Edge processing system for amorphous transparent materials
Patent Information
- Application Number
- TW115205384
- Authority / Receiving Office
- TW · TW
- Patent Type
- Utility models
- Current Assignee / Owner
- Filing Date
- 2026-06-11
- Publication Date
- 2026-10-11
- Estimated Expiration
- 2036-06-10
Smart Images

Figure TWG2TB001916080_001 
Figure TWG2TB001916080_002 
Figure TWG2TB001916080_003
Abstract
Claims
1. An edge processing system for amorphous transparent materials, used for processing an amorphous transparent material, the edge processing system comprising: a laser unit that emits a laser beam, the laser beam passing through an incident medium and outputting to a target processing surface of the amorphous transparent material; and a measurement unit that measures an angle between the target processing surface of the amorphous transparent material and a reference plane, and an incident angle between the laser beam and the target processing surface; An angle calculation unit, based on the optical boundary conditions of the amorphous transparent material and in conjunction with the included angle value, the incident angle value, the optical characteristic parameters of the amorphous transparent material, and the optical characteristic parameters of the incident medium, determines the direction of an internal propagation path of the laser beam entering the amorphous transparent material, calculates an deviation angle between the internal propagation path and the target processing surface, and calculates an optimal incident angle that minimizes the absolute value of the deviation angle within a feasible incident angle range; and an adjustment unit, which adjusts the laser unit so that the incident angle of the laser beam is equal to the optimal incident angle, so as to process the target processing surface of the amorphous transparent material and make the energy propagation direction inside the amorphous transparent material approach the target processing surface.
2. The edge processing system for amorphous transparent materials as described in claim 1, wherein, The angle calculation unit calculates the refraction angle of the internal propagation path through a calculation formula (1) and calculates the deviation angle using a calculation formula (2). The calculation formula (1) is: and the calculation formula (2) is: where is the refractive index of the incident medium, is the incident angle, is the refractive index of the amorphous transparent material, is the refraction angle, is the deviation angle, and is the included angle.
3. The edge processing system for amorphous transparent materials as described in claim 1, wherein, The angle calculation unit calculates the refractive index of the amorphous transparent material through a calculation formula (3). The calculation formula (3) is: where is the corrected refractive index of the amorphous transparent material, is the linear refractive index of the amorphous transparent material, is the nonlinear Kerr coefficient of the amorphous transparent material, and I is the local laser intensity.
4. The edge processing system for amorphous transparent materials as described in claim 1, wherein, The angle calculation unit calculates an angle matching ratio using a calculation formula (4), which is: , where is the angle matching ratio, is the refractive index of the amorphous transparent material, is the refractive index of the incident medium, and is the included angle; When the angle matching ratio is less than or equal to 1, the angle calculation unit calculates the optimal incident angle using a calculation formula (5) to make the deviation angle zero, which is: , where is the optimal incident angle, and is the angle matching ratio; When the angle matching ratio is greater than 1, the angle calculation unit performs a numerical search within the feasible incident angle range using a calculation formula (6) to obtain the optimal incident angle, where the feasible incident angle range is: , where is the maximum value of the incident angle, and the calculation formula (6) is: .
5. The edge processing system for amorphous transparent materials as described in claim 4 further includes an evaluation unit that calculates a penetration depth coefficient by a calculation formula (7) and an energy limitation efficiency by a calculation formula (8), and confirms whether the penetration depth coefficient is less than or equal to a preset critical penetration coefficient. The calculation formula (7) is: , and the calculation formula (8) is: , where is the penetration depth coefficient and is the energy limitation efficiency.
6. The edge processing system for amorphous transparent materials as described in claim 5, wherein, The preset critical penetration coefficient is between 0.05 and 0.
2.
7. The edge processing system for amorphous transparent materials as described in claim 5 further includes a prediction unit that receives the optimal incident angle, the penetration depth coefficient, the complex laser parameters of the laser beam, and the complex material property parameters. The prediction unit calculates a damage index using a calculation formula (9), which is: , where, Here, is the damage index, is the geometric factor; M is the material damage sensitivity factor; Φ is the penetration energy flux factor that includes the penetration depth coefficient; and P is the pulse accumulation factor.
