Method for forming carbon film on substrate

TWI935636BActive Publication Date: 2026-08-11SKYTECH
View PDF 2 Cites 0 Cited by

Patent Information

Application Number
TW114101665
Authority / Receiving Office
TW · TW
Patent Type
Patents
Current Assignee / Owner
Filing Date
2025-01-15
Publication Date
2026-08-11
Estimated Expiration
2045-01-14

Smart Images

  • Figure TWG2TB001905575_001
    Figure TWG2TB001905575_001
  • Figure TWG2TB001905575_002
    Figure TWG2TB001905575_002
  • Figure TWG2TB001905575_003
    Figure TWG2TB001905575_003
Patent Text Reader

Abstract

This invention discloses a method for forming a carbon film on a substrate surface, comprising performing an ion implantation process on the substrate to form an ion implantation region on the substrate; heating the substrate and performing a plasma pre-cleaning process on the substrate; forming a carbon film on at least one surface of the substrate; and then subjecting the substrate to high-temperature tempering. After heating and plasma pretreatment, moisture and dangling bonds on the substrate can be removed, and it is beneficial to form a dense and flat carbon film on the substrate, thereby improving the protective effect of the carbon film on the substrate.
Need to check novelty before this filing date? Find Prior Art

Claims

1. A method for forming a carbon film on a substrate surface, comprising: An epitaxial layer is formed on a silicon carbide substrate to form a substrate; An ion implantation process is performed on the substrate to form at least one ion implantation region on the epitaxial layer of the substrate, and n-type or p-type doping is formed; the substrate, the epitaxial layer and the ion implantation region are heated to remove moisture from the substrate, the epitaxial layer and the ion implantation region; a plasma pre-cleaning process is performed on the substrate, the epitaxial layer and the ion implantation region; a carbon film is formed on at least one surface of the substrate, wherein the carbon film covers the ion implantation region on the substrate; and the substrate is subjected to a high-temperature tempering process.

2. The method for forming a carbon film on the surface of a substrate as described in claim 1, wherein the heating temperature of the substrate is between 100°C and 300°C.

3. The method for forming a carbon film on the surface of a substrate as described in claim 2, wherein the heating time of the substrate is between 60 seconds and 300 seconds.

4. The method for forming a carbon film on the surface of a substrate as described in claim 1, wherein the high-temperature tempering temperature of the substrate is greater than 1900°C.

5. The method for forming a carbon film on a substrate surface as claimed in claim 1, comprising the following steps: conveying the substrate to a chemical vapor deposition chamber; heating the substrate and performing a plasma pre-cleaning process in the chemical vapor deposition chamber; and forming the carbon film on at least one surface of the substrate in the chemical vapor deposition chamber through a chemical vapor deposition process.

6. The method for forming a carbon film on a substrate surface as claimed in claim 1, comprising the following steps: after completing the heating of the substrate and the plasma pre-cleaning process, transporting the substrate to a chemical vapor deposition chamber, and forming the carbon film on the substrate on at least one surface of the substrate through a chemical vapor deposition process.

Citation Information

Patent Citations

  • Method and apparatus for precleaning a substrate surface prior to epitaxial growth

    CN107574476A

  • Semiconductor substrate, method for manufacturing semiconductor

    CN118727141A