Pin for IC testing device

USD1110964SActive Publication Date: 2026-02-03JOHNSTECH INTERNATIONAL CORP

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[0001] FIG. 1 is a top front right side perspective view of a pin for IC testing device showing my new design;

[0002] FIG. 2 is a top rear left side perspective view thereof.

[0003] FIG. 3 is a front view thereof.

[0004] FIG. 4 is a back view thereof.

[0005] FIG. 5 is a left view thereof.

[0006] FIG. 6 is a right view thereof.

[0007] FIG. 7 is a top view thereof; and,

[0008] FIG. 8 is a bottom view thereof.

The ornamental design for a pin for IC testing device as shown and described.