Low-thermal expansion member

Abstract

Provided is a low-thermal expansion member having a low coefficient of thermal expansion, like conventional Li2O—Al2O3—SiO2-based crystallized glasses, and being low in cost. A low-thermal expansion member contains a MgO—Al2O3—SiO2-based crystal.

Description

TECHNICAL FIELD

[0001] The present invention relates to low-thermal expansion members. More specifically, the present invention relates to members suitable as materials for, for example, a front window of an oil stove, a wood stove or the like, a substrate for high-technology products, such as a color filter substrate or an image sensor substrate, a setter for firing electronic components, a light diffuser plate, a furnace core tube for producing semiconductors, a mask for producing semiconductors, an optical lens, a dimension measurement member, a communication member, a construction member, a chemical reaction container, an electromagnetic cooker top plate, a heat-resistant plate or utensil, a heat-resistant cover, a window glass for fire doors, a member for astrometric telescopes, and a member for space optics.BACKGROUND ART

[0002] Conventionally, a Li2O—Al2O3—SiO2-based crystallized glass is used as a material for a front window of an oil stove, a wood stove or the like, a substrate for high-technology products, such as a color filter substrate or an image sensor substrate, a setter for firing electronic components, a light diffuser plate, a furnace core tube for producing semiconductors, a mask for producing semiconductors, an optical lens, a dimension measurement member, a communication member, a construction member, a chemical reaction container, an electromagnetic cooker top plate, a heat-resistant plate or utensil, a heat-resistant cover, a window glass for fire doors, a member for astrometric telescopes, a member for space optics, and so on. For example, Patent Literatures 1 to 3 disclose Li2O—Al2O3—SiO2-based crystallized glasses in which Li2O—Al2O3—SiO2-based crystals, such as a β-quartz solid solution (Li2O·Al2O3·nSiO2 [where 2≤n≤4]) or a β-spodumene solid solution (Li2O·Al2O3·nSiO2 [where n≥4]) are precipitated as a major crystalline phase.

[0003] Li2O—Al2O3—SiO2-based crystallized glasses have a low coefficient of thermal expansion and high mechanical strength and therefore have excellent thermal characteristics. In addition, the type of crystals to be precipitated therein can be controlled by appropriately adjusting heat treatment conditions in a crystallization process and, thus, a transparent crystallized glass (in which a β-quartz solid solution is precipitated) can be easily produced.CITATION LISTPatent Literature[PTL 1]JP-B-S39-21049[PTL 2]JP-B-S40-20182[PTL 3]JP-A-H01-308845[PTL 4]JP-A-H11-228180[PTL 5]JP-A-H11-228181SUMMARY OF INVENTIONTechnical ProblemRecently, development of lithium ion batteries or the like is increasing and the demand for source materials for lithium is drastically growing in various industries, which has invited a global rise in the prices of the source materials for lithium. As a result, it has become difficult to produce a Li2O—Al2O3—SiO2-based crystallized glass stably and at a comparable production cost as before and, therefore, alternative materials for conventional Li2O—Al2O3—SiO2-based crystallized glasses are needed.In view of the above, an object of the present invention is to provide a low-thermal expansion member having a low coefficient of thermal expansion, like conventional Li2O—Al2O3—SiO2-based crystallized glasses, and being low in cost.Solution to ProblemThe inventors have found from intensive studies that the above problem can be overcome by a member containing crystals having a specified composition and propose the member as the present invention.[1] Specifically, a low-thermal expansion member according to the present invention has a feature that it contains a MgO—Al2O3—SiO2-based crystal. MgO—Al2O3—SiO2-based crystals are low in thermal expansion and low in cost because their major components are MgO, Al2O3, and SiO2, which are inexpensive. The term “low thermal expansion” in the present invention means that the coefficient of thermal expansion at 30 to 380° C. is not more than 30×10−7 / ° C.[2] The low-thermal expansion member according to the present invention preferably has a feature that, in the above aspect [1], it contains α-cordierite (indialite) and has transmittancy. By doing so, the member has transmittancy and can easily have a low thermal expansion. The term “transmittancy” means that the member has a transmittance (total transmittance) of more than 0% at a thickness of 4 mm and a wavelength of any one of 380 nm, 800 nm, and 1200 nm.

[0014] [3] The low-thermal expansion member according to the present invention preferably has a feature that, in the above aspect [1] or [2], it contains, in terms of % by mass, 20 to 90% SiO2, more than 0 to 50% Al2O3, and more than 0 to 40% MgO. In this case, the major components are MgO, Al2O3, and SiO2 each inexpensive and, therefore, the low-thermal expansion member is low in cost and can easily have a low thermal expansion.

[0015] [4] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [3], SiO2 / (SiO2+Al2O3+MgO) is 0.45 to 0.81 in terms of % by mass. In this case, the transmittancy can be easily increased while the coefficient of thermal expansion is kept low.

[0016] [5] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [4], Al2O3 / (SiO2+Al2O3+MgO) is 0.01 to 0.45 in terms of % by mass. In this case, the transmittancy can be easily increased while the coefficient of thermal expansion is kept low.

[0017] [6] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [5], MgO / (SiO2+Al2O3+MgO) is 0.03 to 0.29 in terms of % by mass. In this case, the transmittancy can be easily increased while the coefficient of thermal expansion is kept low.

[0018] [7] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [6], SiO2 / Al2O3 is 1 to 15 in terms of % by mass. In this case, while the coefficient of thermal expansion is kept low, the transmittancy can be increased and the liquidus viscosity can be easily increased.

[0019] [8] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [7], SiO2 / MgO is 2 to 15 in terms of % by mass. In this case, while the coefficient of thermal expansion is kept low, the transmittancy can be increased and the liquidus viscosity can be easily increased.

[0020] [9] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [8], Al2O3 / MgO is 0.2 to 15 in terms of % by mass. In this case, while the coefficient of thermal expansion is kept low, the transmittancy can be increased and the liquidus viscosity can be easily increased.

[0021]

[10] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to [9], it contains 0 to 5.6% BaO in terms of % by mass, SiO2 / Al2O3 is 2.5 to 15 in terms of % by mass, and SiO2 / MgO is 5.4 to 15 in terms of % by mass. In this case, devitrification can be easily reduced. In addition, while the coefficient of thermal expansion is made low, the transmittancy can be increased and the liquidus viscosity can be easily increased.

[0022]

[11] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[10] , it contains 0 to 5.6% BaO in terms of % by mass, SiO2 / Al2O3 is 2.5 to 15 in terms of % by mass, and Al2O3 / MgO is 1.8 to 15 in terms of % by mass. In this case, devitrification can be easily reduced. In addition, while the coefficient of thermal expansion is made low, the transmittancy can be increased and the liquidus viscosity can be easily increased.

[0023]

[12] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[11] , it contains, in terms of % by mass, 55.5 to 90% SiO2 and more than 0% ZnO. In this case, while the coefficient of thermal expansion is kept low, the formability and meltability of glass can be easily increased.

[0024]

[13] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[12] , (Li2O+Na2O+K2O) / SiO2 is 0.00005 to 0.03 in terms of % by mass. In this case, while the viscosity characteristics of glass can be optimized to efficiently promote precipitation of crystals and the chemical durability can be easily increased.

[0025]

[14] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[13] , Li2O+Na2O+K2O+CaO+SrO+BaO is not more than 2% by mass. In this case, the low-thermal expansion member is less likely to become clouded.

[0026]

[15] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[14] , (SiO2+ZnO) / (MgO+Al2O3) is 0.7 to 3 in terms of % by mass. In this case, the transmittancy can be easily increased while the coefficient of thermal expansion is kept low.

[0027]

[16] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[15] , ZnO—(TiO2+ZrO2) is −15 to 5% by mass. In this case, the transmittancy can be easily increased.

[0028]

[17] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[16] , TiO2 / (TiO2+Fe2O3) is 0.001 to 0.999 in terms of % by mass. In this case, a high-transmittancy low-thermal expansion member can be easily obtained at low cost.

[0029]

[18] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[17] , it contains at least one of MoO3, V2O5, CuO, NiO, MnO2, Cr2O3, Nd2O3, WO3, and Co3O4. In this case, precipitation of crystals can be easily promoted. In addition, the glass can be easily colored in a desired color.

[0030]

[19] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[18] , it contains more than 0% MoO3 in terms of % by mass. In this case, the viscosity of glass can be decreased to easily improve the meltability and formability of the glass.

[0031]

[20] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[19] , SiO2 / (SiO2+Al2O3+MgO) is 0.36 to 0.81 in terms of % by mass, Al2O3 / (SiO2+Al2O3+MgO) is 0.09 to 0.5 in terms of % by mass, MgO / (SiO2+Al2O3+MgO) is 0.01 to 0.29 in terms of % by mass, and the low-thermal expansion member contains 0.01 to less than 2.5% Na2O in terms of % by mass and at least one of As2O3, Sb2O3, SnO2, and Cl. In this case, the transmittancy can be easily increased while the coefficient of thermal expansion is kept low.

[0032]

[21] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[20] , it has a β-OH value of more than 0 to 2 / mm. In this case, the initial reaction of the raw material batch can be promoted and the bubble quality, the thermal resistance, and so on of the member can be easily improved.

[0033]

[22] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[21] , it has a transmittance of not less than 10% at a thickness of 4 mm and a wavelength of 1200 nm. In this case, the member is suitable when used in an infrared camera or applications for infrared communication, such as a remote controller. Herein, when transmittance is referred to simply as “transmittance”, it means “total transmittance” and is distinguished from diffuse transmittance.

[0034]

[23] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[22] , it has a coefficient of thermal expansion of not more than 30×10−7 / ° C. at 30 to 380° C. In this case, the member is suitable for various applications requiring low thermal expansion characteristics.

[0035]

[24] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[23] , it has a coefficient of thermal expansion of not more than 30×10−7 / ° C. at 30 to 750° C. In this case, the member is suitable for various applications requiring low thermal expansion characteristics.

[0036]

[25] The low-thermal expansion member according to the present invention preferably has a feature that, in any one of the above aspects [1] to

[24] , it is a crystallized glass. In this case, a member having desired characteristics can be easily produced. The crystallized glass refers to a composite material that is obtained by subjecting an original glass in glassy state (a crystallizable glass) before being crystallized to heat treatment or the like to precipitate desired crystals in a glass matrix and therefore contains glass and crystals.

[0037]

[26] A precursor of a low-thermal expansion member according to the present invention has a feature that it is made of a crystallizable glass containing, in terms of % by mass, 20 to 90% SiO2, more than 0 to 50% Al2O3, more than 0 to 40% MgO, 0 to 20% CaO, 0 to 20% SrO, 0 to 20% BaO, 0 to 20% ZnO, 0 to 10% Li2O, 0 to 20% Na2O, 0 to 20% K2O, 0 to 20% B2O3, 0 to 20% P2O5, 0 to 20% TiO2, 0 to 20% ZrO2, 0 to 10% HfO2, and 0 to 20% SnO2.

[0038]

[27] A method for producing a low-thermal expansion member according to the present invention is a method for producing the low-thermal expansion member described in the above aspect

[25] and has a feature that it includes the steps of: heating a raw material into a melt and forming the melt into a shape to obtain a crystallizable glass; and subjecting the crystallizable glass to heat treatment to crystallize the crystallizable glass.

[0039]

[28] The method for producing the low-thermal expansion member according to the present invention preferably has a feature that, in the above aspect

[27] , an amount of metal Al added to the raw material is more than 0 to 5000 ppm in terms of % by mass. In this case, the crystallization of glass can be easily promoted.Advantageous Effects of Invention

[0040] The present invention enables provision of a low-thermal expansion member having a low coefficient of thermal expansion, like conventional Li2O—Al2O3—SiO2-based crystallized glasses, and being low in cost.BRIEF DESCRIPTION OF DRAWINGS

[0041] FIG. 1 is a chart showing an XRD pattern of Example No. 127.

[0042] FIG. 2 is a histogram showing measurement results of Example No. 306 in terms of void size.DESCRIPTION OF EMBODIMENTS

[0043] A low-thermal expansion member according to the present invention has a feature that it contains a MgO—Al2O3—SiO2-based crystal. Specifically, the MgO—Al2O3—SiO2-based crystal is preferably α-cordierite. α-cordierite is a crystal that is represented by Mg2Al4Si5O18 and has a hexagonal crystal structure. α-cordierite is known to exhibit negative expansion relative to the c-axis of the crystal. When the member contains α-cordierite, its coefficient of thermal expansion can be easily reduced close to zero and its cost can be easily kept low because the major components of α-cordierite are MgO, Al2O3, and SiO2 each inexpensive. The low-thermal expansion member according to the present invention may contain any cordierite other than α-cordierite. Examples include a metastable-phase μ-cordierite having a hexagonal crystal structure, like α-cordierite, and β-cordierite having an orthorhombic crystal structure. The low-thermal expansion member according to the present invention may contain other types of crystals different from MgO—Al2O3—SiO2-based crystals so long as desired characteristics (i.e., desired low-thermal expansion characteristic and transmittancy) can be obtained. Examples of the above types of crystals include gahnite, willemite (zinc silicate), Al2SiO5 (aluminum silicate), zirconia, zirconia titanate, a tin-containing zirconia-based oxide, titania, aluminotitanate, β-quartz solid solution, α-quartz, β-quartz, β-spodumene solid solution, spodumene, zircon, enstatite, mica, nepheline, anorthite, lithium disilicate, lithium metasilicate, wollastonite, diopside, cristobalite, tridymite, feldspar, spinel-based crystals, and metal colloid. These types of crystals may be contained singly or in combination of two or more of them.

[0044] The low-thermal expansion member according to the present invention is made of, for example, a crystallized glass. The crystallized glass according to the present invention may be, so long as having desired characteristics, a crystallized glass in which crystals are precipitated from the surface of the glass or a crystallized glass in which crystals are precipitated from inside of the glass other than the surface. The composition of the crystallized glass preferably contains, for example, in terms of % by mass, 20 to 90% SiO2, more than 0 to 50% Al2O3, and more than 0 to 40% MgO. Reasons why the composition is limited as just described will be described below. In the following description of the respective contents of components, “%” refers to “% by mass” unless otherwise stated.

[0045] SiO2 is a component that forms part of a glass network and constitutes part of a MgO—Al2O3—SiO2-based crystal. The content of SiO2 is preferably not more than 90%, not more than 80%, not more than 75%, not more than 73%, or not more than 70%, particularly preferably not more than 69%, preferably not less than 20%, not less than 30%, not less than 35%, not less than 40%, not less than 45%, not less than 48%, not less than 50%, not less than 53%, or not less than 55.5%, and particularly preferably not less than 57%. If the content of SiO2 is too small, the coefficient of thermal expansion tends to increase and, therefore, a crystallized glass having excellent thermal shock resistance is less likely to be obtained. In addition, the chemical durability tends to decrease. Furthermore, the liquidus viscosity of glass is likely to decrease, which makes it difficult to form the glass into shape and thus makes it likely that the productivity decreases. Therefore, in the case where importance is placed on increasing the liquidus viscosity of glass, the lower limit of the content of SiO2 is preferably not less than 58%, not less than 60%, not less than 61%, not less than 62%, not less than 63%, or not less than 65%, and particularly preferably not less than 67%. On the other hand, if the content of SiO2 is too large, the meltability of glass decreases, the viscosity of glass melt increases to make the glass difficult to be fined, and the glass is difficult to form into shape, which makes it likely that the productivity decreases. In addition, the time taken for crystallization increases, which makes it likely that the productivity decreases. Furthermore, crystals (for example, quartz crystals) other than desired crystals, such as α-cordierite, tend to precipitate, which makes it likely that the coefficient of thermal expansion of the crystallized glass increases.

[0046] Al2O3 is a component that constitutes part of a MgO—Al2O3—SiO2-based crystal. The content of Al2O3 is preferably more than 0 to 50%, 1 to 47.5%, 5 to 45%, 10 to 42.5%, 12 to 40%, 13 to 37.5%, 15 to 35%, or 15 to 30%, and particularly preferably 16 to 25%. If the content of Al2O3 is too small, desired crystals, such as α-cordierite, tend to be less likely to precipitate and, as a result, the coefficient of thermal expansion tends to increase. In addition, the difference in coefficient of thermal expansion between the crystalline phase and the residual glass phase after crystallization increases, which may make the crystallized glass susceptible to breakage. Furthermore, the difference in refractive index between the crystalline phase and the residual glass phase after crystallization increases, which makes it likely that the crystallized glass becomes opaque. On the other hand, if the content of Al2O3 is too large, the viscosity of glass melt excessively decreases to make it difficult to form the glass into shape and, as a result, the productivity is likely to decrease. In addition, mullite crystals or other crystals may precipitate to cause devitrification of the glass and the crystallized glass becomes susceptible to breakage.

[0047] MgO is a component that constitutes part of a MgO—Al2O3—SiO2-based crystal. The content of MgO is preferably more than 0 to 40%, 1 to 37.5%, 2 to 35%, 3 to 32.5%, 4 to 30%, 5 to 27.5%, 6 to 25%, or 7 to 20%, and particularly preferably 7 to 15%. If the content of MgO is too small, desired crystals, such as α-cordierite, tend to be less likely to precipitate and, as a result, the coefficient of thermal expansion tends to increase. In addition, the difference in coefficient of thermal expansion between the crystalline phase and the residual glass phase after crystallization increases, which may make the crystallized glass susceptible to breakage. Furthermore, the difference in refractive index between the crystalline phase and the residual glass phase after crystallization increases, which makes it likely that the crystallized glass becomes opaque. On the other hand, if the content of MgO is too large, the viscosity of glass melt excessively decreases to make it difficult to form the glass into shape and, as a result, the productivity is likely to decrease.

[0048] In the low-thermal expansion member according to the present invention, the desired low-thermal expansion characteristics are achieved by mutual canceling out between negative expansion of the crystalline phase made of MgO—Al2O3—SiO2-based crystals (particularly, α-cordierite crystals) or others and positive expansion of the residual glass phase. On the other hand, the transmittancy can be increased by adjusting the refractive index difference between the crystalline phase and the residual glass phase. Taken together, in order to obtain a crystallized glass having high transmittancy and low thermal expansion, it is preferred to closely adjust the elemental compositions of both the crystalline phase and the residual glass phase in the crystallized glass, the ratio of presence between them, and so on. The inventors conducted intensive studies and, as a result, found that the crystalline phase and the residual glass phase can be suitably controlled by restricting the following ratios regarding the contents of three components MgO, SiO2, and Al2O3 constituting part of the crystalline phase as set forth below. SiO2 / (SiO2+Al2O3+MgO) (i.e., the ratio between the content of SiO2 and the sum of the contents of SiO2, Al2O3, and MgO) is preferably not more than 0.99, not more than 0.9, not more than 0.81, not more than 0.78, or not more than 0.75, particularly preferably not more than 0.73, preferably not less than 0.18, not less than 0.2, not less than 0.25, not less than 0.3, not less than 0.35, not less than 0.36, not less than 0.4, or not less than 0.45, and particularly preferably not less than 0.5. Furthermore, Al2O3 / (SiO2+Al2O3+MgO) (i.e., the ratio between the content of Al2O3 and the sum of the contents of SiO2, Al2O3, and MgO) is preferably not more than 0.71, not more than 0.6, not more than 0.5, not more than 0.45, not more than 0.4, or not more than 0.3, particularly preferably not more than 0.25, preferably not less than 0.01, not less than 0.09, not less than 0.13, not less than 0.14, not less than 0.15, not less than 0.16, or not less than 0.17, and particularly preferably not less than 0.18. Moreover, MgO / (SiO2+Al2O3+MgO) (i.e., the ratio between the content of MgO and the sum of the contents of SiO2, Al2O3, and MgO) is preferably not more than 0.67, not more than 0.6, not more than 0.5, not more than 0.4, not more than 0.29, not more than 0.2, not more than 0.15, or not more than 0.125, particularly preferably not more than 0.1, preferably not less than 0.01, not less than 0.03, not less than 0.04, not less than 0.05, or not less than 0.06, and particularly preferably not less than 0.07. If each of SiO2 / (SiO2+Al2O3+MgO), Al2O3 / (SiO2+Al2O3+MgO), and MgO / (SiO2+Al2O3+MgO) is without the above range, crystals of α-cordierite or the like are less likely to precipitate and, therefore, the coefficient of thermal expansion of the obtained crystallized glass tends to increase. In addition, the refractive index difference between the crystalline phase and the residual glass phase increases, which makes it likely that the crystallized glass becomes opaque.

[0049] The inventors found that when, regarding the contents of three components MgO, SiO2, and Al2O3 constituting part of the crystalline phase, SiO2 / Al2O3 (the ratio between the content of SiO2 and the content of Al2O3), SiO2 / MgO (the ratio between the content of SiO2 and the content of MgO), and Al2O3 / MgO (the ratio between the content of Al2O3 and the content of MgO) are restricted as set forth below, a crystallized glass having high transmittancy and low thermal expansion can be realized and the liquidus viscosity can be increased, which makes the glass easily formable into shape and thus increases the productivity. SiO2 / Al2O3 is preferably not more than 20, not more than 15, not more than 10, not more than 7.5, not more than 7, not more than 6.5, not more than 6, not more than 5.5, not more than 5, not more than 4.5, or not more than 4, particularly preferably not more than 3.75, preferably not less than 0.4, not less than 0.5, not less than 1, not less than 1.2, not less than 1.4, not less than 1.5, not less than 1.7, not less than 2, or not less than 2.5, and particularly preferably not less than 3. Furthermore, SiO2 / MgO is preferably not more than 20, not more than 15, not more than 14, not more than 13, not more than 12, not more than 11.5, not more than 11, not more than 10.5, not more than 10, or not more than 9.5, particularly preferably not more than 9, preferably not less than 0.5, not less than 2, not less than 2.4, not less than 2.8, not less than 3, not less than 3.4, not less than 3.5, not less than 4, not less than 5, not less than 5.4, not less than 6, or not less than 7, and particularly preferably not less than 8. Moreover, Al2O3 / MgO is preferably not more than 15, not more than 10, not more than 5, not more than 4.8, not more than 4.6, not more than 4.4, not more than 4.2, not more than 4, not more than 3.8, not more than 3.6, not more than 3.4, or not more than 3.2, particularly preferably not more than 3, preferably not less than 0.05, not less than 0.1, not less than 0.2, not less than 0.4, not less than 0.6, not less than 0.8, not less than 1, not less than 1.2, not less than 1.4, not less than 1.6, not less than 1.8, or not less than 2, and particularly preferably not less than 2.3. If each of SiO2 / Al2O3, SiO2 / MgO, and Al2O3 / MgO is without the above range, crystals of α-cordierite or the like are less likely to precipitate and, therefore, the coefficient of thermal expansion of the obtained crystallized glass tends to increase. In addition, the refractive index difference between the crystalline phase and the residual glass phase increases, which makes it likely that the crystallized glass becomes opaque. Furthermore, the liquidus viscosity decreases, which makes it difficult to form the glass into shape and thus decreases the productivity.

[0050] The low-thermal expansion member according to the present invention may contain, in addition to the above components, 0 to 10% Li2O, 0 to 20% Na2O, 0 to 20% K2O, 0 to 20% CaO, 0 to 20% SrO, 0 to 20% BaO, 0 to 20% ZnO, 0 to 20% B2O3, 0 to 20% P2O5, 0 to 20% TiO2, 0 to 20% ZrO2, and 0 to 20% SnO2.

[0051] Li2O is a component that can form a solid solution together with a MgO—Al2O3—SiO2-based crystal, has a large effect on crystallinity and decreases the viscosity of glass to increase the meltability and formability of the glass. On the other hand, the prices of lithium source materials globally rise as described previously and, therefore, the content of Li2O is required to be reduced as low as possible. Furthermore, if the content of Li2O is too large, the coefficient of linear thermal expansion becomes too high, which make it difficult to increase the thermal resistance and thermal shock resistance. Therefore, the content of Li2O is preferably 0 to 10%, 0 to 8%, 0 to 6%, 0 to 4%, 0 to 3%, 0 to 2.5%, 0 to 2%, 0 to 1.5%, 0 to 1%, 0 to 0.5%, 0 to 0.3%, 0 to 0.2%, or 0 to 0.1%, and particularly preferably 0 to 0.05%. However, Li2O is likely to be mixed as impurities into glass. Therefore, if complete removal of Li2O is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, the lower limit of the content of Li2O is preferably not less than 0.0001%, more preferably not less than 0.0003%, and particularly preferably not less than 0.0005%.

[0052] Na2O is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. Furthermore, Na2O is also a component for adjusting the coefficient of thermal expansion, the refractive index, and so on of MgO—Al2O3—SiO2-based crystallized glass. The content of Na2O is preferably not more than 20%, not more than 15%, not more than 10%, not more than 5%, not more than 3%, less than 2.5%, not more than 1.5%, less than 1.5%, not more than 1%, or not more than 0.5%, and particularly preferably not more than 0.3%. If the content of Na2O is too large, devitrification is likely to occur and the glass becomes susceptible to breakage. However, Na2O is likely to be mixed as impurities into glass. Therefore, if complete removal of Na2O is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, the lower limit of the content of Na2O is preferably not less than 0.0001%, not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.003%, or not less than 0.005, and particularly preferably not less than 0.01.

[0053] K2O is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. Furthermore, K2O is also a component for adjusting the coefficient of thermal expansion, the refractive index, and so on of MgO—Al2O3—SiO2-based crystallized glass. The content of K2O is preferably 0 to 20%, 0 to 15%, 0 to 10%, 0 to 5%, 0 to 3%, 0 to 1%, or 0 to 0.5%, and particularly preferably 0 to 0.3%. If the content of K2O is too large, devitrification is likely to occur and the glass becomes susceptible to breakage. However, K2O is likely to be mixed as impurities into glass. Therefore, if complete removal of K2O is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, the lower limit of the content of K2O is preferably not less than 0.0001%, more preferably not less than 0.0003%, and particularly preferably not less than 0.0005%.

[0054] Although Li2O, Na2O, and K2O are components that increase the meltability and formability of glass, an excessive large content of each of them causes the viscosity to excessively decrease, which may cause the glass to become excessively softened during crystallization. In addition, if each of Li2O, Na2O, and K2O is too much, the chemical durability of glass decreases. On the other hand, SiO2 is a component that constitutes part of a MgO—Al2O3—SiO2-based crystal as a major crystalline phase and incorporation of an appropriate amount of SiO2 into glass has the effect of increasing the viscosity of the glass to reduce softening of residual glass. In addition, SiO2 is also a component that increases the chemical durability of glass. Therefore, in order to optimize the viscosity characteristics of the glass to efficiently promote precipitation of crystals and obtain a crystallized glass having high chemical durability, (Li2O+Na2O+K2O) / SiO2 (i.e., the ratio between the sum of contents of Li2O, Na2O, and K2O and the content of SiO2) is preferably controlled within a suitable range. (Li2O+Na2O+K2O) / SiO2 is preferably 0 to 0.1, 0.00005 to 0.03, 0.00005 to 0.01, 0.0001 to 0.008, 0.0002 to 0.007, 0.0003 to 0.006, or 0.0004 to 0.005, and particularly preferably 0.0004 to 0.002.

[0055] CaO is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. Furthermore, CaO is also a component for adjusting the coefficient of thermal expansion, the refractive index, and so on of MgO—Al2O3—SiO2-based crystallized glass. The content of CaO is preferably 0 to 20%, 0 to 15%, 0 to 10%, 0 to 5%, 0 to 3%, 0 to 1%, or 0 to 0.5%, and particularly preferably 0 to 0.3%. If the content of CaO is too large, devitrification is likely to occur and the glass becomes susceptible to breakage. However, CaO is likely to be mixed as impurities into glass. Therefore, if complete removal of CaO is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, the lower limit of the content of CaO is preferably not less than 0.0001%, more preferably not less than 0.0003%, and particularly preferably not less than 0.0005%.

[0056] SrO is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. Furthermore, SrO is also a component for adjusting the coefficient of thermal expansion, the refractive index, and so on of MgO—Al2O3—SiO2-based crystallized glass. The content of SrO is preferably 0 to 20%, 0 to 15%, 0 to 10%, 0 to 5%, 0 to 3%, 0 to 1%, or 0 to 0.5%, and particularly preferably 0 to 0.3%. If the content of SrO is too large, devitrification is likely to occur and the glass becomes susceptible to breakage. However, SrO is likely to be mixed as impurities into glass. Therefore, if complete removal of SrO is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, the lower limit of the content of SrO is preferably not less than 0.0001%, more preferably not less than 0.0003%, and particularly preferably not less than 0.0005%.

[0057] BaO is a component that reduces the viscosity of the glass to increase the meltability and formability of the glass. Furthermore, BaO is also a component for adjusting the coefficient of thermal expansion, the refractive index, and so on of MgO—Al2O3—SiO2-based crystallized glass. The content of BaO is preferably 0 to 20%, 0 to 15%, 0 to 10%, 0 to 7%, 0 to 6%, 0 to 5.6%, 0 to 5%, 0 to 4%, 0 to 3%, 0 to 1%, or 0 to 0.5%, and particularly preferably 0 to 0.3%. If the content of BaO is too large, devitrification is likely to occur and the glass becomes susceptible to breakage. However, BaO is likely to be mixed as impurities into glass. Therefore, if complete removal of BaO is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, the lower limit of the content of BaO is preferably not less than 0.0001%, more preferably not less than 0.0003%, and particularly preferably not less than 0.0005%.

[0058] In the low-thermal expansion member according to the present invention, cations of Li2O, Na2O, K2O, CaO, SrO, and BaO are more likely to remain in the residual glass phase after crystallization than Mg cations constituting part of the major crystalline phase. For this reason, if the total content of these components is too large, a refractive index difference between the crystalline phase and the residual glass is likely to occur and, thus, the crystallized glass may easily become clouded. Therefore, Li2O+Na2O+K2O+CaO+SrO+BaO (the sum of the contents of Li2O, Na2O, K2O, CaO, SrO, and BaO) is preferably not more than 9%, not more than 8%, not more than 7%, not less than 6%, not more than 5%, not more than 4%, not more than 3%, not more than 2%, not more than 1%, not more than 0.8%, or not more than 0.5%, and particularly preferably not more than 0.3%.

[0059] ZnO is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. Furthermore, ZnO is also a component for adjusting the coefficient of thermal expansion, the refractive index, and so on of MgO—Al2O3—SiO2-based crystallized glass. The content of ZnO is preferably 0 to 20%, 0 to 15%, 0 to 10%, more than 0 to 5%, 0.1 to 5%, 0.2 to 4%, 0.3 to 3.5%, 0.4 to 3%, 0.5 to 2.5%, 0.6 to 2%, or 0.7 to 1.9%, and particularly preferably 0.8 to 1.8%. If the content of ZnO is too large, devitrification is likely to occur and the glass becomes susceptible to breakage. If the refractive index difference between the crystalline phase and the glass phase increases, the obtained crystallized glass is likely to become clouded. However, positive incorporation of ZnO reduces the refractive index difference between the crystalline phase and the glass phase to facilitate reduction of clouding of the crystallized glass.

[0060] In the low-thermal expansion member according to the present invention, (SiO2+ZnO) / (MgO+Al2O3) (i.e., the ratio between the sum of the contents of SiO2 and ZnO and the sum of the contents of MgO and Al2O3) is preferably 0.5 to 5, 0.7 to 3, 0.8 to 2.8, 0.9 to 2.7, or 1 to 2.7, and particularly preferably 1.2 to 2.7. If (SiO2+ZnO) / (MgO+Al2O3) is more than the above upper limit, α-cordierite crystals are less likely to precipitate and, therefore, the coefficient of thermal expansion of the obtained crystallized glass tends to increase. On the other hand, if (SiO2+ZnO) / (MgO+Al2O3) is less than the above lower limit, the liquidus temperature of glass tends to increase and, therefore, devitrification is likely to occur during production.

[0061] B2O3 is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. The content of B2O3 is preferably 0 to 20%, 0 to 15%, 0 to 10%, 0 to 5%, 0.1 to 5%, or 0.2 to 3%, and particularly preferably 0.2 to 1%. If the content of B2O3 is too large, the amount of B2O3 evaporated during melting becomes large and, thus, the environmental burden increases. In addition, surface crystallization tends to excessively progress, which may make it likely that the mechanical strength of the obtained crystallized glass decreases and may make it impossible to achieve a desired transmittancy. However, B2O3 is likely to be mixed as impurities into glass. Therefore, if complete removal of B2O3 is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, B2O3 may be contained in glass at a content of not less than 0.0001%, not less than 0.0003%, or particularly not less than 0.0005%.

[0062] P2O5 is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. On the other hand, if the content of P2O5 is too large, the amount of MgO—Al2O3—SiO2-based crystals precipitated becomes small and, thus, the coefficient of thermal expansion of the obtained crystallized glass tends to increase. The content of P2O5 is preferably 0 to 20%, 0 to 15%, 0 to 10%, or 0 to 5%, and particularly preferably 0 to 3%. However, P2O5 is likely to be mixed as impurities into glass. Therefore, if complete removal of P2O5 is pursued, the raw material batch tends to be expensive to increase the production cost. In reducing the increase in production cost, P2O5 may be contained in glass at a content of not less than 0.0001%, not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.005%, not less than 0.01%, not less than 0.05%, or particularly not less than 0.1%.

[0063] TiO2 is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. Furthermore, TiO2 is also a component that promotes crystallization and can precipitate MgO—Al2O3—SiO2-based crystals well to contribute to achievement of desired low-thermal expansion characteristics and concurrently an increase in transmittancy. On the other hand, if TiO2 is much contained in glass, the precipitated crystals may enlarge, which may decrease the transmittancy. In addition, the coloration of the glass is significantly intensified. Particularly, if zirconia titanate-based crystals containing ZrO2 and TiO2 precipitate, electrons in the crystals transition from the valence band of oxygen serving as a ligand to the conduction bands of zirconia and titanium serving as central metals (LMCT transition), which involves the coloration of crystallized glass. Furthermore, if titanium remains in the residual glass phase, LMCT transition may occur from the valence band of the SiO2 skeleton to the conduction band of tetravalent titanium in the residual glass phase. In addition, d-d transition occurs in trivalent titanium in the residual glass phase, which involves the coloration of the crystallized glass. In the case where titanium and iron coexist, coloration like ilmenite (FeTiO3) may develop. It is known that, in another case, the coexistence of titanium and tin intensifies the yellowish color of glass. Therefore, the content of TiO2 is preferably not more than 20%, not more than 15%, not more than 10%, not more than 8%, or not more than 5%, and particularly preferably not more than 4%, preferably more than 0%, not less than 0.005%, not less than 0.01%, not less than 0.1%, not less than 1%, not less than 2%, not less than 2.5%, or not less than 3%, and particularly preferably not less than 3.3%. In accordance with the application of the low-thermal expansion member according to the present invention, the content of TiO2 may be controlled to adjust the transmittancy. For example, in the case where a colored (for example, black) appearance is required for a cooker top plate or the like, the content of TiO2 may be not less than 4%.

[0064] ZrO2 is a component that promotes crystallization, but an excessive large content of ZrO2 makes it likely that coarse ZrO2 crystals precipitate to make the crystallized glass devitrifiable and susceptible to breakage. Therefore, the content of ZrO2 is preferably not more than 20%, not more than 15%, not more than 10%, not more than 5%, or not more than 3%, and particularly preferably not more than 1%. On the other hand, by adding an appropriate amount of ZrO2 into glass, the crystallite size and the amount of precipitation of the MgO—Al2O3—SiO2-based crystals can be controlled and, thus, can contribute to achievement of desired low-thermal expansion characteristics and an increase in transmittancy. Therefore, in obtaining the above effects with the use of ZrO2, the content of ZrO2 is preferably more than 0%, not less than 0.005%, not less than 0.01%, not less than 0.1%, not less than 1%, or not less than 2%, and particularly preferably not less than 3.3%.

[0065] Regarding crystallized glasses, by reducing the refractive index difference between the crystalline phase and the residual glass phase, light scattering is reduced and, thus, the transmittancy can be increased. In MgO—Al2O3—SiO2-based crystallized glass, ZnO is a component that adjusts the refractive index of the residual glass. On the other hand, TiO2 and ZrO2 are components capable of functioning as crystal nuclei, promote precipitation of crystals, and, therefore, have influence on the refractive index of the crystalline phase. Therefore, in view of further increasing the transmittancy of the low-thermal expansion member according to the present invention, it is preferred to suitably control the contents of these components. Specifically, ZnO—(TiO2+ZrO2) (i.e., the difference between the content of ZnO and the sum of the contents of TiO2 and ZrO2) is preferably −15 to 5%, −10 to 4%, or −5 to 3%, and particularly preferably −5 to 2%.

[0066] HfO2 is a component that increases the Young's modulus, modulus of rigidity, and so on of glass and also a component that reduces the viscosity of glass to increase the meltability and formability of the glass. If the content of HfO2 is too large, the mechanical strength of the obtained crystallized glass becomes excessively high, which makes it difficult to subject the crystallized glass to processing or the like and thus makes it difficult to obtain a suitable surface condition and, eventually, an excellent transmittancy. Furthermore, the source material for HfO2 is expensive, leading to an increased production cost. In view of the above, the content of HfO2 is preferably not more than 10%, not more than 5%, not more than 1%, not more than 0.5%, not more than 0.3%, or not more than 0.1%, and particularly preferably not more than 0.05%. The lower limit of the content of HfO2 is not particularly limited and not less than 0%. However, HfO2 is a component that can be mixed into glass from raw materials used and the amount of HfO2 mixed varies depending on the composition of the raw materials. Therefore, actually, it is acceptable for the glass to contain HfO2 in an amount of not less than 0.0001%, not less than 0.0003%, or particularly not less than 0.0005%.

[0067] SnO2 causes a reaction of SnO2→SnO+1 / 2O2 under high temperature to emit 02 gas into glass melt. This reaction is known as a fining mechanism of SnO2 and the O2 gas emitted during the reaction has not only a “defoaming effect” of expanding fine bubbles present in the glass melt and releasing them to the outside of the glass system, but also a “stirring effect” of mixing the glass melt. Furthermore, in the low-thermal expansion member according to the present invention, SnO2 is also a component that promotes crystallization. Therefore, by incorporating an appropriate amount of SnO2 into glass, a crystallized glass having a desired transmittancy and a desired coefficient of thermal expansion can be easily obtained. On the other hand, SnO2 is a component that, if much contained in glass, significantly intensifies the coloration of the glass and concurrently makes it likely that devitrification increases. The upper limit of SnO2 is preferably not more than 20%, not more than 15%, not more than 10%, not more than 5%, not more than 3%, not more than 1%, or not more than 0.5%, and particularly preferably not more than 0.3%, and the lower limit of SnO2 is preferably more than 0%, not less than 0.005%, not less than 0.01%, or not less than 0.05%, and particularly preferably not less than 0.1%. However, SnO2 is likely to be mixed as impurities into glass. Therefore, if complete removal of SnO2 is pursued, the raw material batch tends to be expensive to increase the production cost. Therefore, it is possible to reduce the increase in production cost by restricting the lower limit of the content of SnO2 as described above.

[0068] The low-thermal expansion member according to the present invention may contain, other than the above components, the following components.

[0069] Fe2O3 is a component that intensifies the coloration of glass and also a component that significantly intensifies the coloration, particularly, by interaction with TiO2 and / or SnO2. The content of Fe2O3 is preferably not more than 0.4%, not more than 0.1%, not more than 0.08%, not more than 0.06%, not less than 0.05%, not more than 0.04%, not more than 0.035%, not more than 0.03%, not more than 0.02%, not more than 0.015%, not more than 0.013%, or not more than 0.012%, and particularly preferably not more than 0.011%. However, Fe2O3 is likely to be mixed as impurities into glass. Therefore, if complete removal of Fe2O3 is pursued, the raw material batch tends to be expensive to increase the production cost. In order to reduce the increase in production cost, the lower limit of the content of Fe2O3 is preferably not less than 0.0001%, not less than 0.0002%, not less than 0.0003%, or not less than 0.0005%, and particularly preferably not less than 0.001%. In accordance with the application of the low-thermal expansion member according to the present invention, the content of Fe2O3 may be controlled to adjust the transmittancy. For example, in the case where a colored appearance is required for a cooker top plate or the like, the content of Fe2O3 may be not less than 0.1%, not less than 0.3%, or particularly not less than 1%.

[0070] In the case where titanium and iron coexist, coloration like ilmenite (FeTiO3) may develop. Particularly, in the case of coexistence of titanium and iron in MgO—Al2O3—SiO2-based crystallized glasses, titanium and iron components having not been precipitated as crystal nuclei or major crystals by crystallization may remain in the residual glass after crystallization and promotes the development of the coloration. These components may be able to be reduced in amount from a design perspective. However, TiO2 and Fe2O3 are likely to be mixed as impurities into glass. Therefore, if complete removal of these components is pursued, the raw material batch tends to be expensive to increase the production cost. Hence, from the viewpoint of reducing the coloration of the obtained crystallized glass, TiO2 / (TiO2+Fe2O3) is preferably 0 to 1. On the other hand, in order to further reduce the production cost, the crystallized glass may contain both the components within an acceptable range of coloration. In this case, TiO2 / (TiO2+Fe2O3) is preferably 0.001 to 0.999, 0.003 to 0.997, 0.005 to 0.995, 0.007 to 0.993, 0.009 to 0.991, 0.01 to 0.99, 0.1 to 0.9, 0.15 to 0.85, or 0.2 to 0.8, and particularly preferably 0.25 to 0.75. Thus, a high-transmittancy low-thermal expansion member can be easily obtained at low cost.

[0071] As2O3 causes a reaction of As2O5→As2O3+O2 under high temperature to emit O2 gas into glass melt. This reaction is known as a fining mechanism of As2O3 and the O2 gas emitted during the reaction has a “defoaming effect” of expanding fine bubbles present in the glass melt and releasing them to the outside of the glass system. On the other hand, because As2O3 is a toxic component, if it is much contained in glass, the environment may be contaminated, for example, during the production process of glass or during treatment of waste glass. The content of As2O3 is preferably 0 to 20%, 0 to 5%, or 0 to 1%, and particularly preferably 0 to 0.1%. However, As2O3 is likely to be mixed as impurities into glass. Therefore, if complete removal of As2O3 is pursued, the raw material batch tends to be expensive to increase the production cost. In order to reduce the increase in production cost, the lower limit of the content of As2O3 is preferably not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.005%, or not less than 0.01%, and particularly preferably not less than 0.02%.

[0072] Sb2O3 causes a reaction of Sb2O5→Sb2O3+O2 under high temperature to emit O2 gas into glass melt. This reaction is known as a fining mechanism of Sb2O3 and the O2 gas emitted during the reaction has a “defoaming effect” of expanding fine bubbles present in the glass melt and releasing them to the outside of the glass system. On the other hand, because Sb2O3 is a toxic component, if it is much contained in glass, the environment may be contaminated, for example, during the production process of glass or during treatment of waste glass. The content of Sb2O3 is preferably 0 to 20%, 0 to 5%, or 0 to 1%, and particularly preferably 0 to 0.1%. However, Sb2O3 is likely to be mixed as impurities into glass. Therefore, if complete removal of Sb2O3 is pursued, the raw material batch tends to be expensive to increase the production cost. In order to reduce the increase in production cost, the lower limit of the content of Sb2O3 is preferably not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.005%, or not less than 0.01%, and particularly preferably not less than 0.02%.

[0073] Cl2 causes a reaction of NaCl→NaCl gas under high temperature to emit NaCl gas into glass melt. This reaction is known as a fining mechanism of Cl2 and the NaCl gas emitted during the reaction has a “defoaming effect” of expanding fine bubbles present in the glass melt and releasing them to the outside of the glass system. On the other hand, because Cl2 is a toxic component, if it is much contained in glass, the environment may be contaminated, for example, during the production process of glass or during treatment of waste glass. The content of Cl2 is preferably 0 to 20%, 0 to 5%, or 0 to 1%, and particularly preferably 0 to 0.1%. However, if complete removal of Cl2 is pursued, the raw material batch tends to be expensive to increase the production cost. In order to reduce the increase in production cost, the lower limit of the content of Cl2 is preferably not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.005%, or not less than 0.01%, and particularly preferably not less than 0.02%.

[0074] Since As2O3 and Sb2O3 are toxic components, much incorporation of them into glass may cause the environment to be contaminated, for example, during the production process of glass or during treatment of waste glass. Therefore, the upper limit of As2O3+Sb2O3 (the sum of the contents of As2O3 and Sb2O3) is preferably not more than 20%, not more than 5%, not more than 1%, or not more than 0.5%, and particularly preferably less than 0.3%. Meanwhile, these components function as fining agents in glass melt and have a “defoaming effect” of expanding fine bubbles present in the glass melt and releasing them to the outside of the glass system. Therefore, in increasing the ability to defoam glass, the lower limit of the content of As2O3+Sb2O3 may be more than 0, not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.005%, not less than 0.01%, not less than 0.05%, or particularly not less than 0.1%.

[0075] SnO2, As2O3, Sb2O3, and Cl2 are toxic and, therefore, much incorporation of them into glass may cause the environment to be contaminated, for example, during the production process of glass or during treatment of waste glass. Therefore, the upper limit of SnO2+As2O3+Sb2O3+Cl2 (the sum of the contents of SnO2, As2O3, Sb2O3, and Cl2) is preferably not more than 20%, not more than 5%, not more than 1%, or not more than 0.3%, and particularly preferably not more than 0.2%. Meanwhile, these components function as fining agents in glass melt and have a “defoaming effect” of expanding fine bubbles present in the glass melt and releasing them to the outside of the glass system. Therefore, in increasing the ability to defoam glass, at least one of SnO2, As2O3, Sb2O3, and Cl2 is preferably contained in glass and the lower limit of the content of SnO2+As2O3+Sb2O3+Cl2 may be more than 0%, not less than 0.0003%, not less than 0.0005%, not less than 0.001%, not less than 0.005%, not less than 0.01%, not less than 0.05%, or particularly not less than 0.1%.

[0076] SnO2 has not only a fining effect, but also the effect of promoting crystallization. In addition, SnO2 is lower in toxicity than As2O3, Sb2O3, and Cl2 having a fining effect like SnO2 and therefore less likely to contaminate the environment. For this reason, in order to lower the environmental burden, increase the ability to defoam glass, and concurrently promote the crystallization of the glass to efficiently obtain desired characteristics, among the above components SnO2, As2O3, Sb2O3, and Cl2 having a fining effect, SnO2 is preferably positively contained in glass and the lower limit of SnO2 / (As2O3+Sb2O3+SnO2+Cl2) (i.e., the ratio between the content of SnO2 and the sum of the contents of SnO2, As2O3, Sb2O3, and Cl2) is preferably not less than 0.00003, not less than 0.0003, not less than 0.003, not less than 0.03, not less than 0.05, not less than 0.1, or not less than 0.5. The upper limit is not particularly limited, but is actually not more than 10.

[0077] Pt is a component that can be mixed in the ionic, colloidal, metallic or other states into glass and causes the glass to develop a yellowish to dark brown color. This tendency is significant after crystallization. Furthermore, the inventors found from intensive studies that the incorporation of Pt may have an effect on the nucleation and crystallizing behavior of crystallized glass to make the crystallized glass easily clouded. Therefore, the content of Pt is preferably not more than 60 ppm, not more than 30 ppm, not more than 7 ppm, not more than 6 ppm, not more than 5 ppm, not more than 4 ppm, not more than 3 ppm, not more than 2 ppm, not more than 1.6 ppm, not more than 1.4 ppm, not more than 1.2 ppm, not more than 1 ppm, not more than 0.9 ppm, not more than 0.8 ppm, not more than 0.7 ppm, not more than 0.6 ppm, not more than 0.5 ppm, not more than 0.45 ppm, not more than 0.40 ppm, or not more than 0.35 ppm, and particularly preferably not more than 0.30 ppm. Although the incorporation of Pt should be avoided as much as possible, there may be a case where, with the use of general melting facilities, Pt members need to be used in order to obtain a homogeneous glass. Therefore, if complete removal of Pt is pursued, the production cost tends to increase. In the absence of any adverse effect on coloring, for the purpose of reducing the increase in production cost, the lower limit of the content of Pt is preferably not less than 0.0001 ppm, not less than 0.001 ppm, not less than 0.005 ppm, not less than 0.01 ppm, not less than 0.02 ppm, not less than 0.03 ppm, not less than 0.04 ppm, not less than 0.05 ppm, or not less than 0.06 ppm, and particularly preferably not less than 0.07 ppm. Furthermore, so long as coloration is permitted, Pt may be used as an agent for promoting crystallization. In doing so, Pt may be used alone or used in combination with another or other components. In using Pt as an agent for promoting crystallization, its form (colloid, metallic crystals or so on) is not particularly limited.

[0078] Rh is a component that can be mixed in the ionic, colloidal, metallic or other states into glass and Rh, like Pt, causes the crystallized glass to develop a yellowish to ginger color and tends to make the crystallized glass clouded. Therefore, the content of Rh is preferably not more than 7 ppm, not more than 6 ppm, not more than 5 ppm, not more than 4 ppm, not more than 3 ppm, not more than 2 ppm, not more than 1.6 ppm, not more than 1.4 ppm, not more than 1.2 ppm, not more than 1 ppm, not more than 0.9 ppm, not more than 0.8 ppm, not more than 0.7 ppm, not more than 0.6 ppm, not more than 0.5 ppm, not more than 0.45 ppm, not more than 0.40 ppm, or not more than 0.35 ppm, and particularly preferably not more than 0.30 ppm. Although the incorporation of Rh should be avoided as much as possible, there may be a case where, with the use of general melting facilities, Rh members need to be used in order to obtain a homogeneous glass. Therefore, if complete removal of Rh is pursued, the production cost tends to increase. In the absence of any adverse effect on coloring, for the purpose of reducing the increase in production cost, the lower limit of the content of Rh is preferably not less than 0.0001 ppm, not less than 0.001 ppm, not less than 0.005 ppm, not less than 0.01 ppm, not less than 0.02 ppm, not less than 0.03 ppm, not less than 0.04 ppm, not less than 0.05 ppm, or not less than 0.06 ppm, and particularly preferably not less than 0.07 ppm. Furthermore, so long as coloration is permitted, Rh may be used as an agent for promoting crystallization. In doing so, Rh may be used alone or used in combination with another or other components. In using Rh as an agent for promoting crystallization, its form (colloid, metallic crystals or so on) is not particularly limited.

[0079] The content of Pt+Rh (the total content of Pt and Rh) is preferably not more than 60 ppm, not more than 30 ppm, not more than 9 ppm, not more than 8 ppm, not more than 7 ppm, not more than 6 ppm, not more than 5 ppm, not more than 4.75 ppm, not more than 4.5 ppm, not more than 4.25 ppm, not more than 4 ppm, not more than 3.75 ppm, not more than 3.5 ppm, not more than 3.25 ppm, not more than 3 ppm, not more than 2.75 ppm, not more than 2.5 ppm, not more than 2.25 ppm, not more than 2 ppm, not more than 1.75 ppm, not more than 1.5 ppm, not more than 1.25 ppm, not more than 1 ppm, not more than 0.95 ppm, not more than 0.9 ppm, not more than 0.85 ppm, not more than 0.8 ppm, not more than 0.75 ppm, not more than 0.7 ppm, not more than 0.65 ppm, not more than 0.60 ppm, not more than 0.55 ppm, not more than 0.50 ppm, not more than 0.45 ppm, not more than 0.40 ppm, or not more than 0.35 ppm, and particularly preferably not more than 0.30 ppm. Although the incorporation of Pt and Rh should be avoided as much as possible, there may be a case where, with the use of general melting facilities, Pt members and Rh members need to be used in order to obtain a homogeneous glass. Therefore, if complete removal of Pt and Rh is pursued, the production cost tends to increase. In the absence of any adverse effect on coloring, for the purpose of reducing the increase in production cost, the lower limit of Pt+Rh is preferably not less than 0.0001 ppm, not less than 0.001 ppm, not less than 0.005 ppm, not less than 0.01 ppm, not less than 0.02 ppm, not less than 0.03 ppm, not less than 0.04 ppm, not less than 0.05 ppm, or not less than 0.06 ppm, and particularly preferably not less than 0.07 ppm.

[0080] MoO3 is a component that reduces the viscosity of glass to increase the meltability and formability of the glass. The content of MoO3 is preferably not less than 0%, more preferably more than 0%, and particularly preferably not less than 0.0001%. On the other hand, if the content of MoO3 is too large, glass is likely to be colored and devitrified matter containing Mo is likely to precipitate, thus increasing the production load. Therefore, the content of MoO3 is preferably not more than 20%, not more than 15%, not more than 10%, or not more than 5%, and particularly preferably not more than 3%. In accordance with the application of the low-thermal expansion member according to the present invention, the content of MoO3 may be controlled to adjust the transmittancy. For example, in the case where a colored appearance is required for a cooker top plate or the like, the content of MoO3 may be not less than 0.01%, not less than 0.1%, not less than 0.3%, or particularly not less than 0.5%.

[0081] V2O5, CuO, NiO, MnO2, Cr2O3, Nd2O3, WO3, and Co3O4 are components that can color the low-thermal expansion member. Therefore, in accordance with the application of the low-thermal expansion member according to the present invention, these components may be contained in glass to adjust the transmittancy of the low-thermal expansion member. For example, in the case where a colored appearance is required for a cooker top plate or the like, the content of each of these components may be more than 0 to 5%, 0.01 to 4%, 0.05 to 3.5%, or particularly 0.1 to not less than 3%.

[0082] In the absence of any adverse effect in obtaining the desired characteristics and for the purpose of promoting crystallization, coloring the low-thermal expansion member or giving any other function to the low-thermal expansion member, the low-thermal expansion member according to the present invention may contain, other than the components described thus far, minor components, such as, for example, H2, CO2, CO, H2O, He, Ne, Ar, and N2, each up to 0.1%.

[0083] When Ag, Au, Pd, Ir, Sc, Ce, Pr, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Ac, Th, Pa, U or so on is deliberately added into glass, the raw material cost increases and, as a result, the production cost tends to increase. On the other hand, when glass containing Ag, Au and / or so on is subjected to light irradiation or heat treatment, agglomerates of these components are formed and crystallization can be promoted based on these agglomerates. Furthermore, Pd and so on have various catalytic actions. When glass contains these components, the crystallized glass can be given specific functions. In view of the above circumstances, in the case where the purpose is to promote crystallization, color the low-thermal expansion member or give other functions, the glass may contain each of the above components in a range of not more than 1%, not more than 0.5%, not more than 0.3%, or not more than 0.1%. In other cases, the content of each of the above components is preferably not more than 500 ppm, not more than 300 ppm, or not more than 100 ppm, and particularly preferably not more than 10 ppm.

[0084] In the absence of any adverse effect in further obtaining desired characteristics, the low-thermal expansion member according to the present invention may contain SO3, MnO, Y2O3, La2O3, HfO2, Ta2O5, Nb2O5, RfO2, and so on up to 10% in total. However, the raw material batch of the above components is expensive and, thus, the production cost tends to increase. Therefore, these components may not be incorporated into glass unless the circumstances are exceptional.

[0085] In view of the description thus far, a preferred composition range of the low-thermal expansion member according to the present invention is, in terms of % by mass, 0 to 70% SiO2, 10 to 50% Al2O3, 3 to 40% MgO, 0 to 10% Li2O, 0 to 20% Na2O, 0 to 20% K2O, 0 to 20% CaO, 0 to 20% SrO, 0 to 20% BaO, 0 to 20% ZnO, 0 to 20% B2O3, 0 to 20% P2O5, 0 to 20% TiO2, 0 to 20% ZrO2, 0 to 20% SnO2, not more than 0.1% Fe2O3, not more than 7 ppm Pt, not more than 7 ppm Rh, 9 ppm Pt+Rh, and more than 0% MoO3. Another preferred composition range thereof is 0 to 5.6% BaO, 2.5 to 15 SiO2 / Al2O3, and 5.4 to 15 SiO2 / MgO, still another preferred composition range is 0 to 5.6% BaO, 2.5 to 15 SiO2 / Al2O3, and 1.8 to 15 Al2O3 / MgO, and yet still another preferred composition range is 55.5 to 90% SiO2 and more than 0% ZnO.

[0086] A precursor of a low-thermal expansion member according to the present invention is made of, for example, a crystallizable glass (an original glass before being crystallized). In this case, the respective ranges of contents of the components of the crystallizable glass are the same as those described above. Furthermore, for example, when the precursor of a low-thermal expansion member is subjected to heat treatment in predetermined conditions, a low-thermal expansion member can be obtained.

[0087] In the low-thermal expansion member according to the present invention, the β-OH value is preferably more than 0 to 2 / mm, 0.001 to 2 / mm, 0.01 to 1.5 / mm, 0.02 to 1.5 / mm, 0.03 to 1.2 / mm, 0.04 to 1.5 / mm, 0.05 to 1.4 / mm, 0.06 to 1.3 / mm, 0.07 to 1.2 / mm, 0.08 to 1.1 / mm, 0.08 to 1 / mm, 0.08 to 0.9 / mm, 0.08 to 0.85 / mm, 0.08 to 0.8 / mm, 0.08 to 0.75 / mm, 0.08 to 0.74 / mm, 0.08 to 0.73 / mm, 0.08 to 0.72 / mm, or 0.08 to 0.71 / mm, and particularly preferably 0.08 to 0.7 / mm. When the β-OH value is in the above range, the glass quality is less likely to decrease. Specifically, if the β-OH value is too small, the amount of water vapor produced during melting of the raw material batch reduces. Therefore, the effect of stirring the raw material batch due to production of water vapor is reduced, which makes it less likely that the initial reaction of the raw material batch is promoted and, thus, makes it likely that the production load increases. On the other hand, if the β-OH value is too large, bubbles are likely to be produced at the interface between a metallic member, such as Pt, or a refractory member and glass melt, which makes it likely that the quality of the obtained glass member decreases. In addition, the glass transition point, the deformation point, the strain point, the annealing point, and the softening point may decrease or the coefficient of thermal expansion may increase, which deteriorates the thermal resistance and the thermal shock resistance and, therefore, makes the glass member unsuitable for use under high temperature.

[0088] In the low-thermal expansion member according to the present invention, the density is preferably 1.2 to 3.50 g / cm3, 2.00 to 3.40 g / cm3, 2.10 to 3.35 g / cm3, or 2.20 to 3.30 g / cm3, and particularly preferably 2.30 to 3.25 g / cm3. If the density is too small, the gas permeability of the glass increases and, thus, the glass may be contaminated during a long-term storage. On the other hand, if the density is too large, the weight per unit area becomes large and, therefore, the member becomes difficult to handle.

[0089] In the low-thermal expansion member according to the present invention, the transmittance (total transmittance) at a thickness of 4 mm and a wavelength of 380 nm is preferably not less than 0.5%, not less than 1%, not less than 3%, not less than 5%, not less than 10%, not less than 15%, not less than 20%, not less than 25%, not less than 30%, not less than 35%, not less than 40%, not less than 45%, not less than 50%, not less than 55%, not less than 60%, not less than 65%, not less than 70%, not less than 75%, not less than 78%, not less than 80%, not less than 81%, not less than 82%, or not less than 83%, and particularly preferably not less than 84%. If the transmittance at a wavelength of 380 nm is too low, the yellow coloration may deepen and the transparency of the member may decrease, resulting in failure to obtain a desired transmittancy. Depending on the application, even a low transmittance at a wavelength of 380 nm may be acceptable. In this case, the transmittance at a wavelength of 380 nm is not limited to the above and may be less than 0.5%.

[0090] In the low-thermal expansion member according to the present invention, the transmittance (total transmittance) at a thickness of 4 mm and a wavelength of 800 nm is preferably not less than 0.5%, not less than 1%, not less than 3%, not less than 5%, not less than 10%, not less than 15%, not less than 20%, not less than 25%, not less than 30%, not less than 35%, not less than 40%, not less than 45%, not less than 50%, not less than 55%, not less than 60%, not less than 65%, not less than 70%, not less than 75%, not less than 78%, not less than 80%, not less than 81%, not less than 82%, not less than 83%, not less than 84%, not less than 85%, not less than 86%, or not less than 87%, and particularly preferably not less than 88%. If the transmittance at a wavelength of 800 nm is too low, the appearance is likely to become greenish. Particularly, when the member is used in medical applications, such as vein authentication, the higher the transmittance at a wavelength of 800 nm, the more preferred it is. Depending on the application, even a low transmittance at a wavelength of 800 nm may be acceptable. In this case, the transmittance at a wavelength of 800 nm is not limited to the above and may be less than 0.5%.

[0091] In the low-thermal expansion member according to the present invention, the transmittance (total transmittance) at a thickness of 4 mm and a wavelength of 1200 nm is preferably not less than 0.5%, not less than 1%, not less than 3%, not less than 5%, not less than 10%, not less than 15%, not less than 20%, not less than 25%, not less than 30%, not less than 35%, not less than 40%, not less than 45%, not less than 50%, not less than 55%, not less than 60%, not less than 65%, not less than 70%, not less than 72%, not less than 74%, not less than 76%, not less than 78%, not less than 80%, not less than 81%, not less than 82%, not less than 83%, not less than 84%, not less than 85%, not less than 86%, not less than 87%, or not less than 88%, and particularly preferably not less than 89%. Particularly, when the member is used in an infrared camera or applications for infrared communication, such as a remote controller, the higher the transmittance at a wavelength of 1200 nm, the more preferred it is. Depending on the application, even a low transmittance at a wavelength of 1200 nm may be acceptable. In this case, the transmittance at a wavelength of 1200 nm is not limited to the above and may be less than 0.5%.

[0092] In the low-thermal expansion member according to the present invention, the liquidus temperature is preferably not higher than 1540° C., not higher than 1535° C., not higher than 1530° C., not higher than 1525° C., not higher than 1520° C., not higher than 1515° C., not higher than 1510° C., not higher than 1505° C., not higher than 1500° C., not higher than 1495° C., not higher than 1490° C., not higher than 1485° C., not higher than 1480° C., not higher than 1475° C., not higher than 1470° C., not higher than 1465° C., not higher than 1460° C., not higher than 1455° C., not higher than 1450° C., not higher than 1445° C., not higher than 1440° C., not higher than 1435° C., not higher than 1430° C., not higher than 1425° C., not higher than 1420° C., or not higher than 1415° C., and particularly preferably not higher than 1410° C. If the liquidus temperature is too high, devitrification is likely to occur during production. On the other hand, when the liquidus temperature is 1480° C. or below, the member can be easily produced by a roll process or the like. When the liquidus temperature is 1450° C. or below, the member can be easily produced by a casting process or the like. When the liquidus temperature is 1410° C. or below, the member can be easily produced by a fusion process or the like.

[0093] In the low-thermal expansion member according to the present invention, the liquidus viscosity (the logarithmic value of the viscosity at the liquidus temperature) is not less than 1.6, not less than 1.70, not less than 1.75, not less than 1.80, not less than 1.85, not less than 1.90, not less than 1.95, not less than 2.00, not less than 2.05, not less than 2.10, not less than 2.15, not less than 2.20, not less than 2.25, not less than 2.30, not less than 2.35, not less than 2.40, not less than 2.45, not less than 2.50, not less than 2.55, not less than 2.60, not less than 2.65, not less than 2.70, not less than 2.75, not less than 2.80, not less than 2.85, not less than 2.90, not less than 2.95, not less than 3.00, not less than 3.05, not less than 3.10, not less than 3.15, not less than 3.20, not less than 3.25, not less than 3.30, not less than 3.35, not less than 3.40, not less than 3.45, not less than 3.50, not less than 3.55, not less than 3.60, or not less than 3.65, and particularly preferably not less than 3.70. If the liquidus viscosity is too low, devitrification is likely to occur during production. On the other hand, when the liquidus viscosity is not less than 3.40, the member can be easily produced by a roll process or the like. When the liquidus viscosity is not less than 3.50, the member can be easily produced by a casting process or the like. When the liquidus viscosity is not less than 3.70, the member can be easily produced by a fusion process or the like.

[0094] In the low-thermal expansion member according to the present invention, the coefficient of thermal expansion at 30 to 380° C. is preferably not more than 30×10−7 / ° C., not more than 25×10−7 / ° C., not more than 20×10−7 / ° C., not more than 18×10−7 / ° C., not more than 16×10−7 / ° C., not more than 14×10−7 / ° C., not more than 13×10−7 / ° C., not more than 12×10−7 / ° C., not more than 11×10−7 / ° C., not more than 10×10−7 / ° C., not more than 9×10−7 / ° C., not more than 8×10−7 / ° C., not more than 7×10−7 / ° C., not more than 6×10−7 / ° C., not more than 5×10−7 / ° C., not more than 4×10−7 / ° C., or not more than 3×10−7 / ° C., and particularly preferably not more than 2×10−7 / ° C. When the dimensional stability and / or the thermal shock resistance are particularly required, the coefficient of thermal expansion is preferably −5×10−7 / ° C. to 5×10−7 / ° C., −3×10−7 / ° C. to 3×10−7 / ° C., −2.5×10−7 / ° C. to 2.5×10−7 / ° C., −2×10−7 / ° C. to 2×10−7 / ° C., −1.5×10−7 / ° C. to 1.5×10−7 / ° C., or −1×10−7 / ° C. to 1×10−7 / ° C., and particularly preferably −0.5×10−7 / ° C. to 0.5×10−7 / ° C.

[0095] In the low-thermal expansion member according to the present invention, the coefficient of thermal expansion at 30 to 750° C. is preferably not more than 30×10−7 / ° C., not more than 25×10−7 / ° C., not more than 20×10−7 / ° C., not more than 18×10−7 / ° C., not more than 16×10−7 / ° C., not more than 14×10−7 / ° C., not more than 13×10−7 / ° C., not more than 12×10−7 / ° C., not more than 11×10−7 / ° C., not more than 10×10−7 / ° C., not more than 9×10−7 / ° C., not more than 8×10−7 / ° C., not more than 7×10−7 / ° C., not more than 6×10−7 / ° C., not more than 5×10−7 / ° C., or not more than 4×10−7 / ° C., and particularly preferably not more than 3×10−7 / ° C. When the dimensional stability and / or the thermal shock resistance are particularly required, the coefficient of thermal expansion is preferably −15×10−7 / ° C. to 15×10−7 / ° C., −12×10−7 / ° C. to 12×10−7 / ° C., −10×10−7 / ° C. to 10×10−7 / ° C., −8×10−7 / ° C. to 8×10−7 / ° C., −6×10−7 / ° C. to 6×10−7 / ° C., −5×10−7 / ° C. to 5×10−7 / ° C., −4.5×10−7 / ° C. to 4.5×10−7 / ° C., −4×10−7 / ° C. to 4×10−7 / ° C., −3.5×10−7 / ° C. to 3.5×10−7 / ° C., −3×10−7 / ° C. to 3×10−7 / ° C., −2.5×10−7 / ° C. to 2.5×10−7 / ° C., −2×10−7 / ° C. to 2×10−7 / ° C., −1.5×10−7 / ° C. to 1.5×10−7 / ° C., or −1×10−7 / ° C. to 1×10−7 / ° C., and particularly preferably −0.5×10−7 / ° C. to 0.5×10−7 / ° C.

[0096] The low-thermal expansion member according to the present invention may be subjected to chemical strengthening or other treatments. Regarding the treatment conditions for chemical strengthening treatment, the treatment time and the treatment temperature are sufficient to be appropriately selected in consideration of the glass composition, the crystallinity, the type of molten salt, and so on. For example, for the purpose of facilitating chemical strengthening after crystallization, a glass composition containing much Na2O, which is likely to be contained in residual glass, may be selected or the crystallinity may be de deliberately lowered. Furthermore, the molten salt may contain alkali metals, such as Li, Na, and K, singly or in combination. Moreover, aside from an ordinary single-step strengthening process, a multistep chemical strengthening process may be selected. The member may be subjected to a physical strengthening process, such as air cooling strengthening. Furthermore, a film may be applied to the surface of the member by sputtering or other methods, in which case the physical and chemical durability can be increased.

[0097] Next, a description will be given of a method for producing a low-thermal expansion member according to the present invention.

[0098] First, a batch of raw materials prepared to provide a glass having the above-described composition is loaded into a glass melting furnace and melted at 1600 to 1700° C. and the molten glass is then formed into shape. Thus, a crystallizable glass as a precursor (a glass before being crystallized) is obtained. In melting the glass, for example, a flame melting process using a burner or the like or an electric melting process by electrical heating may be used. Alternatively, a melting process using laser irradiation or a melting process using plasma is also possible. Furthermore, the shape of the sample may be sheet-like, fibrous, film-like, powdered, spherical, hollow or so on and is not particularly limited.

[0099] In producing the low-thermal expansion member according to the present invention, metal Al may be added to the raw material batch. In the present invention, metal Al is a component that can promote crystallization of glass and also a component that adjusts the refractive index of the residual glass phase to increase the transmittancy of the obtained crystallized glass. On the other hand, if metal Al is excessively added, this may make the crystallized glass clouded. The amount of metal Al added is preferably more than 0 to 5000 ppm, more preferably 1 to 4000 ppm, and particularly preferably 10 to 3000 ppm.

[0100] Examples of the method for forming the molten glass into shape include an overflow process, a float process, a down-draw process, a slot down process, a redraw process, a containerless process, a blow process, a press forming process, a roll process, a bushing process, and a tube draw process.

[0101] Next, the obtained crystallizable glass is subjected to heat treatment and thus crystallized. The crystallization conditions include holding the crystallizable glass at 800 to 1250° C. for 2 minutes to 1000 hours. The heat treatment may be performed at a specific temperature only, may be performed stepwise by holding the glass in two or more temperature levels or may be performed by the application of heat with a temperature gradient. Alternatively, the crystallization may be promoted by applying sonic waves or electromagnetic waves to the crystallizable glass.

[0102] Next, the glass after being subjected to the heat treatment is cooled. The cooling of the glass may be performed at a cooling rate with a specific temperature gradient or in two or more levels of temperature gradients. In the case where the glass is desired to obtain a sufficient thermal shock resistance, it is desirable to control the cooling rate to sufficiently structurally relax the residual glass phase. The average cooling rate from 800° C. to 25° C. is, in an innermost portion of the crystallized glass thickness farthest from the surface, preferably not hirer than 3000° C. / min, not higher than 1000° C. / min, not higher than 500° C. / min, not higher than 400° C. / min, not higher than 300° C. / min, not higher than 200° C. / min, not higher than 100° C. / min, not higher than 50° C. / min, not higher than 25° C. / min, or not higher than 10° C. / min, and particularly preferably not higher than 5° C. / min. In the case where the glass is desired to obtain dimensional stability over a long period, the above average cooling rate is preferably not higher than 2.5° C. / min, not higher than 1° C. / min, not higher than 0.5° C. / min, not higher than 0.1° C. / min, not higher than 0.05° C. / min, not higher than 0.01° C. / min, not higher than 0.005° C. / min, not higher than 0.001° C. / min, or not higher than 0.0005° C. / min, and particularly preferably not higher than 0.0001° C. / min. Except for the case where physical strengthening treatment by air cooing, water cooling or the like is performed, the cooling rate of the glass at the glass surface and the cooling rate thereof in the innermost portion of the glass thickness farthest from the glass surface preferably approximate to each other. The value of the cooling rate in the innermost portion farthest from the glass surface divided by the cooling rate at the glass surface is preferably 0.0001 to 1, 0.001 to 1, 0.01 to 1, 0.1 to 1, 0.5 to 1, 0.8 to 1, or 0.9 to 1, and particularly preferably 1. As the above value is closer to 1, residual strain is less likely to occur in all locations of the glass sample and long-term dimensional stability is more likely to be obtained. The cooling rate at the glass surface can be estimated by contact thermometry or with a radiation thermometer, while the temperature of the inner portions of the glass can be determined by placing the glass sample in a high-temperature state into a cooling medium, measuring the heat quantity and rate of heat quantity change of the cooling medium, and making an estimate from the obtained numeric measurement data, and the respective specific heats and the thermal conductivity, and so on of the glass sample and the cooling medium.

[0103] When the low-thermal expansion member according to the present invention has a sheet-like shape, the average surface roughness Ra of the principal surface thereof is preferably not more than 50 nm, not more than 25 nm, not more than 15 nm, not more than 10 nm, not more than 9 nm, not more than 8 nm, not more than 7 nm, not more than 6 nm, not more than 5 nm, not more than 4 nm, not more than 3 nm, or not more than 2 nm, and particularly preferably not more than 1 nm. If the surface roughness Ra is too large, light incident on the glass surface from the outside is likely to be scattered, light is less likely to be emitted from the inside of the glass toward the outside, and a desired transmittancy is less likely to be obtained. In addition, the glass becomes susceptible to breakage. On the other hand, if the surface roughness Ra of the flat surface is too small, the glass surface is likely to be charged and the attractive force between the glass and an object brought into contact with the glass surface becomes large, which may make it difficult to obtain mold releasability. In addition, because of the charged glass surface, a desired electrical responsiveness may be less likely to be obtained. In view of the above circumstances, the surface roughness Ra of the flat surface of the glass according to the present invention is preferably not less than 0.01 nm, not less than 0.03 nm, not less than 0.05 nm, not less than 0.07 nm, not less than 0.09 nm, not less than 0.1 nm, or not less than 0.3 nm, and particularly preferably not less than 0.5 nm.

[0104] When the low-thermal expansion member according to the present invention has a sheet-like shape, the average surface roughness Ra of the end surface thereof is preferably not more than 100 nm, not more than 50 nm, not more than 25 nm, not more than 15 nm, not more than 10 nm, not more than 9 nm, not more than 8 nm, not more than 7 nm, not more than 6 nm, not more than 5 nm, not more than 4 nm, not more than 3 nm, or not more than 2 nm, and particularly preferably not more than 1 nm. If the surface roughness Ra of the end surface is too large, light is less likely to enter the inside of the glass through the end surface of the glass, light is less likely to be emitted from the inside of the glass toward the outside, and a desired transmittancy is less likely to be obtained. In addition, the glass becomes susceptible to breakage. On the other hand, if the surface roughness Ra of the end surface is too small, in physically holding the glass at the end surface thereof with a holder, the contact area between the glass and the holder becomes small and the frictional resistance becomes small, which may make it difficult to surely hold the glass. In view of the above circumstances, the surface roughness Ra of the end surface of the glass according to the present invention is preferably not less than 0.01 nm, not less than 0.03 nm, not less than 0.05 nm, not less than 0.07 nm, not less than 0.09 nm, or not less than 0.1 nm.

[0105] The low-thermal expansion member according to the present invention preferably has a unpolished surface. The theoretical strength of glass is originally very high, but glass is often broken even under a much lower stress than the theoretical strength. The reason for this is that nanoscopic defects called Griffth flaws are produced in the glass surface in processes after the forming of glass into shape, such as a polishing process or the like. Therefore, when the surface of the low-thermal expansion member according to the present invention is unpolished, the original mechanical strength is less likely to be impaired and, thus, the glass becomes less susceptible to breakage. In addition, since the polishing process can be omitted, the production cost can be reduced. For example, when the member according to the present invention has a sheet-like shape and, in this case, the entire effective surfaces of both the principal surfaces of the glass are unpolished, the member according to the present invention becomes even less susceptible to breakage. In order to make the entire effective surfaces into unpolished surfaces, it is effective to make, at the time of forming into shape, surface portions corresponding to the effective surfaces into free surfaces. Furthermore, even if the surface portions corresponding to the effective surfaces make contact with a solid member, such as a forming jig, during forming into shape, the portions only have to be heated again at a temperature of the glass transition point or higher. Thus, smooth surfaces similar to free surfaces can be formed.

[0106] The waviness of the low-thermal expansion member according to the present invention is preferably not more than 10 μm, not more than 5 μm, not more than 4 μm, not more than 3 μm, not more than 2 μm, not more than 1 μm, not more than 0.8 μm, not more than 0.7 μm, not more than 0.6 μm, not more than 0.5 μm, not more than 0.4 μm, not more than 0.3 μm, not more than 0.2 μm, not more than 0.1 μm, not more than 0.08 μm, not more than 0.05 μm, not more than 0.03 μm, or not more than 0.02 μm, and particularly preferably not more than 0.01 μm. If the waviness is too large, a distribution of incident angles of light incident on the glass surface at a specific location is likely to be generated and the amount of light scattered on the member surface becomes large on average, which makes it difficult to obtain a desired transmittancy. The lower limit of the waviness is not particularly limited, but is actually not less than 0.01 nm.

[0107] The thickness of the low-thermal expansion member according to the present invention is preferably not more than 10 mm, not more than 9 mm, not more than 8 mm, not more than 7 mm, not more than 6 mm, or not more than 5 mm, and particularly preferably not more than 4 mm. If the thickness of a sample is too large, the attenuation rate of light in the inside of the member becomes large, which makes it difficult to obtain a desired transmittancy. Furthermore, with use of the member according to the present invention as a display, the thickness is preferably not more than 1000 μm, 500 μm, not more than 200 μm, not more than 100 μm, not more than 70 μm, not more than 50 μm, not more than 30 μm, or 1 to 20 μm, and particularly preferably 5 to 10 μm.

[0108] The difference between the maximum thickness and the minimum thickness of the low-thermal expansion member according to the present invention is preferably not more than 50 μm, not more than 25 μm, not more than 10 μm, not more than 5 μm, not more than 1 μm, not more than 500 nm, not more than 300 nm, not more than 100 nm, not more than 50 nm, not more than 25 nm, not more than 15 nm, not more than 10 nm, not more than 9 nm, not more than 8 nm, not more than 7 nm, not more than 6 nm, not more than 5 nm, not more than 4 nm, not more than 3 nm, or not more than 2 nm, and particularly preferably not more than 1 nm. If the difference between the maximum thickness and the minimum thickness is too large, the incident angle of light having entered the member through one of the front and back surfaces thereof becomes different from the exit angle of light when exiting from the other surface, which causes the light to scatter undesirably and makes it likely that the surface appearance looks dazzling.

[0109] The surface roughness Ra of the principal surface and end surface of the member can be measured by a method based on JIS B 0601:2001. The waviness can be measured with a stylus surface profile measurement device by a method based on SEMI STD D15-1296 “measurement method for surface waviness of FPD glass substrate”. The thickness can be measured with a general device, such as a digital caliper or a point-contact roughness meter.

[0110] The average crystallite size of the major crystalline phase of the low-thermal expansion member according to the present invention is preferably not more than 1000 nm, not more than 500 nm, not more than 300 nm, or not more than 100 nm, and particularly preferably not more than 90 nm. If the average crystallite size of the major crystalline phase is too large, the crystallized glass is likely to become opaque. The lower limit of the average crystallite size of the major crystalline phase is not particularly limited, but is actually not less than 1 nm.

[0111] The low-thermal expansion member according to the present invention may contain voids within an acceptable range of transmittancy. When the member contains voids, the coefficient of thermal expansion tends to be lowered. The size of voids is, for example, about several nanometers to 600 μm. The size of nanoscale voids can be measured with a field-emission scanning electron microscope (SU-8220 manufactured by Hitachi High-Technologies Corporation) and the size of microscale voids can be measured with a microfocus X-ray CT system (manufactured by Shimadzu Corporation) or a polarizing microscope (ECLIPSE LV100 POL). In decreasing the coefficient of thermal expansion with the use of voids, the voidage (the percentage of the volume of voids in the entire volume of the low-thermal expansion member) is preferably not less than 0.01%, not less than 0.05%, or particularly preferably not less than 0.1%, and preferably not more than 5%, not more than 1%, or particularly preferably not more than 0.5%. If the voidage is too high, the mechanical strength of the obtained low-thermal expansion member is likely to decrease. In addition, light is likely to scatter and the transmittancy is likely to decrease. The measurement of the voidage can be performed using a microfocus X-ray CT system (manufactured by Shimadzu Corporation), in which the voidage can be measured and calculated by taking an image of the inside of the sample and subjecting the image to defect / inclusion analysis with VGSTUDIO MAX manufactured by VOLUME GRAPHICS.EXAMPLES

[0112] Hereinafter, the present invention will be described with reference to examples, but the present invention is not limited to the following examples. Tables 1 to 148 show examples (Sample Nos. 1 to 366) of the present invention.TABLE 1No. 1No. 2No. 3No. 4No. 5[% by mass]SiO251.851.651.249.850.8Al2O332.43334.731.728.7MgO15.114.713.713.810.8Li2O00000Na2O0.090.080.020.070.07K2O00000CaO0.480.460.122.10.35SrO00000BaO00000ZnO00000B2O300000P2O500000.03TiO20.010.020.022.39.03ZrO200000HfO200000SnO20.090.10.230.170.19Fe2O30.030.030.010.030.03As2O300000Sb2O300000Cl200000MoO30.00030.00030.00030.00030.0003V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.520.520.510.520.56Al / (Si + Al + Mg)0.330.330.350.330.32Mg / (Si + Al + Mg)0.150.150.140.140.12Si / Al1.601.561.481.571.77Si / Mg3.433.513.743.614.70Al / Mg2.152.242.532.302.66(Li + Na + K) / Si0.001740.001550.000390.001410.00138Li + Na + K + Ca +0.570.540.142.170.42Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.091.081.061.091.29Zn − (Ti + Zr) [% by mass]−0.01−0.02−0.02−2.3−9.03Ti / (Ti + Fe)0.2500.4000.6670.9870.997As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.090.100.230.170.19Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 2No. 1No. 2No. 3No. 4No. 5Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1241unmeasured12241192unmeasuredequiv. to10{circumflex over ( )}3 [° C.]1332unmeasured13241290unmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  1395unmeasured13901356unmeasuredViscosity10{circumflex over ( )}2 [° C.]1476unmeasured14741440unmeasuredLiquidus Temperature [° C.]unmeasuredunmeasured1538unmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasured1.7unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.40.540.837.740.536.7Density [g / cm3]2.632.642.632.662.65β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①810° C.-2 h810° C.-2 h1150° C.-3 h810° C.-2 h1210° C.-3 min1210° C.-10 h1210° C.-1 h1210° C.-10 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL*unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasured138unmeasured126α [×10−7 / ° C.] 30-380° C.01.6−6.772.412.4α [×10−7 / ° C.] 30-750° C.78.90.079.818.2Density [g / cm3]2.512.51unmeasured2.55unmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredCrystallization Conditions②—1100° C.-3 h1210° C.-2 h—1210° C.-2 minAverage Crystallite Size [nm]—126117—58α [×10−7 / ° C.] 30-380° C.—0.14−1.85—unmeasuredα [×10−7 / ° C.] 30-750° C.8.014.55—unmeasuredTABLE 3No. 6No. 7No. 8No. 9No. 10[% by mass]SiO251.550.850.766.760.1Al2O331.530.630.723.727.8MgO1413.9148.911.4Li2O0.01000.010.01Na2O0.080.080.070.060.07K2O00000CaO0.450.450.340.220.28SrO00000BaO00000ZnO00000B2O300000P2O50.013.974.0300TiO22.280.020.010.020.01ZrO20000.020.01HfO200000SnO200000Fe2O30.170.180.180.350.3As2O300000Sb2O300000Cl200000MoO30.00030.00030.00030.00030.0003V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.530.530.530.670.61Al / (Si + Al + Mg)0.320.320.320.240.28Mg / (Si + Al + Mg)0.140.150.150.090.11Si / Al1.631.661.652.812.16Si / Mg3.683.653.627.495.27Al / Mg2.252.202.192.662.44(Li + Na + K) / Si0.001750.001570.001380.001050.00133Li + Na + K + Ca +0.540.530.410.290.36Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.131.141.132.051.53Zn − (Ti + Zr) [% by mass]−2.28−0.02−0.01−0.04−0.02Ti / (Ti + Fe)0.9310.1000.0530.0540.032As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]00000Sn / (Sn + As + Sb + Cl)—————Metal Al [ppm]00000TABLE 4No. 6No. 7No. 8No. 9No. 10Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.38.437.4unmeasured2833Density [g / cm3]2.642.602.602.472.54β-OH [ / mm]0.140.140.140.140.14After CrystallizationCrystallization Conditions①810° C.-2 h 810° C.-10 h 810° C.-10 h810° C.-2 h810° C.-2 h1210° C.-10 h1210° C.-1 h1210° C.-1 h1210° C.-10 h1210° C.-10 hTransmittance [%]380 nmunmeasured0.56unmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasured11.7unmeasuredunmeasuredunmeasured1200 nm unmeasured17unmeasuredunmeasuredunmeasuredL*unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.unmeasuredunmeasuredAverage Crystallite Size [nm]unmeasured126unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured9.4unmeasuredunmeasured23.3α [×10−7 / ° C.] 30-750° C.unmeasured16.18unmeasuredunmeasured24.6Density [g / cm3]unmeasured2.49unmeasured2.362.43Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 5No. 11No. 12No. 13No. 14No. 15[% by mass]SiO243.049.348.950.648.8Al2O332.932.832.73033.3MgO13.113.61413.213.4Li2O0.01000.010Na2O0.080.080.080.070.08K2O00000CaO0.330.330.350.330.34SrO00000BaO00000ZnO00000B2O300000P2O50.030.010.012.973.94TiO20.060.030.030.020.01ZrO210.193.663.692.530HfO20.210.080.080.050SnO20.120.110.120.180.18Fe2O30.020.020.020.020.02As2O300000Sb2O300000Cl200000MoO30.000320.000320.000320.000320.00032V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.480.520.510.540.51Al / (Si + Al + Mg)0.370.340.340.320.35Mg / (Si + Al + Mg)0.150.140.150.140.14Si / Al1.311.501.501.691.47Si / Mg3.283.633.493.833.64Al / Mg2.512.412.342.272.49(Li + Na + K) / Si0.002090.001620.001640.001580.00164Li + Na + K + Ca +0.420.410.430.410.42Sr + Ba [% by mass](Si + Zn) / (Mg + Al)0.931.061.051.171.04Zn − (Ti + Zr) [% by mass]−10.25−3.69−3.72−2.55−0.01Ti / (Ti + Fe)0.7500.6000.6000.5000.333As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.120.110.120.180.18Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 6No. 11No. 12No. 13No. 14No. 15Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.4238.8unmeasured36.937.3Density [g / cm3]2.832.692.692.632.61β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①810° C.-2 h810° C.-10 h810° C.-2 h810° C.-2 h810° C.-2 h1210° C.-10 h1210° C.-1 h1210° C.-10 h1210° C.-10 h1210° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasured0.624 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasured9.451200 nm unmeasuredunmeasuredunmeasuredunmeasured14L*unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasured117unmeasuredunmeasured126α [×10−7 / ° C.] 30-380° C.unmeasured8.35unmeasured17.75.34α [×10−7 / ° C.] 30-750° C.unmeasured15.06unmeasured22.412.21Density [g / cm3]2.932.56unmeasured2.532.50Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 7No. 16No. 17No. 18No. 19No. 20[% by mass]SiO248.146.755.753.155.4Al2O332.631.830.230.627.5MgO13.412.712.414.715.5Li2O00000Na2O0.080.080.050.040.04K2O00000CaO0.340.330.310.370.38SrO00000BaO00000ZnO00000B2O300000P2O50.020.02000TiO20.040.051.070.960.94ZrO25.267.93000HfO20.110.17000SnO20.110.120.190.150.15Fe2O30.020.020.020.020.02As2O300000Sb2O300000Cl200000MoO30.000320.000320.000320.000320.00032V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt1.51.51.51.51.5Rh0.020.020.020.020.02Pt + Rh1.521.521.521.521.52Si / (Si + Al + Mg)0.510.510.570.540.56Al / (Si + Al + Mg)0.350.350.310.310.28Mg / (Si + Al + Mg)0.140.140.130.150.16Si / Al1.481.471.841.742.01Si / Mg3.593.684.493.613.57Al / Mg2.432.502.442.081.77(Li + Na + K) / Si0.001660.001710.000900.000750.00072Li + Na + K + Ca +0.420.410.360.410.42Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.051.051.311.171.29Zn − (Ti + Zr) [% by mass]−5.3−7.98−1.07−0.96−0.94Ti / (Ti + Fe)0.6670.7140.9820.9800.979As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.110.120.190.150.15Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 8No. 16No. 17No. 18No. 19No. 20Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.39.839.738.835.639.5Density [g / cm3]2.722.762.582.622.61β-OH [ / mm]0.130.130.130.130.13After CrystallizationCrystallization Conditions①810° C.-2 h810° C.-2 h1150° C.-3 h1150° C.-3 h1050° C.-5 h1210° C.-10 h1210° C.-10 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL*unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.unmeasuredα-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasured12695126α [×10−7 / ° C.] 30-380° C.4.18unmeasuredunmeasured−8.22−4.42α [×10−7 / ° C.] 30-750° C.11.58unmeasuredunmeasured−1.662.29Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 9No. 21No. 22No. 23No. 24No. 25[% by mass]SiO246.853.248.652.252.8Al2O331.930.133.229.527.5MgO12.610.913.110.710.2Li2O00000Na2O0.020.020.020.020.02K2O0.020.020.010.020.02CaO0.090.270.090.270.25SrO00000BaO00000ZnO00000B2O300000P2O50.030.020.020.020.03TiO28.285.154.797.068.96ZrO200000HfO200000SnO20.20.210.20.210.23Fe2O30.010.020.010.020.02As2O300000Sb2O300000Cl200000MoO30.000280.000280.000280.000280.00028V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt1.31.31.31.31.3Rh0.020.020.020.020.02Pt + Rh1.321.321.321.321.32Si / (Si + Al + Mg)0.510.560.510.560.58Al / (Si + Al + Mg)0.350.320.350.320.30Mg / (Si + Al + Mg)0.140.120.140.120.11Si / Al1.471.771.461.771.92Si / Mg3.714.883.714.885.18Al / Mg2.532.762.532.762.70(Li + Na + K) / Si0.000850.000750.000620.000770.00076Li + Na + K + Ca +0.130.310.120.310.29Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.051.301.051.301.40Zn − (Ti + Zr) [% by mass]−8.28−5.15−4.79−7.06−8.96Ti / (Ti + Fe)0.9990.9960.9980.9970.998As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.200.210.200.210.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 10No. 21No. 22No. 23No. 24No. 25Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.39.935.338.936.435.7Density [g / cm3]2.702.622.672.632.63β-OH [ / mm]0.180.180.180.180.18After CrystallizationCrystallization Conditions1810° C.-2 h830° C.-10 h810° C.-2 h1100° C.-3 h1210° C.-15 min1210° C.-10 h1100° C.-3 h1210° C.-10 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL*unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsunmeasuredα-Cor.unmeasuredα-Cor.α-Cor.Average Crystallite Size [nm]unmeasured126unmeasured126108α [×10−7 / ° C.] 30-380° C.unmeasured0.36unmeasured−1.4621.8α [×10−7 / ° C.] 30-750° C.unmeasured5.53unmeasured4.3225.4Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 11No. 26No. 27No. 28No. 29No. 30[% by mass]SiO254.849.848.650.450.0Al2O32628.227.628.628.3MgO9.610.510.310.610.5Li2O0.010.010.010.010.01Na2O0.020.020.020.020.02K2O0.030.020.020.020.02CaO0.240.270.260.270.27SrO00000BaO00000ZnO00000B2O300000P2O50.032.124.172.124.19TiO28.988.858.87.666.44ZrO200000HfO200000SnO20.230.20.210.20.2Fe2O30.010.020.020.020.02As2O300000Sb2O300000Cl200000MoO30.000280.000280.000280.000280.00028V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt1.31.31.31.31.3Rh0.020.020.020.020.02Pt + Rh1.321.321.321.321.32Si / (Si + Al + Mg)0.610.560.560.560.56Al / (Si + Al + Mg)0.290.320.320.320.32Mg / (Si + Al + Mg)0.110.120.120.120.12Si / Al2.111.771.761.761.77Si / Mg5.714.744.724.754.76Al / Mg2.712.692.682.702.70(Li + Na + K) / Si0.001090.001000.001030.000990.00100Li + Na + K + Ca +0.30.320.310.320.32Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.541.291.281.291.29Zn − (Ti + Zr) [% by mass]−8.98−8.85−8.8−7.66−6.44Ti / (Ti + Fe)0.9990.9980.9980.9970.997As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.200.210.200.20Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 12No. 26No. 27No. 28No. 29No. 30Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.34.435.935.735.934.8Density [g / cm3]2.602.642.622.632.60β-OH [ / mm]0.140.140.140.140.14After CrystallizationCrystallization Conditions①1210° C.-15 min1210° C.-30 min1210° C.-1 h1100° C.-3 h1210° C.-1 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.unmeasuredAverage Crystallite Size [nm]117117unmeasured126unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasured8.06unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasured13.31unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 13No. 31No. 32No. 33No. 34No. 35[% by mass]SiO252.754.650.450.250.0Al2O32927.528.628.228.3MgO10.710.310.610.510.5Li2O0.020.020.020.020.02Na2O0.020.020.020.030.03K2O0.020.020.020.030.03CaO0.270.260.260.270.26SrO00000BaO00000ZnO00000B2O3000.91.50P2O50.020.020.030.030.03TiO26.997.048.978.988.61ZrO200001.93HfO200000.04SnO20.20.210.20.20.2Fe2O30.020.010.010.020.02As2O300000Sb2O300000Cl200000MoO30.000280.000280.000280.000280.00028V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh1.21.21.21.21.2Pt + Rh1.231.231.231.231.23Si / (Si + Al + Mg)0.570.590.560.560.56Al / (Si + Al + Mg)0.310.300.320.320.32Mg / (Si + Al + Mg)0.120.110.120.120.12Si / Al1.821.991.761.781.77Si / Mg4.935.304.754.784.76Al / Mg2.712.672.702.692.70(Li + Na + K) / Si0.001140.001100.001190.001590.00160Li + Na + K + Ca +0.330.320.320.350.34Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.331.441.291.301.29Zn − (Ti + Zr) [% by mass]−6.99−7.04−8.97−8.98−10.54Ti / (Ti + Fe)0.9970.9990.9990.9980.998As + Sb [% by mass]00000Sn + As + Sb + Cl0.200.210.200.200.20[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 14No. 31No. 32No. 33No. 34No. 35Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.34.635.636.936.937.4Density [g / cm3]2.612.632.652.642.68β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1100° C.-3 h1210° C.-7 min1210° C.-15 min1210° C.-1 h1210° C.-15 minTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.unmeasuredα-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]117unmeasured117unmeasured101α [×10−7 / ° C.] 30-380° C.7.92unmeasured23.4unmeasured17.6α [×10−7 / ° C.] 30-750° C.12.14unmeasured26.9unmeasured22.7Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 15No. 36No. 37No. 38No. 39No. 40[% by mass]SiO249.150.750.450.349.8Al2O327.728.728.428.327.7MgO10.210.610.510.410.2Li2O00000Na2O0.030.030.040.030.03K2O0.030.020.020.020.02CaO0.260.260.270.280.29SrO00000BaO00000ZnO00000B2O300000P2O50.040.030.030.030.03TiO28.517.466.248.458.36ZrO23.821.933.8300HfO20.080.040.0800SnO20.190.210.22.23.51Fe2O30.020.020.020.020.02As2O300000Sb2O300000Cl200000MoO30.000280.000280.000280.000280.00028V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt1.31.31.31.31.3Rh0.020.020.020.020.02Pt + Rh1.321.321.321.321.32Si / (Si + Al + Mg)0.560.560.560.570.57Al / (Si + Al + Mg)0.320.320.320.320.32Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al1.771.771.771.781.80Si / Mg4.814.784.804.844.88Al / Mg2.722.712.702.722.72(Li + Na + K) / Si0.001220.000990.001190.000990.00100Li + Na + K + Ca +0.320.310.330.330.34Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.301.291.301.301.31Zn − (Ti + Zr) [% by mass]−12.33−9.39−10.07−8.45−8.36Ti / (Ti + Fe)0.9980.9970.9970.9980.998As + Sb [% by mass]00000Sn + As + Sb + Cl0.190.210.202.203.51[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 16No. 36No. 37No. 38No. 39No. 40Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.37.936.937.437.337.5Density [g / cm3]2.712.672.692.682.71β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①1210° C.-30 min1210° C.-30 min1210° C.-30 min1210° C.-30 min1210° C.-30 minTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasured126unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured21.7unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured26.6unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 17No. 41No. 42No. 43No. 44No. 45[% by mass]SiO251.050.450.547.648.9Al2O328.528.328.529.427.6MgO10.510.510.211.510.2Li2O0.020.020.020.020.02Na2O0.030.030.030.030.04K2O0.020.010.030.020.02CaO0.280.290.250.30.27SrO00000BaO001.7200ZnO00000B2O30002.92.7P2O50.020.020.030.020.03TiO27.316.118.476.36.4ZrO200001.86HfO200000.04SnO22.34.30.211.91.9Fe2O30.020.020.020.020.02As2O300000Sb2O300000Cl200000MoO30.000280.000280.000280.000280.00028V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh1.21.21.21.21.2Pt + Rh1.241.241.241.241.24Si / (Si + Al + Mg)0.570.570.570.540.56Al / (Si + Al + Mg)0.320.320.320.330.32Mg / (Si + Al + Mg)0.120.120.110.130.12Si / Al1.791.781.771.621.77Si / Mg4.864.804.954.144.79Al / Mg2.712.702.792.562.71(Li + Na + K) / Si0.001370.001190.001580.001470.00164Li + Na + K + Ca +0.350.352.050.370.35Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.311.301.301.161.29Zn − (Ti + Zr) [% by mass]−7.31−6.11−8.47−6.3−8.26Ti / (Ti + Fe)0.9970.9970.9980.9970.997As + Sb [% by mass]00000Sn + As + Sb + Cl2.304.300.211.901.90[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 18No. 41No. 42No. 43No. 44No. 45Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.36.83737.33836.8Density [g / cm3]2.672.692.672.662.65β-OH [ / mm]0.140.140.140.140.14After CrystallizationCrystallization Conditions①1210° C.-30 min1210° C.-30 min1210° C.-15 min1210° C.-30 min1210° C.-1 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.unmeasuredα-Cor.Average Crystallite Size [nm]unmeasured117108unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured14.1unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured19unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 19No. 46No. 47No. 48No. 49No. 50[% by mass]SiO252.951.853.752.749.7Al2O332.635.332.134.636.7MgO14.112.613.912.413.3Li2O00000Na2O0.030.030.030.040.03K2O00000CaO0.090.090.090.090.09SrO00000BaO00000ZnO00000B2O300000P2O500000TiO20.010.010.010.010.01ZrO20000.010HfO200000SnO20.220.230.230.220.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000150.000150.000150.000150.00015V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.010.010.010.010.01Rh0.020.020.020.020.02Pt + Rh0.030.030.030.030.03Si / (Si + Al + Mg)0.530.520.540.530.50Al / (Si + Al + Mg)0.330.350.320.350.37Mg / (Si + Al + Mg)0.140.130.140.120.13Si / Al1.621.471.671.521.35Si / Mg3.754.113.864.253.74Al / Mg2.312.802.312.792.76(Li + Na + K) / Si0.000570.000580.000560.000760.00060Li + Na + K + Ca +0.120.120.120.130.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.131.081.171.120.99Zn − (Ti + Zr) [% by mass]−0.01−0.01−0.01−0.02−0.01Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl0.220.230.230.220.21[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 20No. 46No. 47No. 48No. 49No. 50Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]1255unmeasured1225unmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]1342unmeasured1333unmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] 1404unmeasured1405unmeasuredunmeasured 10{circumflex over ( )}2 [° C.]1487unmeasured1495unmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasured1473unmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasured2.1unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.37.836.637.436.137.8Density [g / cm3]2.622.602.612.612.64β-OH [ / mm]0.130.130.130.130.13After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h 810° C.-2 h1150° C.-3 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]101126108117126α [×10−7 / ° C.] 30-380° C.−7.42.4−10.65−4.08−11.62α [×10−7 / ° C.] 30-750° C.−0.638.46−4.562.1−5.21Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 21No. 51No. 52No. 53No. 54No. 55[% by mass]SiO250.650.551.550.149.3Al2O334.23633.731.133.5MgO14.813.114.513.411.9Li2O00000Na2O0.040.030.030.020.02K2O0000.020.02CaO0.10.110.110.110.1SrO00000BaO00000ZnO00000B2O300000P2O50000.020.02TiO20.010.010.015.014.91ZrO200000HfO200000SnO20.230.210.220.230.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000150.000150.000150.000150.00015V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.010.010.010.010.01Rh0.020.020.020.020.02Pt + Rh0.030.030.030.030.03Si / (Si + Al + Mg)0.510.510.520.530.52Al / (Si + Al + Mg)0.340.360.340.330.35Mg / (Si + Al + Mg)0.150.130.150.140.13Si / Al1.481.401.531.611.47Si / Mg3.423.853.553.744.14Al / Mg2.312.752.322.322.82(Li + Na + K) / Si0.000790.000590.000580.000800.00081Li + Na + K + Ca +0.140.140.140.150.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.031.031.071.131.09Zn − (Ti + Zr) [% by mass]−0.01−0.01−0.01−5.01−4.91Ti / (Ti + Fe)0.5000.5000.5000.9980.998As + Sb [% by mass]00000Sn + As + Sb + Cl0.230.210.220.230.23[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 22No. 51No. 52No. 53No. 54No. 55Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]1232unmeasured1204unmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]1319unmeasured1309unmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] 1379unmeasured1378unmeasuredunmeasured 10{circumflex over ( )}2 [° C.]1458unmeasured1465unmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.39.237.238.638.737.3Density [g / cm3]2.642.632.632.662.66β-OH [ / mm]0.190.190.190.190.19After CrystallizationCrystallization Conditions① 810° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]89117108117117α [×10−7 / ° C.] 30-380° C.1.31−2.37−4.129.255.52α [×10−7 / ° C.] 30-750° C.8.223.82.2715.8211.59Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 23No. 56No. 57No. 58No. 59No. 60[% by mass]SiO251.050.147.148.048.1Al2O330.532.93532.634.3MgO13.111.712.61412.3Li2O00000Na2O0.020.020.020.020.02K2O0.020.020.020.020.02CaO0.110.10.110.120.11SrO00000BaO00000ZnO00000B2O300000P2O50.020.020.020.020.02TiO25.014.914.94.974.9ZrO200000HfO200000SnO20.220.220.210.210.22Fe2O30.010.010.010.020.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.020.020.020.020.02Rh0.010.010.010.010.01Pt + Rh0.030.030.030.030.03Si / (Si + Al + Mg)0.540.530.500.510.51Al / (Si + Al + Mg)0.320.350.370.340.36Mg / (Si + Al + Mg)0.140.120.130.150.13Si / Al1.671.521.351.471.40Si / Mg3.894.283.743.433.91Al / Mg2.332.812.782.332.79(Li + Na + K) / Si0.000780.000800.000850.000830.00083Li + Na + K + Ca +0.150.140.150.160.15Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.171.120.991.031.03Zn − (Ti + Zr) [% by mass]−5.01−4.91−4.9−4.97−4.9Ti / (Ti + Fe)0.9980.9980.9980.9960.998As + Sb [% by mass]00000Sn + As + Sb + Cl0.220.220.210.210.22[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 24No. 56No. 57No. 58No. 59No. 60Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.37.936.938.239.738.2Density [g / cm3]2.652.652.682.682.67β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]108117117117117α [×10−7 / ° C.] 30-380° C.8.455.450.658.66−0.56α [×10−7 / ° C.] 30-750° C.15.6511.377.5115.56.57Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 25No. 61No. 62No. 63No. 64No. 65[% by mass]SiO249.051.750.852.551.7Al2O331.931.934.431.333.7MgO13.713.912.313.612.1Li2O00000Na2O0.020.020.020.020.02K2O0.020000CaO0.120.120.110.120.11SrO00000BaO00000ZnO00000B2O300000P2O50.022.142.12.272.1TiO24.950.020.020.020.02ZrO20000.010HfO200000SnO20.210.230.230.230.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh0.010.010.010.010.01Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.520.530.520.540.53Al / (Si + Al + Mg)0.340.330.350.320.35Mg / (Si + Al + Mg)0.140.140.130.140.12Si / Al1.541.621.481.681.53Si / Mg3.583.724.133.864.27Al / Mg2.332.292.802.302.79(Li + Na + K) / Si0.000820.000390.000390.000380.00039Li + Na + K + Ca +0.160.140.130.140.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.071.131.091.171.13Zn − (Ti + Zr) [% by mass]−4.95−0.02−0.02−0.03−0.02Ti / (Ti + Fe)0.9980.6670.6670.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl0.210.230.230.230.23[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 26No. 61No. 62No. 63No. 64No. 65Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.39.337.131.836.735.3Density [g / cm3]2.672.612.612.602.60β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]108126138126126α [×10−7 / ° C.] 30-380° C.9.769.422.1912.245.21α [×10−7 / ° C.] 30-750° C.16.8216.48.4219.411.35Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 27No. 66No. 67No. 68No. 69No. 70[% by mass]SiO248.749.649.550.352.4Al2O335.833.535.23332.3MgO1314.412.814.214Li2O00000Na2O0.020.020.020.020.02K2O00000CaO0.120.130.110.120.12SrO00000BaO00000ZnO00000B2O300000.9P2O52.092.142.12.130TiO20.010.010.010.010.01ZrO20.010000HfO200000SnO20.220.220.220.220.23Fe2O30.010.020.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh0.010.010.010.010.01Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.500.510.510.520.53Al / (Si + Al + Mg)0.370.340.360.340.33Mg / (Si + Al + Mg)0.130.150.130.150.14Si / Al1.361.481.411.521.62Si / Mg3.753.443.873.543.74Al / Mg2.752.332.752.322.31(Li + Na + K) / Si0.000410.000400.000400.000400.00038Li + Na + K + Ca + Sr + Ba [% by mass]0.140.150.130.140.14(Si + Zn) / (Mg + Al)1.001.041.031.071.13Zn − (Ti + Zr) [% by mass]−0.02−0.01−0.01−0.01−0.01Ti / (Ti + Fe)0.5000.3330.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.220.220.220.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 28No. 66No. 67No. 68No. 69No. 70Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.36.838.436.637.737.8Density [g / cm3]2.632.632.622.622.61β-OH [ / mm]0.130.130.130.130.13After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]138126126126126α [×10−7 / ° C.] 30-380° C.1.98−5.35−1.31−2.862.01α [×10−7 / ° C.] 30-750° C.8.10.85.923.69.48Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 29No. 71No. 72No. 73No. 74No. 75[% by mass]SiO251.453.352.249.150.1Al2O334.831.73436.333.8MgO12.513.712.313.114.6Li2O00000Na2O0.020.020.020.020.02K2O00000CaO0.110.120.110.120.12SrO00000BaO00000ZnO00000B2O30.90.91.11.21.1P2O500000TiO20.010.010.010.010.01ZrO200.01000HfO200000SnO20.220.220.220.210.21Fe2O30.010.010.020.010.01As2O300000Sb2O300000Cl200000MoO30.000240.000240.000240.000240.00024V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh0.020.020.020.020.02Pt + Rh0.060.060.060.060.06Si / (Si + Al + Mg)0.520.540.530.500.51Al / (Si + Al + Mg)0.350.320.350.370.34Mg / (Si + Al + Mg)0.130.140.120.130.15Si / Al1.481.681.541.351.48Si / Mg4.113.894.243.753.43Al / Mg2.782.312.762.772.32(Li + Na + K) / Si0.000390.000380.000380.000410.00040Li + Na + K + Ca + Sr + Ba [% by mass]0.130.140.130.140.14(Si + Zn) / (Mg + Al)1.091.171.130.991.04Zn − (Ti + Zr) [% by mass]−0.01−0.02−0.01−0.01−0.01Ti / (Ti + Fe)0.5000.5000.3330.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.220.220.210.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 30No. 71No. 72No. 73No. 74No. 75Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.36.4373637.738.6Density [g / cm3]2.612.602.602.632.63β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]126126126117117α [×10−7 / ° C.] 30-380° C.−2.361.02−2.19−2.823.62α [×10−7 / ° C.] 30-750° C.5.718.56.034.589.74Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 31No. 76No. 77No. 78No. 79No. 80[% by mass]SiO250.151.051.850.852.4Al2O335.533.23234.431.5MgO12.914.213.912.413.7Li2O00000Na2O0.020.030.030.040.04K2O00000CaO0.110.110.10.090.1SrO00000BaO00000ZnO00000B2O31.11.2000P2O500000TiO20.010.010.020.020.03ZrO200.011.941.91.95HfO2000.040.040.04SnO20.210.20.230.230.23Fe2O30.020.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000240.000240.000240.000240.00024V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh0.020.020.020.020.02Pt + Rh0.060.060.060.060.06Si / (Si + Al + Mg)0.510.520.530.520.54Al / (Si + Al + Mg)0.360.340.330.350.32Mg / (Si + Al + Mg)0.130.140.140.130.14Si / Al1.411.541.621.481.66Si / Mg3.883.593.734.103.82Al / Mg2.752.342.302.772.30(Li + Na + K) / Si0.000400.000590.000580.000790.00076Li + Na + K + Ca + Sr + Ba [% by mass]0.130.140.130.130.14(Si + Zn) / (Mg + Al)1.041.081.131.091.16Zn − (Ti + Zr) [% by mass]−0.01−0.02−1.96−1.92−1.98Ti / (Ti + Fe)0.3330.5000.6670.6670.750As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.210.200.230.230.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 32No. 76No. 77No. 78No. 79No. 80Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.37.23838.336.937.7Density [g / cm3]2.622.622.652.652.64β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]126117117126126α [×10−7 / ° C.] 30-380° C.−2.381.7867.574−0.9616.789α [×10−7 / ° C.] 30-750° C.5.399.4714.3575.85913.747Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 33No. 81No. 82No. 83No. 84No. 85[% by mass]SiO251.748.749.749.650.4Al2O333.93633.535.333MgO12.11314.412.814.3Li2O00000Na2O0.040.040.040.040.03K2O00000CaO0.090.10.10.090.09SrO00000BaO00000ZnO00000B2O300000P2O5000.0100.01TiO20.020.020.020.020.03ZrO21.891.891.921.891.92HfO20.040.040.040.040.04SnO20.230.220.210.220.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000220.000220.000220.000220.00022V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh0.020.020.020.020.02Pt + Rh0.060.060.060.060.06Si / (Si + Al + Mg)0.530.500.510.510.52Al / (Si + Al + Mg)0.350.370.340.360.34Mg / (Si + Al + Mg)0.120.130.150.130.15Si / Al1.531.351.481.411.53Si / Mg4.273.753.453.883.52Al / Mg2.802.772.332.762.31(Li + Na + K) / Si0.000770.000820.000800.000810.00060Li + Na + K + Ca + Sr + Ba [% by mass]0.130.140.140.130.12(Si + Zn) / (Mg + Al)1.120.991.041.031.07Zn − (Ti + Zr) [% by mass]−1.91−1.91−1.94−1.91−1.95Ti / (Ti + Fe)0.6670.6670.6670.6670.750As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.220.210.220.22Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 34No. 81No. 82No. 83No. 84No. 85Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.36.438.239.437.938.9Density [g / cm3]2.642.672.672.662.66β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]126138126126117α [×10−7 / ° C.] 30-380° C.−2.44−1.15.97−17.63α [×10−7 / ° C.] 30-750° C.4.735.3112.85.4714.5Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 35No. 86No. 87No. 88No. 89No. 90[% by mass]SiO248.347.448.948.145.4Al2O329.932.329.431.733.7MgO12.911.512.711.412.2Li2O0.010.010.010.010.01Na2O0.030.030.030.030.03K2O0.020.020.030.020.02CaO0.080.070.080.070.08SrO00000BaO00000ZnO00000B2O300000P2O50.030.030.030.030.03TiO28.488.378.548.448.35ZrO200000HfO200000SnO20.220.220.210.210.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000220.000220.000220.000220.00022V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.040.040.040.040.04Rh0.020.020.020.020.02Pt + Rh0.060.060.060.060.06Si / (Si + Al + Mg)0.530.520.540.530.50Al / (Si + Al + Mg)0.330.350.320.350.37Mg / (Si + Al + Mg)0.140.130.140.130.13Si / Al1.621.471.661.521.35Si / Mg3.744.123.854.223.72Al / Mg2.322.812.312.782.76(Li + Na + K) / Si0.001240.001270.001430.001250.00132Li + Na + K + Ca + Sr + Ba [% by mass]0.140.130.150.130.14(Si + Zn) / (Mg + Al)1.131.081.161.120.99Zn − (Ti + Zr) [% by mass]−8.48−8.37−8.54−8.44−8.35Ti / (Ti + Fe)0.9990.9990.9990.9990.999As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.220.210.210.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 36No. 86No. 87No. 88No. 89No. 90Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.39.938.139.13839.8Density [g / cm3]2.692.692.682.682.71β-OH [ / mm]0.140.140.140.140.14After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]108108108117117α [×10−7 / ° C.] 30-380° C.12.418.656.539.146.18α [×10−7 / ° C.] 30-750° C.19.0216.0313.1816.0413.32Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 37No. 91No. 92No. 93No. 94No. 95[% by mass]SiO246.346.347.055.661.7Al2O331.43330.824.618MgO13.51213.314.414.8Li2O00000Na2O0.030.040.030.030.02K2O0.020.020.0200CaO0.080.080.090.090.09SrO00000BaO00000ZnO00000B2O30005.095.11P2O50.030.030.0300TiO28.58.378.5200.01ZrO200000HfO200000SnO20.210.210.210.210.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000180.000180.000180.000180.00018V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.510.510.520.590.65Al / (Si + Al + Mg)0.340.360.340.260.19Mg / (Si + Al + Mg)0.150.130.150.150.16Si / Al1.471.401.532.263.43Si / Mg3.433.863.533.864.17Al / Mg2.332.752.321.711.22(Li + Na + K) / Si0.001080.001300.001060.000540.00032Li + Na + K + Ca + Sr + Ba [% by mass]0.130.140.140.120.11(Si + Zn) / (Mg + Al)1.031.031.071.431.88Zn − (Ti + Zr) [% by mass]−8.5−8.37−8.520−0.01Ti / (Ti + Fe)0.9990.9990.9990.0000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.210.210.210.210.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 38No. 91No. 92No. 93No. 94No. 95Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.41.339.44036.337Density [g / cm3]2.712.702.712.532.49β-OH [ / mm]0.140.140.140.140.14After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-4 h1210° C.-4 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]117117117117117α [×10−7 / ° C.] 30-380° C.9.767.968.18unmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.17.2115.4915.12unmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 39No. 96No. 97No. 98No. 99No. 100[% by mass]SiO259.253.854.850.151.0Al2O31831.430.734.233.5MgO14.714.414.115.415.1Li2O00000Na2O0.020.030.030.030.04K2O00000CaO0.090.090.090.090.09SrO00000BaO00000ZnO00000B2O35.220000P2O50.010000TiO22.550.010.010.010.01ZrO200000HfO200000SnO20.230.230.230.220.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000180.000180.000180.000180.00018V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.640.540.550.500.51Al / (Si + Al + Mg)0.200.320.310.340.34Mg / (Si + Al + Mg)0.160.140.140.150.15Si / Al3.291.711.791.461.52Si / Mg4.033.743.893.253.38Al / Mg1.222.182.182.222.22(Li + Na + K) / Si0.000340.000560.000550.000600.00078Li + Na + K + Ca + Sr + Ba [% by mass]0.110.120.120.120.13(Si + Zn) / (Mg + Al)1.811.171.221.011.05Zn − (Ti + Zr) [% by mass]−2.55−0.01−0.01−0.01−0.01Ti / (Ti + Fe)0.9960.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.230.230.220.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 40No. 96No. 97No. 98No. 99No. 100Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1241unmeasured12241192unmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]1332unmeasured13241290unmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  1395unmeasured13901356unmeasured10{circumflex over ( )}2 [° C.]1476unmeasured14741440unmeasuredLiquidus Temperature [° C.]unmeasuredunmeasured1538unmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasured1.7unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.40.540.837.740.536.7Density [g / cm3]2.632.642.632.662.65β-OH [ / mm]0.120.120.120.120.12After CrystallizationCrystallization Conditions①1210° C.-4 h1210° C.-2 h810° C.-2 h1210° C.-2 h810° C.-2 h1210° C.-10 h1210° C.-10 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]10110110112695α [×10−7 / ° C.] 30-380° C.unmeasured−7.917.724.692.14α [×10−7 / ° C.] 30-750° C.unmeasured−1.0913.38118.95Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 41No. 101No. 102No. 103No. 104No. 105[% by mass]SiO251.152.851.750.249.8Al2O330.531.330.829.829.8MgO13.213.713.41312.9Li2O00000Na2O0.030.030.030.030.02K2O0.0200.010.020.02CaO0.090.090.090.080.09SrO00000BaO00000ZnO00000B2O301.91.21.90P2O50.0200.010.020.03TiO24.840.012.594.747.12ZrO200000HfO200000SnO20.220.210.210.20.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.000180.000180.000180.000180.00018V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.540.540.540.540.54Al / (Si + Al + Mg)0.320.320.320.320.32Mg / (Si + Al + Mg)0.140.140.140.140.14Si / Al1.681.691.681.681.67Si / Mg3.873.853.863.863.86Al / Mg2.312.282.302.292.31(Li + Na + K) / Si0.000980.000570.000770.001000.00080Li + Na + K + Ca + Sr + Ba [% by mass]0.140.120.130.130.13(Si + Zn) / (Mg + Al)1.171.171.171.171.17Zn − (Ti + Zr) [% by mass]−4.84−0.01−2.59−4.74−7.12Ti / (Ti + Fe)0.9980.5000.9960.9980.999As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.210.210.200.22Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 42No. 101No. 102No. 103No. 104No. 105Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]1212121512041194unmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]1302131713021284unmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] 1365138713691347unmeasured 10{circumflex over ( )}2 [° C.]1448147514551429unmeasuredLiquidus Temperature [° C.]1461144014611424unmeasuredLiquidus Viscosity [—]1.92.222unmeasuredα [×10−7 / ° C.] 30-380° C.38.337.337.838.139.1Density [g / cm3]2.652.592.622.63unmeasuredβ-OH [ / mm]1.51.51.51.51.5After CrystallizationCrystallization Conditions①1150° C.-3 h1150° C.-3 h1150° C.-3 h1150° C.-3 h1210° C.-2 hTransmittance380 nmunmeasured2.54unmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasured13.1unmeasuredunmeasuredunmeasuredthickness1200 nm unmeasured19.6unmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.unmeasuredAverage Crystallite Size [nm]117117117126unmeasuredα [×10−7 / ° C.] 30-380° C.8.4−6.24−3.974.67unmeasuredα [×10−7 / ° C.] 30-750° C.15.22.933.9714.25unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 43No. 106No. 107No. 108No. 109No110[% by mass]SiO251.851.453.553.663.2Al2O330.933.8323223.3MgO13.513.113.913.95.5Li2O00000Na2O0.020.030.030.030.44K2O00000.29CaO0.10.490.090.090.14SrO00.230.0100BaO00.020.0101.22ZnO000.0100B2O33.410.70.20.10P2O5000.0101.34TiO20.010.010.010.012ZrO2000.0102.26HfO2000.00010.0010.05SnO20.20.220.230.230.3Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.540.520.540.540.69Al / (Si + Al + Mg)0.320.340.320.320.25Mg / (Si + Al + Mg)0.140.130.140.140.06Si / Al1.681.521.671.682.71Si / Mg3.843.923.853.8611.49Al / Mg2.292.582.302.304.24(Li + Na + K) / Si0.000390.000580.000560.000560.01155Li + Na + K + Ca +0.120.770.140.122.09Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.171.101.171.172.19Zn − (Ti + Zr) [% by mass]−0.01−0.01−0.01−0.01−4.26Ti / (Ti + Fe)0.5000.5000.5000.5000.995As + Sb [% by mass00000Sn + As + Sb + Cl0.200.220.230.230.30[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 44No. 106No. 107No. 108No. 109No. 110Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.35.7unmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasured32.8unmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasured58.8unmeasuredunmeasuredunmeasuredthickness1200 nm unmeasured64.2unmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]117unmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.8.77unmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.23.1unmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 451No. 111No. 112No. 113No. 114No. 115[% by mass]SiO260.765.065.058.159.5Al2O32620.420.426.425.3MgO5.45.55.59.86.2Li2O00000Na2O0.440.451.350.070.07K2O0.290.30.300.01CaO0.140.140.145.358.58SrO00000BaO1.211.241.2400ZnO00000B2O301000P2O51.331.351.360.010.02TiO21.972.012.020.010.01ZrO22.222.262.2700HfO20.050.050.0500SnO20.290.290.290.30.3Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.660.720.720.620.65Al / (Si + Al + Mg)0.280.220.220.280.28Mg / (Si + Al + Mg)0.060.060.060.100.07Si / Al2.333.193.192.202.35Si / Mg11.2411.8211.825.939.60Al / Mg4.813.713.712.694.08(Li + Na + K) / Si0.012030.011540.025380.001200.00134Li + Na + K + Ca +2.082.133.035.428.66Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.932.512.511.601.89Zn − (Ti + Zr) [% by mass]−4.19−4.27−4.29−0.01−0.01Ti / (Ti + Fe)0.9950.9950.9950.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl0.290.290.290.300.30[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 46No. 111No. 112No. 113No. 114No. 115Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]1434unmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]1497unmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] 1564unmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]1694unmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasured1249unmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 47No. 116No. 117No. 118No. 119No. 120[% by mass]SiO252.152.551.652.052.5Al2O332.731.93433.233.6MgO12.411.813.112.413.1Li2O00000Na2O0.030.020.030.040.03K2O0.010000CaO0.871.240.10.10.1SrO0.470.71000BaO0.050.07000ZnO000.991.960.47B2O31.11.6000P2O500000TiO20.010.010.010.020.01ZrO200000HfO200000SnO20.210.210.220.220.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.540.550.520.530.53Al / (Si + Al + Mg)0.340.330.340.340.34Mg / (Si + Al + Mg)0.130.120.130.130.13Si / Al1.591.651.521.571.56Si / Mg4.204.453.944.194.01Al / Mg2.642.702.602.682.56(Li + Na + K) / Si0.000770.000380.000580.000770.00057Li + Na + K + Ca +1.432.040.130.140.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.161.201.121.181.13Zn − (Ti + Zr) [% by mass]−0.01−0.010.981.940.46Ti / (Ti + Fe)0.5000.5000.5000.6670.500As + Sb [% by mass]00000Sn + As + Sb + Cl0.210.210.220.220.22[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 48No. 116No. 117No. 118No. 119No. 120Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1055° C.-2 h1140° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]126126117117126α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 49No. 121No. 122No. 123No. 124No. 125[% by mass]SiO253.955.356.856.257.9Al2O332.431.330.130.829.5MgO12.411.610.911.711Li2O00000Na2O0.030.040.030.050.04K2O00.010.010.010.01CaO0.10.060.050.060.06SrO00000BaO00000ZnO0.931.381.850.951.28B2O300000P2O500000TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.220.230.230.230.24Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.550.560.580.570.59Al / (Si + Al + Mg)0.330.320.310.310.30Mg / (Si + Al + Mg)0.130.120.110.120.11Si / Al1.661.771.891.821.96Si / Mg4.354.775.214.805.26Al / Mg2.612.702.762.632.68(Li + Na + K) / Si0.000560.000900.000700.001070.00086Li + Na + K + Ca +0.130.110.090.120.11Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.221.321.431.341.46Zn − (Ti + Zr) [% by mass]0.921.371.840.941.27Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass00000Sn + As + Sb + Cl0.220.230.230.230.24[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 50No. 121No. 122No. 123No. 124No. 125Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasured1380unmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasured1413unmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasured1453unmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasured1534unmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasured16.3unmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasured63.9unmeasuredunmeasuredthickness1200 nm unmeasuredunmeasured76unmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]126unmeasured116unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured5.38unmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured11.02unmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 51No. 126No. 127No. 128No. 129No. 130[% by mass]SiO256.157.455.356.654.2Al2O330.12929.228.430.4MgO12.511.812.311.612.6Li2O00000Na2O0.050.040.050.030.08K2O0.010.010.010.010.01CaO0.060.060.060.060.86SrO00000.46BaO00000.05ZnO0.931.390.931.380B2O3001.91.71.1P2O500000TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.230.230.210.220.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.570.580.570.590.56Al / (Si + Al + Mg)0.300.300.300.290.31Mg / (Si + Al + Mg)0.130.120.130.120.13Si / Al1.861.981.891.991.78Si / Mg4.494.864.504.884.30Al / Mg2.412.462.372.452.41(Li + Na + K) / Si0.001070.000870.001080.000710.00166Li + Na + K + Ca +0.120.110.120.11.46Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.341.441.351.451.26Zn − (Ti + Zr) [% by mass]0.921.380.921.37−0.01Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass00000Sn + As + Sb + Cl0.230.230.210.220.23[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 52No. 126No. 127No. 128No. 129No. 130Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasured1294unmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasured1377unmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasured1442unmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasured1534unmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1140° C.-2 h1110° C.-2 h1110° C.-2 h1120° C.-2 hTransmittance380 nmunmeasured19.8unmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasured66.2unmeasuredunmeasuredunmeasuredthickness1200 nm unmeasured78.1unmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured5.86unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured11.65unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 53No. 131No. 132No. 133No. 134No. 135[% by mass]SiO254.553.253.454.652.2Al2O329.729.929.330.632.2MgO11.912.411.711.112.2Li2O00000Na2O0.080.080.080.050.05K2O0.010.010.010.010.01CaO1.250.861.260.850.06SrO0.70.470.710.460BaO0.070.050.070.050ZnO0000.940B2O31.62.73.21.11.1P2O500002.03TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.220.220.210.230.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.570.560.570.570.54Al / (Si + Al + Mg)0.310.310.310.320.33Mg / (Si + Al + Mg)0.120.130.120.120.13Si / Al1.841.781.821.781.62Si / Mg4.584.294.564.924.28Al / Mg2.502.412.502.762.64(Li + Na + K) / Si0.001650.001690.001690.001100.00115Li + Na + K + Ca +2.111.472.131.420.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.311.261.301.331.18Zn − (Ti + Zr) [% by mass]−0.01−0.01−0.010.93−0.01Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass00000Sn + As + Sb + Cl0.220.220.210.230.23[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 54No. 131No. 132No. 133No. 134No. 135Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasuredunmeasuredunmeasuredunmeasured 10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 55No. 136No. 137No. 138No. 139No. 140[% by mass]SiO251.456.958.748.454.0Al2O331.925.827.534.931.7MgO11.19.713.516.413.9Li2O00000Na2O0.070.040.050.060.05K2O0.010.010.010.010.01CaO0.065.260.070.090.07SrO00000BaO00000ZnO2.220000B2O31.10000P2O51.920.02000TiO20.0120.020.010.01ZrO200000HfO200000SnO20.220.290.230.210.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.540.620.590.490.54Al / (Si + Al + Mg)0.340.280.280.350.32Mg / (Si + Al + Mg)0.120.100.140.160.14Si / Al1.612.212.131.391.70Si / Mg4.635.874.352.953.88Al / Mg2.872.662.042.132.28(Li + Na + K) / Si0.001560.000880.001020.001450.00111Li + Na + K + Ca +0.145.310.130.160.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.251.601.430.941.18Zn − (Ti + Zr) [% by mass]2.21−2−0.02−0.01−0.01Ti / (Ti + Fe)0.5000.9950.6670.5000.500As + Sb [% by mass00000Sn + As + Sb + Cl0.220.290.230.210.22[% by mass]Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 56No. 136No. 137No. 138No. 139No. 140Before CrystallizationTemperature 10{circumflex over ( )}4 [° C.]unmeasuredunmeasured125711991246equiv. to High- 10{circumflex over ( )}3 [° C.]unmeasuredunmeasured137112871340Temp. Viscosity10{circumflex over ( )}2.5 [° C.] unmeasuredunmeasured144813471406 10{circumflex over ( )}2 [° C.]unmeasuredunmeasured154514251493Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1140° C.-2 h1140° C.-2 h1140° C.-2 h1140° C.-2 h1140° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 57No. 141No. 142No. 143No. 144No. 145[% by mass]SiO253.861.749.950.058.1Al2O329.125.830.934.229.4MgO16.712.218.813.612.1Li2O00000Na2O0.050.040.050.070.05K2O0.010.010.010.010.01CaO0.090.060.10.070.06SrO00000BaO00000ZnO0001.830B2O300000P2O500000TiO20.010.020.010.010.02ZrO200000HfO200000SnO20.230.230.230.230.24Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.540.620.500.510.58Al / (Si + Al + Mg)0.290.260.310.350.30Mg / (Si + Al + Mg)0.170.120.190.140.12Si / Al1.852.391.611.461.98Si / Mg3.225.062.653.684.80Al / Mg1.742.111.642.512.43(Li + Na + K) / Si0.001120.000810.001200.001600.00103Li + Na + K + Ca + Sr + Ba [% by mass]0.150.110.160.150.12(Si + Zn) / (Mg + Al)1.171.621.001.081.40Zn − (Ti + Zr) [% by mass]−0.01−0.02−0.011.82−0.02Ti / (Ti + Fe)0.5000.6670.5000.5000.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.230.230.230.24Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 58No. 141No. 142No. 143No. 144No. 145Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12111275115012461281equiv. to High-10{circumflex over ( )}3 [° C.]13061404125713281386Temp. Viscosity10{circumflex over ( )}2.5 [° C.]  1375149013261386146010{circumflex over ( )}2 [° C.]14651596141114631557Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1060° C.-2 h1010° C.-2 h1060° C.-2 h1060° C.-2 h1170° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasured21.3[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasured68.6thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasured81.5L *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasured40.7Transmittance800 nmunmeasuredunmeasuredunmeasuredunmeasured42.5[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasured35.1Precipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasured7.71α [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasured13.69Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 59No. 146No. 147No. 148No. 149No. 150[% by mass]SiO252.956.357.357.156.8Al2O331.528.328.928.828.6MgO13.811.611.911.811.8Li2O000.10.51Na2O0.070.060.060.070.07K2O0.010.010.010.010.01CaO0.070.060.060.060.06SrO00000BaO00000ZnO1.41.381.411.411.39B2O300000P2O500000TiO20.011.970.010.010.01ZrO200000HfO200000SnO20.230.240.230.230.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.540.590.580.580.58Al / (Si + Al + Mg)0.320.290.290.290.29Mg / (Si + Al + Mg)0.140.120.120.120.12Si / Al1.681.991.981.981.99Si / Mg3.834.854.824.844.81Al / Mg2.282.442.432.442.42(Li + Na + K) / Si0.001510.001240.002970.010160.01901Li + Na + K + Ca + Sr + Ba [% by mass]0.150.130.230.641.14(Si + Zn) / (Mg + Al)1.201.451.441.441.44Zn − (Ti + Zr) [% by mass]1.39−0.591.41.41.38Ti / (Ti + Fe)0.5000.9950.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.240.230.230.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 60No. 146No. 147No. 148No. 149No. 150Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1140° C.-2 h1140° C.-2 h1140° C.-2 h1190° C.-2 h1160° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured7.1922.89unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured13.0626.62unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 61No. 151No. 152No. 153No. 154No. 155[% by mass]SiO258.654.845.963.360.5Al2O331.33340.12224.5MgO9.811.813.714.414.6Li2O00000Na2O0.050.050.060.040.06K2O0.010.010.010.010.01CaO0.060.070.080.080.08SrO00000BaO00000ZnO00000B2O300000P2O500000TiO20.020.010.010.020.02ZrO200000HfO200000SnO20.170.160.170.220.22Fe2O30.020.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.590.550.460.630.61Al / (Si + Al + Mg)0.310.330.400.220.25Mg / (Si + Al + Mg)0.100.120.140.140.15Si / Al1.871.661.142.882.47Si / Mg5.984.643.354.404.14Al / Mg3.192.802.931.531.68(Li + Na + K) / Si0.001020.001090.001530.000790.00116Li + Na + K + Ca + Sr + Ba [% by mass]0.120.130.150.130.15(Si + Zn) / (Mg + Al)1.431.220.851.741.55Zn − (Ti + Zr) [% by mass]−0.02−0.01−0.01−0.02−0.02Ti / (Ti + Fe)0.5000.5000.5000.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.170.160.170.220.22Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 62No. 151No. 152No. 153No. 154No. 155Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasured1303unmeasured1254unmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasured1386unmeasured1386unmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasured1446unmeasured1472unmeasured10{circumflex over ( )}2 [° C.]unmeasured1526unmeasured1579unmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1140° C.-2 h1140° C.-2 h1140° C.-2 h1140° C.-2 h1140° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 63No. 156No. 157No. 158No. 159No. 160[% by mass]SiO259.455.451.057.860.6Al2O331.734.738.327.125.6MgO8.59.510.313.312Li2O00000Na2O0.070.080.080.080.07K2O0.010.010.010.010.01CaO0.050.050.060.070.06SrO00000BaO00000ZnO0001.391.4B2O300000P2O500000TiO20.020.010.010.010.02ZrO200000HfO200000SnO20.210.190.180.240.24Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.600.560.510.590.62Al / (Si + Al + Mg)0.320.350.380.280.26Mg / (Si + Al + Mg)0.090.100.100.140.12Si / Al1.871.601.332.132.37Si / Mg6.995.834.954.355.05Al / Mg3.733.653.722.042.13(Li + Na + K) / Si0.001350.001620.001760.001560.00132Li + Na + K + Ca + Sr + Ba [% by mass]0.130.140.150.160.14(Si + Zn) / (Mg + Al)1.481.251.051.471.65Zn − (Ti + Zr) [% by mass]−0.02−0.01−0.011.381.38Ti / (Ti + Fe)0.6670.5000.5000.5000.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.210.190.180.240.24Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 64No. 156No. 157No. 158No. 159No. 160Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1120° C.-2 h1210° C.-2 h1130° C.-2 h1130° C.-2 h1100° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 65No. 161No. 162No. 163No. 164No. 165[% by mass]SiO259.156.353.756.856.4Al2O327.628.7332928.7MgO11.411.811.611.911.8Li2O00000Na2O0.070.090.090.070.08K2O0.0100.010.010.01CaO0.060.060.060.070.06SrO0001.860BaO00002.68ZnO1.412.791.400B2O300000P2O500000TiO20.020.010.010.020.02ZrO200000HfO200000SnO20.30.240.160.210.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.00020.00020.00020.00020.0002V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.600.580.550.580.58Al / (Si + Al + Mg)0.280.300.340.300.30Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al2.141.961.631.961.97Si / Mg5.184.774.634.774.78Al / Mg2.422.432.842.442.43(Li + Na + K) / Si0.001350.001600.001860.001410.00160Li + Na + K + Ca + Sr + Ba [% by mass]0.140.150.162.012.83(Si + Zn) / (Mg + Al)1.551.461.241.391.39Zn − (Ti + Zr) [% by mass]1.392.781.39−0.02−0.02Ti / (Ti + Fe)0.6670.5000.5000.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.300.240.160.210.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 66No. 161No. 162No. 163No. 164No. 165Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 h1210° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 67No. 166No. 167No. 168No. 169No. 170[% by mass]SiO257.457.357.357.357.2Al2O329.328.9292929.1MgO1211.911.911.811.9Li2O00000Na2O0.070.060.060.060.06K2O0.010.010.010.010.01CaO0.940.060.060.060.06SrO00000BaO00000ZnO01.411.381.381.39B2O300000P2O500000TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.230.230.220.230.23Fe2O30.010.010.010.010As2O300000Sb2O300000Cl200000MoO30.00020000V2O500.0300CuO000.1000NiO0000.090MnO200000.11Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.580.580.58Al / (Si + Al + Mg)0.300.290.300.300.30Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al1.961.981.981.981.97Si / Mg4.784.824.824.864.81Al / Mg2.442.432.442.462.45(Li + Na + K) / Si0.001390.001220.001220.001220.00122Li + Na + K + Ca + Sr + Ba [% by mass]1.020.130.130.130.13(Si + Zn) / (Mg + Al)1.391.441.431.441.43Zn − (Ti + Zr) [% by mass]−0.011.41.371.371.38Ti / (Ti + Fe)0.5000.5000.5000.5001.000As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.230.220.230.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 68No. 166No. 167No. 168No. 169No. 170Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasured2.582.582.582.58β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1210° C.-2 h1150° C.-2 h1110° C.-2 h1100° C.-2 h1110° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasured60596058α [×10−7 / ° C.] 30-380° C.unmeasured7.12unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured12.98unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 69No. 171No. 172No. 173No. 174No. 175[% by mass]SiO257.157.257.157.257.2Al2O329.12929.12929MgO11.911.911.911.911.9Li2O00000Na2O0.080.080.080.080.08K2O0.010.010.010.010.01CaO0.060.060.060.060.06SrO00000BaO00000ZnO1.391.41.41.41.4B2O300000P2O500000TiO20.110.010.010.010.01ZrO200000HfO200000SnO20.220.230.230.230.23Fe2O30.010.10.010.010.01As2O300000Sb2O300000Cl200000MoO300000.11V2O500000CuO00000NiO00000MnO200000Cr2O3000.0900Nd2O30000.100WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.580.580.58Al / (Si + Al + Mg)0.300.300.300.300.30Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al1.961.971.961.971.97Si / Mg4.804.814.804.814.81Al / Mg2.452.442.452.442.44(Li + Na + K) / Si0.001580.001570.001580.001570.00157Li + Na + K + Ca + Sr + Ba [% by mass]0.150.150.150.150.15(Si + Zn) / (Mg + Al)1.431.431.431.431.43Zn − (Ti + Zr) [% by mass]1.281.391.391.391.39Ti / (Ti + Fe)0.9170.0910.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.230.230.230.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 70No. 171No. 172No. 173No. 174No. 175Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to High-10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTemp. Viscosity10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasured10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.582.582.582.582.58β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1100° C.-2 h1140° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]5958585961α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughness ofunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrincipal SurfaceRa [nm]Average Surface Roughness of EndunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredSurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 71No. 176No. 177No. 178No. 179No. 180[% by mass]SiO257.157.157.156.656.7Al2O329.129.129.128.828.8MgO11.911.911.911.811.8Li2O00000Na2O0.080.080.080.080.08K2O0.010.0100.010CaO0.060.060.060.060.07SrO00000BaO00000ZnO1.41.391.41.41.41B2O300000P2O500000TiO20.010.010.010.990.01ZrO200000HfO200000SnO20.230.220.220.231.09Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500.10000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO30.110000Co3O4000.1100[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.580.580.58Al / (Si + Al + Mg)0.300.300.300.300.30Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al1.961.961.961.971.97Si / Mg4.804.804.804.804.81Al / Mg2.452.452.452.442.44(Li + Na + K) / Si0.001580.001580.001400.001590.00141Li + Na + K + Ca + Sr + Ba [% by mass]0.150.150.140.150.15(Si + Zn) / (Mg + Al)1.431.431.431.431.43Zn − (Ti + Zr) [% by mass]1.391.381.390.411.4Ti / (Ti + Fe)0.5000.5000.5000.9900.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.220.220.231.09Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 72No. 176No. 177No. 178No. 179No. 180Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasured12461255equiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasured13611368High-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasured14371443Viscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasured15331536Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasured14481454Liquidus Viscosity [—]unmeasuredunmeasuredunmeasured2.42.4α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.592.582.592.592.60β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions{circle around (1)}1130° C.-2 h1110° C.-2 h1110° C.-2 h1110° C.-2 h1085° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]5958596158α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 73No. 181No. 182No. 183No. 184No. 185[% by mass]SiO256.656.656.756.765.1Al2O328.728.828.728.819.9MgO11.811.811.811.714.6Li2O00000Na2O0.080.080.080.080.05K2O0.010.010.010.010.01CaO0.060.060.060.060.08SrO00000BaO00000ZnO1.41.41.41.40B2O300000P2O500.98000TiO20.010.010.010.010.02ZrO21.020000HfO20.020000SnO20.230.230.220.220.19Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO3001.100V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300010Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.580.580.65Al / (Si + Al + Mg)0.300.300.300.300.20Mg / (Si + Al + Mg)0.120.120.120.120.15Si / Al1.971.971.981.973.27Si / Mg4.804.804.814.854.46Al / Mg2.432.442.432.461.36(Li + Na + K) / Si0.001590.001590.001590.001590.00092Li + Na + K + Ca +0.150.150.150.150.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.431.431.431.431.89Zn − (Ti + Zr) [% by mass]0.371.391.391.39−0.02Ti / (Ti + Fe)0.5000.5000.5000.5000.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.230.220.220.19Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 74No. 181No. 182No. 183No. 184No. 185Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12641253125112561273equiv. to10{circumflex over ( )}3 [° C.]13691372136513681416High-Temp.10{circumflex over ( )}2.5 [° C.]  14421451144214441507Viscosity10{circumflex over ( )}2 [° C.]15351548153715391619Liquidus Temperature [° C.]14501447145014611357Liquidus Viscosity [—]2.52.52.52.43.38α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasured34.9Density [g / cm3]2.602.582.592.602.52β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1100° C.-2 h1110° C.-2 h1100° C.-2 h1085° C.-2 h1120° C.-2 hTransmittance380 nm19.4unmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nm66.5unmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm 78.7unmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasured58unmeasured5850α [×10−7 / ° C.] 30-380° C.8.24unmeasured11.63unmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.14.1unmeasured17.71unmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 75No. 186No. 187No. 188No. 189No. 190[% by mass]SiO254.650.759.756.856.2Al2O325.426.82826.430.4MgO19.622.11216.513Li2O00000Na2O0.070.070.060.060.07K2O0.010.010.0100.01CaO0.10.120.060.080.07SrO00000BaO00000ZnO00.01000B2O300000P2O500.01000TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.20.180.20.20.2Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.550.510.600.570.56Al / (Si + Al + Mg)0.260.270.280.260.31Mg / (Si + Al + Mg)0.200.220.120.170.13Si / Al2.151.892.132.151.85Si / Mg2.792.294.983.444.32Al / Mg1.301.212.331.602.34(Li + Na + K) / Si0.001470.001580.001170.001060.00142Li + Na + K + Ca +0.180.20.130.140.15Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.211.041.491.321.29Zn − (Ti + Zr) [% by mass]−0.010−0.01−0.01−0.01Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.200.180.200.200.20Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 76No. 186No. 187No. 188No. 189No. 190Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]11951159114011281183equiv. to10{circumflex over ( )}3 [° C.]13161264123012131298High-Temp.10{circumflex over ( )}2.5 [° C.]  13961336129412741374Viscosity10{circumflex over ( )}2 [° C.]14981427137813551466Liquidus Temperature [° C.]13641335134814001287Liquidus Viscosity [—]2.692.512.161.783.1α [×10−7 / ° C.] 30-380° C.41.2unmeasuredunmeasured48.241.3Density [g / cm3]2.592.642.682.712.61β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1120° C.-2 h1090° C.-2 h1100° C.-2 h1100° C.-2 h1100° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]3751575659α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 77No. 191No. 192No. 193No. 194No. 195[% by mass]SiO257.456.353.756.856.4Al2O329.328.7332928.7MgO1211.811.611.911.8Li2O00000Na2O0.070.090.090.070.08K2O0.0100.010.010.01CaO0.940.060.060.070.06SrO0001.860BaO00002.68ZnO02.791.400B2O300000P2O500000TiO20.010.010.010.020.02ZrO200000HfO200000SnO20.230.240.160.210.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.550.580.58Al / (Si + Al + Mg)0.300.300.340.300.30Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al1.961.961.631.961.97Si / Mg4.784.774.634.774.78Al / Mg2.442.432.842.442.43(Li + Na + K) / Si0.001390.001600.001860.001410.00160Li + Na + K + Ca +1.020.150.162.012.83Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.391.461.241.391.39Zn − (Ti + Zr) [% by mass]−0.012.781.39−0.02−0.02Ti / (Ti + Fe)0.5000.5000.5000.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.240.160.210.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 78No. 191No. 192No. 193No. 194No. 195Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1170unmeasuredunmeasured1202unmeasuredequiv. to10{circumflex over ( )}3 [° C.]1280unmeasuredunmeasured1319unmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  1350unmeasuredunmeasured1395unmeasuredViscosity10{circumflex over ( )}2 [° C.]1441unmeasuredunmeasured1490unmeasuredLiquidus Temperature [° C.]1314unmeasuredunmeasured1380unmeasuredLiquidus Viscosity [—]2.7unmeasuredunmeasured2.59unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured45.3unmeasured38.9unmeasuredDensity [g / cm3]2.642.692.552.602.58β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1110° C.-2 h1100° C.-2 h1200° C.-2 h1110° C.-2 h1110° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]6158596259α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 79No. 196No. 197No. 198No. 199No. 200[% by mass]SiO254.354.55756.755.5Al2O332.432.928.928.732.2MgO12.911.811.811.811.9Li2O00000Na2O0.070.070.080.080.07K2O0.010.010.010.010.01CaO0.070.060.060.060.06SrO00000BaO00000ZnO001.41.40B2O300000P2O50000.330TiO20.010.490.50.330.01ZrO20000.340HfO20000.010SnO20.190.170.230.20.19Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.550.550.580.580.56Al / (Si + Al + Mg)0.330.330.300.300.32Mg / (Si + Al + Mg)0.130.120.120.120.12Si / Al1.681.661.971.981.72Si / Mg4.214.624.834.814.66Al / Mg2.512.792.452.432.71(Li + Na + K) / Si0.001470.001470.001580.001590.00144Li + Na + K + Ca +0.150.140.150.150.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.201.221.431.431.26Zn − (Ti + Zr) [% by mass]−0.01−0.490.90.73−0.01Ti / (Ti + Fe)0.5000.9800.9800.9710.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.190.170.230.200.19Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 80No. 196No. 197No. 198No. 199No. 200Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasured1259unmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasured1366unmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasured1441unmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasured1539unmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasured1443unmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasured2.49unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.602.592.592.592.58β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1085° C.-2 h1100° C.-2 h1110° C.-2 h1130° C.-2 h1120° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]59unmeasuredunmeasured59unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasured8.6unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasured14.7unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 81No. 201No. 202No. 203No. 204No. 205[% by mass]SiO25554.557.756.856.5Al2O332.432.729.22929MgO12.212.51211.911.9Li2O00000Na2O0.070.070.070.080.08K2O0.010.010.010.010.01CaO0.060.060.060.060.06SrO00000BaO00000ZnO000.711.391.39B2O300000P2O500000TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.190.190.230.220.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O50000.120.18CuO00000NiO00000MnO200000Cr2O30000.390.57Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.550.550.580.580.58Al / (Si + Al + Mg)0.330.330.300.300.30Mg / (Si + Al + Mg)0.120.130.120.120.12Si / Al1.701.671.981.961.95Si / Mg4.514.364.814.774.75Al / Mg2.662.622.432.442.44(Li + Na + K) / Si0.001450.001470.001390.001580.00159Li + Na + K + Ca +0.140.140.140.150.15Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.231.211.421.421.42Zn − (Ti + Zr) [% by mass]−0.01−0.010.71.381.38Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.190.190.230.220.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 82No. 201No. 202No. 203No. 204No. 205Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.592.592.572.592.60β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1120° C.-2 h1110° C.-2 h1130° C.-2 h1110° C.-2 h1100° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 83No. 206No. 207No. 208No. 209No. 210[% by mass]SiO256.357.254.754.854.8Al2O328.931.83033.132.6MgO11.910.71511.311.8Li2O00000Na2O0.080.070.070.070.07K2O0.010.010.010.010.01CaO0.060.060.080.060.06SrO00000BaO00000ZnO1.40000B2O300000P2O500000TiO20.010.010.010.490.5ZrO200000HfO200000SnO20.220.180.20.170.16Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O50.250000CuO00000NiO00000MnO200000Cr2O30.80000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.570.550.550.55Al / (Si + Al + Mg)0.300.320.300.330.33Mg / (Si + Al + Mg)0.120.110.150.110.12Si / Al1.951.801.821.661.68Si / Mg4.735.353.654.854.64Al / Mg2.432.972.002.932.76(Li + Na + K) / Si0.001600.001400.001460.001460.00146Li + Na + K + Ca +0.150.140.160.140.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.411.351.221.231.23Zn − (Ti + Zr) [% by mass]1.39−0.01−0.01−0.49−0.5Ti / (Ti + Fe)0.5000.5000.5000.9800.980As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.180.200.170.16Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 84No. 206No. 207No. 208No. 209No. 210Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.602.562.612.592.59β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1110° C.-2 h1150° C.-2 h1100° C.-2 h1100° C.-2 h1100° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 85No. 211No. 212No. 213No. 214No. 215[% by mass]SiO256.456.65757.557.8Al2O329.229.1292929.3MgO11.911.911.911.912Li2O00000Na2O0.080.080.080.080.07K2O0.010.010.010.010.01CaO0.060.060.060.060.06SrO00000BaO00000ZnO1.411.411.411.410.71B2O300000P2O50.010.01000TiO20.010.010.010.010.01ZrO20.010.01000HfO200000SnO20.210.20.2200Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.730.650.2800V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.580.580.58Al / (Si + Al + Mg)0.300.300.300.290.30Mg / (Si + Al + Mg)0.120.120.120.120.12Si / Al1.931.951.971.981.97Si / Mg4.744.764.794.834.82Al / Mg2.452.452.442.442.44(Li + Na + K) / Si0.001600.001590.001580.001570.00138Li + Na + K + Ca +0.150.150.150.150.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.411.411.431.441.42Zn − (Ti + Zr) [% by mass]1.391.391.41.40.7Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.210.200.220.000.00Sn / (Sn + As + Sb + Cl)111——Metal Al [ppm]00000TABLE 86No. 211No. 212No. 213No. 214No. 215Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.592.592.592.582.57β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1100° C.-2 h1100° C.-2 h1100° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 87No. 216No. 217No. 218No. 219No. 220[% by mass]SiO258.254.354.654.354.1Al2O329.532.6333333MgO12.112.911.811.911.9Li2O00000Na2O0.060.070.070.070.07K2O0.010.010.010.010.01CaO0.060.070.060.060.06SrO00000BaO00000ZnO000.0100B2O300000P2O500000TiO20.020.010.010.010.01ZrO200000HfO200000SnO2000.130.130.13Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO3000.280.540.80V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.540.550.550.55Al / (Si + Al + Mg)0.300.330.330.330.33Mg / (Si + Al + Mg)0.120.130.120.120.12Si / Al1.971.671.651.651.64Si / Mg4.814.214.634.564.55Al / Mg2.442.532.802.772.77(Li + Na + K) / Si0.001200.001470.001470.001470.00148Li + Na + K + Ca +0.130.150.140.140.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.401.191.221.211.20Zn − (Ti + Zr) [% by mass]−0.02−0.010−0.01−0.01Ti / (Ti + Fe)0.6670.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.000.000.130.130.13Sn / (Sn + As + Sb + Cl)——111Metal Al [ppm]00000TABLE 88No. 216No. 217No. 218No. 219No. 220Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.562.592.592.592.59β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 89No. 221No. 222No. 223No. 224No. 225[% by mass]SiO253.95757.457.859.4Al2O33325.225.425.722.9MgO11.914.81515.114.6Li2O00000Na2O0.070.060.060.060.06K2O0.010.01000.01CaO0.060.080.080.080.07SrO00000BaO00000ZnO00000B2O302.61.91.12.6P2O500000TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.120.190.20.220.26Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO31.010000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.550.590.590.590.61Al / (Si + Al + Mg)0.330.260.260.260.24Mg / (Si + Al + Mg)0.120.150.150.150.15Si / Al1.632.262.262.252.59Si / Mg4.533.853.833.834.07Al / Mg2.771.701.691.701.57(Li + Na + K) / Si0.001480.001230.001050.001040.00118Li + Na + K + Ca +0.140.150.140.140.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.201.431.421.421.58Zn − (Ti + Zr) [% by mass]−0.01−0.01−0.01−0.01−0.01Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.120.190.200.220.26Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 90No. 221No. 222No. 223No. 224No. 225Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.602.552.582.572.53β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1250° C.-2 h1250° C.-2 h1250° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasured636261unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured20.219.7unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured28.126.7unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 91No. 226No. 227No. 228No. 229No. 230[% by mass]SiO255.353.257.357.260.4Al2O32929272526.8MgO11.91211.91211Li2O00000Na2O0.080.080.080.070.07K2O0.010.010.010.010.01CaO0.060.060.060.060.05SrO00000BaO00000ZnO1.421.421.421.421.4B2O300000P2O52.014.022.014.020TiO20.010.010.010.010.01ZrO200000HfO200000SnO20.230.230.220.240.2Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.570.560.600.610.62Al / (Si + Al + Mg)0.300.310.280.270.27Mg / (Si + Al + Mg)0.120.130.120.130.11Si / Al1.911.832.122.292.25Si / Mg4.654.434.824.775.49Al / Mg2.442.422.272.082.44(Li + Na + K) / Si0.001630.001690.001570.001400.00132Li + Na + K + Ca +0.150.150.150.140.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.391.331.511.581.63Zn − (Ti + Zr) [% by mass]1.411.411.411.411.39Ti / (Ti + Fe)0.5000.5000.5000.5000.500As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.230.230.220.240.20Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 92No. 226No. 227No. 228No. 229No. 230Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12771248125212591291equiv. to10{circumflex over ( )}3 [° C.]13751363137913921404High-Temp.10{circumflex over ( )}2.5 [° C.]  14471440146214791482Viscosity10{circumflex over ( )}2 [° C.]15461536156415831585Liquidus Temperature [° C.]14561438140212911441Liquidus Viscosity [—]2.452.512.853.732.75α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.582.582.562.552.55β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1250° C.-2 h1130° C.-2 h1150° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasured52α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured19.3unmeasured14α [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured26.2unmeasured17.8Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 93No. 231No. 232No. 233No. 234No. 235[% by mass]SiO262.965.368.263.863.8Al2O32523.321.319.519.5MgO10.39.78.814.314.3Li2O00000Na2O0.070.070.060.050.05K2O0.010.010.010.010.01CaO0.050.050.040.070.07SrO00000BaO00000ZnO1.41.411.400B2O300000P2O50000.010TiO20.010.010.021.990.03ZrO200001.99HfO200000.04SnO20.190.190.170.190.18Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.640.660.690.650.65Al / (Si + Al + Mg)0.250.240.220.200.20Mg / (Si + Al + Mg)0.100.100.090.150.15Si / Al2.522.803.203.273.27Si / Mg6.116.737.754.464.46Al / Mg2.432.402.421.361.36(Li + Na + K) / Si0.001270.001230.001030.000940.00094Li + Na + K + Ca +0.130.130.110.130.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.822.022.311.891.89Zn − (Ti + Zr) [% by mass]1.391.41.38−1.99−2.02Ti / (Ti + Fe)0.5000.5000.6670.9950.750As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.190.190.170.190.18Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 94No. 231No. 232No. 233No. 234No. 235Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]13011321135112541264equiv. to10{circumflex over ( )}3 [° C.]14331465150313911401High-Temp.10{circumflex over ( )}2.5 [° C.]  15211559160114801489Viscosity10{circumflex over ( )}2 [° C.]16321673172015911597Liquidus Temperature [° C.]1405139613701421unmeasuredLiquidus Viscosity [—]3.183.443.862.82unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured28.1unmeasuredunmeasuredDensity [g / cm3]2.522.502.472.531.27β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1150° C.-2 h1200° C.-2 h1250° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured21.7unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured22.6unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 95No. 236No. 237No. 238No. 239No. 240[% by mass]SiO264.164.660.560.560.4Al2O319.619.725.225.225.5MgO14.314.411.911.912Li2O00000Na2O0.050.060.060.060.06K2O0.010.940.010.010.01CaO0.070.070.060.060.06SrO00000BaO00000ZnO00000B2O31.70001.71P2O5000.0100TiO20.020.021.980.020.02ZrO20001.950HfO20000.040SnO20.180.180.220.20.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.650.650.620.620.62Al / (Si + Al + Mg)0.200.200.260.260.26Mg / (Si + Al + Mg)0.150.150.120.120.12Si / Al3.273.282.402.402.37Si / Mg4.484.495.085.085.03Al / Mg1.371.372.122.122.13(Li + Na + K) / Si0.000940.015480.001160.001160.00116Li + Na + K + Ca +0.131.070.130.130.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.891.891.631.631.61Zn − (Ti + Zr) [% by mass]−0.02−0.02−1.98−1.97−0.02Ti / (Ti + Fe)0.6670.6670.9950.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.180.180.220.200.22Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 96No. 236No. 237No. 238No. 239No. 240Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12561271125612651256equiv. to10{circumflex over ( )}3 [° C.]13941412138613951386High-Temp.10{circumflex over ( )}2.5 [° C.]  14831505147114791470Viscosity10{circumflex over ( )}2 [° C.]15921616157815811574Liquidus Temperature [° C.]unmeasuredunmeasured137813691377Liquidus Viscosity [—]unmeasuredunmeasured3.053.183.06α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.502.522.552.562.52β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1010° C.-2 h1130° C.-2 h1120° C.-2 h1120° C.-2 h1120° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured11.711.8unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured16.416.8unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 97No. 241No. 242No. 243No. 244No. 245[% by mass]SiO261.157.457.457.461.5Al2O325.629292921.8MgO1211.811.811.814.3Li2O00000Na2O0.060.040.040.040.05K2O0.940.010.010.010.01CaO0.060.060.060.060.07SrO00000BaO00000ZnO01.391.391.390B2O300000P2O500000.01TiO20.010.010.010.012ZrO200000HfO200000SnO20.20.230.230.230.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.03500.03500.03Rh0.020.020.020.020.02Pt + Rh0.0550.020.0550.020.05Si / (Si + Al + Mg)0.620.580.580.580.63Al / (Si + Al + Mg)0.260.300.300.300.22Mg / (Si + Al + Mg)0.120.120.120.120.15Si / Al2.391.981.981.982.82Si / Mg5.094.864.864.864.30Al / Mg2.132.462.462.461.52(Li + Na + K) / Si0.016370.000870.000870.000870.00098Li + Na + K + Ca +1.060.110.110.110.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.631.441.441.441.70Zn − (Ti + Zr) [% by mass]−0.011.381.381.38−2Ti / (Ti + Fe)0.5000.5000.5000.5000.995As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.200.230.230.230.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]005005000TABLE 98No. 241No. 242No. 243No. 244No. 245Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1275unmeasuredunmeasuredunmeasured1237equiv. to10{circumflex over ( )}3 [° C.]1408unmeasuredunmeasuredunmeasured1367High-Temp.10{circumflex over ( )}2.5 [° C.]  1494unmeasuredunmeasuredunmeasured1452Viscosity10{circumflex over ( )}2 [° C.]1600unmeasuredunmeasuredunmeasured1555Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasured1314Liquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasured3.37α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.532.582.582.582.55β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasured26.6unmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasured65unmeasuredunmeasuredthickness1200 nm unmeasuredunmeasured76.6unmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasured484948unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured6.697.16.93unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured12.512.913unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 99No. 246No. 247No. 248No. 249No. 250[% by mass]SiO261.561.662.264.564Al2O321.821.82219.719.4MgO14.314.314.414.414.2Li2O00000Na2O0.050.050.060.050.06K2O0.010.010.940.010.01CaO0.070.070.070.070.07SrO00000BaO00002.04ZnO00000B2O301.8010P2O500000TiO20.030.020.020.020.02ZrO21.980000HfO20.040000SnO20.220.220.210.190.18Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.630.630.630.650.66Al / (Si + Al + Mg)0.220.220.220.200.20Mg / (Si + Al + Mg)0.150.150.150.150.15Si / Al2.822.832.833.273.30Si / Mg4.304.314.324.484.51Al / Mg1.521.521.531.371.37(Li + Na + K) / Si0.000980.000970.016080.000930.00109Li + Na + K + Ca +0.130.131.070.132.18Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.701.711.711.891.90Zn − (Ti + Zr) [% by mass]−2.01−0.02−0.02−0.02−0.02Ti / (Ti + Fe)0.7500.6670.6670.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.220.210.190.18Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 100No. 246No. 247No. 248No. 249No. 250Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]124812391253unmeasured1268equiv. to10{circumflex over ( )}3 [° C.]137813711387unmeasured1405High-Temp.10{circumflex over ( )}2.5 [° C.]  146414561475unmeasured1494Viscosity10{circumflex over ( )}2 [° C.]156715611581unmeasured1605Liquidus Temperature [° C.]13011258unmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]3.553.84unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.572.522.532.512.55β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 101No. 251No. 252No. 253No. 254No. 255[% by mass]SiO263.863.954.955.955.5Al2O319.519.527.728.328.1MgO14.314.311.411.711.6Li2O00000Na2O0.050.050.070.080.07K2O0.010.010.010.010.01CaO0.070.070.060.060.06SrO00000BaO00000ZnO001.361.41.39B2O310000P2O50.011.970.0100TiO210.021.970.030.03ZrO2002.282.223.04HfO2000.040.040.06SnO20.190.190.210.240.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.650.650.580.580.58Al / (Si + Al + Mg)0.200.200.290.300.30Mg / (Si + Al + Mg)0.150.150.120.120.12Si / Al3.273.281.981.981.98Si / Mg4.464.474.824.784.78Al / Mg1.361.362.432.422.42(Li + Na + K) / Si0.000940.000940.001460.001610.00144Li + Na + K + Ca +0.130.130.140.150.14Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.891.891.441.431.43Zn − (Ti + Zr) [% by mass]−1−0.02−2.89−0.85−1.68Ti / (Ti + Fe)0.9900.6670.9950.7500.750As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.190.190.210.240.22Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 102No. 251No. 252No. 253No. 254No. 255Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12541277unmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]13911418unmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  14791510unmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]15861621unmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasured1399unmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasured3.12unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.522.512.632.622.63β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 103No. 256No. 257No. 258No. 259No. 260[% by mass]SiO25557.25754.664.5Al2O327.829.128.733.419.5MgO11.411.911.811.714.1Li2O00000Na2O0.070.080.080.070.05K2O00.010.010.010.01CaO0.060.060.060.060.07SrO00000BaO00000ZnO1.371.391.400B2O300001.6P2O500000TiO20.030.020.020.020.02ZrO23.030000HfO20.060000SnO21.230.190.940.140.16Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.580.580.580.550.66Al / (Si + Al + Mg)0.300.300.290.340.20Mg / (Si + Al + Mg)0.120.120.120.120.14Si / Al1.981.971.991.633.31Si / Mg4.824.814.834.674.57Al / Mg2.442.452.432.851.38(Li + Na + K) / Si0.001270.001570.001580.001470.00093Li + Na + K + Ca +0.130.150.150.140.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.441.431.441.211.92Zn − (Ti + Zr) [% by mass]−1.691.371.38−0.02−0.02Ti / (Ti + Fe)0.7500.6670.6670.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]1.230.190.940.140.16Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]01000500500500TABLE 104No. 256No. 257No. 258No. 259No. 260Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.652.582.602.592.50β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasured36.3unmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasured67.9unmeasuredunmeasuredunmeasuredthickness1200 nm unmeasured77.9unmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured7.6unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured14unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 105No. 261No. 262No. 263No. 264No. 265[% by mass]SiO264.76464.160.460.5Al2O319.719.419.525.325.2MgO14.414.214.21211.9Li2O00000Na2O0.970.060.040.060.07K2O0.010.010.010.010.01CaO0.070.071.930.060.06SrO02.06000BaO00002.05ZnO00000B2O300000P2O5000.011.960TiO20.020.020.020.020.02ZrO200000HfO200000SnO20.180.180.180.230.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.650.660.660.620.62Al / (Si + Al + Mg)0.200.200.200.260.26Mg / (Si + Al + Mg)0.150.150.150.120.12Si / Al3.283.303.292.392.40Si / Mg4.494.514.515.035.08Al / Mg1.371.371.372.112.12(Li + Na + K) / Si0.015150.001090.000780.001160.00132Li + Na + K + Ca +1.052.21.980.132.19Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.901.901.901.621.63Zn − (Ti + Zr) [% by mass]−0.02−0.02−0.02−0.02−0.02Ti / (Ti + Fe)0.6670.6670.6670.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.180.180.180.230.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 106No. 261No. 262No. 263No. 264No. 265Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12581260125212781270equiv. to10{circumflex over ( )}3 [° C.]13991395138814121402High-Temp.10{circumflex over ( )}2.5 [° C.]  14901483147714981488Viscosity10{circumflex over ( )}2 [° C.]16011590158516041592Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.522.552.542.522.56β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 107No. 266No. 267No. 268No. 269No. 270[% by mass]SiO261.260.560.561.761.6Al2O325.525.225.321.821.8MgO1211.911.914.214.2Li2O00000Na2O0.970.070.060.050.07K2O0.010.010.010.010.01CaO0.060.061.940.070.07SrO02.08000BaO00002.04ZnO00000B2O300000P2O50001.960TiO20.020.020.020.020.02ZrO200000HfO200000SnO20.220.210.230.220.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.620.620.620.630.63Al / (Si + Al + Mg)0.260.260.260.220.22Mg / (Si + Al + Mg)0.120.120.120.150.15Si / Al2.402.402.392.832.83Si / Mg5.105.085.084.354.34Al / Mg2.132.122.131.541.54(Li + Na + K) / Si0.016010.001320.001160.000970.00130Li + Na + K + Ca +1.042.222.010.132.19Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.631.631.631.711.71Zn − (Ti + Zr) [% by mass]−0.02−0.02−0.02−0.02−0.02Ti / (Ti + Fe)0.6670.6670.6670.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.210.230.220.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 108No. 266No. 267No. 268No. 269No. 270Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12651266125812581251equiv. to10{circumflex over ( )}3 [° C.]13991398138913941384High-Temp.10{circumflex over ( )}2.5 [° C.]  14861484147314811471Viscosity10{circumflex over ( )}2 [° C.]15921589157715871577Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.532.562.552.532.57β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 109No. 271No. 272No. 273No. 274No. 275[% by mass]SiO262.361.761.765.167.4Al2O32221.721.89.715.8MgO14.414.214.224.716.5Li2O00000Na2O0.970.060.050.030.03K2O0.010.010.010.010.01CaO0.070.071.940.130.08SrO02.07000BaO00000ZnO00000B2O300000P2O500.010.010.010TiO20.020.020.020.020.02ZrO200000HfO200000SnO20.210.210.220.20.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.630.630.630.650.68Al / (Si + Al + Mg)0.220.220.220.100.16Mg / (Si + Al + Mg)0.150.150.150.250.17Si / Al2.832.842.836.714.27Si / Mg4.334.354.352.644.08Al / Mg1.531.531.540.390.96(Li + Na + K) / Si0.015730.001130.000970.000610.00059Li + Na + K + Ca +1.052.2120.170.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.711.721.711.892.09Zn − (Ti + Zr) [% by mass]−0.02−0.02−0.02−0.02−0.02Ti / (Ti + Fe)0.6670.6670.6670.6670.667As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.210.210.220.200.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 110No. 271No. 272No. 273No. 274No. 275Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasured1247123711761259equiv. to10{circumflex over ( )}3 [° C.]unmeasured1378136612781397High-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasured1464145113501487Viscosity10{circumflex over ( )}2 [° C.]unmeasured1568155414441598Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasured1436Liquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasured2.77α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasured36.5Density [g / cm3]2.542.572.562.612.52β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 h1130° C.-2 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 111No. 276No. 277No. 278No. 279No. 280[% by mass]SiO267.267.364.561.963.9Al2O322.423.225.12722.4MgO109.21010.79Li2O00000Na2O0.050.050.060.060.05K2O0.010.010.010.010.01CaO0.050.040.050.050.04SrO00000BaO00000ZnO00000B2O300000P2O500000.02TiO20.020.020.020.021.98ZrO200002.34HfO200000.05SnO20.190.210.210.220.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.670.680.650.620.67Al / (Si + Al + Mg)0.220.230.250.270.24Mg / (Si + Al + Mg)0.100.090.100.110.09Si / Al3.002.902.572.292.85Si / Mg6.727.326.455.797.10Al / Mg2.242.522.512.522.49(Li + Na + K) / Si0.000890.000890.001090.001130.00094Li + Na + K + Ca +0.110.10.120.120.1Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.072.081.841.642.04Zn − (Ti + Zr) [% by mass]−0.02−0.02−0.02−0.02−4.32Ti / (Ti + Fe)0.6670.6670.6670.6670.995As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.190.210.210.220.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 112No. 276No. 277No. 278No. 279No. 280Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]13361341131012901305equiv. to10{circumflex over ( )}3 [° C.]14871489145114221449High-Temp.10{circumflex over ( )}2.5 [° C.]  15821583154115071541Viscosity10{circumflex over ( )}2 [° C.]16931696164916121652Liquidus Temperature [° C.]13861429unmeasured14601409Liquidus Viscosity [—]3.643.37unmeasured2.763.25α [×10−7 / ° C.] 30-380° C.unmeasured28.329.529.928.7Density [g / cm3]2.472.472.492.522.52β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1130° C.-2 h1150° C.-12 h1230° C.-6 h1150° C.-12 h1150° C.-12 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured13.319.621.0α [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured1823.525.7Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 113No. 281No. 282No. 283No. 284No. 285[% by mass]SiO261.859.164.461.759.3Al2O32425.922.224.125.9MgO9.510.38.89.610.3Li2O00000Na2O0.060.060.050.050.06K2O0.010.010.010.010.01CaO0.050.050.050.060.06SrO00000BaO00000ZnO00000B2O300000P2O50.020.020.010.010.02TiO21.941.960.040.040.04ZrO22.312.323.073.083.05HfO20.050.050.070.070.06SnO20.220.231.231.241.22Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.650.620.680.650.62Al / (Si + Al + Mg)0.250.270.230.250.27Mg / (Si + Al + Mg)0.100.110.090.100.11Si / Al2.582.282.902.562.29Si / Mg6.515.747.326.435.76Al / Mg2.532.512.522.512.51(Li + Na + K) / Si0.001130.001180.000930.000970.00118Li + Na + K + Ca +0.120.120.110.120.13Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.841.632.081.831.64Zn − (Ti + Zr) [% by mass]−4.25−4.28−3.11−3.12−3.09Ti / (Ti + Fe)0.9950.9950.8000.8000.800As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.231.231.241.22Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 114No. 281No. 282No. 283No. 284No. 285Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured32.229unmeasuredunmeasuredDensity [g / cm3]2.542.572.532.562.59β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1150° C.-12 h1150° C.-12 h1150° C.-12 h1150° C.-12 h1150° C.-12 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.18.616.3unmeasuredunmeasured11.7α [×10−7 / ° C.] 30-750° C.2221.4unmeasuredunmeasured17.9Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 115No. 286No. 287No. 288No. 289No. 290[% by mass]SiO26360.357.763.160.5Al2O321.723.625.521.823.6MgO8.69.410.18.79.4Li2O00000Na2O0.050.050.060.050.05K2O0.010.010.0100CaO0.040.050.050.050.05SrO00000BaO00000ZnO00000B2O300000P2O51.971.992.011.971.98TiO21.951.961.980.040.04ZrO22.312.322.343.13.11HfO20.050.050.050.060.06SnO20.220.210.221.221.24Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.680.650.620.670.65Al / (Si + Al + Mg)0.230.250.270.230.25Mg / (Si + Al + Mg)0.090.100.110.090.10Si / Al2.902.562.262.892.56Si / Mg7.336.415.717.256.44Al / Mg2.522.512.522.512.51(Li + Na + K) / Si0.000950.001000.001210.000790.00083Li + Na + K + Ca +0.10.110.120.10.1Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.081.831.622.071.83Zn − (Ti + Zr) [% by mass]−4.26−4.28−4.32−3.14−3.15Ti / (Ti + Fe)0.9950.9950.9950.8000.800As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.220.210.221.221.24Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 116No. 286No. 287No. 288No. 289No. 290Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]13121285127213191293equiv. to10{circumflex over ( )}3 [° C.]14601418139414641430High-Temp.10{circumflex over ( )}2.5 [° C.]  15541506147715581519Viscosity10{circumflex over ( )}2 [° C.]16681614158116711627Liquidus Temperature [° C.]13851396141813751396Liquidus Viscosity [—]3.473.142.843.573.22α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.512.532.562.522.55β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1150° C.-12 h1150° C.-12 h1150° C.- 12 h1150° C.-12 h1150° C.-12 hTransmittance380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL *unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb *unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured[%] 4 mm1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredthicknessPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal Surface Ra [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End Surface Ra [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 117No. 291No. 292No. 293No. 294No. 295[% by mass]SiO25857.664.464.464.4Al2O325.429.225.225.225.2MgO10.111.5101010Li2O00000Na2O0.060.020.060.060.06K2O00.010.010.010.01CaO0.060.060.050.050.05SrO00000BaO00000ZnO01.38000B2O300000P2O51.980000TiO20.030.020.020.020.02ZrO23.090000HfO20.060000SnO21.240.21000Fe2O30.010.010.010.010.01As2O3000.2500Sb2O30000.250Cl200000.25MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.620.590.650.650.65Al / (Si + Al + Mg)0.270.300.250.250.25Mg / (Si + Al + Mg)0.110.120.100.100.10Si / Al2.281.972.562.562.56Si / Mg5.745.016.446.446.44Al / Mg2.512.542.522.522.52(Li + Na + K) / Si0.001030.000520.001090.001090.00109Li + Na + K + Ca +0.120.090.120.120.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.631.451.831.831.83Zn − (Ti + Zr) [% by mass]−3.121.36−0.02−0.02−0.02Ti / (Ti + Fe)0.7500.6670.6670.6670.667As + Sb [% by mass]000.250.250Sn + As + Sb + Cl [% by mass]1.240.210.250.250.25Sn / (Sn + As + Sb + Cl)11000Metal Al [ppm]01000100010001000TABLE 118No. 291No. 292No. 293No. 294No. 295Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1278unmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]1399unmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  1481unmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]1585unmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]1415unmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]2.89unmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.572.58unmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions①1150° C.-12 h1150° C.-12 h1150° C.-12 h1150° C.-12 h1150° C.-12 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasured12.7unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasured16.5unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 119No. 296No. 297No. 298No. 299No. 300[% by mass]SiO264.468.268.168.165.9Al2O325.221.221.221.221.2MgO108.78.78.78.7Li2O00000Na2O0.060.060.060.060.06K2O0.010.010.010.010.01CaO0.050.040.040.040.04SrO00000BaO00000ZnO01.391.381.381.38B2O300000P2O500000.01TiO20.020.020.020.022.5ZrO200000HfO200000SnO200.170.170.170.16Fe2O30.010.010.010.010.01As2O30.140000Sb2O30.140000Cl200000MoO300.20.30.40V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.650.700.690.690.69Al / (Si + Al + Mg)0.250.220.220.220.22Mg / (Si + Al + Mg)0.100.090.090.090.09Si / Al2.563.223.213.213.11Si / Mg6.447.847.837.837.57Al / Mg2.522.442.442.442.44(Li + Na + K) / Si0.001090.001030.001030.001030.00106Li + Na + K + Ca +0.120.110.110.110.11Sr + Ba [% by mass](Si + Zn) / (Mg + Al)1.832.332.322.322.25Zn − (Ti + Zr) [% by mass]−0.021.371.361.36−1.12Ti / (Ti + Fe)0.6670.6670.6670.6670.996As + Sb [% by mass]0.280000Sn + As + Sb + Cl [% by mass]0.280.170.170.170.16Sn / (Sn + As + Sb + Cl)01111Metal Al [ppm]10000000TABLE 120No. 296No. 297No. 298No. 299No. 300Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasuredunmeasured1317equiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasuredunmeasured1468High-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasuredunmeasured1564Viscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasuredunmeasured1674Liquidus Temperature [° C.]unmeasuredunmeasuredunmeasuredunmeasured1386Liquidus Viscosity [—]unmeasuredunmeasuredunmeasuredunmeasured3.5α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasured28.5Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasured2.49β-OH [ / mm]0.15unmeasuredunmeasuredunmeasured0.15After CrystallizationCrystallization Conditions①1150° C.-12 h1150° C.-12 h1150° C.-12 h1150° C.-12 h 850° C.-6 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 121No. 301No. 302No. 303No. 304No. 305[% by mass]SiO264.965.46766.666.8Al2O320.92121.321.121.2MgO8.68.68.78.78.7Li2O00000Na2O0.060.060.060.060.06K2O0.010.010.010.010.01CaO0.040.040.040.040.04SrO00000BaO00000ZnO1.381.381.391.351.36B2O300000P2O50.010.01000TiO20.041.261.250.030.64ZrO23.861.9501.960.98HfO20.080.0400.040.02SnO20.160.160.160.160.17Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.690.690.690.690.69Al / (Si + Al + Mg)0.220.220.220.220.22Mg / (Si + Al + Mg)0.090.090.090.090.09Si / Al3.113.113.153.163.15Si / Mg7.557.607.707.667.68Al / Mg2.432.442.452.432.44(Li + Na + K) / Si0.001080.001070.001040.001050.00105Li + Na + K + Ca +0.110.110.110.110.11Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.252.262.282.282.28Zn − (Ti + Zr) [% by mass]−2.52−1.830.14−0.64−0.26Ti / (Ti + Fe)0.8000.9920.9920.7500.985As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.160.160.160.160.17Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 122No. 301No. 302No. 303No. 304No. 305Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]13221316133613391337equiv. to10{circumflex over ( )}3 [° C.]14691465148814911489High-Temp.10{circumflex over ( )}2.5 [° C.]  15641560158415871586Viscosity10{circumflex over ( )}2 [° C.]16731671169516991697Liquidus Temperature [° C.]13541358136113761368Liquidus Viscosity [—]3.753.693.813.733.77α [×10−7 / ° C.] 30-380° C.28.929.228.128.428.4Density [g / cm3]2.522.542.482.502.49β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 123No. 306No. 307No. 308No. 309No. 310[% by mass]SiO263.665.765.266.665Al2O32121.120.721.120.9MgO8.78.78.58.78.6Li2O00000Na2O0.060.060.060.060.06K2O0.020.010.010.010.01CaO0.040.040.050.040.04SrO00000BaO00000ZnO1.351.361.351.381.37B2O300000P2O50.020.010.0100.01TiO24.971.880.040.030.04ZrO200.982.881.473.36HfO200.020.060.030.07SnO20.170.171.110.570.56Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.680.690.690.690.69Al / (Si + Al + Mg)0.230.220.220.220.22Mg / (Si + Al + Mg)0.090.090.090.090.09Si / Al3.033.113.153.163.11Si / Mg7.317.557.677.667.56Al / Mg2.412.432.442.432.43(Li + Na + K) / Si0.001260.001070.001070.001050.00108Li + Na + K + Ca +0.120.110.120.110.11Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.192.252.282.282.25Zn − (Ti + Zr) [% by mass]−3.62−1.5−1.57−0.12−2.03Ti / (Ti + Fe)0.9980.9950.8000.7500.800As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.170.171.110.570.56Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 124No. 306No. 307No. 308No. 309No. 310Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12871318131913361321equiv. to10{circumflex over ( )}3 [° C.]14321467146614871469High-Temp.10{circumflex over ( )}2.5 [° C.]  15271562156015831563Viscosity10{circumflex over ( )}2 [° C.]16351673167016941669Liquidus Temperature [° C.]13501362137313861366Liquidus Viscosity [—]3.523.673.63.633.66α [×10−7 / ° C.] 30-380° C.2928.628.928.628.9Density [g / cm3]2.522.502.542.502.54β-OH [ / mm]0.150.150.150.150.15After CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.−2.3unmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.3.07unmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.45unmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 125No. 311No. 312No. 313No. 314No. 315[% by mass]SiO264.854.856.154.856.1Al2O320.927.628.227.628.3MgO8.611.311.511.311.5Li2O00000Na2O0.060.060.060.060.06K2O00.020.020.020.02CaO0.050.040.040.040.04SrO00000BaO00000ZnO1.371.341.371.341.38B2O300000P2O50.010000TiO20.034.572.344.572.34ZrO22.420000HfO20.050000SnO21.70.220.230.220.23Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500.10.10.030.03CuO00.10.10.030.03NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.690.580.590.580.58Al / (Si + Al + Mg)0.220.290.290.290.30Mg / (Si + Al + Mg)0.090.120.120.120.12Si / Al3.101.991.991.991.98Si / Mg7.534.854.884.854.88Al / Mg2.432.442.452.442.46(Li + Na + K) / Si0.000930.001460.001430.001460.00143Li + Na + K + Ca +0.110.120.120.120.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.241.441.451.441.44Zn − (Ti + Zr) [% by mass]−1.08−3.23−0.97−3.23−0.96Ti / (Ti + Fe)0.7500.9980.9960.9980.996As + Sb [ % by mass]00000Sn + As + Sb + Cl [% by mass]1.700.220.230.220.23Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 126No. 311No. 312No. 313No. 314No. 315Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1322unmeasuredunmeasuredunmeasuredunmeasuredequiv. to10{circumflex over ( )}3 [° C.]1470unmeasuredunmeasuredunmeasuredunmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  1565unmeasuredunmeasuredunmeasuredunmeasuredViscosity10{circumflex over ( )}2 [° C.]1677unmeasuredunmeasuredunmeasuredunmeasuredLiquidus Temperature [° C.]1360unmeasuredunmeasuredunmeasuredunmeasuredLiquidus Viscosity [—]3.71unmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.28.7unmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.54unmeasuredunmeasuredunmeasuredunmeasuredβ-OH [ / mm]0.15unmeasuredunmeasuredunmeasuredunmeasuredAfter CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 127No. 316No. 317No. 318No. 319No. 320[% by mass]SiO263.863.961.363.658.7Al2O322.122.22420.825.8MgO8.88.89.68.610.3Li2O00000Na2O0.050.050.050.060.06K2O0.01000.020.01CaO0.040.050.060.040.05SrO00000BaO00000ZnO0001.350B2O300000P2O50.020.010.010.020.02TiO21.960.040.044.911.97ZrO22.293.043.0902.3HfO20.050.060.0600.05SnO20.211.21.230.140.21Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO30.560.550.560.510.54V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.670.670.650.680.62Al / (Si + Al + Mg)0.230.230.250.220.27Mg / (Si + Al + Mg)0.090.090.100.090.11Si / Al2.892.882.553.062.28Si / Mg7.257.266.397.405.70Al / Mg2.512.522.502.422.50(Li + Na + K) / Si0.000940.000780.000820.001260.00119Li + Na + K + Ca +0.10.10.110.120.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.062.061.822.211.63Zn − (Ti + Zr) [% by mass]−4.25−3.08−3.13−3.56−4.27Ti / (Ti + Fe)0.9950.8000.8000.9980.995As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.211.201.230.140.21Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 128No. 316No. 317No. 318No. 319No. 320Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasuredunmeasured1282unmeasuredequiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasuredunmeasured1428unmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasuredunmeasured1521unmeasuredViscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasuredunmeasured1630unmeasuredLiquidus Temperature [° C.]unmeasuredunmeasuredunmeasured1355unmeasuredLiquidus Viscosity [—]unmeasuredunmeasuredunmeasured3.46unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasured29.2unmeasuredDensity [g / cm3]2.522.532.562.522.57β-OH [ / mm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAfter CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasured−1.08unmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasured4.08unmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasured2.45unmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 129No. 321No. 322No. 323No. 324No. 325[% by mass]SiO264.264.061.261.962.8Al2O321.221.120.120.420.6MgO9.39.04.28.48.5Li2O00000Na2O0.050.050.040.050.05K2O0.020.020.020.010.01CaO0.040.040.010.040.04SrO00000BaO00000ZnO00.699.571.321.34B2O300000P2O50.020.020.020.020.02TiO24.974.964.740.072.47ZrO20007.463.9HfO20000.160.08SnO20.160.170.160.160.16Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.680.680.720.680.68Al / (Si + Al + Mg)0.220.220.240.220.22Mg / (Si + Al + Mg)0.100.100.050.090.09Si / Al3.033.033.043.033.05Si / Mg6.907.1114.577.377.39Al / Mg2.282.344.792.432.42(Li + Na + K) / Si0.001090.001090.000980.000970.00096Li + Na + K + Ca +0.110.110.070.10.1Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.102.152.912.202.20Zn − (Ti + Zr) [% by mass]−4.97−4.274.83−6.21−5.03Ti / (Ti + Fe)0.9980.9980.9980.8750.996As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.160.170.160.160.16Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 130No. 321No. 322No. 323No. 324No. 325Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12871285127313051291equiv. to10{circumflex over ( )}3 [° C.]14331431141714361432High-Temp.10{circumflex over ( )}2.5 [° C.]  15271524151215231522Viscosity10{circumflex over ( )}2 [° C.]16361634162316301631Liquidus Temperature [° C.]135313491386unmeasured1349Liquidus Viscosity [—]3.513.523.6unmeasured3.55α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.502.512.622.612.57β-OH [ / mm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAfter CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.−1.3−0.03unmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.4.55.3unmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 131No. 326No. 327No. 328No. 329No. 330[% by mass]SiO263.362.366.267.969.5Al2O320.820.620.419.318.2MgO8.58.48.17.67.2Li2O00000Na2O0.050.050.050.050.05K2O0.010.010.020.020.02CaO0.040.040.040.030.03SrO00000BaO00000ZnO1.351.34000B2O300000P2O50.020.020.020.020.02TiO23.691.254.924.94.86ZrO22.05.73000HfO20.040.12000SnO20.170.160.170.160.16Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.680.680.700.720.73Al / (Si + Al + Mg)0.220.230.220.200.19Mg / (Si + Al + Mg)0.090.090.090.080.08Si / Al3.043.023.253.523.82Si / Mg7.457.428.178.939.65Al / Mg2.452.452.522.542.53(Li + Na + K) / Si0.000950.000960.001060.001030.00101Li + Na + K + Ca +0.10.10.110.10.1Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.212.192.322.522.74Zn − (Ti + Zr) [% by mass]−4.34−5.64−4.92−4.9−4.86Ti / (Ti + Fe)0.9970.9920.9980.9980.998As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.170.160.170.160.16Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 132No. 326No. 327No. 328No. 329No. 330Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]12851292132313421359equiv. to10{circumflex over ( )}3 [° C.]14281431147414961517High-Temp.10{circumflex over ( )}2.5 [° C.]  15171520156915941617Viscosity10{circumflex over ( )}2 [° C.]16241627168217091735Liquidus Temperature [° C.]1375unmeasured137913841387Liquidus Viscosity [—]3.34unmeasured3.593.73.8α [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]2.542.592.482.462.45β-OH [ / mm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAfter CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 hTransmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured−0.416.437.44α [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured4.329.7810.85Density [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 133No. 331No. 332No. 333No. 334No. 335[% by mass]SiO269.972.876.368.063.7Al2O321.419.317.818.221MgO8.57.75.67.38.6Li2O00000Na2O0.050.040.040.060.06K2O0000.020.02CaO0.040.040.020.030.04SrO00000BaO00000ZnO0001.361.37B2O300000P2O50000.020TiO20.020.020.024.894.98ZrO200000HfO200000SnO20.160.170.170.160.17Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.700.730.770.730.68Al / (Si + Al + Mg)0.210.190.180.190.23Mg / (Si + Al + Mg)0.090.080.060.080.09Si / Al3.273.774.293.743.03Si / Mg8.229.4513.639.327.41Al / Mg2.522.513.182.492.44(Li + Na + K) / Si0.000720.000550.000520.001180.00126Li + Na + K + Ca +0.090.080.060.110.12Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.342.703.262.722.20Zn − (Ti + Zr) [% by mass]−0.02−0.02−0.02−3.53−3.61Ti / (Ti + Fe)0.6670.6670.6670.9980.998As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.160.170.170.160.17Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00001000TABLE 134No. 331No. 332No. 333No. 334No. 335Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1374141814891345unmeasuredequiv. to10{circumflex over ( )}3 [° C.]1529158316621504unmeasuredHigh-Temp.10{circumflex over ( )}2.5 [° C.]  1628168417681605unmeasuredViscosity10{circumflex over ( )}2 [° C.]1746180118931726unmeasuredLiquidus Temperature [° C.]1401unmeasured1464unmeasuredunmeasuredLiquidus Viscosity [—]3.8unmeasured4.17unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.26.62521.22628.6Density [g / cm3]2.442.422.372.472.52β-OH [ / mm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAfter CrystallizationCrystallization Conditions① 850° C.-6 h 850° C.-6 h 850° C.-6 h 850° C.-6 h805° C.-60 h 1230° C.-1 h1230° C.-1 h1230° C.-1 h1230° C.-1 h1075° C.-30 min1120° C.-2 h  Transmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasured0.5of Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasured0.1of End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasured0.01TABLE 135No. 336No. 337No. 338No. 339No. 340[% by mass]SiO269.662.569.270.367.4Al2O318.818.519.119.218.9MgO7.47.37.67.67.6Li2O00000Na2O0.040.040.040.040.04K2O000.020.010.01CaO0.040.040.050.050.05SrO00000BaO00000ZnO00000B2O300000P2O5000.020.010.02TiO206.73.752.513.42ZrO204.51002.34HfO23.910.12000.05SnO20.170.170.160.160.17Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.730.710.720.720.72Al / (Si + Al + Mg)0.200.210.200.200.20Mg / (Si + Al + Mg)0.080.080.080.080.08Si / Al3.703.383.623.663.57Si / Mg9.418.569.119.258.87Al / Mg2.542.532.512.532.49(Li + Na + K) / Si0.000570.000640.000870.000710.00074Li + Na + K + Ca +0.080.080.110.10.1Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.662.422.592.622.54Zn − (Ti + Zr) [% by mass]0−11.21−3.75−2.51−5.76Ti / (Ti + Fe)0.0000.9990.9970.9960.997As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.170.170.160.160.17Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 136No. 336No. 337No. 338No. 339No. 340Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]unmeasuredunmeasured136113781344equiv. to10{circumflex over ( )}3 [° C.]unmeasuredunmeasured151915381498High-Temp.10{circumflex over ( )}2.5 [° C.]  unmeasuredunmeasured162016401596Viscosity10{circumflex over ( )}2 [° C.]unmeasuredunmeasured174217611713Liquidus Temperature [° C.]unmeasuredunmeasured13831398unmeasuredLiquidus Viscosity [—]unmeasuredunmeasured3.843.86unmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured25.625.226.4Density [g / cm3]2.492.572.522.532.49β-OH [ / mm]unmeasuredunmeasured0.15unmeasuredunmeasuredAfter CrystallizationCrystallization Conditions①805° C.-60 h 700° C.-2 h805° C.-60 h 805° C.-60 h 805° C.-60 h 1075° C.-30 min1200° C.-20 h1075° C.-30 min1075° C.-30 min1075° C.-30 min1120° C.-2 h  1120° C.-2 h  1120° C.-2 h  1120° C.-2 h  Transmittance [%]380 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness800 nmunmeasuredunmeasured34.8unmeasuredunmeasured1200 nm unmeasuredunmeasured45.2unmeasuredunmeasuredL* unmeasuredunmeasuredunmeasuredunmeasuredunmeasureda*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredb*unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredDiffuse600 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTransmittance [%]800 nmunmeasuredunmeasuredunmeasuredunmeasuredunmeasured4 mm thickness1200 nm unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredPrecipitated Crystalsα-Cor.α-Cor.α-Cor.α-Cor.α-Cor.Average Crystallite Size [nm]unmeasuredunmeasured37unmeasuredunmeasuredα [×10−7 / ° C.] 30-380° C.unmeasuredunmeasured8.8unmeasuredunmeasuredα [×10−7 / ° C.] 30-750° C.unmeasuredunmeasured12.1unmeasuredunmeasuredDensity [g / cm3]unmeasuredunmeasured2.39unmeasuredunmeasuredAverage Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof Principal SurfaceRa [nm]Average Surface Roughnessunmeasuredunmeasuredunmeasuredunmeasuredunmeasuredof End SurfaceRa [nm]Waviness [μm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredTABLE 137No. 341No. 342No. 343No. 344No. 345[% by mass]SiO269.254.868.368.668.9Al2O31927.619.119.119.1MgO7.611.37.67.67.6Li2O00000Na2O0.040.040.040.040.04K2O0.0100.010.010.01CaO0.050.040.050.050.05SrO00000BaO00000ZnO01.340.0100B2O300000P2O50.0200.020.020.02TiO22.294.734.664.374.06ZrO21.570000HfO20.030000SnO20.160.220.160.170.17Fe2O30.010.010.010.010.01As2O300000Sb2O300000Cl200000MoO300000V2O500000CuO00000NiO00000MnO200000Cr2O300000Nd2O300000WO300000Co3O400000[ppm]Pt0.030.030.030.030.03Rh0.020.020.020.020.02Pt + Rh0.050.050.050.050.05Si / (Si + Al + Mg)0.720.580.720.720.72Al / (Si + Al + Mg)0.200.290.200.200.20Mg / (Si + Al + Mg)0.080.120.080.080.08Si / Al3.641.993.583.593.61Si / Mg9.114.858.999.039.07Al / Mg2.502.442.512.512.51(Li + Na + K) / Si0.000720.000730.000730.000730.00073Li + Na + K + Ca +0.10.080.10.10.1Sr + Ba [% by mass](Si + Zn) / (Mg + Al)2.601.442.562.572.58Zn − (Ti + Zr) [% by mass]−3.86−3.39−4.65−4.37−4.06Ti / (Ti + Fe)0.9960.9980.9980.9980.998As + Sb [% by mass]00000Sn + As + Sb + Cl [% by mass]0.160.220.160.170.17Sn / (Sn + As + Sb + Cl)11111Metal Al [ppm]00000TABLE 138No. 341No. 342No. 343No. 344No. 345Before CrystallizationTemperature10{circumflex over ( )}4 [° C.]1368unmeasured134813521358equiv. to10{circumflex over ( )}3 [° C.]1525unmeasured150515101516High-Temp.10{circumflex over ( )}2.5 [° C.]  1625unmeasured160416091616Viscosity10{circumflex over ( )}2 [° C.]1744unmeasured172417271735Liquidus Temperature [° C.]unmeasuredunmeasured143714271389Liquidus Viscosity [—]unmeasuredunmeasured3.43.493.78α [×10−7 / ° C.] 30-380° C.25.4unmeasured25.725.725.7Density [g / cm3]2.462.622.462.452.45β-OH [ / mm]unmeasuredunmeasuredunmeasuredunmeasuredunmeasuredAfter CrystallizationCrystallization Conditions①805° C.-60 h 805° C.-60 h 805° C.-60 h 805° C.-60 h 805° C.-60 h 1075° C.-30 min1075° C.-30 min1075° C.-30 min1075° C.-30 min1075° C.-30 min1120° C.-2 h  1120° C.-2 h  ...

Claims

1: A low-thermal expansion member containing a MgO—Al2O3—SiO2-based crystal.2: The low-thermal expansion member according to claim 1, containing α-cordierite and having transmittancy.3: The low-thermal expansion member according to claim 2, containing, in terms of % by mass, 20 to 90% SiO2, more than 0 to 50% Al2O3, and more than 0 to 40% MgO.4: The low-thermal expansion member according to claim 2, wherein SiO2 / (SiO2+Al2O3+MgO) is 0.45 to 0.81 in terms of % by mass.5: The low-thermal expansion member according to claim 2, wherein Al2O3 / (SiO2+Al2O3+MgO) is 0.01 to 0.45 in terms of % by mass.6: The low-thermal expansion member according to claim 2, wherein MgO / (SiO2+Al2O3+MgO) is 0.03 to 0.29 in terms of % by mass.7: The low-thermal expansion member according to claim 2, wherein SiO2 / Al2O3 is 1 to 15 in terms of % by mass.8: The low-thermal expansion member according to claim 2, wherein SiO2 / MgO is 2 to 15 in terms of % by mass.9: The low-thermal expansion member according to claim 2, wherein Al2O3 / MgO is 0.2 to 15 in terms of % by mass.10: The low-thermal expansion member according to claim 2, wherein, in terms of % by mass, the low-thermal expansion member contains 0 to 5.6% BaO, SiO2 / Al2O3 is 2.5 to 15, and SiO2 / MgO is 5.4 to 15.11: The low-thermal expansion member according to claim 2, wherein, in terms of % by mass, the low-thermal expansion member contains 0 to 5.6% BaO, SiO2 / Al2O3 is 2.5 to 15, and Al2O3 / MgO is 1.8 to 15.12: The low-thermal expansion member according to claim 2, containing, in terms of % by mass, 55.5 to 90% SiO2 and more than 0% ZnO.13: The low-thermal expansion member according to claim 2, wherein (Li2O+Na2O+K2O) / SiO2 is 0.00005 to 0.03 in terms of % by mass.14: The low-thermal expansion member according to claim 2, wherein Li2O+Na2O+K2O+CaO+SrO+BaO is not more than 2% in terms of % by mass.15: The low-thermal expansion member according to claim 2, wherein (SiO2+ZnO) / (MgO+Al2O3) is 0.7 to 3 in terms of % by mass.16: The low-thermal expansion member according to claim 2, wherein ZnO—(TiO2+ZrO2) is −15 to 5% in terms of % by mass.17: The low-thermal expansion member according to claim 2, wherein TiO2 / (TiO2+Fe2O3) is 0.001 to 0.999 in terms of % by mass.18: The low-thermal expansion member according to claim 2, containing at least one of MoO3, V2O5, CuO, NiO, MnO2, Cr2O3, Nd2O3, WO3, and Co3O4.19: The low-thermal expansion member according to claim 2, containing more than 0% MoO3 in terms of % by mass.20: The low-thermal expansion member according to claim 2, wherein, in terms of % by mass, SiO2 / (SiO2+Al2O3+MgO) is 0.36 to 0.81, Al2O3 / (SiO2+Al2O3+MgO) is 0.09 to 0.5, MgO / (SiO2+Al2O3+MgO) is 0.01 to 0.29, and the low-thermal expansion member contains 0.01 to less than 2.5% Na2O and at least one of As2O3, Sb2O3, SnO2, and Cl.21: The low-thermal expansion member according to claim 1, wherein a β-OH value is more than 0 to 2 / mm.22: The low-thermal expansion member according to claim 1, wherein a transmittance at a thickness of 4 mm and a wavelength of 1200 nm is not less than 10%.23: The low-thermal expansion member according to claim 1, wherein a coefficient of thermal expansion at 30 to 380° C. is not more than 30×10−7 / ° C.24: The low-thermal expansion member according to claim 1, wherein a coefficient of thermal expansion at 30 to 750° C. is not more than 30×10−7 / ° C.25: The low-thermal expansion member according to claim 1, being a crystallized glass.26: A precursor of a low-thermal expansion member, the precursor being made of a crystallizable glass containing, in terms of % by mass, 20 to 90% SiO2, more than 0 to 50% Al2O3, more than 0 to 40% MgO, 0 to 20% CaO, 0 to 20% SrO, 0 to 20% BaO, 0 to 20% ZnO, 0 to 10% Li2O, 0 to 20% Na2O, 0 to 20% K2O, 0 to 20% B2O3, 0 to 20% P2O5, 0 to 20% TiO2, 0 to 20% ZrO2, 0 to 10% HfO2, and 0 to 20% SnO2.27: A method for producing the low-thermal expansion member according to claim 25, the method comprising the steps of:heating a raw material into a melt and forming the melt into a shape to obtain a crystallizable glass; andsubjecting the crystallizable glass to heat treatment to crystallize the crystallizable glass.28: The method for producing the low-thermal expansion member according to claim 27, wherein an amount of metal Al added to the raw material is more than 0 to 5000 ppm in terms of % by mass.

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