Barrel for a test probe

Description

[0001] FIG. 1 is a perspective view depicting a barrel according to the present invention;

[0002] FIG. 2 is a front view of the barrel of FIG. 1;

[0003] FIG. 3 is a rear view of the barrel of FIG. 1;

[0004] FIG. 4 is a left side view of the barrel of FIG. 1;

[0005] FIG. 5 is a right side view of the barrel of FIG. 1;

[0006] FIG. 6 is a top view of the barrel of FIG. 1; and,

[0007] FIG. 7 is a bottom view of the barrel of FIG. 1.

[0008] The barrel for a test probe according to the present invention is used in testing electrical properties of a substrate or semiconductor used in information technology (IT) fields.

[0009] The solid lines shown in the figures represent portions of the barrel that form part of the claimed design. The dash-single dotted lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.

Claims

The ornamental design for a barrel for a test probe as shown and described.

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