Contact pin for integrated circuit testing
USD1075695SActive Publication Date: 2025-05-20JOHNSTECH INTERNATIONAL CORP
Patent Information
- Application Number
- US29/917131
- Authority / Receiving Office
- US · United States
- Patent Type
- Designs(United States)
- Current Assignee / Owner
- Filing Date
- 2023-11-17
- Publication Date
- 2025-05-20
- Estimated Expiration
- 2040-05-20
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Figure USD1075695-D00000_ABST
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Description
[0001] FIG. 1 is a Top Front Right Side Perspective view of a contact pin for integrated circuit testing showing my new design.
[0002] FIG. 2 is a Bottom Rear Left Side Perspective view thereof.
[0003] FIG. 3 is a Front view thereof.
[0004] FIG. 4 is a Rear view thereof.
[0005] FIG. 5 is a Left view thereof.
[0006] FIG. 6 is a Right view thereof.
[0007] FIG. 7 is a Top view thereof; and,
[0008] FIG. 8 is a Bottom view thereof.
Claims
The ornamental design for a contact pin for integrated circuit testing as shown and described.
Citation Information
Patent Citations
Part of electric contact
TWD228536S
Wafer Level Integrated Circuit Contactor and Method of Construction
US20160161528A1
On-Center Electrically Conductive Pins For Integrated Testing
US20160370406A1
Contacting system for electrical devices
US5639247A
IC socket
US5841640A
Cited By
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