Multi-channel measurement system

Abstract

A multi-channel measurement system for measuring a printed circuit board (PCB) includes a first fixture for placing and positioning the PCB, having M first probes corresponding to M first measurement points on the PCB; a first control device including A first connectors and a first control unit electrically connected to the A first connectors, wherein M of the A first connectors are electrically connected to the M first probes of the first fixture; a second fixture disposed at a relative position to the first fixture, having N second probes corresponding to N second measurement points on the PCB; and a second control device including B second connectors and a second control unit electrically connected to the B second connectors, wherein N of the B second connectors are electrically connected to the N second probes of the second fixture; when the first fixture and the second fixture are in relative contact, the M first probes of the first fixture are electrically connected to the M first measurement points on the PCB, and the N second probes of the second fixture are electrically connected to the N second measurement points on the PCB.

Claims

1. A multi-channel measurement system for measuring the high-frequency impedance of a printed circuit board, comprising: A first fixture for placing and positioning the printed circuit board, the first fixture having M first probes corresponding to M first measurement points of the printed circuit board; A first control device includes A first connectors and a first control unit electrically connected to the A first connectors, M of the A first connectors being electrically connected to the M first probes of the first fixture; a second fixture is disposed at a position opposite to the first fixture, the second fixture having N second probes corresponding to N second measurement points of the printed circuit board. A second control device includes B second connectors and a second control unit electrically connected to the B second connectors. N of the B second connectors are electrically connected to N second probes of a second fixture. When the first fixture and the second fixture are in relative contact, M first probes of the first fixture are electrically connected to M first measurement points of the printed circuit board. The first control unit can simultaneously output M first measurement signals to the M first probes via the M first connectors and receive M high-frequency impedance measurement results returned by the M first probes via the M first connectors. Furthermore, the N second probes of the second fixture are electrically connected to the N second measurement points of the printed circuit board, and the second control unit can simultaneously output N second measurement signals to the N second probes via the N second connectors and receive N high-frequency impedance measurement results returned by the N second probes via the N second connectors. Where M is a positive integer greater than or equal to 0, A is a positive integer greater than or equal to 2, and when M is not equal to 0, A is greater than or equal to M. N is a positive integer greater than or equal to 0, B is a positive integer greater than or equal to 2, and when N is not equal to 0, B is greater than or equal to N; and M and N are not both 0; wherein, the first control device includes m independent first control circuit boards, each of the first control circuit boards includes a first connectors and a first controller electrically connected to the a first connectors, and each of the first controllers can output the first measurement signal through the first connectors electrically connected to it, and can receive the measurement result returned by the first connectors electrically connected to it; the second control device includes n independent second control circuit boards, each of the second control circuit boards includes b second connectors and a second controller electrically connected to the b second connectors, and each of the second controllers can output the second measurement signal through the second connectors electrically connected to it, and can receive the measurement result returned by the second connectors electrically connected to it; wherein, the first controllers constitute the first control unit, the second controllers constitute the second control unit, m and n are positive integers greater than or equal to 1, a is A / m and is a positive integer, and b is B / n and is a positive integer.

2. The multi-channel measurement system as described in claim 1, wherein, The first fixture has M first probes and multiple positioning pins on a first plane, and the second fixture has N second probes on a second plane opposite to the first plane. The positioning pins correspond to multiple positioning holes of the printed circuit board, and the printed circuit board is placed on the first plane and the positioning pins pass through the corresponding positioning holes to accurately position the printed circuit board on the first plane and make the M first measurement points of the printed circuit board precisely dock with the M first probes on the first plane.

3. The multi-channel measurement system as described in claim 1 or 2, wherein, The first fixture and the second fixture are respectively provided with at least one corresponding positioning element. When the first fixture and the second fixture are in relative contact, the at least one positioning element provided on the first fixture and the second fixture will be closely matched with each other, so that the first fixture and the second fixture are precisely positioned with each other, and the N second measurement points of the printed circuit board are precisely connected with the N second probes provided on the second plane.

4. The multi-channel measurement system as described in claim 1, wherein, Each of the first controllers is also electrically connected to a computer device via a PCIe bus, and transmits the received measurement results to the computer device via the corresponding PCIe bus; and each of the second controllers is also electrically connected to the computer device via a PCIe bus, and transmits the received measurement results to the computer device via the corresponding PCIe bus.

5. The multi-channel measurement system as described in claim 1, wherein, The first fixture has A third connectors on one side wall, corresponding to the number of A first connectors. Both the first and third connectors are high-frequency connectors. The A third connectors provide electrical connections to the M first probes of the first fixture, and each third connector provides electrical connections to each first connector via a high-frequency cable. The second fixture has B fourth connectors on one side wall, corresponding to the number of B second connectors. Both the second and fourth connectors are high-frequency connectors. The B fourth connectors provide electrical connections to the N second probes of the second fixture, and each fourth connector provides electrical connections to each second connector via the high-frequency cable.

6. The multi-channel measurement system as claimed in claim 1 further includes a driving device connected to the first fixture or the second fixture and controlled by a computer device to drive the first fixture to reciprocate relative to the second fixture or to drive the second fixture to reciprocate relative to the first fixture, so that the first fixture and the second fixture approach each other and fit together.

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