Contact sensing detection device

TWI941983BActive Publication Date: 2026-10-11NATIONAL CHANGHUA UNIVERSITY OF EDUCATION +1
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Patent Information

Application Number
TW113129938
Authority / Receiving Office
TW · TW
Patent Type
Patents
Current Assignee / Owner
Filing Date
2024-08-09
Publication Date
2026-10-11
Estimated Expiration
2044-08-08

AI Technical Summary

Technical Problem

Existing contact and non-contact methods for testing light-emitting elements suffer from damage, alignment issues, and environmental interference, leading to reduced efficiency and accuracy in yield detection.

Method used

A semi-contact detection device with an anode and cathode detection units on the same side of a substrate, using an insulating unit to contact the light-emitting element, allowing large-area detection and alignment-free alignment, while utilizing insulating materials to prevent damage.

Benefits of technology

Enhances detection efficiency and accuracy by allowing large-area detection with minimal alignment and reduces damage to light-emitting elements.

✦ Generated by Eureka AI based on patent content.

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Abstract

This application discloses a contact-sensing detection device for detecting a miniature light-emitting element. The device includes a substrate, an anode detection unit, a cathode detection unit, and an insulating unit. The substrate and the miniature light-emitting element are disposed opposite each other. The anode detection unit is positioned corresponding to the anode of the miniature light-emitting element; the cathode detection unit is positioned corresponding to the cathode of the miniature light-emitting element, and the cathode and anode detection units are located on the same side of the substrate. The insulating unit is disposed on the side of the miniature light-emitting element adjacent to the anode and cathode detection units. When the insulating unit contacts the miniature light-emitting element, the contact-sensing detection device is coupled to the miniature light-emitting element, thereby detecting the miniature light-emitting element. This improves the efficiency and accuracy of the detection process.
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Description

[Technical Field]

[0001] This application relates to a semi-contact testing device, and more particularly to a semi-contact testing device for detecting the yield of light-emitting elements. [Previous Technology]

[0002] In recent years, due to the rapid development of the electronic technology field, there have been significant improvements in the size, cost, performance, and power consumption of electronic components. For example, in displays, the light-emitting elements used have achieved micron-level manufacturing precision, thus greatly reducing their size. Because the size of the light-emitting elements is extremely small, the number of light-emitting elements fabricated on a substrate is typically in the tens of thousands or more. Consequently, the yield rate of these light-emitting elements has become particularly important.

[0003] In the past, manufacturers would test the yield of light-emitting elements using either contact or non-contact methods. However, after long-term practice by technicians, the two methods have the following technical drawbacks, which are explained below:

[0004] I. Contact Detection Method: This method involves using a probe to touch the light-emitting element to detect whether it can emit light normally. However, the constant contact between the probe and the light-emitting element can easily damage the probe, requiring replacement. Furthermore, due to the large number of light-emitting elements and their small spacing, the probe needs to be precisely aligned for accurate detection. Consequently, the probe inevitably requires time for alignment, thus reducing detection efficiency.

[0005] II. Non-contact detection method: This method uses spectral equipment to detect light-emitting elements, such as detecting the wavelength, color, or luminous efficiency of the light-emitting elements. However, this method is easily affected by external environmental interference, which can lead to inaccurate measurement results.

[0006] In view of this, those skilled in the art are actively developing a technical solution to solve the above problems in order to improve the deficiencies of the prior art. [Summary of the Invention]

[0007] The main objective of this application is to provide a semi-contact detection device with high detection efficiency and accuracy.

[0008] The foregoing objectives do not preclude the existence of other objectives. Objectives that can be deduced by a person skilled in the art from the description, claims, or drawings of this application are also included in the objectives of this application. Therefore, the objectives of this application are not limited to those listed above.

[0009] To achieve the above objective, this application provides a semi-contact detection device for detecting a light-emitting element. The semi-contact detection device includes a substrate, an anode detection unit, a cathode detection unit, and an insulating unit. The substrate and the light-emitting element are disposed opposite to each other; the anode detection unit is disposed corresponding to the anode of the light-emitting element; the cathode detection unit is disposed corresponding to the cathode of the light-emitting element, and the cathode detection unit and the anode detection unit are located on the same side of the substrate; the insulating unit is disposed on the side of the light-emitting element adjacent to the anode detection unit and the cathode detection unit; when the insulating unit contacts the light-emitting element, the semi-contact detection device is coupled to the light-emitting element, thereby performing the detection of the light-emitting element.

[0010] Accordingly, this application has the following technical features:

[0011] In this application, the anode detection unit and the cathode detection unit are disposed on the same side of the substrate, and the insulating unit is disposed on the side of the light-emitting element adjacent to the anode detection unit and the cathode detection unit. When the insulating unit contacts the light-emitting element, the light-emitting element can be detected over a large area to achieve high detection efficiency.

[0012] Second, since this application detects light-emitting elements in a large-area manner, the insulating unit of this application only needs to be simply aligned with the light-emitting element for detection. In this way, in addition to higher detection efficiency, the accuracy of detection can also be improved.

Implementation Method

[0014] To facilitate the description of the central idea expressed in the above-mentioned content section of this application, specific embodiments are given below. Various objects in the embodiments are depicted according to a scale, size, deformation, or displacement suitable for illustration, and are not drawn to the scale of actual components, as will be stated prior.

[0015] The exemplary embodiments of this application are described in detail below with reference to the drawings, and are not intended to limit the technical principles of this application to the specific disclosed embodiments. The scope of this application is limited only by the scope of the claims and covers alternatives, modifications and equivalents.

[0016] Please refer to Figures 1 to 7. In the embodiments of this application, this application provides a semi-contact detection device 100, which is used to detect a light-emitting element 1 to determine the yield of the light-emitting element 1. The light-emitting element 1 may be a micro light-emitting diode.

[0017] Please refer to Figures 1 and 2 for details. The semi-contact detection device 100 includes a substrate 10, an anode detection unit 20, a cathode detection unit 30, and an insulating unit 40. The semi-contact detection device 100 is coupled to an AC power supply 2.

[0018] The substrate 10 is positioned opposite to the light-emitting element 1. To facilitate the drawing of each object, the substrate 10 is presented in perspective, as will be explained earlier. In addition, the substrate 10 may be made of glass.

[0019] The anode detection unit 20 is set to correspond to the anode 1a of the light-emitting element 1.

[0020] The cathode detection unit 30 is disposed corresponding to the cathode 1b of the light-emitting element 1, and the cathode detection unit 30 and the anode detection unit 20 are located on the same side of the substrate 10. That is, the anode detection unit 20 and the cathode detection unit 30 are both located on the side of the substrate 10 facing the light-emitting element 1.

[0021] In this embodiment, the anode detection unit 20 has a first detection portion 21 and a first recessed portion 22, and the cathode detection unit 30 has a second detection portion 31 and a second recessed portion 32. The first detection portion 21 extends and is adjacent to the second recessed portion 32, and the shortest distance between the first detection portion 21 and the second recessed portion 32 forms a first spacing D1. The second detection portion 31 extends and is adjacent to the first recessed portion 22, and the shortest distance between the second detection portion 31 and the first recessed portion 22 forms a second spacing D2. As shown in Figures 1 and 2, the first detection portion 21 and the second detection portion 31 are arranged in an alternating pattern.

[0022] In more detail, the first detection unit 21 and the second detection unit 31 form a detection module T, which can detect the light-emitting element 1 over a large area, thereby increasing the measurement efficiency. This application does not limit the number of detection modules T, and the number of detection modules T can be increased or decreased according to the actual situation.

[0023] On the other hand, the third distance D3 between the first detection unit 21 and the second detection unit 31 can be modified according to the actual situation. For example, since the distance between the anode 1a and the cathode 1b of the light-emitting element 1 is small, the first detection unit 21 in the detection module T can be adjacent to the second detection unit 31, that is, the distance between the two third distance D3 is small.

[0024] Please refer to Figure 2. For the sake of clarity in explaining the first detection unit 21 and the second detection unit 31, the drawing of the insulating unit 40 is omitted in Figure 2. However, the shape of the insulating unit 40 corresponds to the shape of the anode detection unit 20 and the cathode detection unit 30 in Figure 2.

[0025] In one embodiment of this application, the first detection unit 21 and the second detection unit 31 are each in the shape of a strip, and the first detection unit 21 and the second detection unit 31 are arranged on the substrate 10. Of course, the first detection unit 21 and the second detection unit 31 are not limited to being in the shape of a strip.

[0026] Furthermore, the anode detection unit 20 also has a first connecting portion 23, and the cathode detection unit 30 also has a second connecting portion 33. The number of first detection portions 21 and the number of second detection portions 31 are both multiple. The multiple first detection portions 21 are connected to the same side of the first connecting portion 23, and the multiple second detection portions 31 are connected to the same side of the second connecting portion 33, so that the multiple first detection portions 21 and the multiple second detection portions 31 are arranged in an array. The first connecting portion 23 and the second connecting portion 33 can be coupled to the AC power supply 2.

[0027] Please refer to Figures 3 and 4 for details. The insulating unit 40 is disposed on one side of the light-emitting element 1 adjacent to the anode detection unit 20 and the cathode detection unit 30. When the insulating unit 40 contacts the light-emitting element 1, the semi-contact detection device 100 is coupled to the light-emitting element 1, thereby performing detection of the light-emitting element 1.

[0028] Please refer to Figure 5 for the cross-sectional view shown in Figure 5 to describe the relationship between the various objects.

[0029] In one embodiment of this application, the insulating unit 40 has a first insulating layer 41 and a second insulating layer 42. The first insulating layer 41 is disposed on one side of the anode detection unit 20 adjacent to the light-emitting element 1, and the first insulating layer 41 is used to contact the anode 1a of the light-emitting element 1. The second insulating layer 42 is disposed on one side of the cathode detection unit 30 adjacent to the light-emitting element 1, and the second insulating layer 42 is used to contact the cathode 1b of the light-emitting element 1. As shown in FIG5, when the insulating unit 40 contacts the light-emitting element 1, the first insulating layer 41 contacts the anode 1a of the light-emitting element 1, and the second insulating layer 42 contacts the cathode 1b of the light-emitting element 1.

[0030] Please refer to Figures 5 and 6. When the first insulating layer 41 is in contact with the anode 1a and the second insulating layer 42 is in contact with the cathode 1b, the anode detection unit 20, the first insulating layer 41, and the anode 1a form a first coupling capacitor C1, and the cathode detection unit 30, the second insulating layer 42, and the cathode 1b form a second coupling capacitor C2. That is, the light-emitting element 1 is coupled between the first coupling capacitor C1 and the second coupling capacitor C2 to form a circuit with the AC power supply 2, thereby detecting the yield of the light-emitting element 1.

[0031] Furthermore, the insulating unit 40 is made of an insulating material with flexible properties; in this embodiment, the insulating unit 40 is made of hafnium oxide, tungsten oxide, titanium oxide, and aluminum hafnium oxide, etc., or it can be a combination of nanoparticles, polydimethylsiloxane (PDMS), and elastic high-dielectric materials. This application is not limited to this. In this way, the insulating unit 40 provides a buffering effect, making the light-emitting element 1 less likely to be damaged by contact.

[0032] Please refer to Figure 7. The difference between the embodiment in Figure 7 and the embodiment in Figure 1 is that the insulating unit 40 in Figure 1 is a patterned design, while the insulating unit 40 in Figure 7 is similar to a plane. In this embodiment, the insulating unit 40 is located on one side of the anode detection unit 20 and the cathode detection unit 30 adjacent to the light-emitting element 1, thereby forming a contact surface. When the insulating unit 40 contacts the light-emitting element 1, the insulating unit 40 will simultaneously contact the anode 1a and the cathode 1b of the light-emitting element 1. In this way, the light-emitting element 1 is detected by the entire insulating unit 40, eliminating the trouble of alignment, thus improving the efficiency of detection.

[0033] Furthermore, the insulating unit 40 completely covers the first detection part 21, the first recessed part 22, the second detection part 31, and the second recessed part 32. Of course, the insulating unit 40 may also cover the first connecting part 23 and the second connecting part 33. In more detail, when detecting the light-emitting element 1, the insulating unit 40 will simultaneously contact the entire anode detection unit 20, the cathode detection unit 30, and the anode 1a and cathode 1b of the light-emitting element 1 for detection.

[0034] The number of light-emitting elements 1 is multiple. The multiple light-emitting elements 1 are arranged in an array on a carrier plate 200, such that the first insulating layer 41 can contact the anode 1a of the multiple light-emitting elements 1, and the second insulating layer 42 can contact the cathode 1b of the multiple light-emitting elements 1.

[0035] In this embodiment, a plurality of light-emitting elements 1 are respectively disposed on a plurality of bases 1c, and the plurality of bases 1c all have the characteristic of being conductive.

[0036] Based on the above technical features, this application includes the following technical characteristics:

[0037] 1. This application detects the light-emitting element 1 over a large area through the anode detection unit 20, the cathode detection unit 30 and the insulation unit 40, thereby achieving high detection efficiency.

[0038] Second, on the other hand, the insulating unit 40 of this application only needs to be aligned with the anode 1a and cathode 1b of the light-emitting element 1 to perform detection, which can further improve the accuracy of detection.

[0039] Third, the insulating unit 40 of this application is an insulating material with soft properties. In this way, the insulating unit 40 provides a buffer between the detection unit and the light-emitting element 1, so that the light-emitting element 1 is not easily damaged due to contact.

[0040] Fourth, in another embodiment of this application, since the insulating unit 40 is similar to a plane, during detection, the insulating unit 40 can fully contact the anode 1a and cathode 1b of the light-emitting element 1, thereby eliminating the trouble of alignment and further increasing the detection efficiency.

[0041] The foregoing effects do not preclude the existence of other effects. Effects that can be derived by those skilled in the art from the description, claims, or drawings are also included in the effects of this application. Therefore, the effects of this application are not limited to those listed above.

[0042] The above-described embodiments are only used to illustrate this application and are not intended to limit the scope of this application. All modifications or changes made without departing from the spirit of this application are within the scope of protection intended by this application. [Simplified Explanation of the Diagram]

[0013] Figure 1 is a perspective view of a semi-contact detection device according to an embodiment of this application, particularly showing the appearance of the semi-contact detection device. Figure 2 is a bottom view of a semi-contact detection device according to an embodiment of this application, particularly showing the features of the anode detection unit and the cathode detection unit. Figures 3 and 4 are schematic diagrams (a) and (b) of a semi-contact detection device according to an embodiment of this application, respectively, particularly showing the contact between the semi-contact detection device and the light-emitting element. Figure 5 is a cross-sectional view of Figure 4 along section line AA. Figure 6 is a circuit diagram of a semi-contact detection device according to an embodiment of this application. Figure 7 is a perspective view of a semi-contact detection device according to another embodiment of this application, particularly showing the simultaneous contact of the insulating unit with the anode detection unit and the cathode detection unit.

Claims

1. A contact-sensing detection device for detecting a micro light-emitting element, the contact-sensing detection device comprising: a light-transmitting substrate disposed opposite to the micro light-emitting element; an anode detection unit disposed corresponding to the anode of the micro light-emitting element; a cathode detection unit disposed corresponding to the cathode of the micro light-emitting element, wherein the cathode detection unit and the anode detection unit are located on the same side of the substrate; and an insulating unit disposed on the side of the anode detection unit and the cathode detection unit adjacent to the micro light-emitting element, the insulating unit having a first insulating layer and a second insulating layer, the first insulating layer being disposed on the side of the anode detection unit adjacent to the micro light-emitting element, and the second insulating layer being disposed on the side of the cathode detection unit adjacent to the micro light-emitting element; when the insulating unit contacts the micro light-emitting element, the first insulating layer contacts the anode of the micro light-emitting element, and the second insulating layer contacts the cathode of the micro light-emitting element, thereby detecting the micro light-emitting element.

2. The contact-sensing detection device as described in claim 1, wherein, The anode detection unit has a first detection section and a first recessed section, and the cathode detection unit has a second detection section and a second recessed section. The first detection section extends and is adjacent to the second recessed section, and the second detection section extends and is adjacent to the first recessed section, so that the first detection section and the second detection section are arranged in an alternating manner.

3. The contact-sensing detection device as described in claim 2, wherein, The first detection section and the second detection section are each in the shape of a strip, and the first detection section and the second detection section are arranged on the substrate.

4. The contact-sensing detection device as described in claim 3, wherein, The anode detection unit has a first connection portion, and the cathode detection unit has a second connection portion. The number of the first detection portions and the number of the second detection portions are both multiple. The first detection portions are connected to the same side of the first connection portion, and the second detection portions are connected to the same side of the second connection portion, so that the first detection portions and the second detection portions are arranged in an array.

5. The contact-sensing detection device as described in claim 4, wherein, The number of micro-light-emitting elements is multiple, and these micro-light-emitting elements are arranged in an array on a carrier plate, so that the first insulating layer can contact the anode of these micro-light-emitting elements, and the second insulating layer can contact the cathode of these micro-light-emitting elements.

6. The contact-sensing detection device as described in claim 4, wherein, The insulating unit is made of a flexible insulating material.

Citation Information

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