Electric contact

USD1115703SActive Publication Date: 2026-03-03NIHON MICRONICS KK
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2024-05-22
Publication Date
2026-03-03

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Description

[0001] FIG. 1 is a front, bottom and left side perspective view of an electric contact, showing my new design;

[0002] FIG. 2 is a front, bottom and right side perspective view thereof;

[0003] FIG. 3 is a front elevational view thereof;

[0004] FIG. 4 is a rear elevational view thereof;

[0005] FIG. 5 is an enlarged left side elevational view thereof;

[0006] FIG. 6 is an enlarged right side elevational view thereof;

[0007] FIG. 7 is a top plan view thereof;

[0008] FIG. 8 is a bottom plan view thereof;

[0009] FIG. 9 is an enlarged view of the part 9-9 in FIG. 1;

[0010] FIG. 10 is an enlarged view of the part 10-10 in FIG. 2;

[0011] FIG. 11 is an enlarged view of the part 11-11 in FIG. 3;

[0012] FIG. 12 is an enlarged view of the part 12-12 in FIG. 4;

[0013] FIG. 13 is an enlarged view of the part 13-13 in FIG. 7; and,

[0014] FIG. 14 is an enlarged view of the part 14-14 in FIG. 8.

[0015] The broken lines shown in the drawings illustrate portions of the electric contact that form no part of the claimed design.

[0016] This article is an electric contact (probe pin) that electrically contacts with an electrode of inspecting objects, used for test equipment for electronic components such as semiconductor devices and integrated circuits.

Claims

The ornamental design for an electric contact, as shown and described.

Citation Information

Patent Citations

  • Spring probe contact assembly

    USD1090440S

  • Electrical contact

    USD475021S

  • Contact for an electrical connector

    USD516039S

  • Multi-contact point terminal

    USD601971S

  • Contact probe

    USD699607S