Time-of-flight mass spectrometer assembly with a secondary flange

Abstract

This invention discloses a time-of-flight mass spectrometer assembly including a flange having a surface facing a vacuum chamber and a surface facing the environment. The flange defines an opening extending between the surface facing the vacuum chamber and the surface facing the environment. A plurality of stacked components are supported by the surface of the flange facing the vacuum chamber. An auxiliary flange is removably secured within the opening of the flange. The auxiliary flange includes a surface facing the vacuum chamber and a surface facing the environment. Supported spectrometer components are supported by the surface of the auxiliary flange facing the vacuum chamber, such that the process of removing the auxiliary flange from the flange is used to remove the supported components from the plurality of stacked components supported by the surface of the flange facing the vacuum chamber.

Description

Technical Field

[0001] The foregoing disclosure relates to an improved time-of-flight (TOF) mass spectrometer, and more specifically to a more compact TOF mass spectrometer having at least one spectrometer component that can be easily removed and replaced using an auxiliary flange. Cross-citation of related applications This application claims the benefit and priority of U.S. Provisional Patent Application Serial No. 63 / 187,054, filed May 11, 2021, entitled “Time-of-Flight Mass Spectrometer Detector,” the entire contents of which are incorporated herein by reference. Prior Technology

[0002] Time-of-flight mass spectrometry (TOF-MS) is a mass spectrometry method that uses the time of flight of ions to determine their mass-to-charge ratio. TOF-MS uses a TOF mass spectrometer, which includes a detector, an ion source, and other components. The components of a TOF mass spectrometer are arranged along a main structure, with the detector surrounded by other components. While the main structure provides secure mounting points for the TOF mass spectrometer components, it results in a very long TOF mass spectrometer. Furthermore, without disassembling most of the TOF mass spectrometer, it is difficult to access components that may need to be removed and replaced (such as the detector). Such disassembly takes time and results in significant shutdown time, as well as an increased possibility of damage to other components during disassembly and reassembly. These are some of the drawbacks of the current TOF mass spectrometers in use. Summary of the Invention

[0003] The disclosed TOF mass spectrometer assembly includes multiple components assembled on a main flange connected to a vacuum chamber. The main flange also defines an opening for receiving an auxiliary flange that supports at least one of the TOF mass spectrometer components. In this way, only at least one supported component can be removed from the vacuum chamber without disconnecting the main flange from the vacuum chamber and removing the entire TOF mass spectrometer assembly. This makes the removal and replacement of at least one supported component easier and faster, resulting in less shutdown time for the TOF mass spectrometer assembly. It also allows the rest of the TOF mass spectrometer to remain protected from contamination (e.g., dust) and incidental damage within the vacuum chamber. Furthermore, the auxiliary flange enables precise placement of the supported component relative to the other components of the TOF mass spectrometer assembly held within the vacuum chamber. An embodiment of a time-of-flight mass spectrometer assembly mounted in a vacuum chamber includes a flange configured to be secured to an opening in the vacuum chamber. The flange includes a surface facing the vacuum chamber and a surface facing the environment. The flange also defines a cutout portion extending between the surface facing the vacuum chamber and the surface facing the environment. Multiple components are assembled to and supported by the vacuum chamber-facing surface of the flange and configured to be positioned within the vacuum chamber. An auxiliary flange is configured to be removably secured to the flange to close the cutout portion of the flange. The auxiliary flange also includes a surface facing the vacuum chamber and a surface facing the environment. A supported component is attached to the vacuum chamber-facing surface of the auxiliary flange. Therefore, removing the auxiliary flange from the flange is used to remove the supported component from the vacuum chamber while maintaining the flange secured to the opening in the vacuum chamber. In one embodiment, the supported component is a detector. In one embodiment, when the auxiliary flange is removably secured to the flange to close a cut-out portion of the flange, the vacuum chamber-facing surface of the flange extends along a plane higher than the vacuum chamber-facing surface of the auxiliary flange. In one embodiment, the auxiliary flange is secured to the flange using a plurality of fasteners positioned around the periphery of the auxiliary flange. In one embodiment, at least one of the plurality of components includes an ion source. In one embodiment, a seal is positioned between the flange and the auxiliary flange. In another embodiment, the seal is made of metal. In yet another embodiment, the auxiliary flange defines one or more through connections to connect the supported component to a controller. Another embodiment of the time-of-flight mass spectrometer includes a flange having a surface facing a vacuum chamber and a surface facing the environment. The flange defines an opening extending between the surface facing the vacuum chamber and the surface facing the environment. A plurality of stacked components are supported by the surface of the flange facing the vacuum chamber. An auxiliary flange is removably secured within the opening of the flange and includes a surface facing the vacuum chamber and a surface facing the environment. A supported component is configured to be supported by the surface of the auxiliary flange facing the vacuum chamber, such that removing the auxiliary flange from the flange is used to remove the supported component from the plurality of stacked components supported by the surface of the flange facing the vacuum chamber. This invention provides an embodiment of a method for manufacturing a time-of-flight mass spectrometer. The method includes constructing a flange to include a surface facing a vacuum chamber and a surface facing an environment; defining an opening extending between the surface facing the vacuum chamber and the surface facing the environment; and supporting a plurality of stacked components on the surface facing the vacuum chamber of the flange. The method further includes constructing an auxiliary flange to include a surface facing the vacuum chamber and a surface facing the environment; and removably securing it to the flange to close the opening of the flange. Supported components are constructed to be supported by the surface facing the vacuum chamber of the auxiliary flange, such that removing the auxiliary flange from the flange is used to remove the supported component from the plurality of stacked components supported by the surface facing the vacuum chamber of the flange. An embodiment of the flange of a time-of-flight mass spectrometer assembly includes a body configured to connect to a vacuum chamber. The body includes a surface facing the vacuum chamber and a surface facing the environment. An opening defined in the body extends between the surface facing the vacuum chamber and the surface facing the environment and defines an inner lip. A plurality of openings are positioned around the periphery of the body, each of the plurality of openings being sized to receive fasteners to connect the body to the vacuum chamber. An auxiliary flange is sized to at least partially fit within an opening in the body of the flange, and a seal is positioned between the auxiliary flange and the body of the flange. Simple Explanation of the Diagram

[0004] A more specific description of the invention, which has been briefly summarized above, can be obtained by referring to the embodiments, some of which are illustrated in the drawings. However, it should be noted that the drawings only illustrate typical embodiments of the invention and should therefore not be considered as limiting its scope, as the invention may recognize other equally effective embodiments. Therefore, for a further understanding of the nature and purpose of the invention, reference can be made to the following detailed description, read in conjunction with the drawings, wherein: [Figure 1] shows a perspective side view of an embodiment of the components of a time-of-flight mass spectrometer assembly stacked on a flange; [Figure 2] shows a top plan view of the flange; and [Figure 3] schematically shows a cross-sectional view taken along line AA of the embodiment of Figure 2. The diagrams are for illustrative purposes and are not necessarily to scale. Implementation

[0005] The following discussion relates to various embodiments of a time-of-flight mass spectrometer assembly with an auxiliary flange. It should be understood that the versions described herein are examples embodying the specific inventive concepts detailed herein. Therefore, other variations and modifications will be apparent to those skilled in the art. Furthermore, certain terms are used throughout this discussion to provide a suitable framework of reference for the drawings. Terms such as “upstream,” “downstream,” “up,” “down,” “forward,” “backward,” “inner,” “outer,” “front,” “rear,” “top,” “bottom,” “inner,” “outer,” “first,” “second,” etc., are not intended to limit these concepts unless specifically indicated. The term “about” or “approximately” as used herein may refer to a range of 80%–125% of the claimed or disclosed value. Regarding the drawings, their purpose is to depict the prominent features of the time-of-flight mass spectrometer assembly with an auxiliary flange, and they are not specifically provided to scale. Referring to Figure 1, an embodiment of the TOF mass spectrometer assembly 100 is shown assembled on a flange 110 having a flange body 111. Specifically, multiple spectrometer components 120, 140, and 150 are assembled on the vacuum chamber-facing surface 112 of the body 111 of the flange 110. The multiple spectrometer components 120, 140, and 150 of the TOF mass spectrometer assembly 100 are stacked on the vacuum chamber-facing surface 112 of the flange 110, making the entire TOF mass spectrometer assembly 100 more compact and allowing it to be fully inserted into and removed from the vacuum chamber 50 (see Figure 3) as a single unit. As shown in Figure 1, one or more of the multiple spectrometer components 120, 140, and 150 can be connected to each other and then to one or more supports 180, which in turn are connected to the body 111 of the flange 110. In the example shown, components 150 and 120 are connected to component 140, which is then attached to flange 110 via support 180. In this way, a structurally stable and compact TOF mass spectrometer assembly 100 can be constructed. Spectrometer components 120, 130, 140, and 150 are generally known in the art and will not be described in detail individually, nor will the overall operation of the disclosed TOF mass spectrometer assembly 100 be discussed in detail. In one embodiment, the plurality of spectrometer components may include an ion source 120, transfer optics, a grid, an accelerating electrode and a drift tube (each included as part of 140), and an ion mirror 150. One or more connection portions 160 are configured to connect a plurality of spectrometer components 120, 140, 150 to a through connection portion 170 in the body 111 of the flange 110. The through connection portion 170 extends between the vacuum chamber-facing surface 112 and the environment-facing surface 114 of the flange 110, such that one or more of the connection portions 160 can be connected to an external component 400 (see FIG. 3). The external component 400 may include a power supply, a controller, or any other source or device that controls the corresponding components 120, 140, 150 of the TOF mass spectrometer assembly 100 via the through connection portion 170 (see FIGS. 2 and 3). Figure 2 shows the surface 112 of the body 111 of the flange 110 facing the vacuum chamber. The flange 110 is connected to the vacuum chamber 50 using a plurality of fasteners 119 positioned around the periphery of the body 111 of the flange 110. A plurality of through-connections 170 are shown positioned inside or radially inward of the plurality of fasteners 119. As can be seen in Figure 2, the through-connections 170 may have different dimensions depending on the connection type. Another type of through-connection 172, which can be connected to a controller and / or data collection equipment (not shown), is shown. Turning to Figure 3, the body 111 of flange 110 defines a cutout portion 117 or opening extending between a surface 112 facing the vacuum chamber and a surface 114 facing the environment. The cutout portion 117 is radially inwardly positioned from a plurality of fasteners 119 and configured to receive an auxiliary flange 200. As shown in Figure 2, the auxiliary flange 200 is polygonal in shape; however, this may not be the case in other embodiments of the auxiliary flange 200. Referring back to Figure 3, the auxiliary flange 200 has a surface 212 facing the vacuum chamber and a surface 214 facing the environment. A lip 216 is defined around the periphery of the auxiliary flange 200 and is connected to flange 110 by a plurality of auxiliary flange fasteners 219 positioned by the lip 216 of the auxiliary flange 200. Turning to Figure 3, the surface 212 of the auxiliary flange 200 facing the vacuum chamber is configured to support a component 130 of the TOF mass spectrometer assembly 100. In one embodiment, the supported component 130 is an ion detector; however, in other embodiments, the supported component may be another component of the TOF mass spectrometer assembly 100. The supported component 130 can be directly connected to the auxiliary flange 200 via one or more connectors 220. The flange 110, the auxiliary flange 200, and the supported component 130 are configured such that mounting the auxiliary flange 200 positions the supported component 130 in proper proximity to the remainder of the plurality of spectrometer components for proper operation of the TOF mass spectrometer assembly 100. A seal 300 is positioned between the inner surface 118 of the flange 110 and the lip surface 218 of the auxiliary flange 200 (and around the plurality of auxiliary flange fasteners 219). The seal 300 can be any suitable material that forms an airtight seal between the inner surface 118 of the flange 110 and the lip surface 218 of the auxiliary flange 200, while resisting the harsh conditions and chemicals present in the vacuum chamber 50. In one embodiment, the seal 300 is made of metal, more specifically of copper. The auxiliary flange 200 allows the supported component 130 to be removed from the vacuum chamber 50, enabling it to be secured or replaced without removing the flange 110 from the vacuum chamber 50. Once the supported component 130 is secured or replaced, a new seal 300 is applied to the lip surface 218 (or the inner surface 118 of the flange 110), and the auxiliary flange 200 is reinstalled into the cutout portion 117 and secured to the flange 110 by a plurality of auxiliary flange fasteners 219. In this way, only the supported component 130 is removed from the vacuum chamber 50, without needing to unconnect the flange 110 from the vacuum chamber 50 and remove the entire TOF mass spectrometer assembly 100. This makes the removal and replacement of the supported component 130 easier and faster, resulting in less shutdown time for the TOF mass spectrometer assembly 100. It also allows the remainder of the TOF mass spectrometer assembly 100 to remain protected within the chamber from contamination (e.g., dust) and incidental damage. As shown in Figure 3, the vacuum chamber-facing surface 212 of the auxiliary flange 200 extends along plane P, and the vacuum chamber-facing surface 112 of the flange 110 extends along plane Q. As shown, plane P does not extend along plane Q; however, in other embodiments, the vacuum chamber-facing surfaces 212 of the auxiliary flange 200 and 112 of the flange 110 extend along the same plane. In this way, supported members 130 of various sizes can be accommodated. In one embodiment, the auxiliary flange 200 may be manufactured to include the supported member 130 and its connection portion 222 (if desired) and a corresponding through-hole 221. In this embodiment, replacing the supported member 130 only requires removing the auxiliary flange 200 to which the supported member 130 is attached, and then replacing it with a different auxiliary flange 200 connected to a different supported member. In each embodiment, a new seal 300 is installed before the auxiliary flange 200 is mounted onto the flange 110. In some embodiments, the seal 300 may be pre-installed on the lip surface 218 of the auxiliary flange 200 to further increase the ease and speed at which the supported component 130 can be removed from and replaced back into the TOF mass spectrometer assembly 100. In other embodiments, additional flanges may be included to enable the removal of other specific components of the TOF mass spectrometer assembly 100 and / or specific areas close to the TOF mass spectrometer assembly 100. This invention includes combinations of aspects described herein. References to “embodiment”, etc., refer to features present in at least one aspect of the invention. Individual references to “embodiment” or “specific aspect”, etc., do not necessarily refer to the same one or more aspects; however, such aspects are not mutually exclusive unless so indicated or obvious to those skilled in the art. Unless otherwise expressly stated, the word “or” is used in this disclosure in a non-exclusive sense. The invention has been described in detail with particular reference to certain preferred aspects thereof, but it should be understood that variations, combinations and modifications can be made by those skilled in the art within the spirit and scope of the invention.

[0006] 100: TOF Mass Spectrometer Assembly 110: Flange 111: Main Body 112: (Surface facing the vacuum chamber) 117: Incision area 118: Inner surface 119: Fasteners 120: Ion source 130: Supported component 140: Spectrometer Components 150: Ion microscope 160: Connecting part 170: Straight-through connection section 172: Straight-through connection section 180: Support component 200: Auxiliary flange 212: (Surface facing the vacuum chamber) 216: Lip border 218: Lip surface 219: Auxiliary flange fastener 220: Connector 221: Through hole 222: Connecting part 300: Seals 400: External components 50: Vacuum Chamber AA: Section line P: Plane Q: Plane

Claims

1. A time-of-flight mass spectrometer assembly for installation in a vacuum chamber, the time-of-flight mass spectrometer assembly comprising: A flange configured to be fixed to an opening of the vacuum chamber, the flange including a body having a surface facing the vacuum chamber and a surface facing the environment, wherein the body further defines a cutout portion extending between the surface facing the vacuum chamber and the surface facing the environment; Multiple stacked spectrometer components, the multiple stacked spectrometer components being supported by the vacuum chamber-facing surface of the flange and configured to be positioned within the vacuum chamber; an auxiliary flange, the auxiliary flange being configured to be removably secured within the cutout portion to close the cutout portion, wherein the auxiliary flange includes a vacuum chamber-facing surface and an environment-facing surface; And a supported component configured to connect to the surface of the auxiliary flange facing the vacuum chamber, wherein the process of removing the auxiliary flange from the flange is used to remove the supported component from the vacuum chamber while keeping the flange fixed to the opening of the vacuum chamber.

2. The time-of-flight mass spectrometer assembly according to claim 1, wherein the supported component is a detector.

3. The time-of-flight mass spectrometer assembly according to claim 1, wherein the supported component is an ion source.

4. The time-of-flight mass spectrometer assembly according to claim 1, wherein the vacuum chamber-facing surface of the flange extends along a first plane and the vacuum chamber-facing surface of the auxiliary flange extends along a second plane, wherein the first plane is different from the second plane when the auxiliary flange is connected to the body of the flange.

5. The time-of-flight mass spectrometer assembly according to claim 1, wherein the auxiliary flange is secured to the flange using a plurality of fasteners positioned around the periphery of the auxiliary flange.

6. The time-of-flight mass spectrometer assembly according to claim 1, wherein at least one of the plurality of stacked spectrometer components includes an ion source.

7. The time-of-flight mass spectrometer assembly according to claim 1, further comprising an airtight seal positioned between the flange and the auxiliary flange.

8. The time-of-flight mass spectrometer assembly according to claim 7, wherein the hermetic seal is made of metal.

9. The time-of-flight mass spectrometer assembly according to claim 1, wherein the auxiliary flange defines one or more through connections to connect the supported component to a controller.

10. A time-of-flight mass spectrometer assembly, comprising: flange The flange includes a surface facing the vacuum chamber and a surface facing the environment, wherein the flange defines an opening extending between the surface facing the vacuum chamber and the surface facing the environment; Multiple stacked components, the multiple stacked components being supported by the vacuum chamber-facing surface of the flange; an auxiliary flange, the auxiliary flange being removably fixed to the flange and configured to block the opening, wherein the auxiliary flange includes a vacuum chamber-facing surface and an environment-facing surface; And a supported component configured to be supported by the surface of the auxiliary flange facing the vacuum chamber, wherein the process of removing the auxiliary flange from the flange is used to remove the supported component from the plurality of stacked components supported by the surface of the flange facing the vacuum chamber.

11. The time-of-flight mass spectrometer assembly according to claim 10, wherein the supported component is a detector.

12. The time-of-flight mass spectrometer assembly according to claim 10, wherein the supported component is an ion source.

13. The time-of-flight mass spectrometer assembly according to claim 10, wherein the vacuum chamber-facing surface of the flange extends along a first plane and the vacuum chamber-facing surface of the auxiliary flange extends along a second plane, wherein the first plane is different from the second plane when the auxiliary flange is removably fixed within the opening of the flange.

14. The time-of-flight mass spectrometer assembly according to claim 10, wherein the auxiliary flange is secured to the flange using a plurality of fasteners positioned around the periphery of the auxiliary flange.

15. The time-of-flight mass spectrometer assembly according to claim 10, wherein at least one of the plurality of stacked components includes an ion source.

16. The time-of-flight mass spectrometer assembly according to claim 10, further comprising a seal positioned between the flange and the auxiliary flange.

17. The time-of-flight mass spectrometer assembly according to claim 16, wherein the seal is made of metal.

18. The time-of-flight mass spectrometer assembly according to claim 10, wherein the auxiliary flange defines one or more through connections configured to connect the supported component to an external component.

19. A method for manufacturing a time-of-flight mass spectrometer assembly, the method comprising: A flange is constructed to include a surface facing the vacuum chamber and a surface facing the environment, and an opening extending between the surface facing the vacuum chamber and the surface facing the environment, and to support a plurality of stacked components on the surface facing the vacuum chamber of the flange; an auxiliary flange is constructed to include a surface facing the vacuum chamber and a surface facing the environment, and is removably secured to the flange to block the opening. And constructing a supported component to: be supported by the surface of the auxiliary flange facing the vacuum chamber for proper access to the plurality of stacked components, and to remove the plurality of stacked components supported by the surface of the flange facing the vacuum chamber by removing the auxiliary flange from the flange.

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