Spring probe contact
USD1117094SActive Publication Date: 2026-03-10JOHNSTECH INTERNATIONAL CORP
Patent Information
- Authority / Receiving Office
- US · United States
- Patent Type
- Designs(United States)
- Current Assignee / Owner
- Filing Date
- 2025-02-07
- Publication Date
- 2026-03-10
Smart Images
Figure USD1117094-D00000_ABST
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Description
[0001] FIG. 1 is a top, front, right-side perspective view of a spring probe contact, showing my new design;
[0002] FIG. 2 is a bottom, rear, left-side perspective view thereof;
[0003] FIG. 3 is a front view thereof;
[0004] FIG. 4 is a rear view thereof;
[0005] FIG. 5 is a left view thereof;
[0006] FIG. 6 is a right view thereof;
[0007] FIG. 7 is a top view thereof; and,
[0008] FIG. 8 is a bottom view thereof.
Claims
The ornamental design for a spring probe contact as shown and described.
Citation Information
Patent Citations
Device for test socket pin having single coil spring divided into upper and lower regions
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Method of connecting IC package to IC contactor with weaker force and IC contactor for such method
US20010039128A1
Electrical contact probe with compliant internal interconnect
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Spring contact assembly
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Contact terminal for test socket
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