Microresistive element with heterogeneous conductive structure and measurement notch

TWI934736BActive Publication Date: 2026-08-01陳富強 余清益 張乃文
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Patent Information

Authority / Receiving Office
TW · TW
Patent Type
Patents
Current Assignee / Owner
陳富強 余清益 張乃文
Filing Date
2025-08-04
Publication Date
2026-08-01

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    Figure TWG2TB001904081_001
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  • Figure TWG2TB001904081_003
    Figure TWG2TB001904081_003
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Abstract

A microresistive element with a heterogeneous conductive structure and a measurement notch includes an alloy body made of a precision resistance alloy. Two pairs of conductive terminals, specifically first to fourth conductive terminals, are disposed at opposite ends of the body. These terminals are made of a conductive metal and are bonded to the alloy body by electroplating, sintering, or pressing. Each of the conductive terminals on both sides has a transverse notch that cuts in from the inner side between the two conductive terminals on the same side and extends to the middle section of the body, forming a measurement section corresponding to the width of the conductive terminals, thereby improving the accuracy of resistance measurement. In one embodiment, a longitudinal groove is further provided to enhance the stability and accuracy of voltage detection. This invention, through the heterogeneous material separation and notch design, effectively reduces errors caused by contact interference and current diffusion, making it suitable for high-precision current detection devices.
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Claims

1. A microresistive element with a conductive structure of dissimilar materials and a measurement notch, comprising: an alloy body having a first end and a second end disposed opposite to each other; a first conductive terminal and a third conductive terminal disposed at the first end of the alloy body, and both being made of copper; a second conductive terminal and a fourth conductive terminal disposed at the second end of the alloy body, and both being made of copper; wherein, The first conductive terminal, the third conductive terminal, the second conductive terminal, and the fourth conductive terminal are respectively bonded to the alloy body to form a conductive structure of different materials; and a transverse cut is cut in the middle of the first conductive terminal and the third conductive terminal, and a transverse cut is cut in the middle of the second conductive terminal and the fourth conductive terminal. The transverse cuts extend to the middle section of the alloy body to form a separation section for current input and voltage measurement, thereby improving the accuracy of resistance measurement.

2. The microresistive element with a conductive structure of dissimilar materials and a measurement notch as described in claim 1, wherein, The first to fourth conductive terminals extend from both ends of the alloy body and are embedded in its internal sections to increase the electrical contact stability between the terminals and the alloy body.

3. The microresistive element with a conductive structure of dissimilar materials and a measurement notch as described in claim 1, wherein, The alloy body has a longitudinal groove on both sides near the first and second conductive terminals. The longitudinal groove is perpendicular to the transverse cut direction and extends through a portion of the thickness of the alloy body, thereby further defining the measurement section and improving the accuracy of resistance measurement.