Multi-user development system for system level device testing

Abstract

Embodiments of the invention provide a test system for performing advanced system-level testing of multiple devices in parallel via a network connection that provides access to multiple development stations to improve the efficiency and accessibility of system-level testing. A rack-integrated computer (RIC) is coupled to multiple tester racks of a single-board computer (SBC) and provides access to the SBC, which serves as a development workstation, for use via a computer network (e.g., a client network). The SBC can provide final-level testing of devices, such as smartphones, that include several different device underpinnings (DUTs). Access to the SBC as a development workstation can be performed at an IP level under a development license, which can be used, for example, from any location using a static IP address and / or a virtual private network.

Description

Multi-User Development System for System-Level Device Testing Embodiments of the present invention generally relate to the field of electronic device testing. More specifically, embodiments of the present invention relate to system-level test systems and methods. Typically, a device under test (DUT), such as an electronic device, is tested before it is sold to determine the performance and consistency of the electronic device. A variety of test cases can be used to test the device, and the results of these test cases are compared with expected output results. When the result of a test case does not match the expected output value, the device can be considered a faulty device or abnormal, or the device can be classified based on performance, etc. A DUT is typically tested by an automated test equipment (ATE), which can be used to perform complex tests using software and automation to improve test efficiency. The DUT can be any type of semiconductor device, wafer, or component that is intended to be integrated into a final product, such as a computer system, smartphone, or other electronic device. By using ATE to remove defective or non-compliant wafers during manufacturing, the quality of the output can be significantly improved. System-level testing (SLT) advances conventional methods for DUT testing by testing multiple system components connected and assembled in a manner similar to a final product. Conventional methods for DUT testing may only test a specific processor, memory device, material, or the like. In system-level testing, the socket includes the support hardware necessary to test, for example, the key functions of an application processor at the system level. Modern system-level testers are complex and expensive, and current methods for system-level testing typically require special production authorization. Therefore, most entities have access to a relatively small number of system-level test systems for testing application processors and the like. Accordingly, a more efficient and accessible method for system-level testing is desired. Embodiments of the present invention provide a test system for advanced system-level testing of multiple devices implemented in parallel via a network connection that provides access to multiple development stations to improve the efficiency and accessibility of system-level testing. A rack-integrated computer (RIC) is coupled to a plurality of tester racks of a single-board computer (SBC) and provides access to the SBC as a development workstation for use via a computer network (e.g., a customer network). The SBC can provide final-level testing of a device, such as a smartphone, that includes several different devices (DUTs). Access to the SBC as a development workstation can be performed at the IP level under a development authorization and can be used from any global location via a VPN, for example, using a static IP address assigned to the SBC. According to one disclosed embodiment, a system-level test system is disclosed. The test system includes a rack-integrated computer coupled to a network switch, the network switch being configured to provide a remote network connection to a plurality of single-board computers, and the network switch being coupled to the plurality of SBCs. The plurality of SBCs are operable to perform system-level testing on a plurality of devices under test, and the plurality of SBCs are operable to be coupled to the plurality of DUTs. The system-level testing includes testing a plurality of components of the plurality of DUTs by executing a test program by the plurality of SBCs via the remote network connection. According to some embodiments, the system-level test system includes a tester rack having a rack-integrated computer (RIC) disposed in the tester rack, a power distribution board disposed in a slot of the tester rack and coupled to a plurality of SBCs, and a test interface panel disposed in the slot of the tester rack and operable to be coupled to the plurality of DUTs. According to some embodiments, the system-level test system includes a lookup table stored in a memory of the RIC. The lookup table includes a specified IP address for accessing a first SBC of the plurality of SBCs, and the IP address is used to configure the first SBC. The first SBC is operable to be remotely accessed using the IP address to perform the system-level test. According to some embodiments, the first SBC is accessed using an authorization file that enables a development mode that allows connection to the first SBC from any IP address. According to some embodiments, the network switch includes an Ethernet switch. According to some embodiments, the plurality of SBCs includes 6 SBCs, and the plurality of DUTs includes 24 DUTs, wherein each SBC of the plurality of SBCs is respectively coupled to 4 DUTs of the plurality of DUTs for performing system-level testing via a remote network connection. According to some embodiments, the remote network connection uses at least one of the following to provide communication between the plurality of SBCs and a remote computer system: VNC; Remote Desktop Connection; and an integrated development environment. According to some embodiments, the plurality of SBCs are operable to install a customized IDE via the remote network connection. According to some embodiments, the plurality of SBCs are operable to install a customized software library via the remote network connection. According to some embodiments, the system-level test system includes a plurality of network switches coupled to a plurality of tester racks, and each tester rack includes another plurality of SBCs operable to be coupled to another plurality of DUTs. The plurality of network switches are coupled to a RIC to coordinate remote access to the another plurality of SBCs for performing system-level tests on the another plurality of DUTs. According to another embodiment, a single board computer for performing system-level tests is disclosed. The SBC includes a processor, a memory, and a network interface. A plurality of DUTs are operable to be coupled to the processor, the processor is operable to perform system-level tests on the plurality of DUTs, and the network interface is coupled to a network switch. The network switch is coupled to a Rack Integrated Computer (RIC) that coordinates remote access between the network connection interface and a remote computer system. According to some embodiments, the plurality of DUTs are operable to be coupled to the processor using a USB interface. According to some embodiments, the plurality of DUTs includes 4 DUTs, and the processor is operable to perform the system-level tests on the 4 DUTs in parallel. According to some embodiments, the processor is operable to assign a specified IP address to the network interface for connection to the remote network and store the specified IP address in a lookup table in a memory of the RIC. According to some embodiments, the network switch includes an Ethernet switch. According to another embodiment, a method for system-level testing is disclosed. The method includes associating a single board computer (SBC) with a specified IP address and storing the specified IP address in a lookup table in a memory of a Rack Integrated Computer. The RIC and the SBC are coupled to a network switch, and the SBC can be accessed by a remote computer system via the RIC at the specified IP address. The remote computer system causes the SBC to perform system-level tests on a plurality of devices under test operable to be coupled to the SBC. According to some embodiments, the plurality of DUTs includes 4 DUTs, and the SBC is operable to perform system-level tests on the 4 DUTs in parallel. According to some embodiments, the system-level test includes the SBC receiving test commands and data from the remote computer system, and the SBC transmitting test results back to the remote computer system. According to some embodiments, the SBC executes an integrated development environment controlled by the remote computer system. According to some embodiments, the SBC can be further accessed via a combination of the IP address and a port number according to port forwarding rules defined in the lookup table. Reference will now be made in detail to several embodiments. Although the subject matter will be described in connection with alternative embodiments, it will be understood that it is not intended to limit the claimed subject matter to these embodiments. On the contrary, the claimed subject matter is intended to cover alternatives, modifications, and equivalents that may be included within the spirit and scope of the claimed subject matter as defined by the appended claims. In addition, many specific details are set forth in the following detailed description in order to provide a thorough understanding of the claimed subject matter. However, one of ordinary skill in the art will recognize that the embodiments may be practiced without these specific details or with their equivalents. In other instances, well-known methods, procedures, components, and circuits have not been described in detail so as not to unnecessarily obscure aspects and features of the subject matter. Some portions of the detailed description are presented in terms of procedures, steps, logical blocks, processing, and other symbolic representations (e.g., FIG. 5) that can be executed on a computer memory and operate on data bits. These descriptions and representations are the means used by those skilled in the data processing arts to most effectively convey the substance of their work to others skilled in the art. Herein, and generally, a procedure, computer-executed step, logical block, processing procedure, etc. is conceived of as a self-consistent sequence of steps or instructions that cause the desired result. These steps are those that require physical manipulation of physical quantities. Usually, but not necessarily, these quantities take the form of electrical or magnetic signals that can be stored, transmitted, combined, compared, and otherwise manipulated in a computer system. For common reasons, it has proven convenient to refer to these signals as bits, values, elements, symbols, characters, terms, numbers, parameters, or the like. However, it should be borne in mind that all such and similar terms are to be associated with appropriate physical quantities and are merely convenient labels applied to these quantities. Unless explicitly stated otherwise, it will be apparent from the following discussion that, throughout the discussion, terms such as "access," "write," "include," "store," "transfer," "associate," "identify," "encode," "mark," etc. refer to the operations and processes of a computer system or similar electronic computing device that operate on and transform data represented as physical (electronic) quantities in the registers and memories of the computer system into other data similarly represented as physical quantities in the memories or registers of the computer system or other such information storage, transmission, or display devices. Some embodiments may be described in the context of general computer-executable instructions, such as program modules, that can be executed by one or more computers or other devices. Generally, program modules include routines, algorithms, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. Typically, in various embodiments, the functionality of such program modules may be combined or distributed as needed. A multi-user development system for system-level testing via remote access Embodiments of the present invention provide a test system for advanced system-level testing of multiple devices implemented in parallel via a network connection that provides access to multiple development stations to improve the efficiency and access to system-level testing. A rack-integrated computer (RIC) is coupled to multiple tester racks of single-board computers (SBCs) and provides access to the SBCs as development workstations for use via a computer network (e.g., a customer network). The SBCs can provide final-level testing of devices such as smartphones that include several different devices (DUTs). Access to the SBCs as development workstations can be performed at the IP level under a development authorization, and the authorization can be used from any global location, for example, using a static IP address and / or a virtual private network. FIG. 1 illustrates an exemplary single-board computer (SBC) for parallel testing of multiple DUTs according to an embodiment of the present invention. In the example of FIG. 1, the SBC 105 is coupled to DUT-1 (110), DUT-2 (115), DUT-3 (120), and DUT-4 (125) via a USB connection. The SBC 105 provides final-level testing of several different devices (DUTs) including devices such as smartphones and other modern electronic devices. The SBC is typically controlled by active control software that coordinates the testing operations by sending commands to the DUTs and returning results to the active control software and serves as an interface between the active control software and the DUTs. However, embodiments of the present invention can bypass the active control software and use each SBC as an independent development workstation connected to customer hardware in an actual test environment. As illustrated in FIG. 2, according to an embodiment of the present invention, each slot of a power distribution board (PDB) may include multiple SBCs that connect up to 4 DUTs for system-level testing. In the embodiment of FIG. 2, up to 4 DUTs can be tested in parallel by a single SBC, and each slot can test up to 24 DUTs. The SBC 205 can be connected to the DUT 210 via a USB connection, for example, to test the DUT 210 at a system level. System-level testing can be performed via a network connection, and for example, access to the SBCs can be performed based on an IP address-based authorization. The RIC can act as a system controller to coordinate system-level testing by controlling the disposer, registering system-level test results, etc. Usually, these SBC 205s are placed in a power distribution board, and the DUT is placed in a test interface panel that resides in a slot of a tester rack. The PDB and TIB can be installed and uninstalled, for example, by a processor controlled by the RIC. FIG. 3 illustrates an exemplary system-level test system 300 according to an embodiment of the present invention, which includes a tester rack 310 and a tester rack 315, and executes an SLT test environment configured for remote access by a customer network 335. The Rack Integrated Computer System (RIC) 305 provides access to the tester rack 310 and the tester rack 315 to perform system-level testing via remote access using Ethernet switches 320 and 325, respectively. In this way, a remote entity can test a large number of devices (e.g., smart phones and other digital electronic devices) at a system level via remote access, and an SBC can be used to execute test software to test multiple DUTs of devices including application processors, memories, and the like. After completing the system-level testing of these DUTs, the RIC 305 can automatically remove these DUTs and replace them with new DUTs to be tested. The SBCs placed in the racks 310 and 315 can be configured as remote development stations, which can be remotely accessed via commands transmitted over a network such as VNC, Remote Desktop Connection (RDC), or by dedicated development software such as Eclipse or other Integrated Development Environments (IDEs). Alternatively, an IDE built into the SBC, such as Active ATE, can be used. Any suitable development libraries such as Python, Java, and C# can be installed, as well as any license files for remote development. During testing, the SBC acts as a supervisory processor and handles the communication between the remote computer network 335 and the DUTs placed in the TIBs of the racks 310 and 315 to coordinate system-level testing. According to some embodiments, the SBC development mode is enabled by providing a valid license file that allows remote connections from any specified IP address to develop and / or execute system-level test programs. In addition, port forwarding can be used to configure a smart hub to provide access to multiple SBCs according to routing rules defined for various port numbers for testing using static IP addresses and port numbers. According to some embodiments, the IP address 192.168.0.1 is assigned to the RIC 305, and only the RIC can access the SBC when the development mode is not enabled. According to some embodiments, access to the SBC for system-level DUT testing is controlled at the IP level using a dedicated static IP address as defined in a lookup table. In this way, a specific IP address can be assigned to the SBC for remote development by a remote entity for SLT testing. The SBCs can automatically set their own IP addresses and store the IP addresses in the lookup table to control remote access. A specific authorization can be assigned to the entity for remote development, and an authorization file can be used to access the SLT system to enable a development mode that allows access to additional IP addresses. According to some embodiments, the SBCs are accessed at a specified IP address via a virtual private network (VPN) for system-level DUT testing, and port forwarding can be used to map a specific port to a different entity or development environment, for example. The SBCs can be configured with customized development tools to enable a user to control up to 4 test devices as a "test site". For example, multiple test sites can be accessed by a specified entity for parallel testing of more devices or for testing different types of devices. FIG. 4 illustrates an exemplary computer network 400 for performing SLT according to an embodiment of the present invention. The computer network 400 includes a RIC 405 coupled to Ethernet switches 410, 415, and 420 for coordinating SLT testing of racks using SBCs via a network connection by a remote computer system 480. The Ethernet switch 415 provides Ethernet access to the PBDs of the racks 407, 410. As mentioned above, each SBC can be configured as an independent development workstation connected to the hardware in an actual test environment. In this way, each SBC can perform system-level testing on up to 4 DUTs in parallel from any global location via remote access. Typically, a test rack includes a power distribution board (PDB) for accommodating the SBCs and a test interface board (TIB) for accommodating multiple DUTs. In the example of FIG. 4, the tester rack 407 includes 6 SBCs placed on the PBD 425 in slot 1, and each SBC is coupled to 4 DUTs placed on the TIB 430 in slot 1 for system-level testing. The rack 407 includes PDBs and TIBs in slots 1-15 (e.g., PBDs 425, 440 and TIBs 430, 445), where each PDB is connected to the Ethernet switch 415. Similarly, the PBD of the rack 410 is coupled to the Ethernet switch 420, and the rack 2 includes slots 16-30 for accommodating PDBs and TIBs (e.g., PBDs 450, 455 and TIBs 460, 465) to test DUTs at a system level using SBCs. In the example of FIG. 4, each of the racks 407, 410 includes 15 slots for a total of 720 connected DUTs. Each PDB also includes an Ethernet switch or interface to connect the PBD to one of the multiple Ethernet switches for connecting to the RIC 405. The RIC 405 coordinates network communication between the remote computer network 480 and the SBC via network switches 415 and 420. In the example of FIG. 4, the PBD 425 placed in slot 1 includes an Ethernet switch 426 coupled to the Ethernet switch 415 to provide communication between the SBC and the RIC 405. The SBC coupled to the Ethernet switch 435 can be accessed via the remote access by the customer computer network 480 to perform system-level testing on the DUT, which increases the availability of the SLT system and improves the test efficiency for parallel testing of multiple DUTs. FIG. 5 illustrates computer-implemented steps of an exemplary sequence for performing remote system-level testing according to an embodiment of the present invention. In step 505, a specified IP address is assigned to a single-board computer disposed in a tester rack, and the specified IP address is associated with a remote entity, computer system, or computer network. For example, the specified IP address can be stored in a lookup table of a rack-integrated computer or on the single-board computer. The rack-integrated computer is coupled to an Ethernet switch for communicating with the single-board computer to perform SLT operations via remote access. Generally, the SBC is disposed in a PDB placed in a tester rack, and the DUT to be tested by the SBC is disposed in a TIB, which is installed in the same slot of the tester rack. In step 510, the remote entity accesses the single-board computer at the specified IP address. The remote entity can access the single-board computer via remote access using, for example, VNC, Remote Desktop Connection, or an IDE. Additionally, according to an embodiment, a VPN can be used to use port forwarding to access the specified IP address. In step 515, a system-level test is performed by the SBC to test the DUT disposed in the TIB. The system-level test is coordinated by the RIC acting as a supervisor processor. The IDE is used by the remote entity as a development platform, and the SBCs execute test commands / instructions according to the code developed using the IDE. Step 515 can include parallel remote system-level testing of multiple DUTs, and can further include using multiple SBCs to execute test code to test a large number of DUTs, testing the DUTs using different IDEs, different test codes, etc. The SBCs can act as intermediaries between the DUTs and the IDEs by passing test data and commands to the DUTs and returning the results of the SLT test operations to the remote computer system via the computer network. In this way, system-level testing is available to computer systems located anywhere in the world, and remote entities can perform SLT operations as if they had physical access to the test equipment. Exemplary Test System Embodiments of the present invention relate to an electronic system for performing system-level testing of a remotely network-accessible computer system. The embodiment illustrated in FIG. 6 can be, for example, a single-board computer or a rack-integrated computer (RIC) as discussed above. Additionally, system 612 can be used to execute procedure 500 shown in FIG. 5. In the example of FIG. 6, exemplary computer system 612 can be configured as a server and includes a central processing unit (CPU) 601 for running software applications and operating systems. Random access memory 602 and read-only memory 603 store application programs and data for use by the CPU 601. Data storage device 604 provides non-volatile storage for application programs and data and can include fixed disk drives, removable disk drives, flash memory devices, and CD-ROM, DVD-ROM, or other optical storage devices. The data storage device 604 or memory 602 / 603 can store historical and real-time test data (e.g., test results, limits, calculations, etc.). The optional user inputs 606 and 607 include devices (e.g., mouse, joystick, camera, touch screen, keyboard, and / or microphone) for transmitting input from one or more users to the computer system 612. A communication or network interface 608 allows the computer system 612 to communicate with other computer systems, networks, or devices via an electronic communication network including wired and / or wireless communication and including an intranet or the Internet. According to an embodiment, the communication or network interface 608 can be coupled to or can include an Ethernet switch and can be assigned a statically assigned IP address. The optional display device 610 can be any device capable of displaying visual information in response to a signal from the computer system 612 and can include, for example, a flat panel touch display. The components of computer system 612 including the CPU 601, memory 602 / 603, data storage device 604, user input device 606, and graphics subsystem 605 can be coupled via one or more data buses 600. In the case of a single-board computer, the graphics subsystem is integrated into the processor 601. Embodiments of the present invention have been described in this manner. Although the present invention has been described in terms of specific embodiments, it should be understood that the present invention should not be construed as being limited to such embodiments, but rather should be interpreted in accordance with the following claims. 105: SBC 110: DUT-1 115: DUT-2 120: DUT-3 125: DUT-4 205: SBC 210: DUT 300: System-level test system 305, 405: RIC 310, 315: Tester rack, rack 320, 325: Ethernet switch 335: Customer network, remote computer network 400: Computer network 407: Rack, tester rack 410: Ethernet switch, rack 415, 420: Ethernet switch, network switch 426, 435: Ethernet switch 425, 440, 450, 455: PBD 430, 445, 460, 465: TIB 480: Remote computer system, remote computer network, customer computer network 500: Program 505, 510, 515: Step 600: Data bus 601: Central processing unit, CPU, processor 602: Random access memory, memory 603: Read-only memory, memory 604: Data storage device 605: Graphics subsystem 606: User input, user input device 607: User input 608: Communication or network interface 610: Display device 612: System, computer system The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention: FIG. 1 illustrates an exemplary single board computer for parallel testing of multiple DUTs according to an embodiment of the invention. FIG. 2 illustrates an exemplary system-level test system for parallel testing of 4 DUTs using a single SBC according to an embodiment of the invention. FIG. 3 illustrates an exemplary system-level test system according to an embodiment of the invention, which includes a tester rack that executes an SLT test environment that can be remotely accessed by a customer network. FIG. 4 illustrates an exemplary computer network for performing SLT according to an embodiment of the invention. FIG. 5 illustrates an exemplary sequence of computer-executed steps for remotely performing system-level testing according to an embodiment of the invention. FIG. 6 illustrates an exemplary computer platform on which embodiments of the invention can be implemented. 400: Computer network 405: RIC 407: Tester rack, rack 410: Ethernet switch, rack 415, 420: Ethernet switch, network switch 426: Ethernet switch 425,440,450,455:PBD 430,445,460,465:TIB 480:Remote computer system, remote computer network, client computer network

Claims

1. A system-level testing system comprising: a rack-mounted integrated computer (RIC) coupled to a network switch, wherein the network switch is operable to provide a remote network connection to one of a plurality of single-board computers (SBCs) for remotely testing a plurality of devices under test (DUTs) using a remote computer system; the network switch coupled to the plurality of SBCs, wherein the plurality of SBCs are operable to perform system-level testing on the plurality of DUTs, wherein the plurality of SBCs are operable to be coupled to the plurality of DUTs, and wherein the system-level testing includes: The plurality of SBCs receive test data and commands from the remote computer system; and the plurality of SBCs transmit the test data and commands for the plurality of DUTs to receive for testing a plurality of components of the plurality of DUTs according to a test program transmitted via the remote network connection; and a lookup table stored in a memory of the RIC, wherein the lookup table contains a specified IP address for accessing a first SBC of the plurality of SBCs, wherein the IP address is further used to assemble the first SBC, and wherein the first SBC is operable to be remotely accessed using the IP address to perform system-level testing.

2. The system-level test system of claim 1 further comprises: a tester rack, wherein the RIC is disposed in the tester rack; a power distribution board (PBD) disposed in a slot of the tester rack and coupled to the plurality of SBCs; and a test interface board (TIB) disposed in the slot of the tester rack and operable to be coupled to the plurality of DUTs.

3. The system-level test system as requested in item 1, wherein the first SBC is accessed using an authorization file that enables a development mode that allows connection to the first SBC from any IP address.

4. The test system as requested in item 1, wherein the network switch includes an Ethernet switch.

5. The test system as described in Request 1, wherein the plurality of SBCs comprises 6 SBCs, and the plurality of DUTs comprises 24 DUTs, and wherein each of the plurality of SBCs is coupled to 4 of the plurality of DUTs for performing system-level testing via the remote network connection.

6. The test system as requested in item 1, wherein the remote network connection uses at least one of the following to provide communication between the plurality of SBCs and the remote computer system: VNC; remote desktop connection; and an integrated development environment (IDE).

7. The test system as requested in item 1, wherein the plurality of SBCs are operable to install a custom IDE via the remote network connection.

8. The test system as requested in item 1, wherein the plurality of SBCs are operable to install a custom software library via the remote network connection.

9. The test system of claim 1, further comprising a plurality of network switches coupled to a plurality of tester racks, wherein each tester rack includes another plurality of SBCs operable to be coupled to another plurality of DUTs, and wherein the plurality of network switches are coupled to the RIC to coordinate remote access to the other plurality of SBCs for performing system-level testing on the other plurality of DUTs.

10. A single-board computer (SBC) for performing system-level testing, the SBC comprising: a processor; a memory; and a network interface operable to: receive test data and commands from a remote computer system, and transmit the test data and commands for reception by a plurality of DUTs to test a plurality of components of the plurality of DUTs. The plurality of DUTs are operable to be coupled to the processor, which is operable to perform system-level testing on the plurality of DUTs. The network interface is coupled to a network switch, which is coupled to a rack-integrated computer (RIC) that coordinates remote access between the network interface and the remote computer system for remote testing of the plurality of DUTs using the remote computer system according to a test program executed by the processor via a network interface through a remote network connection. The processor is operable to assign a specified IP address to the network interface for connection to the remote network, and the specified IP address is stored in a lookup table in the memory of the RIC.

11. The SBC of request item 10, wherein the plurality of DUTs are operable to be coupled to the processor using a USB interface.

12. The SBC of request item 10, wherein the plurality of DUTs comprises 4 DUTs, and wherein the processor is operable to perform system-level testing in parallel on the 4 DUTs.

13. The SBC of request item 10, wherein the network switch includes an Ethernet switch.

14. A method for system-level testing, comprising: associating a single-board computer (SBC) with a specified IP address; storing the specified IP address in a lookup table in a memory of a rack-integrated computer (RIC), wherein the RIC and the SBC are coupled to a network switch, and wherein the SBC is further accessible from a remote computer system via the RIC to the specified IP address; the SBC receiving test data and commands from the remote computer system; and the SBC transmitting the test data and the commands for reception by a plurality of device under test (DUT) devices for testing a plurality of components of the plurality of DUT devices according to a test program executed by the SBC via the network switch; and the remote computer system causing the SBC to perform system-level testing on the plurality of DUT devices operable to be coupled to the SBC according to the test program.

15. The method of request 14, wherein the plurality of DUTs comprises 4 DUTs, and wherein the SBC is operable to perform system-level testing on the 4 DUTs in parallel.

16. The method of claim 14, wherein the system-level test comprises: the SBC receiving the test command and data from the remote computer system; and the SBC transmitting the test results back to the remote computer system.

17. The method of request item 14, wherein the SBC executes an integrated development environment (IDE) controlled by the remote computer system.

18. The method of request 14 further includes storing port forwarding rules in the lookup table at the RIC, wherein the SBC can further access the port forwarding rules defined in the lookup table via the combination of the IP address and a port number.

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