Probe pin for integrated circuit testing

USD1127742SActive Publication Date: 2026-05-26HICON CO LTD +2
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Patent Information

Authority / Receiving Office
US · United States
Patent Type
Designs(United States)
Current Assignee / Owner
HICON CO LTD
Filing Date
2024-07-17
Publication Date
2026-05-26

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Description

[0001] 1.1 : Perspective

[0002] 1.2 : Front

[0003] 1.3 : Back

[0004] 1.4 : Left

[0005] 1.5 : Right

[0006] 1.6 : Top

[0007] 1.7 : Bottom

Claims

The ornamental design for a probe pin for integrated circuit testing as shown and described.