Contact pin for integrated circuit testing
USD1110279SActive Publication Date: 2026-01-27JOHNSTECH INTERNATIONAL CORP
Patent Information
- Application Number
- US29/941010
- Authority / Receiving Office
- US · United States
- Patent Type
- Designs(United States)
- Current Assignee / Owner
- Filing Date
- 2024-05-07
- Publication Date
- 2026-01-27
- Estimated Expiration
- 2041-01-27
Smart Images
Figure USD1110279-D00000_ABST
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Description
[0001] FIG. 1 is a top front right side perspective view of a contact pin for integrated circuit testing showing my new design.
[0002] FIG. 2 is a bottom rear left side perspective view thereof.
[0003] FIG. 3 is a front view thereof.
[0004] FIG. 4 is a rear view thereof.
[0005] FIG. 5 is a left view thereof.
[0006] FIG. 6 is a right view thereof.
[0007] FIG. 7 is a top view thereof; and,
[0008] FIG. 8 is a bottom view thereof.
Claims
The ornamental design for a contact pin for integrated circuit testing as shown and described.
Citation Information
Patent Citations
Wafer Level Integrated Circuit Contactor and Method of Construction
US20160161528A1
On-Center Electrically Conductive Pins For Integrated Testing
US20160370406A1
Contacting system for electrical devices
US5639247A
IC socket
US5841640A
Electrical interconnect contact system
US5947749A