Measurement probe head

USD1116879SActive Publication Date: 2026-03-10TEKTRONIX INC
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2022-09-07
Publication Date
2026-03-10

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Description

[0001] FIG. 1 is a front-side isometric view of a measurement probe head according to a first embodiment of the disclosed design.

[0002] FIG. 2 is a rear-side isometric view of the measurement probe head of FIG. 1.

[0003] FIG. 3 is a right-side view of the measurement probe head of FIG. 1.

[0004] FIG. 4 is a top view of the measurement probe head of FIG. 1.

[0005] FIG. 5 is a left-side view of the measurement probe head of FIG. 1.

[0006] FIG. 6 is a bottom view of the measurement probe head of FIG. 1.

[0007] FIG. 7 is a front-side view of the measurement probe head of FIG. 1.

[0008] FIG. 8 is a rear-side view of the measurement probe head of FIG. 1.

[0009] FIG. 9 is a front-side isometric view of measurement probe head according to a second embodiment of the disclosed design.

[0010] FIG. 10 is a rear-side isometric view of the measurement probe head of FIG. 9.

[0011] FIG. 11 is a right-side view of the measurement probe head of FIG. 9.

[0012] FIG. 12 is a top view of the measurement probe head of FIG. 9.

[0013] FIG. 13 is a left-side view of the measurement probe head of FIG. 9.

[0014] FIG. 14 is a bottom view of the measurement probe head of FIG. 9.

[0015] FIG. 15 is a front-side view of the measurement probe head of FIG. 9; and,

[0016] FIG. 16 is a rear-side view of the measurement probe head of FIG. 9.

[0017] The broken lines shown are included for the purpose of illustrating portions of the measurement probe head that form no part of the claim.

Claims

The ornamental design for a measurement probe head, as shown and described.

Citation Information

Patent Citations

  • Hub (7 ports)

    CN307083183S

  • Disposable round-tipped probe with illuminated handle

    CN308221893S

  • Test probe (flat head SCPC028MG)

    CN309042738S

  • Shielded Probe Tip Interface

    US20180328962A1

  • Thermal management system for a test-and-measurement probe

    US20210148640A1