split beam being incident perpendicularly toward the lens under test, the second light-emitting unit being located at a position of 0x image height of the lens under test, the remaining second light-emitting units emitting the second beam toward the lens under test, and every two of the remaining second light-emitting units are symmetrically arranged relative to the lens under test, wherein... The angle between each pair of symmetrically arranged first light-emitting units and the lens under test is greater than the angle between each pair of symmetrically arranged second light-emitting units and the lens under test. The optical path length of each second light-emitting unit is greater than the optical path length of each first light-emitting unit, so as to perform wide-angle end testing and telephoto end testing simultaneously. An image sensing unit is disposed on one side of the lens under test. The image sensing unit is used to sense the first beam, the first beams, the second beams, and the second beams that penetrate the lens under test and generate a sensing image accordingly.
2. The lens testing apparatus as claimed in claim 1, wherein the beam splitting unit has a first surface and a second surface opposite to each other, wherein a first light-emitting unit irradiates the first light beam toward the first surface, and the first light beam penetrates the first surface and the second surface to form the first beam splitting; wherein a second light-emitting unit irradiates the second light beam toward the second surface, and the second light beam is reflected from the second surface to form the second beam splitting.
3. The lens testing apparatus as described in claim 2, wherein the beam splitting unit is a planar beam splitter, the first beam incident toward the beam splitting unit is positioned at a first angle relative to the first surface, the first angle being 45 degrees, and the second beam incident toward the beam splitting unit is positioned at a second angle relative to the second surface, the second angle being 45 degrees.
4. The lens testing apparatus as described in any one of claims 1 to 3, wherein each of the first light-emitting units includes a first light source, a first collimator and a first test pattern, the first test pattern being located between the first light source and the first collimator, the first light source emitting light toward the first test pattern and forming the first beam through the first collimator, such that a plurality of first test patterns corresponding to the first test patterns are formed in the sensed image.
5. The lens testing apparatus as described in claim 4, wherein each of the second light-emitting units includes a second light source, a second collimator and a second test pattern, the second test pattern being located between the second light source and the second collimator, the second light source emitting light toward the second test pattern and forming the second beam through the second collimator, such that a plurality of second test patterns corresponding to the second test patterns are formed in the sensed image.
6. The lens testing apparatus as described in any one of claims 1 to 3, wherein each of the first light-emitting units includes a first light source and a first test pattern, the first test pattern being disposed opposite to the first light source, the first light source emitting light toward the first test pattern and forming the first beam, such that a plurality of first test patterns corresponding to the first test patterns are formed in the sensed image, and the first beam is a collimated beam.
7. The lens testing apparatus as claimed in claim 6, wherein each of the second light-emitting units includes a second light source and a second test pattern, the second test pattern being disposed opposite to the second light source, the second light source emitting light toward the second test pattern and forming the second beam, such that a plurality of second test patterns corresponding to the second test patterns are formed in the sensed image, and the second beam is a collimated beam.
8. The lens testing apparatus as claimed in claim 1, wherein the number of the first light-emitting units is five, the number of the second light-emitting units is five, wherein two of the first light-emitting units and two of the second light-emitting units are arranged along a first reference surface, and two more of the first light-emitting units and two more of the second light-emitting units are arranged along a second reference surface, and another first light-emitting unit and another second light-emitting unit are located at the junction of the first reference surface and the second reference surface.
9. The lens testing apparatus as described in claim 1, wherein the beam splitting unit is a planar beam splitter.