Test device

USD1113471SActive Publication Date: 2026-02-17CHEN LI CHUAN
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Patent Information

Application Number
US29/940547
Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2024-05-03
Publication Date
2026-02-17
Estimated Expiration
2041-02-17

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Description

[0001] FIG. 1 is a front, top, and right perspective view of a test device showing my new design;

[0002] FIG. 2 is a rear, bottom, and left view thereof;

[0003] FIG. 3 is a front elevation view thereof;

[0004] FIG. 4 is a rear elevation view thereof;

[0005] FIG. 5 is a left side elevation view thereof;

[0006] FIG. 6 is a right side elevation view thereof;

[0007] FIG. 7 is a top plan view thereof; and,

[0008] FIG. 8 is a bottom plan view thereof.

[0009] The broken lines shown in the drawings depict portions of the test device that form no part of the claimed design.

Claims

The ornamental design for a test device as shown and described.

Citation Information

Patent Citations

  • Insulation resistance tester (ut501)

    CN300821554D

  • Grounding tester (including sheath)

    CN306751915S

  • High voltage insulation tester

    TWD234802S

  • Insulation resistance tester

    USD395834S1

  • Electricity measuring instrument

    USD462021S1