Electric contact
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Designs(United States)
- Current Assignee / Owner
- Filing Date
- 2024-05-22
- Publication Date
- 2026-03-03
Smart Images

Figure USD1115703-D00000_ABST
Description
[0001] FIG. 1 is a front, bottom and left side perspective view of an electric contact, showing my new design;
[0002] FIG. 2 is a front, bottom and right side perspective view thereof;
[0003] FIG. 3 is a front elevational view thereof;
[0004] FIG. 4 is a rear elevational view thereof;
[0005] FIG. 5 is an enlarged left side elevational view thereof;
[0006] FIG. 6 is an enlarged right side elevational view thereof;
[0007] FIG. 7 is a top plan view thereof;
[0008] FIG. 8 is a bottom plan view thereof;
[0009] FIG. 9 is an enlarged view of the part 9-9 in FIG. 1;
[0010] FIG. 10 is an enlarged view of the part 10-10 in FIG. 2;
[0011] FIG. 11 is an enlarged view of the part 11-11 in FIG. 3;
[0012] FIG. 12 is an enlarged view of the part 12-12 in FIG. 4;
[0013] FIG. 13 is an enlarged view of the part 13-13 in FIG. 7; and,
[0014] FIG. 14 is an enlarged view of the part 14-14 in FIG. 8.
[0015] The broken lines shown in the drawings illustrate portions of the electric contact that form no part of the claimed design.
[0016] This article is an electric contact (probe pin) that electrically contacts with an electrode of inspecting objects, used for test equipment for electronic components such as semiconductor devices and integrated circuits.
Claims
The ornamental design for an electric contact, as shown and described.
Citation Information
Patent Citations
Spring probe contact assembly
USD1090440S
Electrical contact
USD475021S
Contact for an electrical connector
USD516039S
Multi-contact point terminal
USD601971S
Contact probe
USD699607S