Spring probe

USD1117091SActive Publication Date: 2026-03-10JOHNSTECH INTERNATIONAL CORP
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
Filing Date
2025-02-07
Publication Date
2026-03-10

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Description

[0001] FIG. 1 is a top, front, right-side perspective view of a spring probe, showing my new design;

[0002] FIG. 2 is a bottom, rear, left-side perspective view thereof;

[0003] FIG. 3 is a front view thereof;

[0004] FIG. 4 is a rear view thereof;

[0005] FIG. 5 is a left view thereof;

[0006] FIG. 6 is a right view thereof;

[0007] FIG. 7 is a top view thereof; and,

[0008] FIG. 8 is a bottom view thereof.

Claims

The ornamental design for a spring probe as shown and described.

Citation Information

Patent Citations

  • Device for test socket pin having single coil spring divided into upper and lower regions

    KR102121754B1

  • Method of connecting IC package to IC contactor with weaker force and IC contactor for such method

    US20010039128A1

  • Contact terminal for test socket

    US20110171839A1

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    US20120129408A1

  • Self-closing spring probe

    US6396293B1