Contact pin for integrated circuit testing

USD1075695SActive Publication Date: 2025-05-20JOHNSTECH INTERNATIONAL CORP

Patent Information

Application Number
US29/917131
Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2023-11-17
Publication Date
2025-05-20
Estimated Expiration
2040-05-20

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Description

[0001] FIG. 1 is a Top Front Right Side Perspective view of a contact pin for integrated circuit testing showing my new design.

[0002] FIG. 2 is a Bottom Rear Left Side Perspective view thereof.

[0003] FIG. 3 is a Front view thereof.

[0004] FIG. 4 is a Rear view thereof.

[0005] FIG. 5 is a Left view thereof.

[0006] FIG. 6 is a Right view thereof.

[0007] FIG. 7 is a Top view thereof; and,

[0008] FIG. 8 is a Bottom view thereof.

Claims

The ornamental design for a contact pin for integrated circuit testing as shown and described.

Citation Information

Patent Citations

  • Part of electric contact

    TWD228536S

  • Wafer Level Integrated Circuit Contactor and Method of Construction

    US20160161528A1

  • On-Center Electrically Conductive Pins For Integrated Testing

    US20160370406A1

  • Contacting system for electrical devices

    US5639247A

  • IC socket

    US5841640A

Cited By

  • Contact pin for integrated circuit testing

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