Electron microscope

USD1085195SActive Publication Date: 2025-07-22SHENZHEN CHUANGSHI OPTICAL TECHNOLOGY CO LTD

Patent Information

Application Number
US29/975697
Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2024-11-30
Publication Date
2025-07-22
Estimated Expiration
2040-07-22

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Description

[0001] FIG. 1 is a front, left, and top perspective view of an electron microscope, showing my new design;

[0002] FIG. 2 is a rear, right, and bottom perspective view thereof;

[0003] FIG. 3 is a front elevational view thereof;

[0004] FIG. 4 is a rear elevational view thereof;

[0005] FIG. 5 is a left side elevational view thereof;

[0006] FIG. 6 is a right side elevational view thereof;

[0007] FIG. 7 is a top plan view thereof;

[0008] FIG. 8 is a bottom plan view thereof; and,

[0009] FIG. 9 is a front, left, and top perspective view thereof shown in a state of use.

[0010] The broken lines in the drawings depict portions of the electron microscope that form no part of the claimed design.

Claims

The ornamental design for an electron microscope, as shown and described.

Citation Information

Patent Citations

  • Electron microscope

    USD644258S

  • Electron microscope

    USD687475S

  • Electron microscope

    USD708244S

  • Electron microscope

    USD958215S

  • electron microscope

    CN307370563S

Cited By

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