A test pin holder structure

TWI942187BActive Publication Date: 2026-10-11WUXI AIFANG XINDONG AUTOMATION EQUIPMENT CO LTD
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Patent Information

Application Number
TW114108815
Authority / Receiving Office
TW · TW
Patent Type
Patents
Current Assignee / Owner
Filing Date
2025-03-10
Publication Date
2026-10-11
Estimated Expiration
2045-03-09

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    Figure TWG2TB001915364_003
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Abstract

A test pin holder structure includes: a base, a plurality of insulating support units, a plurality of spring pins, and a plurality of fixing members. The base is made of metal and has a plurality of pin holder slots distributed thereon. The insulating support units are disposed in the corresponding pin holder slots. Each set of spring pins is confined and fixed within the insulating support unit, with only the pin ends of the spring pins exposed through the surfaces at both ends of the insulating support unit. Several fixing members are locked to the base, fixing the insulating support units to the base. This structure will not deform under long-term use, and is convenient and quick to repair or modify.
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Claims

1. A test pin holder structure, comprising: A base, made of metal, has a plurality of needle seat grooves, each forming a through-hole in the base. The axial diameters of the needle seat grooves are not the same, and each end of the needle seat groove has a first hole and a second hole, with the diameter of the first hole being larger than that of the second hole. Several insulating support units are disposed within the needle seat grooves, allowing the insulating support units to enter the needle seat grooves only through the first hole and preventing them from leaving the needle seat grooves through the second hole. Several spring needles are confined and fixed within the insulating support units, with only the needle bodies at both ends of the spring needles exposed through the surfaces at both ends of the insulating support units. Several fasteners are also included, locking the insulating support units to the base.

2. As described in claim 1, the test pin holder structure, wherein the insulating bearing unit includes a first limiting member and a second limiting member, the first limiting member having a plurality of first pin slots, and the second limiting member having a plurality of second pin slots, wherein the shape of the first limiting member and the second limiting member after engagement is the same as the shape of the pin holder slot and is disposed within the pin holder slot, the first pin slot and the second pin slot having a stepped hole shape, and the space formed after engagement corresponds to the shape of the spring pin, thereby restricting the body of the spring pin within the space and allowing only the pin bodies at both ends to extend out.

3. As described in claim 2, the test pin holder structure has a stepped shape at one end of the first limiting member and the second limiting member, with the first limiting member having a first stepped edge and the second limiting member having a second stepped edge. The fixing member is a screw with a T-shaped cross-section. When the fixing member is locked to the base, the top end of the fixing member is engaged with the first stepped edge, thereby fixing the insulating bearing unit to the base.

4. A test pin holder structure as described in claim 3, wherein each pin holder slot is secured by two fasteners on opposite sides, respectively locked to both sides of the insulating bearing unit.

5. A test pin holder structure as described in claim 1, wherein the base is made of aluminum or an aluminum alloy.

6. A test pin holder structure as described in claim 1, wherein the pin holder slots are arranged in a pattern array on the base.

7. A test pin holder structure as described in claim 1, the base having a first surface and a second surface positioned opposite each other, and a sealing ring provided on both the first surface and the second surface, the sealing ring surrounding a plurality of areas where the pin holder grooves are located.

8. A test pin holder structure as described in claim 7, wherein the base forms a large-area first recessed area on the first surface and a large-area second recessed area on the second surface, and a plurality of pin holder grooves are distributed between the first recessed area and the second recessed area.

9. A test pin holder structure as described in claim 8, wherein the fastener is locked in the first recessed area on the base, and the locked position does not protrude from the first surface.

Citation Information

Patent Citations

  • Test socket and method for fabricating the same

    US20220413008A1