Plasma system

TWM686057UActive Publication Date: 2026-08-01RUIXI TECHNOLOGY CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
TW · TW
Patent Type
Utility models
Current Assignee / Owner
RUIXI TECHNOLOGY CO LTD
Filing Date
2026-05-04
Publication Date
2026-08-01

Smart Images

  • Figure TWG2TB001904621_001
    Figure TWG2TB001904621_001
  • Figure TWG2TB001904621_002
    Figure TWG2TB001904621_002
  • Figure TWG2TB001904621_003
    Figure TWG2TB001904621_003
Patent Text Reader

Abstract

This invention provides a plasma system comprising a vacuum chamber and a chamber window mounted on a machine. The vacuum chamber can hold the workpiece to be processed. A low-voltage plasma, a sputtering gun, and a plasma-assisted chemical vapor deposition coil (PECVD coil) are also mounted around the vacuum chamber. This allows for the uniform deposition of dense thin films on various substrates, enhancing their activity. Furthermore, the chamber window is mounted on one side of the vacuum chamber, enabling real-time monitoring of the plasma reaction status within the vacuum chamber.
Need to check novelty before this filing date? Find Prior Art

Claims

1. A plasma system comprising: a vacuum chamber mounted on a machine base, the vacuum chamber capable of holding a workpiece to be treated, a low-pressure plasma formed by argon, oxygen, and nitrogen being injected into the front of the vacuum chamber, a sputtering gun being mounted on the top surface of the vacuum chamber to uniformly deposit a dense, high-performance thin film on various substrates, a coil being mounted on the back of the vacuum chamber to generate a large number of active particles; and a chamber viewing window mounted on the side of the vacuum chamber to monitor the plasma reaction status within the vacuum chamber in real time.

2. The plasma system as described in claim 1, wherein the machine is equipped with a programmable logic controller (PLC), a radio frequency (RF) device, a direct current power supply (DC) and an electrostatic disk mechanism.

3. The plasma system as described in claim 1, wherein the coil is a plasma-assisted chemical vapor deposition (PECVD) coil.