Device testing apparatus, method, electronic device, and computer-readable storage medium

Abstract

This invention proposes a device testing apparatus, method, electronic device, and computer-readable recording medium. The device testing apparatus includes a processing module, a production line module, and an NFC detection module. A target device is placed on the production line module. The processing module is connected to both the NFC detection module and the target device. The NFC detection module is positioned opposite the production line module. By positioning the NFC detection module relative to the production line module, the target device can be directly tested on the production line without movement, saving testing time. Furthermore, the combination of the NFC detection module and the processing module enables automated testing of the NFC module, further reducing reliance on manual labor and saving labor costs.

Description

Technical Field

[0001] This invention relates to the field of equipment testing, and more particularly to an equipment testing apparatus, method, electronic device, and computer-readable recording medium. Prior Technology

[0002] Currently, the functional testing of NFC (Near Field Communication) for wearable devices, such as watches, is often carried out manually by taking the target device from the production line and placing it into a test fixture for testing. After the test is completed, the target device is removed from the test fixture manually. However, due to issues such as the reaction speed and operational efficiency of the staff, the manual functional testing method has the problem of long testing time in practical applications, and also increases labor costs. Summary of the Invention

[0003] The main objective of this invention is to provide a device testing apparatus, method, electronic device, and computer-readable recording medium, aiming to solve the problems of long testing time and high labor costs in the prior art for NFC function testing.

[0004] To achieve the above objectives, the present invention provides a device testing apparatus, comprising a processing module, a production line module, and an NFC detection module; a target device is placed on the production line module, the processing module is connected to both the NFC detection module and the target device, and the NFC detection module is positioned opposite to the production line module; wherein: the production line module is used to move the target device, and when the target device moves to a position opposite the NFC detection module, it can transmit NFC information with the NFC detection module; the NFC detection module is used to transmit NFC information with the target device; the processing module is used to acquire test data generated during the NFC information transmission between the target device and the NFC detection module, and to test the NFC module of the target device based on the test data.

[0005] Optionally, the NFC detection module includes a signal generating unit and a signal listening unit; the signal generating unit and the signal listening unit are respectively disposed opposite to the production line module, and the signal generating unit and the signal listening unit are respectively connected to the processing module; wherein: when the target device moves to be opposite the signal generating unit, it can transmit NFC information with the signal generating unit; when the target device moves to be opposite the signal listening unit, it can transmit NFC information with the signal listening unit; the signal generating unit is used to send a first test signal so that the target device generates first test data after receiving the first test signal; the signal listening unit is used to detect the second test signal sent by the target device and generate second test data; the processing module is used to test the NFC module of the target device according to the first test data and the second test data.

[0006] Optionally, the production line module includes a conveyor belt unit, an equipment carrier, and a position control unit; the target device is placed on the equipment carrier, the equipment carrier is positioned on the conveyor belt unit, and the position control unit is positioned below the conveyor belt unit; wherein: the conveyor belt unit is used to move the equipment carrier; the position control unit is used to control the equipment carrier to be in a transmission position when the equipment carrier is opposite to the NFC detection module, wherein, in the transmission position, the distance between the target device and the NFC detection module is less than a preset transmission distance.

[0007] Optionally, the number of target devices is multiple, and the signal generating unit includes a signal generating device and multiple polling antennas; the signal generating device is connected to each polling antenna, wherein: when each target device is located at the transmission position corresponding to each polling antenna, the second distance is greater than a preset multiple of the first distance, wherein the first distance is the vertical distance between the polling antenna and the NFC antenna of the target device, and the second distance is the distance between adjacent target devices; the signal generating device is used to generate a first test signal and broadcast the first test signal through the polling antenna.

[0008] Optionally, the number of target devices is multiple, and the signal listening unit includes a signal receiving device and multiple listening antennas. The signal receiving device is connected to each listening antenna. When each target device is located at the transmission position corresponding to each listening antenna, the fourth distance is greater than a preset multiple of the third distance. The third distance is the vertical distance between the listening antenna and the NFC antenna of the target device, and the fourth distance is the distance between adjacent target devices. The signal receiving device is used to acquire the second test data obtained by the listening antenna receiving the second test signal, and send the second test data to the processing module.

[0009] Optionally, the position control unit includes a blocking lifting cylinder; wherein: the blocking lifting cylinder is used to move the device carrier in a direction relative to the NFC detection module.

[0010] Optionally, the conveyor unit includes a main conveyor belt, a defective conveyor belt, and a drive device; the main conveyor belt and the defective conveyor belt are respectively connected to the drive device; the production line module also includes a blocking cylinder and a side-push cylinder, the blocking cylinder is located below the main conveyor belt and in front of the NFC detection module, and the side-push cylinder is located below the main conveyor belt and correspondingly located to the NFC detection module; wherein: the drive device is used to drive the main conveyor belt and the defective conveyor belt to move; the blocking cylinder is used to prevent new target devices from flowing to the transmission position when testing the NFC module of the target device; the side-push cylinder is used to push the target device into the defective conveyor belt when it is determined that the target device is unqualified.

[0011] To achieve the above objectives, the present invention also provides a device testing method, which is applied to the device testing apparatus described above; wherein: the position of the target device on the production line module is determined; when the target device moves to a position opposite the NFC detection module, the target device is controlled to transmit NFC information with the NFC detection module to obtain test data; and the NFC module of the target device is tested based on the test data.

[0012] Optionally, the NFC detection module includes a signal generating unit and a signal listening unit; when the target device moves to be opposite the NFC detection module, the target device is controlled to transmit NFC information with the NFC detection module to obtain test data, including: when the target device moves to be opposite the signal generating unit, the target device is set to analog card mode; the signal generating unit is controlled to send a first test signal to obtain first test data obtained by the target device receiving the first test signal; when the target device moves to be opposite the signal listening unit, the target device is set to read / write card mode; the target device is controlled to send a second test signal to obtain second test data obtained by the signal listening unit receiving the second test signal; and the NFC module of the target device is tested according to the first test data and the second test data.

[0013] Optionally, after testing the NFC module of the target device according to the test data, the process includes: obtaining the test results of the NFC module of the target device; determining whether the target device is unqualified based on the test results; and if the target device is unqualified, controlling the side-push cylinder to push the target device into the defective product conveyor belt.

[0014] To achieve the above objectives, the present invention also provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, it implements the steps of the device testing method described above.

[0015] To achieve the above objectives, the present invention also provides a computer-readable recording medium storing a computer program, which, when executed by a processor, implements the steps of the device testing method described above.

[0016] This invention proposes a device testing apparatus, method, electronic device, and computer-readable recording medium. The device testing apparatus includes a processing module, a production line module, and an NFC detection module. A target device is placed on the production line module. The processing module is connected to both the NFC detection module and the target device. The NFC detection module is positioned opposite to the production line module. The production line module moves the target device, enabling NFC information transmission when it is positioned opposite the NFC detection module. The NFC detection module transmits NFC information with the target device. The processing module acquires test data generated during NFC information transmission between the target device and the NFC detection module, and tests the NFC module of the target device based on this data. By positioning the NFC detection module relative to the production line module, the target device can be tested directly on the production line without movement, saving testing time. Furthermore, the combination of the NFC detection module and the processing module enables automated testing of the NFC module, further reducing reliance on manual labor and saving labor costs. Simple Explanation of the Diagram

[0017] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0018] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Figure 1 is a module structure diagram of the testing device of the present invention; Figure 2 is a schematic diagram of the overall structure of the testing device of the present invention; Figure 3 is a schematic diagram of the tuning circuit of the testing device of the present invention; and Figure 4 is a module structure diagram of the electronic device of the present invention. Implementation

[0019] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of this application.

[0020] This invention provides a device testing apparatus. Referring to Figure 1, which is a module structure diagram of the device testing apparatus of this invention, the device testing apparatus includes a processing module 100, a production line module 200, and an NFC detection module 300; a target device 400 is placed on the production line module 200, the processing module 100 is connected to the NFC detection module 300 and the target device 400 respectively, and the NFC detection module 300 is arranged opposite to the production line module 200; wherein:

[0021] The assembly line module 200 is used to move the target device 400. When the target device 400 moves to a position opposite the NFC detection module 300, it can transmit NFC information with the NFC detection module 300.

[0022] The NFC detection module 300 is used to transmit NFC information with the target device 400;

[0023] The processing module 100 is used to acquire test data generated when the target device 400 and the NFC detection module 300 transmit NFC information, and to test the NFC module of the target device 400 based on the test data.

[0024] The target device 400 is a device equipped with an NFC module that needs to be tested. The target device 400 includes, but is not limited to, wearable devices such as mobile phones, tablets, smartwatches, earphones, and smart bracelets.

[0025] The NFC detection module 300 interacts with the target device 400 to exchange information related to the NFC module function, thereby obtaining test data reflecting the NFC function of the target device 400. It is understood that, based on different projects that require testing, the NFC detection module 300 can be configured accordingly to meet different types of test items.

[0026] The processing module 100 contains a test strategy for the NFC module of the target device 400. After acquiring the test data, the module uses the test strategy to determine whether the NFC function of the target device 400 corresponding to the test data is qualified. The specific test strategy can be set based on the actual test requirements; for example, all sub-strategies corresponding to the executable test items can be pre-stored. Before testing the target device 400, the operator can select the project to be tested and generate a specific test strategy based on the sub-strategy corresponding to the selected test item.

[0027] The assembly line module 200 moves the target device 400. It is understood that during production and testing, the target device 400 is transferred between different workstations via the assembly line. Generally, after arriving at a workstation, it needs to be transferred to that workstation to perform relevant processes. In this embodiment, the assembly line module 200 and the NFC detection module 300 are positioned opposite each other. Simultaneously, when the target device 400 moves on the assembly line module 200, it can transmit information with the NFC detection module 300, thus enabling testing of the NFC module of the target device 400. That is, in this embodiment, the target device 400 can be tested directly on the assembly line without needing to be transferred to a workstation, reducing labor costs. Furthermore, it eliminates the need for other transfer devices, such as robotic arms, saving equipment investment. Moreover, by eliminating the transfer step, the target device 400 can begin testing immediately after reaching the position relative to the NFC detection module 300, reducing testing time and improving testing efficiency.

[0028] In this embodiment, by setting the NFC detection module 300 relative to the production line module 200, the target device 400 can directly test the NFC module on the production line without moving it, saving testing time. At the same time, setting the NFC detection module 300 and the processing module 100 can realize automated testing of the NFC module, further reducing the reliance on manual labor and saving labor costs.

[0029] Further, referring to Figure 2, the NFC detection module 300 includes a signal generating unit and a signal listening unit; the signal generating unit and the signal listening unit are respectively disposed opposite to the pipeline module 200, and the signal generating unit and the signal listening unit are respectively connected to the processing module 100; wherein:

[0030] When the target device 400 moves to a position opposite the signal generating unit, it is able to transmit NFC information with the signal generating unit.

[0031] When the target device 400 moves to a position opposite the signal listening unit, it is able to transmit NFC information with the signal listening unit.

[0032] The signal generating unit is used to send a first test signal so that the target device 400 generates first test data after receiving the first test signal;

[0033] The signal listening unit is used to detect the second test signal sent by the target device 400 and generate second test data;

[0034] The processing module 100 is used to test the NFC module of the target device 400 according to the first test data and the second test data.

[0035] Understandably, the NFC module can implement both analog card mode and read / write card mode. In analog card mode, the NFC of the target device 400 is analogized to an NFC card, passively responding to signals from an external radio frequency field to achieve reading / writing. In read / write card mode, the NFC of the target device 400 generates a radio frequency field and actively sends signals to the NFC card in the radio frequency field to achieve reading / writing of the NFC card.

[0036] To enable the detection of analog card mode and read / write card mode, this embodiment includes a signal generation unit and a signal listening unit.

[0037] The signal generating unit is set for the analog card mode of the NFC module. The signal generating unit outputs a first test signal, the NFC module of the target device 400 receives the first test signal, and generates first test data based on the actual reception. The processing module 100 then performs the test on the analog card mode of the NFC module based on the first test data.

[0038] The signal listening unit is configured for the read / write card mode of the NFC module. The NFC module of the target device 400 outputs a second test signal, the signal listening unit receives the second test signal, and generates second test data based on the actual reception. The processing module 100 then performs the test on the read / write card mode of the NFC module based on the second test data.

[0039] It should be noted that in practical applications, the NFC module of the target device 400 may only support analog card mode or read / write card mode. Therefore, the signal generation unit or signal listening unit can be set accordingly based on actual needs.

[0040] Further, the assembly line module 200 includes a conveyor belt unit, an equipment carrier 220, and a position control unit; the target device 400 is placed on the equipment carrier 220, the equipment carrier 220 is disposed on the conveyor belt unit, and the position control unit is disposed below the conveyor belt unit; wherein:

[0041] The conveyor belt unit is used to move the equipment carrier 220;

[0042] The position control unit is used to control the device carrier 220 to be in a transmission position when the device carrier 220 is opposite to the NFC detection module 300, wherein the distance between the target device 400 and the NFC detection module 300 is less than a preset transmission distance in the transmission position.

[0043] The device carrier 220 is used to carry the target device 400. Furthermore, in order to facilitate the establishment of a connection between the target device 400 and the processing module 100, the device carrier 220 can be connected to the processing module 100. At the same time, a connection device, such as a USB interface or electrical contacts, is provided on the device carrier 220 so that after the interface or contacts of the target device 400 are connected to the USB interface or electrical contacts on the device carrier 220, communication with the processing module 100 can be realized.

[0044] The equipment carrier 220 is mounted on the conveyor belt unit. When the conveyor belt unit moves, the equipment carrier 220 moves with the conveyor belt unit, thereby moving the target equipment 400.

[0045] It is understandable that when the NFC detection module 300 transmits information with the target device 400, it is necessary to ensure that the NFC detection module 300 and the target device 400 are in an effective transmission posture and distance. Therefore, in this embodiment, a position control unit is set so that after the target device 400 and the NFC detection module 300 are relative to each other, the device carrier 220 is moved and kept in the transmission position, so that the target device 400 and the NFC detection module 300 can transmit information at a distance less than the preset transmission distance, while ensuring the stability of the relative positional relationship between the two and improving the accuracy of the test.

[0046] The transmission position is the position where the NFC detection module 300 and the target device 400 can conduct stable information transmission. Generally, the transmission position can be set based on the position of the coil in the actual NFC detection module 300 and the position of the coil of the NFC module in the target device 400. When the target device 400 is in the transmission position, the central axis of the coil of the NFC detection module 300 and the coil of the NFC module in the target device 400 coincides, and the center distance is less than the preset transmission distance. The specific value of the preset transmission distance can be set based on actual needs.

[0047] Furthermore, the number of target devices 400 is multiple, and the signal generating unit includes a signal generating device 311 and a multiple polling antennas 312; the signal generating device 311 is connected to each of the polling antennas 312, wherein:

[0048] When each of the target devices 400 is located at the transmission position corresponding to each of the polling antennas 312, the second distance is greater than a preset multiple of the first distance, wherein the first distance is the vertical distance between the polling antenna 312 and the NFC antenna of the target device 400, and the second distance is the distance between adjacent target devices 400;

[0049] The signal generating device 311 is used to generate a first test signal and broadcast the first test signal through the polling antenna 312.

[0050] Signal generator 311 is used to generate a first test signal; signal generator 311 can be an NFC protocol signal generator; specifically, when testing the analog card mode of target device 400, processing module 100 can send the required test instructions to signal generator 311. After receiving the instructions, signal generator 311 generates a first test signal and sends the first test signal to polling antenna 312; polling antenna 312 is used to transmit the first test signal; specifically, signal generator 311 transmits a first test signal with a carrier frequency of 13.56MHz through polling antenna 312. The NFC antenna inside target device 400 couples to provide power to the NFC module in target device 400, and the NFC module in target device 400 is activated to respond to signal generator 311; signal generator 311 is configured according to ISO / IEC 14443. For Type A, Type B, FeliCa, and ISO15693 communication interface protocols, select the communication rate, such as 106kbps, 212kbps, or 424kbps. The modulated carrier information polls the target device 400. The NFC module of the target device 400 generates a subcarrier frequency Fc and responds with ASK encoding modulation according to the corresponding protocol and communication rate. The RF conformance test of the NFC module in analog card mode includes five aspects: transmission power, carrier frequency, waveform modulation, waveform quality, and no-load field strength. The protocol conformance test includes ASK modulation count, subcarrier modulation, communication distance test, and communication quality, return loss, resonant frequency, quality factor Q, and communication distance. The specific tests for different test items are explained below:

[0051] RF compliance testing:

[0052] Transmission power: The signal generator 311 transmits power to the polling antenna 312 to generate a stable, unmodulated radio frequency field. The signal generator 311, acting as a polling device, transmits carrier modulation via the polling antenna 312 based on a preset protocol. This preset protocol includes, but is not limited to, one or more of the ISO / IEC 14443 Type A, Type B, FeliCa, and ISO 15693 protocols. The output voltage range of the signal generator 311 is 0~15V. The output transmission power can be adjusted by regulating the output voltage of the signal generator 311. The processing module 100 monitors the output voltage of the first terminal, i.e., the transmitting voltage of the polling antenna 312, and simultaneously acquires the transmitting voltage of the antenna of the NFC module in the target device 400. The transmission power test is completed by comparing the transmitting voltage of the polling antenna 312 with the transmitting voltage of the NFC module's antenna.

[0053] Carrier frequency: The signal generator 311 outputs a 13.56MHz unmodulated sine wave signal to the polling antenna 312. The processing module 100, with its built-in FPGA (Field Programmable Gate Array) frequency measurement module, uses a high-speed ADC to sample the voltage signal, triggering a pulse at port J2. It continuously captures 400µs of the unmodulated waveform, obtains the average frequency of the unmodulated waveform, and determines the standard frequency based on the average frequency. Furthermore, it analyzes the harmonic content of the carrier frequency using Fourier transform to ensure that the carrier frequency meets the requirements. Specifically, the closer the carrier frequency is to the 13.56MHz center point frequency, the higher the quality. The target device 400's NFC responds to the polling antenna 312, generating an 848kHz subcarrier. The polling antenna 312 receives the response signal, and the processing module 100 samples it at high speed, demodulates the subcarrier information in the response signal, and determines whether the subcarrier frequency is within the 848kHz range. If it is within the 848kHz range, the carrier frequency is qualified.

[0054] Waveform Modulation: The signal generator 311 outputs an ASK carrier modulation signal through the polling antenna 312 based on a preset protocol. The phase of the ASK carrier modulation signal increases in increments of 10 degrees, starting from 0 degrees, until it reaches 180 degrees. The processing module 100 continuously captures the modulation waveform received by the NFC of the target device 400 for 40µs. After filtering out the 13.56MHz carrier, the entire waveform is analyzed to ensure that the received signal envelope time meets the requirements. For example, if the signal envelope is V, V1 is the initial value before modulation, V2=0.05V1, V3=0.6V1, and V4=0.9V1; where V4 falling to V2 is the falling edge of the envelope, and V2 rising to V4 is the rising edge of the envelope. The rising edge is kept below 400ns, and the falling edge is kept below 600ns. The quality of waveform modulation is measured by the envelope time, the amplitude of the modulation waveform, and the phase.

[0055] Waveform quality: The 13.56MHz unmodulated sine wave signal output by the signal generator 311 is sent to the polling antenna 312. The FPGA frequency measurement module built into the processing module 100 detects the pulse trigger of the processing module 100 and continuously captures 400us of unmodulated waveform. The NFC standard requires the carrier to be a standard sine wave, free of glitches, harmonics, or noise. The processing module 100 uses Fourier transform to analyze the carrier frequency harmonic content and the distortion rate of the sine wave of the unmodulated waveform. The waveform quality is determined based on the harmonic content and the distortion rate of the sine wave. It can be understood that the smaller the distortion rate of the sine wave, the higher the waveform quality; the lower the harmonic content, the higher the waveform quality.

[0056] No-load field strength: when the polling antenna 312 generates an unmodulated radio frequency field, place an ISO standard PICC coil vertically 3cm above the center of the polling antenna 312, the processing module 100 performs sampling through edge triggering to obtain a continuous 10us unmodulated waveform, measures the voltage peak-to-peak value of this segment of unmodulated waveform, and divides the voltage peak-to-peak value by 0.9 to obtain the no-load field strength;

[0057] Protocol conformance test:

[0058] ASK modulation index: the signal generating device 311 performs ASK modulation with different amplitudes for different preset protocols respectively, specifically, ISO / IEC 14443 Type A corresponds to 100% ASK modulation, ISO / IEC 14443 Type B corresponds to 10% ASK modulation, ISO 15693 corresponds to 10% ASK modulation, and FeliCa corresponds to 8~30% ASK modulation; the processing module 100 continuously captures the 40us modulated waveform received by the NFC of the target device 400, performs full waveform analysis on the intercepted waveform, so that the envelope time of the received signal meets the requirements; if the signal envelope is V, V5 is the initial value before modulation, V6=0.05V5, V7=0.5V5, V8=0.8V5, wherein, when V8 drops to V6 it is the envelope falling edge, and when V6 rises to V8 it is the envelope rising edge, the rising edge is kept below 400ns, and the falling edge is kept below 600ns; after filtering the waveform, the processing module 100 demodulates the ASK modulation index according to the decoding rules of the corresponding protocol, and judges whether the ASK modulation index meets the qualification conditions according to the amplitude, phase, time, frequency and other parameters in the ASK modulation index;

[0059] Subcarrier modulation: the processing module 100 transmits polling radio frequency electromagnetic signals through the polling antenna 312, the NFC of the target device 400 responds to the polling antenna 312 and generates a 848kHz subcarrier, the polling antenna 312 receives the response signal, and the processing module 100 demodulates the response signal and detects whether the subcarrier frequency meets the qualification conditions;

[0060] Communication distance and communication quality: control the action of the blocking jacking cylinder 231, so that the distance between the plane where the antenna of the NFC module is located and the plane where the polling antenna 312 is located starts from 10cm, and decreases step by step with a step of 0.5cm until it reaches 1cm, so as to obtain a plurality of detection distances; for each detection distance, the processing unit determines the communication quality corresponding to the detection distance by detecting transmission power, carrier frequency, waveform modulation, waveform quality, no-load field strength, waveform rising edge time, waveform falling edge time, frame detection delay time, frame response time and other parameters, when the communication quality corresponding to all detection distances meets the quality requirements corresponding to the detection distances, the communication distance detection is qualified;

[0061] Return loss, quality factor, and resonant frequency testing: Processing module 100 transmits unmodulated sine waves starting from a carrier frequency of 12MHz, increasing in steps of 10Hz up to 16MHz. The peak-to-peak voltage of the carrier received by the target device 400's NFC is obtained, and the frequency point corresponding to the maximum peak-to-peak voltage is recorded, i.e., the resonant frequency point. The quality factor is:

[0062] Where Zeq1 is the resonant impedance, w is the peak-to-peak value calculated, and Ct is the resonant point after coupling of the polling antenna 312; since the inductance, capacitance, and quality factor of the polling antenna 312 are fixed values, they can be measured in advance using an LCR digital bridge instrument, thus the return loss, quality factor, resonant frequency, and frequency bandwidth of the NFC antenna in the target device 400 (less than -10dB) can be calculated.

[0063] In this embodiment, multiple polling antennas 312 are configured to simultaneously test multiple target devices 400 in analog card mode, thereby improving testing efficiency. Furthermore, in this embodiment, the multiple polling antennas 312 receive the first test signal output by the same signal generator 311, resulting in better consistency between the signals transmitted by the antennas. Compared to the scheme using multiple signal generators 311, this significantly reduces co-channel interference and also reduces investment in testing equipment.

[0064] It is understandable that when multiple target devices 400 are tested simultaneously, interference will occur between them. Conversely, the greater the distance, the less interference occurs between the target devices 400. Therefore, this embodiment defines the first distance and the second distance; specifically, based on the empirical formula for near-field antenna testing:

[0065] Where R is the distance, l represents the maximum physical size of the antenna, and λ represents the electromagnetic wavelength (NFC carrier frequency 13.56MHz); the antenna input impedance is:

[0066] Where Zin is the input impedance, Vi is the wireless input signal voltage, Ii is the signal current, Rin is the resistive component, and Xin is the reactance component; the antenna radiated power Pr is:

[0067] Where k is the proportionality coefficient, I represents the time-varying current, L represents the antenna length, and Qc represents the charge. The electric charge acceleration is the radiated power of the antenna; therefore, the changes in voltage and current can represent the antenna's radiated power. The antenna's directivity D is:

[0068] Where θ is the angle relative to the horizontal plane, β is the angle relative to the vertical plane; Pr is the average radiated power of the antenna, M is the radiation intensity, r is the distance, and the antenna quality factor Q is:

[0069] The resonant frequency f is:

[0070] Where L is the equivalent inductance of the antenna, and C is the equivalent capacitance;

[0071] Substituting the distance L1 from the polling antenna 312 to the coil center of the NFC module of the target device 400 into the formula, we can see that when the second distance L2 > 2L1, the interference between adjacent antennas is relatively small. The farther apart the adjacent target devices 400 are, the smaller the interference. Therefore, the preset multiplier can be set to 2 or a value greater than 2.

[0072] Furthermore, the number of target devices 400 is multiple, and the signal listening unit includes a signal receiving device 321 and a multiple listening antennas 322, wherein the signal receiving device 321 is connected to each of the listening antennas 322, wherein:

[0073] When each of the target devices 400 is located at the transmission position corresponding to each of the listening antennas 322, the fourth distance is greater than a preset multiple of the third distance, wherein the third distance is the vertical distance between the listening antenna 322 and the NFC antenna of the target device 400, and the fourth distance is the distance between adjacent target devices 400;

[0074] The signal receiving device 321 is used to acquire the second test data obtained by the listening antenna 322 receiving the second test signal, and send the second test data to the processing module 100.

[0075] The signal receiving device 321 is used to receive second test data; the signal receiving device 321 can be an NFC protocol analyzer; specifically, when testing the card read / write mode of the target device 400, the processing module 100 can send the test-required instructions to the target device 400. After receiving the instructions, the target device 400 generates a second test signal and sends the second test signal to the listening antenna 322 through the NFC module; the listening antenna 322 receives the second test signal, obtains the second test data based on the actual received content, and sends the second test data to the signal receiving device 321; specifically, the target device 400 transmits a second test signal with a carrier frequency of 13.56MHz through the NFC antenna; the target device 400 uses ISO / IEC 14443 respectively. Type A, Type B, FeliCa, and ISO15693 communication interface protocols select communication rates such as 106kbps, 212kbps, and 424kbps. Modulation carrier information polls the target device 400, listens for the subcarrier frequency Fc generated by the NFC module, and responds with ASK encoding modulation according to the corresponding protocol and communication rate. RF conformance testing of the NFC module in analog card mode includes five aspects: transmission power, carrier frequency, waveform modulation, waveform quality, and no-load field strength. Protocol conformance testing includes ASK modulation count, load modulation amplitude and phase, communication distance testing, and communication quality, return loss, resonant frequency, quality factor Q, communication quality, communication distance, and working condition. The specific tests for different items are explained below:

[0076] Antenna input amplitude: The peak-to-peak voltage value of the fourth monitoring signal of the processing module 100, which is the antenna input amplitude;

[0077] Load modulation: The NFC module of the target device 400 provides an unmodulated radio frequency field, the processing module 100 listens to the load modulation signal received by the listening antenna 322, measures the peak-to-peak value of the load modulation signal, and completes the load modulation test;

[0078] Transmission power: The NFC module of the target device 400 transmits power to generate a stable, unmodulated radio frequency field in the listening antenna 322, which is in the operating domain; the processing module 100 uses edge triggering at the fourth terminal to capture a continuous 10µs unmodulated waveform and measures the root mean square voltage of this waveform to determine the transmission power characteristics of the NFC module of the target device 400;

[0079] Carrier frequency: The NFC module of the target device 400 outputs a 13.56MHz unmodulated sine wave signal, listens for the response signal from the antenna 322, and the FPGA frequency measurement module built into the processing module 100 detects the pulse trigger at the fourth terminal of the processing module 100 and continuously captures 400us of the unmodulated waveform to obtain the average frequency of the unmodulated waveform. Based on the average frequency, a standard frequency is determined. Furthermore, the harmonic content of the carrier frequency is analyzed through Fourier transform to ensure that the carrier frequency meets the requirements. Specifically, the closer the carrier frequency is to the 13.56MHz center point frequency, the higher the quality.

[0080] Waveform Modulation: The listening antenna 322 detects the modulation signal emitted by the NFC antenna. The processing module 100 continuously captures the modulation waveform for 20µs and performs full waveform analysis on the captured waveform to ensure that the envelope time of the received signal meets the requirements. For example, if the signal envelope is V, V9 is the initial value before modulation, V10=0.05V9, V11=0.6V9, and V12=0.9V9; where V12 falling to V10 is the falling edge of the envelope, and V10 rising to V12 is the rising edge of the envelope. The rising edge is kept below 400ns, and the falling edge is kept below 600ns. The quality of waveform modulation is measured by the envelope time and the amplitude of the modulation waveform.

[0081] Waveform Quality: The target device 400 outputs a 13.56MHz unmodulated sine wave signal from its NFC module. The listening antenna 322 responds to the signal. The processing module 100's built-in FPGA frequency measurement module detects the pulse trigger at the fourth terminal of the processing module 100 and continuously captures 400µs of the unmodulated waveform. The NFC standard requires the carrier wave to be a standard sine wave, free of glitches, harmonics, or noise. The processing module 100 uses Fourier transform to analyze the carrier frequency harmonic content and the sine wave distortion rate of the unmodulated waveform. Based on the harmonic content and the sine wave distortion rate, the waveform quality is determined. It can be understood that the lower the sine wave distortion rate, the higher the waveform quality; the lower the harmonic content, the higher the waveform quality.

[0082] No-load field strength: When the NFC antenna generates an unmodulated radio frequency field, the ISO standard PICC coil is placed vertically 3cm above the center of the listening antenna 322. The processing module 100 obtains a continuous 10µs unmodulated waveform through edge-triggered sampling. The peak-to-peak voltage of this unmodulated waveform is measured, and the peak-to-peak voltage is divided by 0.9 to obtain the no-load field strength.

[0083] Return loss, quality factor, and resonant frequency testing: The NFC module of target device 400 transmits unmodulated sine waves starting from a carrier frequency of 12MHz, increasing in steps of 10Hz up to 16MHz. Processing module 100 acquires the peak-to-peak voltage of the carrier received by listening antenna 322 and records the frequency point corresponding to the maximum peak-to-peak voltage, i.e., the resonant frequency point; the quality factor is:

[0084] Communication distance: Control the cylinder 380 in the Y direction to move so that the distance between the NFC antenna and the plane where the listening and interrogating antenna is located starts from 4cm and decreases in increments of 0.5cm until it reaches 1cm to obtain a plurality of detection distances; For each detection distance, the processing module 100 determines the communication quality corresponding to the detection distance by detecting transmission power, carrier frequency, waveform modulation, waveform quality, no-load field strength, waveform rise time, waveform fall time, time detection delay time, and detection response time. When the communication quality corresponding to all detection distances meets the quality requirements corresponding to the detection distance, the communication distance detection is qualified.

[0085] In this embodiment, multiple listening antennas 322 are set up so that the card reading and writing modes of multiple target devices 400 can be tested simultaneously to improve testing efficiency. At the same time, in this embodiment, multiple listening antennas 322 output a second test signal to the same signal receiving device 321, which makes the consistency between the received signals better. Compared with the scheme of multiple signal receiving devices 321, it can significantly reduce co-channel interference and reduce the investment in test equipment.

[0086] The third and fourth distances can be set analogously to the first and second distances mentioned above, and will not be elaborated further.

[0087] It is understandable that the antenna impedances of the NFC modules of different target devices 400 are different, and during testing, an antenna matching the antenna impedance of the NFC module needs to be used for testing; therefore, tuning circuits can be set between the signal generating device 311 and the polling antenna 312, and between the signal receiving device 321 and the listening antenna 322; taking the signal generating device 311 as an example; referring to Figure 3, the tuning circuit includes a first switch S1, a second switch S2, a third switch S3, a first capacitor C1, a second capacitor C2, a third capacitor C3, a first resistor R1, and a second resistor R2; wherein, the first switch S1 of the signal generating device 311 is ... The first terminal of the first capacitor C1 is connected to the first terminal of the first capacitor C1. The second terminal of the first capacitor C1 is connected to the second terminal of the signal generating device 311 in sequence through the first switch S1 and the second capacitor C2. The second terminal of the first capacitor C1 is also connected to the second terminal of the signal generating device 311 in sequence through the second switch S2 and the first resistor R1. The second terminal of the first capacitor C1 is also connected to the first terminal of the second resistor R2. The second terminal of the second resistor R2 is connected to the first terminal of the polling antenna 312. The second terminal of the polling antenna 312 is connected to the second terminal of the signal generating device 311. The third capacitor C3 is connected in parallel with the polling antenna 312. The third switch S3 is connected in parallel with the second resistor R2.

[0088] Where RL is the equivalent resistance of the antenna, CL is the equivalent capacitance of the antenna, and LL is the equivalent inductance of the antenna.

[0089] When setting the tuning circuit, the signal receiving device 321 and the listening antenna 322 can adopt the same structure as described above, except that the signal generating device 311 is replaced by the signal receiving device 321 and the polling antenna 312 is replaced by the listening antenna 322.

[0090] Poynting's theorem explains the law of conservation of energy in electromagnetic fields. In isotropic linear media, the direction of the energy density of electric and magnetic fields represents the direction of electromagnetic energy transfer, and the magnitude of the energy density represents the electromagnetic energy flowing through a unit area perpendicular to it per unit time. This energy density is expressed as:

[0091] Where S is the Poynting vector, E is the electric field strength, and H is the magnetic field strength; based on the property that the electric field strength, magnetic field strength, and propagation direction of electromagnetic waves form a right-handed system, it can be determined that the energy density S of electromagnetic waves is always along the propagation direction of electromagnetic waves, that is, the propagation of energy is forward.

[0092] The mutual inductance M between the polling antenna 312 and the antenna of the NFC module of the target device 400 is:

[0093] Where R₁ is the antenna radius of the reader, R₂ is the antenna radius of the transponder, N₁ is the number of antenna coils of the reader, N₂ is the number of antenna coils of the transponder, and X represents the center distance of the antenna;

[0094] From Faraday's law of electromagnetic induction and Maxwell's equations, the voltage U₂ input to the chip can be obtained as:

[0095] Where R₂ can be considered as the internal resistance of the transponder antenna, which is usually relatively small, and RL is the input resistance of the transponder chip, which is usually relatively large. To improve coupling efficiency and ensure stable operation of the chip, a resonant capacitor needs to be added to the antenna end of the transponder. When the circuit is in a resonant state, the voltage U₂ input to the chip is:

[0096] The polling antenna 312 and the listening antenna 322 can adopt the PICC standard antenna recommended by the NFC Forum standard. The tuning circuit is matched with the impedance of the NFC antenna of the watch under test by controlling the first switch S1, the second switch S2 and the third switch S3.

[0097] Understandably, when the device testing apparatus operates in PCD mode, the carrier frequency is affected by the NFC of the target device 400. However, in PICC mode, when communicating with the polling antenna 312, the carrier frequency used for signal modulation needs to be determined entirely by the radio frequency of the electromagnetic field of the polling antenna 312. If the device testing apparatus operates in PICC mode, it needs to demodulate the signal sent from the polling antenna 312 and modulate the signal during the response.

[0098] The clock required for demodulation by the listening antenna 322 must maintain the same frequency as the radio frequency signal of the alternating electromagnetic field. When the listening antenna 322 modulates the signal, it needs to respond to the polling commands of the target device 400's NFC. At this time, the carrier frequency of the device in PICC mode when the listening antenna 322 modulates the data is also determined according to the carrier frequency of the target device 400's NFC, that is, the same frequency is used for signal modulation. The clock source that drives the listening antenna 322 to work is a clock of the same frequency extracted from the radio frequency signal of the target device 400's NFC. Considering that the signal on the target device 400's NFC radio frequency antenna is not continuous during the modulation and demodulation of the listening antenna 322, it is necessary to obtain a clock at a certain fixed frequency when there is no alternating electromagnetic field on the antenna. This fixed frequency value is the frequency of the signal before the alternating electromagnetic field disappears. It can be seen that during the pause of the Type A signal, there is no radio frequency signal or the radio frequency signal is extremely weak on the NFC antenna.

[0099] To extract the same-frequency signal and maintain it when the field disappears, this embodiment employs a combination of a functional module for frequency measurement and regeneration of the same-frequency signal using an NFC protocol signal generator and an NC protocol analyzer, along with hardware circuitry. The hardware circuitry primarily amplifies and limits the signal taken from the NFC antenna; the NFC protocol signal generator and NFC protocol analyzer primarily perform frequency locking based on the signal acquired from the hardware and continue generating the original frequency signal when the alternating electromagnetic field disappears.

[0100] Furthermore, the position control unit includes a blocking lifting cylinder 231; wherein:

[0101] The blocking lifting cylinder 231 is used to drive the device carrier 220 to move in the direction relative to the NFC detection module 300.

[0102] When the target device 400 is transferred to a position relative to the NFC detection module 300, the device carrier 220 is lifted off the conveyor belt by the blocking lifting cylinder 231. This reduces the impact of conveyor belt vibration on the test results and keeps the target device 400 in the transfer position. After the target device 400 has completed the test, the blocking lifting cylinder 231 descends and the device carrier 220 returns to the conveyor belt to move.

[0103] When setting up the blocking lifting cylinder 231, a blocking lifting cylinder 231 is set up for each polling antenna 312 and listening antenna 322; each blocking lifting cylinder 231 lifts the target device 400 to the transmission position of the corresponding polling antenna 312 when it rises.

[0104] If a simulated card test is performed first, followed by a read / write card test, then after receiving the test command, the processing module 100 establishes a communication connection with the target device 400 through the device carrier 220 and reads relevant information of the target device 400, such as serial number, software version, operating system version, and hardware version. After ensuring the correct version, the processing module 100 sends a command to the target device 400 to put the watch under test into analog card mode. When the target device 400 is transmitted to a position relative to the polling antenna 312, the blocking lifting cylinder 231 corresponding to the polling antenna 312 lifts the device carrier 220 off the conveyor belt and performs analog card testing. After the analog card test is completed, the blocking lifting cylinder 231 descends, and the processing module 100 sends a command to the target device 400 to put the watch under test into read / write card mode. Then the carrier returns to the conveyor belt and moves. When it moves to a position relative to the listening antenna 322, the blocking lifting cylinder 231 corresponding to the listening antenna 322 lifts the device carrier 220 off the conveyor belt and performs read / write card testing. After the read / write card test is completed, the blocking lifting cylinder 231 descends, and the device carrier 220 returns to the conveyor belt. It can then flow to the next workstation. In this embodiment, target devices 400 from different batches can perform analog card testing and read / write card testing at the same time; and target devices 400 from the same batch can perform analog card testing or read / write card testing at the same time; this avoids the situation in traditional solutions where the read / write card mode is idle and waiting during analog card testing, and the analog card mode is idle during read / write card testing, thus greatly improving testing efficiency.

[0105] It should be noted that each component in the production line module 200 can be controlled by setting a processing device, and simultaneously linked with the processing module 100, so that each component performs corresponding operations during the testing process of the target device 400; the specific control method can be set according to actual needs.

[0106] Further, the conveyor belt unit includes a main conveyor belt 211, a defective conveyor belt 212, and a driving device 213; the main conveyor belt 211 and the defective conveyor belt 212 are respectively connected to the driving device 213; the assembly line module 200 also includes a blocking cylinder 232 and a side-push cylinder 233, the blocking cylinder 232 is disposed below the main conveyor belt 211 and in front of the NFC detection module 300, and the side-push cylinder 233 is disposed below the main conveyor belt 211 and correspondingly disposed with respect to the NFC detection module 300; wherein:

[0107] The drive device 213 is used to drive the main conveyor belt 211 and the defective conveyor belt 212 for transmission.

[0108] The blocking cylinder 232 is used to prevent a new target device 400 from flowing to the transmission location when testing the NFC module of the target device 400;

[0109] The side-push cylinder 233 is used to push the target equipment 400 into the defective product conveyor belt 212 when it is determined that the target equipment 400 is unqualified.

[0110] The main conveyor belt 211 serves as the inflow device for the target device 400. Simultaneously, the target device 400 directly performs NFC module testing on the main conveyor belt 211. This means that if a target device 400 is currently being tested, a newly inflowing target device 400 could affect the device already under testing. Therefore, in this embodiment, a blocking cylinder 232 is provided. When a target device 400 is being tested, the blocking cylinder 232 rises, causing a blocking block to rise, thereby preventing new target devices 400 from flowing into the main conveyor belt 211. It can be understood that the inflow direction is the direction of the NFC detection module 300, and the blocking cylinder 232 is positioned in front of the NFC detection module 300. Therefore, when the blocking cylinder 232 rises, the newly inflowing target device 400 is blocked in front of the NFC detection module 300, thus preventing it from affecting the target device 400 currently being tested.

[0111] The main conveyor belt 211 serves as the primary conveyor belt for NFC module testing of the target device 400, connecting the preceding and following workstations. It is understood that when the NFC module test result is qualified, it can flow to the next workstation; however, when the NFC module test result is unqualified, it needs to be re-tested, scrapped, or subjected to other operations for unqualified products. Therefore, in this embodiment, a defective product conveyor belt 212 is set up to automatically separate qualified and unqualified target devices 400. The main conveyor belt 211 transports qualified target devices 400 to the next workstation, while the defective product conveyor belt 212 transports unqualified target devices 400 to the unqualified workstation.

[0112] In order to transfer the position of the target device 400 from the main conveyor belt 211 to the defective product conveyor belt 212, a side-push cylinder 233 is provided in this embodiment. When the test result of the target device 400 is unqualified, the side-push cylinder 233 is controlled to move to push the target device 400 from the main conveyor belt 211 to the defective product conveyor belt 212.

[0113] When setting the side-push cylinder 233, a side-push cylinder 233 is set for each polling antenna 312 and listening antenna 322; when the target device 400 fails the analog card test or the read / write card test, the side-push cylinder 233 at the corresponding position is controlled to push the target device 400 to the defective conveyor belt 212.

[0114] The conveyor belt unit may also include a display screen 214, which is connected to the drive device 213 and is used to display relevant test information and control the drive device 213.

[0115] The present invention also provides a device testing method, applied to the device testing apparatus as described above; the device testing method is applied to the device testing apparatus as described above; wherein:

[0116] Step S10: Determine the position of the target device on the production line module;

[0117] Step S20: When the target device moves to a position opposite the NFC detection module, control the target device to perform NFC information transmission with the NFC detection module to obtain test data;

[0118] Step S30: Test the NFC module of the target device according to the test data.

[0119] The position of the target device on the production line module can be detected by setting up responsive detection devices, such as sensors and vision detection.

[0120] The target devices are those equipped with NFC modules that require testing. Target devices include, but are not limited to, wearable devices such as mobile phones, tablets, smartwatches, earphones, and smart bracelets.

[0121] The NFC detection module interacts with the target device to exchange information related to the NFC module's functions, thereby obtaining test data reflecting the NFC functionality of the target device. It is understandable that, based on different projects requiring testing, the NFC detection module can be configured accordingly to meet different types of test items.

[0122] The processing module contains a test strategy for the NFC module of the target device. After acquiring the test data, the module determines whether the NFC function of the target device corresponding to the test data is qualified based on the test strategy. The specific test strategy can be set according to the actual test requirements; for example, all sub-strategies corresponding to the executable test items can be pre-stored. Before testing the target device, the staff can select the project to be tested, and generate a specific test strategy based on the sub-strategy corresponding to the selected test item.

[0123] The assembly line module moves the target device. Understandably, during production and testing, the target device is transferred between different workstations via the assembly line. Generally, after arriving at a workstation, it needs to be transferred to that workstation to perform relevant processes. In this embodiment, the assembly line module and the NFC detection module are positioned opposite each other. Simultaneously, when the target device moves on the assembly line module, it can transmit information with the NFC detection module, thus enabling testing of the target device's NFC module. That is, in this embodiment, the target device can be tested directly on the assembly line without needing to be transferred to a workstation, reducing labor costs. Furthermore, it eliminates the need for other transfer devices, such as robotic arms, saving on equipment investment. Moreover, by eliminating the transfer step, the target device can begin testing immediately upon reaching the position relative to the NFC detection module, reducing testing time and improving testing efficiency.

[0124] This embodiment sets up an NFC detection module relative to the production line module, enabling the target device to directly test the NFC module on the production line without moving it, thus saving testing time. At the same time, setting up an NFC detection module and a processing module enables automated testing of NFC modules, further reducing reliance on manual labor and saving labor costs.

[0125] Furthermore, the NFC detection module includes a signal generating unit and a signal listening unit; when the target device moves to a position opposite the NFC detection module, the target device is controlled to perform NFC information transmission with the NFC detection module to obtain test data including:

[0126] When the target device moves to a position opposite the signal generating unit, the target device is set to analog card mode;

[0127] The signal generating unit is controlled to send a first test signal to obtain first test data obtained by the target device upon receiving the first test signal;

[0128] When the target device moves to a position opposite the signal listening unit, the target device is set to read / write card mode;

[0129] The target device is controlled to send a second test signal to obtain second test data obtained by the signal listening unit upon receiving the second test signal;

[0130] The NFC module of the target device is tested based on the first test data and the second test data.

[0131] Understandably, NFC modules can implement both analog card mode and read / write card mode. In analog card mode, the target device's NFC is analogized to an NFC card, passively responding to signals from an external radio frequency field to be read / written. In read / write card mode, the target device's NFC generates a radio frequency field and actively sends signals to the NFC card within the radio frequency field to read / write the NFC card.

[0132] To enable the detection of analog card mode and read / write card mode, this embodiment includes a signal generation unit and a signal listening unit.

[0133] The signal generating unit is configured for the analog card mode of the NFC module. The signal generating unit outputs a first test signal, the NFC module of the target device receives the first test signal, and generates first test data based on the actual reception. The processing module then performs the test on the analog card mode of the NFC module based on the first test data.

[0134] The signal listening unit is configured for the NFC module's card reading / writing mode. The target device's NFC module outputs a second test signal, which the signal listening unit receives and generates second test data based on the actual reception. The processing module then uses the second test data to test the NFC module's card reading / writing mode.

[0135] It should be noted that in practical applications, the NFC module of the target device may only support analog card mode or read / write card mode. Therefore, tests for analog card mode or read / write card mode can be set according to actual needs.

[0136] Further, the step of testing the NFC module of the target device based on the test data includes:

[0137] Obtain the test results of the NFC module of the target device;

[0138] Based on the test results, determine whether the target device is unqualified;

[0139] If the target equipment is defective, the control side thrust cylinder pushes the target equipment into the defective product conveyor belt.

[0140] The main conveyor belt serves as the primary transport belt for NFC module testing of target devices, connecting the preceding and following workstations. It is understood that when the NFC module test result is qualified, it can flow to the next workstation; however, when the NFC module test result is unqualified, it needs to be re-tested, scrapped, or subjected to other operations for unqualified products. Therefore, in this embodiment, a defective conveyor belt is set up to achieve automatic separation of qualified and unqualified target devices. Qualified target devices are transported to the next workstation via the main conveyor belt, while unqualified target devices are transported to the unqualified workstation via the defective conveyor belt.

[0141] In order to transfer the target equipment from the main conveyor belt to the defective conveyor belt, a side-push cylinder is provided in this embodiment; when the test result of the target equipment is unqualified, the side-push cylinder is controlled to move to push the target equipment from the main conveyor belt to the defective conveyor belt.

[0142] When setting up the side-push cylinder, a side-push cylinder is set up for each polling antenna and listening antenna; when the target device fails the analog card test or the read / write card test, the side-push cylinder at the corresponding position is controlled to push the target device to the defective conveyor belt.

[0143] Referring to Figure 4, the electronic device may include components such as a communication module 10, a memory 20, and a processor 30 in its hardware structure. In the electronic device, the processor 30 is connected to both the memory 20 and the communication module 10. The memory 20 stores a computer program, which is executed by the processor 30. When the computer program is executed, it implements the steps of the above-described method embodiment.

[0144] The communication module 10 can connect to external communication devices via a network. The communication module 10 can receive requests from external communication devices, and can also send requests, instructions and information to the external communication devices. The external communication devices can be other electronic devices, servers or Internet of Things devices, such as televisions, etc.

[0145] Memory 20 can be used to store software programs and various data. Memory 20 may mainly include a program storage area and a data storage area. The program storage area may store the operating system, at least one application program required for a function (such as determining the position of a target device on a production line module), etc.; the data storage area may include a database, and may store data or information created based on system usage. In addition, memory 20 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk memory device, flash memory device, or other volatile solid-state memory device.

[0146] The processor 30 is the control center of the electronic device. It connects various parts of the electronic device via various interfaces and lines. By running or executing software programs and / or modules stored in the memory 20, and by calling data stored in the memory 20, it performs various functions and processes data, thereby providing overall monitoring of the electronic device. The processor 30 may include one or more processing units; optionally, the processor 30 may integrate an application processor and a modem processor. The application processor mainly handles the operating system, user interface, and applications, while the modem processor mainly handles wireless communication. It is understood that the modem processor may not be integrated into the processor 30.

[0147] Although not shown in Figure 4, the above-described electronic device may also include a circuit control module for connecting to a power source to ensure the normal operation of other components. Those skilled in the art will understand that the electronic device structure shown in Figure 4 does not constitute a limitation on the electronic device, and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0148] The present invention also proposes a computer-readable recording medium storing a computer program thereon. The computer-readable recording medium may be the memory 20 in the electronic device shown in Figure 4, or at least one of ROM (Read-Only Memory) / RAM (Random Access Memory), magnetic disk, and optical disk. The computer-readable recording medium includes several instructions to cause a terminal device with a processor (which may be a television, car, mobile phone, computer, server, terminal, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0149] In this invention, the terms "first," "second," "third," "fourth," and "fifth" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0150] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0151] Although embodiments of the present invention have been shown and described above, the scope of protection of the present invention is not limited thereto. It is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, and substitutions to the above embodiments within the scope of the present invention, and such changes, modifications, and substitutions should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

[0152] 100: Processing Module 200: Assembly Line Module 211: Main transmission belt 212: Defective conveyor belt 213: Drive unit 214: Display Screen 220: Equipment carrier 231: Blocking Lifting Cylinder 232: Blocking cylinder 233: Side-push cylinder 300: NFC detection module 311: Signal Generating Device 312: Polling Antenna 322: Listening Antenna 400: Target device C1~C3: First capacitor~Third capacitor S1~S3: First switch~Third switch R1~R3: First resistor~Second resistor

Claims

1. A device testing apparatus, characterized in that the device testing apparatus comprises a processing module, a production line module, and an NFC detection module; a target device is placed on the production line module, the processing module is connected to the NFC detection module and the target device respectively, and the NFC detection module is disposed opposite to the production line module; wherein: The production line module is used to move the target device. When the target device moves to a position opposite the NFC detection module, the target device on the production line module can transmit NFC information with the NFC detection module. The NFC detection module is used to transmit NFC information with the target device on the production line module. The processing module is used to acquire test data generated when the target device on the production line module transmits NFC information with the NFC detection module, and to test the NFC module of the target device based on the test data.

2. The device testing apparatus as described in claim 1, wherein the NFC detection module includes a signal generating unit and a signal listening unit; the signal generating unit and the signal listening unit are respectively disposed opposite to the production line module, and the signal generating unit and the signal listening unit are respectively connected to the processing module; wherein: When the target device moves to be opposite the signal generating unit, it can transmit NFC information with the signal generating unit; when the target device moves to be opposite the signal listening unit, it can transmit NFC information with the signal listening unit; the signal generating unit is used to send a first test signal so that the target device generates first test data after receiving the first test signal; the signal listening unit is used to detect a second test signal sent by the target device and generate second test data; and the processing module is used to test the NFC module of the target device according to the first test data and the second test data.

3. The equipment testing apparatus as claimed in claim 1, wherein the production line module includes a conveyor belt unit, an equipment carrier, and a position control unit; a target device is placed on the equipment carrier, the equipment carrier is disposed on the conveyor belt unit, and the position control unit is disposed below the conveyor belt unit; wherein: The conveyor belt unit is used to move the device carrier; and the position control unit is used to control the device carrier to be in a transmission position when the device carrier is opposite to the NFC detection module, wherein the distance between the target device and the NFC detection module is less than a preset transmission distance in the transmission position.

4. The device testing apparatus as described in claim 2 or 3, wherein the number of target devices is plurality of, and the signal generating unit includes a signal generating device and a plurality of polling antennas; the signal generating device is connected to each of the polling antennas, wherein: When each target device is located at the transmission position corresponding to each polling antenna, a second distance is greater than a preset multiple of a first distance, wherein the first distance is the vertical distance between the polling antenna and the NFC antenna of the target device, and the second distance is the distance between adjacent target devices; and the signal generating device is used to generate a first test signal and broadcast the first test signal through the polling antenna.

5. The device testing apparatus as claimed in claim 2, wherein the number of target devices is a plurality of those devices, and the signal listening unit includes a signal receiving device and a plurality of listening antennas, wherein the signal receiving device is connected to each of the listening antennas, wherein: When each target device is located at the transmission position corresponding to each listening antenna, a fourth distance is greater than a preset multiple of a third distance, wherein the third distance is the vertical distance between the listening antenna and the NFC antenna of the target device, and the fourth distance is the distance between adjacent target devices; and the signal receiving device is used to acquire a second test data obtained by the listening antenna receiving the second test signal, and send the second test data to the processing module.

6. The equipment testing apparatus as claimed in claim 3, wherein the position control unit includes a blocking lifting cylinder; wherein: The blocking lifting cylinder is used to move the device carrier in a direction relative to the NFC detection module.

7. The equipment testing apparatus as described in claim 3, wherein the conveyor belt unit includes a main conveyor belt, a secondary conveyor belt, and a driving device; the main conveyor belt and the secondary conveyor belt are respectively connected to the driving device; the production line module further includes a blocking cylinder and a side-push cylinder, the blocking cylinder being disposed below the main conveyor belt and in front of the NFC detection module, and the side-push cylinder being disposed below the main conveyor belt and correspondingly disposed to the NFC detection module; wherein: The drive unit is used to drive the main conveyor belt and the defective conveyor belt; the blocking cylinder is used to prevent a new target device from flowing to the transmission position when the NFC module of the target device is being tested; and the side-push cylinder is used to push the target device into the defective conveyor belt when it is determined that the target device is unqualified.

8. A device testing method, wherein the device testing method is applied to a device testing apparatus as described in any one of claims 1 to 7; wherein: The position of the target device on a production line module is determined; when the target device moves to a position opposite the NFC detection module, the target device on the production line module is controlled to transmit NFC information with the NFC detection module to obtain test data; and the NFC module of the target device is tested based on the test data.

9. The device testing method as described in claim 8, wherein the NFC detection module includes a signal generating unit and a signal listening unit; when the target device moves to a position opposite the NFC detection module, the target device is controlled to perform NFC information transmission with the NFC detection module, and the test data obtained includes: When the target device moves to a position opposite the signal generating unit, the target device is set to analog card mode; the signal generating unit is controlled to send a first test signal to obtain first test data obtained by the target device upon receiving the first test signal; when the target device moves to a position opposite the signal listening unit, the target device is set to read / write card mode; the target device is controlled to send a second test signal to obtain second test data obtained by the signal listening unit upon receiving the second test signal; and the NFC module of the target device is tested based on the first test data and the second test data.

10. The device testing method as described in claim 8, wherein after testing the NFC module of the target device based on the test data, the method includes: Obtain the test results of the NFC module of the target device; Based on the test results, determine whether the target equipment is unqualified; And if the target equipment is unqualified, the control side push cylinder pushes the target equipment into the primary product conveyor belt.

11. An electronic device, characterized in that the electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the device testing method as described in any one of claims 8 to 10.

12. A computer-readable recording medium, characterized in that a computer program is stored on the computer-readable recording medium, which, when executed by a processor, implements the steps of the device testing method as described in any one of claims 8 to 10.

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