Device for measuring particles

USD1098934SActive Publication Date: 2025-10-21DONGWOO FINE CHEM CO LTD
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Patent Information

Application Number
US29/905349
Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2023-10-19
Publication Date
2025-10-21
Estimated Expiration
2040-10-21

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Description

[0001] FIG. 1 is a perspective view of the device for measuring particles of the present invention;

[0002] FIG. 2 is a front view thereof;

[0003] FIG. 3 is a rear view thereof;

[0004] FIG. 4 is a left side view thereof;

[0005] FIG. 5 is a right side view thereof;

[0006] FIG. 6 is top view thereof;

[0007] FIG. 7 is a bottom view thereof; and,

[0008] FIG. 8 is a perspective view of the device for measuring particles of the present invention, at a different angle.

[0009] The broken lines in the figures depict portions of the device for measuring particles which form no part of the claimed design.

Claims

The ornamental design for a device for measuring particles, as shown and described herein.

Citation Information

Patent Citations

  • Particulate matter measuring instrument sampling probe

    CN308115921S

  • Measurement apparatus used in optics (medical apparatus)

    JP1685139S

  • Particle measurement device

    TWD224210S

  • Particle tracking analysis method using scattered light (PTA) and device for detecting and identifying particles of a nanometric order of magnitude in liquids of all types

    US20170059471A1

  • Measuring device

    US20180080862A1